The End of CMOS Scaling

Toward the Introduction of New Materials and Structural Changes to Improve MOSFET Performance

Thomas Skotnicki, James A. Hutchby, Tsu-Jae King, H.-S. Philip Wong, and Frederic Boeuf

he rapid cadence of metal-oxide semiconductor field-effect transistor (MOSFET) scaling, as seen in the new 2003 International Technology Roadmap for Semiconductors (ITRS) [1], is accelerating introduction of new technologies to extend complementary TMOS (CMOS) down to, and perhaps beyond, the 22-nm node. This acceleration simultaneously requires the industry to intensify research on two highly challenging thrusts: one is scaling CMOS into an increasingly difficult manufacturing domain well below the 90-nm node for high performance (HP), low operating power (LOP), and low standby power (LSTP) applications, and the other is an exciting opportunity to invent fundamentally new approaches to information and signal processing to sustain functional scaling beyond the domain of CMOS. This article is focused on scaling CMOS to its fundamental limits, determined by manufacturing, physics, and costs using new materials and nonclassical structures. The companion articles in this issue address possible approaches for extending information processing into new realms of performance and application using new memory devices, logic devices, and architectures. The primary goal of these articles is to stimulate invention and research leading to feasibility demonstration for one or more roadmap-extending concepts. The following provides a brief introduction to each of the new nonclassical CMOS structures. This is followed by a presentation of one scenario for introduction of new structural changes to the MOSFET to scale CMOS to the end of the ITRS. A brief review of electrostatic

NONCLASSICAL CMOS STRUCTURES Nonclassical CMOS includes those advanced MOSFET structures shown in Table 1(a) and (b), which, combined with material enhancements, such as new gate stack materials, provides a path to scaling CMOS to the end of the roadmap. For digital applications, scaling challenges include controlling leakage currents and short-channel effects, increasing drain saturation current while reducing the power supply voltage, and maintaining control of device parameters (e.g., threshold voltage and leakage current) across the chip and from chip to chip. For analog/mixed-signal/RF applications, the challenges additionally include sustaining linearity, low noise figure, high power-added efficiency, and good transistor matching. The industrial and academic communities are pursuing two avenues to meeting these challenges—new materials and new transistor structures. New materials include those used in the gate stack (high-κ dielectrics and electrode materials), those used in the conducting channel that

■ 16 8755-3996/05/$20.00 ©2005 IEEE IEEE CIRCUITS & DEVICES MAGAZINE ■ JANUARY/FEBRUARY 2005 have improved carrier transport properties, as well as new dielectric layer. This structure combines the best features of materials used in the source/drain regions with reduced resis- the classical MOSFET (e.g., deep source/drain contact regions tance and improved carrier injection properties. New transis- for low parasitic resistance) with the best features of SOI tech- tor structures seek to improve the electrostatics of the nology (improved electrostatics). The increased capacitive cou- MOSFET, provide a platform for introduction of new materi- pling between the source, drain, and channel with the als, and accommodate the integration needs of new materials. conducting substrate through the ultra-thin BOX has the The following provides a brief introduction and overview to potential of reducing the speed of the device, and improving each of these nonclassical CMOS structures given in Table it’s electrostatic integrity. The former may be traded against 1(a) and (b). the latter by reducing the channel doping, which eventually Transport-enhanced MOSFETs [2]–[16] are those struc- leads to moderately improved speed for a constant Ioff. tures for which increased transistor drive current for Engineering the source/drain is becoming critically impor- improved circuit performance can be achieved by enhancing tant to maintaining the source and drain resistance to be a the average velocity of carriers in the channel. Approaches to reasonable fraction (∼10%) of the channel resistance. Conse- enhancing transport include mechanically straining the chan- quently, a new category of source/drain engineered MOSFETs nel layer to enhance carrier mobility and velocity, and [41]–[52] is introduced to address this issue. Two sub-catego- employing alternative channel materials such as silicon-ger- ry structures are described for providing engineered manium, germanium, or III-V compound semiconductors source/drain structures. First is the Schottky source/drain with electron and hole mobilities and velocities higher than structure [41]–[48]. In this case, the use of metallic source those in silicon. A judicious choice of crystal orientation and and drain electrodes minimizes parasitic series resistance and current transport direction may also provide transport eliminates the need for ultra-shallow p–n junctions. Metals or enhancement [17]. However, an important issue is how to fab- silicides that form low (near zero) Schottky barrier heights in ricate transport enhanced channel layers (such as a strained Si contact with silicon (i.e., a low-work-function metal for NMOS, layer) in several of the nonclassical CMOS transistor struc- and a high-work-function metal for PMOS) are required to tures [e.g., the multiple gate structures discussed in Table minimize contact resistance and maximize transistor drive 1(b)]. Researchers have recently demonstrated that a strained current in the on state. A UTB is needed to provide low leakage Si-on-insulator (SOI) substrate technology can be used to in the off state. Second is the reduced fringing/overlap gate combine the advantages of the ultra-thin body (UTB) struc- FET [49]–[52]. As MOSFET scaling continues, the parasitic ture and enhanced carrier transport [18]–[20]. The UTB SOI MOSFET 35 EI Bulk EI DG Tsi 0.35 [21]–[31] consists of a very 35 EI Bulk EI DG Tsi 0.35 ≤ 30 High Performance 0.3 thin (tSi 10 nm), fully 30 Low Operation 0.3 25 0.25 Power depleted (FD) transistor body 25 0.25 to ensure good electrostatic 0.2 20 20 0.2

control of the channel by the EI 15 0.15 EI 15 0.15 Tsi (nm) gate in the off state. Typically, Tsi (nm) 10 0.1 10 0.1 the ratio of the channel Tolerable EI Tolerable EI length to the channel thick- 5 0.05 5 0.05 ness will be ≥ 3. Therefore, 0 0 0 0 120 100 80 60 40 20 0 120 100 80 60 40 20 0 an extremely thin (tSi < 4 CMOS Node CMOS Node nm) Si channel is required to (a) (b) scale CMOS to the 22-nm node. The use of a lightly 35 EI Bulk EI DG Tsi 0.35 doped or undoped body pro- 30 Low Standby 0.3 vides immunity to Vt varia- Power 25 0.25 tions due to statistical dopant fluctuations, as well as 20 0.2 EI enhanced carrier mobilities 15 0.15 Tsi (nm) for higher transistor drive 10 Tolerable EI 0.1 current. The localized and 5 0.05 ultra-thin buried oxide (BOX) 0 0 FET [32]–[40] is an UTB SOI- 120 100 80 60 40 20 0 like FET in which a thin Si CMOS Node channel is locally isolated (c) from the bulk-Si substrate by a thin (10–30 nm) buried 1. Estimation of electrostatic integrity (EI) for bulk and double-gate FETs.

IEEE CIRCUITS & DEVICES MAGAZINE ■ JANUARY/FEBRUARY 2005 17 ■ Table 1(a). Single-gate Nonclassical CMOS Technologies.

Transport-Enhanced MOSFETs UTB SOI MOSFETs Source/Drain Engineered MOSFETs

Strained Si, Ge, SiGe FD Si film Bias Silicide Gate Gate S D Buried Oxide nFET pFET S D BOX Ground BOX (<20nm) Silicon Isolation Non-overlapped region Silicon Substrate Plane Bulk wafer Schottky Barrier Device Isolation Concept Strained Si, Ge, SiGe, Fully depleted SOI Ultra-thin channel Schottky source/drain Non-overlapped S/D SiGeC or other with body thinner and localized extensions on bulk, semiconductor; on than 10 nm ultra-thin BOX SOI, or DG devices bulk or SOI Application/Driver HP CMOS [2] HP, LOP, and LSTP HP, LOP, and LSTP HP CMOS [2] HP, LOP, and LSTP CMOS [2] CMOS [2] CMOS [2] Advantages • High mobility • Improved • SOI-like structure • Low source/drain • Reduced SCE and subthreshold slope on bulk resistance DIBL • No floating body • Shallow junction by • Reduced parasitic • Potentially lower Eeff geometry gate capacitance •Junction silicidation as on bulk • Improved S-slope and SCE Particular Strength • High mobility • Low diode leakage • Quasi-DG operation due • No need for abrupt S/D • Very low gate without change • Low junction to ground plane effect doping or activation capacitance in device capacitance enabled by the ultra thin architecture • No significant change BOX in design with respect • Bulk compatible to bulk Potential Weakness • Material defects and • Very thin silicon • Ground plane capacitance • Ultra-thin SOI required • High source/drain diode leakage (only required with low • Selective epi required • NFET silicide material resistance for bulk) defect density for channel and S/D not readily available • Reliability •Process compatibility • Vth adjustment • Parasitic potential •Advantageous only and thermal budget difficult barrier for very short • Operating temperature • Selective epi required devices for elevated S/D

Scaling Issues Bandgap usually Control of Si film Process becomes easier No particular scaling Sensitivity to Lg smaller than Si thickness with Lg down-scaling issue variation (shorter tunnel) Design Challenges Compact model needed None None Compact model needed Compact model needed Gain/Loss in Layout No difference No difference No difference No difference No difference compared to Bulk / Impact on Ion Ioff • Improved by 20–30% • Improved by 15–20% • Improved by 15–20% • Improved by 10–15% • Both shifted to compared to Bulk (from MASTAR (from MASTAR (from MASTAR (from MASTAR lower values µ = supposing effX2) supposing Eeff/2 and supposing Eeff/2 and supposing Rseries 0) S = 75 mV/decade) S = 75 mV/decade) Impact on CV/I • Lowered by 15–20% • Lowered by 10–15% • Lowered by 10–15% • Lowered by 10–15% • Constancy or gain compared to Bulk (from MASTAR (from MASTAR (from MASTAR (from MASTAR due to lower µ = supposing effX2) supposing Eeff/2 and supposing Eeff/2 and supposing Rseries 0) gate capacitance S = 75 mV/decade) S = 75 mV/decade) Analog Suitability Not clear Potential for slight Potential for slight Not clear Not clear / Gm Gd advantage improvement improvement compared to Bulk

capacitance between the gate and source/drain detrimentally increase of source/drain resistance usually expected for the affects circuit performance, and its impact becomes more nonoverlap transistor is reduced with decreasing gate significant as the gate length is scaled down. For gate length, thus providing a new optimization paradigm for lengths below ∼20 nm, transistor optimization for peak cir- extremely short devices. cuit performance within leakage current constraints will As illustrated in Table 1(b) and described in the following, likely dictate a structure wherein the gate electrode does not a variety of multiple-gate nonclassical CMOS structures overlap the source or drain to minimize the effect of para- [53]–[92] have been proposed and demonstrated to help man- sitic fringing/overlap capacitance. Due to lengthening of its age electrostatic integrity (i.e., SCEs) in ultra scaled CMOS electrical channel, the nonoverlapped gate structure does structures. In the first of these structures, the N-gate (N > 2) not require ultra-shallow source/drain junctions in order to MOSFET [53]–[59], current flows horizontally (parallel to the provide good control of short-channel effects. Also, the plane of the substrate) between the source and drain along

■ 18 IEEE CIRCUITS & DEVICES MAGAZINE ■ JANUARY/FEBRUARY 2005 Table 1(b). Multiple-gate Nonclassical CMOS Technologies.

Multiple Gate MOSFETs N-Gate (N > 2) Double-gate

Gate Gate W Lg Si Source Drain Gate Gate

n+ n+ TSi Drain Source Drain Si-Substrate Device STI Concept Tied gates (number Tied gates, side-wall Tied gates planar Independently Vertical conduction of channels >2) conduction conduction switched gates, planar conduction Application/Driver HP, LOP, and HP, LOP, and HP, LOP, and LOP and LSTP HP, LOP, and LSTP LSTP CMOS [2] LSTP CMOS [2] LSTP CMOS [2] CMOS [2] CMOS [2] Advantages • Higher drive current • Higher drive current • Higher drive current • Improved short • Potential for 3D •2× thicker fin allowed • Improved • Improved subthreshold channel effect integration subthreshold slope slope • Improved short • Improved short channel channel effect effect Particular Strength • Thicker Si body • Relatively easy • Process compatible with • Electrically (statically • Lithography possible process integration bulk and on bulk wafers or dynamically) independent Lg • Very good control of adjustable threshold silicon film thickness voltage Potential weakness • Limited device width • Fin thickness less • Width limited to <1 µm•Difficult integration • Junction profiling • Corner effect than the gate length • Back-gate capacitance difficult • Fin shape and aspect • Degraded subthreshold • Process integration ratio slope difficult • Parasitic capacitance • Single-gate length Scaling Issues • Sub-lithographic fin • Sub-lithographic fin • Bottom gate larger • Gate alignment • Si vertical channel thickness required thickness required than top gate film thickness Design Challenges • Fin width discretization • Fin width discretization • Modified layout • New device layout • New device layout Gain/Loss in Layout • No difference • No difference • No difference • No difference • Up to 30% gain in compared to Bulk layout density / Advantage in Ion Ioff • Improved by 20–30% • Improved by 20–30% • Improved by 20–30% • Potential for • Improved by 20–30% compared to Bulk (from MASTAR (from MASTAR (from MASTAR improvement (from MASTAR assuming Eeff/2 assuming Eeff/2 assuming Eeff/2 assuming Eeff/2 and and S = 65 V/decade) and S = 65 V/decade) and S = 65 V/decade) S = 65 V/decade) Advantage in CV/I • Lowered by 15–20% • Lowered by 15–20% • Lowered by 15–20% • Potential for • Lowered by 15–20% compared to Bulk (from MASTAR (from MASTAR (from MASTAR improvement (from MASTAR assuming Eeff/2 and assuming Eeff/2 and assuming Eeff/2 and assuming Eeff/2 and S = 65 V/decade) S = 65 V/decade) S = 65 V/decade) S = 65 V/decade) Analog Suitability • Potential for • Potential for • Potential for • Potential for • Potential for / Gm Gd advantage improvement improvement improvement improvement improvement compared to Bulk

vertical channel surfaces, as well as one or more horizontal two isolated gates for low-power and, perhaps, mixed-signal channel surfaces. The large number of gates provides for applications. Four typical double-gate structures are described improved electrostatic control of the channel, so that the Si in the following. First is the tied double-gate, sidewall conduc- body thickness and width can be larger than for the UTB SOI tion structure [60]–[71]. This is a double-gate transistor struc- and double-gate FET structures, respectively. The gate elec- ture in which current flows horizontally (parallel to the plane of trodes are formed from a single deposited gate layer and are the substrate) between the source and drain along opposite ver- defined lithographically. They are tied together electrically tical channel surfaces. The width of the vertical silicon fin is and are self-aligned with each other as well as the narrow (smaller than the channel length) to provide adequate source/drain regions. The principal advantage of the structure control of short-channel effects. A lithographically defined gate resides in the relaxation of the needs on the thinness of the Si straddles the fin, forming self-aligned, electrically connected body or the vertical fin. The challenge is in slightly poorer gate electrodes along the sidewalls of the fin. The principal electrostatic integrity than with double-gate structures, par- advantage with this structure is the planar bulk-like layout and ticularly in the corner regions of the channel. process. In fact, this structure can be implemented on bulk Si Several double-gate MOSFET structures [60]–[90] have been substrates [44]. The major challenge is with fabrication of thin proposed to further improve engineering of the channel elec- fins that need to be a fraction (one third to one half) of the gate trostatics and, in some cases, to provide independent control of length, thus requiring sublithographic techniques.

IEEE CIRCUITS & DEVICES MAGAZINE ■ JANUARY/FEBRUARY 2005 19 ■ 100 1000 StrainUTB SG Met.GUTB DG Q. BallisticMet. Junc. Bulk + + + + + + StrainUTB SG Met.GUTB DG Q. BallisticMet. Junc. HP22 Bulk+ + + + + + LoP22 HP32 m µ m µ 10 LoP32 100 HP45 LoP45

HP65 nA/Ioff, LoP65 Ioff, nA/Ioff, HP90 LoP90 HP100 Low Operation Power High Performance LoP100 ITRS 2003 Requirements ITRS 2003 Requirements 10 1 500 1000 1500 2000 2500 3000 300 500 700 900 1100 1300 1500 Ion, µA/µm Ion, µA/µm (a) (b) 1 Low Standby Power ITRS 2003 Requirements m

µ Strain UTB SGMet.GUTB DG Q. BallisticMet. Junc. Bulk+ + + + + + 0.1 LSTP22 LSTP32

Ioff, nA/Ioff, LSTP45

LSTP65

LSTP90 0.01 LSTP100 100300 500 700 900 1100 1300 1500 Ion, µA/µm (c)

2. Impact of the technology boosters on HP, LOP, and LSTP CMOS roadmaps in terms of Ion : Ioff ratio. MASTAR calculation with translation of technology boosters according to Table 2.

The second structure is the tied double-gate planar FET automatically when switching to a metal-like gate electrode. [72]–[78]. In this structure, current flows horizontally (paral- Another major challenge is in the fabrication process, particu- lel to the plane of the substrate) between the source and drain larly for those structures requiring alignment of the top and along opposite horizontal channel surfaces. The top and bot- bottom gate electrodes. tom gate electrodes are deposited in the same step and are The third structure is the independently switched double- defined lithographically. They may or may not be self-aligned gate (ground-plane) FET [79]–[84]. This structure is similar to each other, and are electrically connected to one another. to the tied double-gate planar FET, except that the top and The source/drain regions are typically self-aligned to the top bottom gate electrodes are electrically isolated to provide for gate electrode. The principal advantages of this structure independent biasing of the two gates. The top gate is typically reside in the potential simplicity of the process (closest to used to switch the transistor on and off, while the bottom gate bulk planar process) and in the compactness of the layout is used for dynamic (or static) Vt adjustment. The principal (same as for bulk planar) as well as in its compatibility with advantage is in the very low Ioff this structure offers. The dis- bulk layout (no need for redesigning libraries). It is also advantage is in rather poor subthreshold behavior and in the important that the channel thickness is determined by epi- relaxed layout. An independently switched double-gate tran- taxy, rather than etching, and, thus, is very well controlled. sistor can also be implemented in a vertical structure by dis- The challenge resides in the doping of the poly in the bottom connecting the gates of the double-gate, sidewall conduction gate (shadowed by the channel), but this problem disappears structure by chemical mechanical polishing [80].

■ 20 IEEE CIRCUITS & DEVICES MAGAZINE ■ JANUARY/FEBRUARY 2005 10 Met. Junc. + 10 Met. Junc. High Performance + HP22 Low Operation Power Cfring X0.5 Cfring X0.5 ITRS 2003 + ITRS 2003 LoP 22 +

Requirements Requirements Q. Ballistic HP32 Q. Ballistic LoP 32 + + LoP 45 UTB DG + UTB DG + LoP 65 HP45 LoP 90 Met.G Met.G , THz LoP 100 + , THz + 1 1 − 1 − HP65 UTB SG UTB SG + + (CV/I) (CV/I) HP90 Strain Strain + + HP100 Bulk Bulk

1 0.1 2000 2005 2010 2015 2020 2000 2005 2010 2015 2020 Year Year (a) (b)

10 Met. Junc. Low Standby Power +

ITRS 2003 Cfring X0.5 + Requirements LstP 22 LstP 32 Q. Ballistic + LstP 45

LstP 65 UTB DG + LstP 90 , THz

1 LstP 100 − 1 Met.G +

(CV/I) UTB SG +

Strain +

Bulk 0.1 2000 2005 2010 2015 2020 Year (c)

3. Impact of the technology boosters on HP, LOP, and LSTP CMOS roadmaps in terms of device intrinsic speed (f=1/(CV/I)). MASTAR calculation with translation of technology boosters according to Table 2.

The fourth structure is the “vertical conduction” transistor AN EMERGING NONCLASSICAL CMOS TECHNOLOGY [85]–[92]. In this case, current flows between the source and ROADMAP SCENARIO drain in the vertical direction (orthogonal to the plane of the As investments relative to the majority of the nonclassical CMOS substrate) along two or more vertical channel surfaces. The structures presented previously may be very large, it would be gate length, hence the channel length, is defined by the thick- quite helpful to assess the gain in performance they promise. ness of the single deposited gate layer, rather than by a litho- This knowledge will likely contribute to the technical justifica- graphic step. The gate electrodes are electrically connected, tion and validity of the strategic R&D decisions that will be and are vertically self-aligned with each other and the diffused required to develop and implement one or more of these source/drain extension regions. The principal advantage with options. For many reasons, this is a very difficult task. First, the this structure is that the channel length is defined by epitaxy properties of new materials may provide some surprises. For one rather than by lithography (possibility of very short and well- example, knowledge of these material properties is often based controlled channels). The disadvantage is this structure on isolated large-volume samples, whereas, in CMOS, applica- requires a challenging process and the layout is different from tions of very thin and low-volume layers are most common. Sec- that for bulk transistors. ond, integration of these materials into a CMOS process may

IEEE CIRCUITS & DEVICES MAGAZINE ■ JANUARY/FEBRUARY 2005 21 ■ documentation (at the end of the Table 2. Technology Performance Boosters. Nonclassical CMOS section of the Technology Performance Boosters Emerging Research Devices Chapter), Translation Translation Translation MASTAR or on request from thomas.skotnicki Nature for Ion for Cgate for Ioff Default Value @st.com or [email protected].] µ × The main equations have been aligned Strained-Si, Ge, etc. eff Bmob NA NA Strained-Si, = Bmob 2 and calibrated between both tools so × = = . UTB Eeff Bfield NA S 75 mV/decade Bfield 0 5 as to ensure very close agreement for × = = = . (Single Gate) and d Bd and Xj Tdep Tsi Bd 0 5 all three PIDS ITRS technology tables κ − − − = Metal Gate/High- Tox el Bgate Tox el Bgate Tox el Bgate Bgate (HP, LOP, and LSTP) [1]. The Gate Dielectric 4A NMOS × = . methodology used in the spreadsheet UTB Eeff Bfield NA S = 65 mV/decade Bfield 0 5 × = = / = (Double Gate) and d Bd and Xj Tdep Tsi 2 Bd 0 model to assemble the PIDS technolo- × ( ) = . gy requirements tables consists in sat- Ballistic Vsat Bball NA NA Bball 1 3 –1 × = . isfying the intrinsic speed (CV/I ) Reduced Gate Parasitic NA Cfringe Bfring NA Bfring 0 5 Capacitance (Fringing improvement rate (17% per year) by and/or Overlap) requiring the necessary values of Ion × = . Metallic S/D Junction Rsd Bjunc NA NA Bjunc 0 5 (transistor “on”-current) but without The boosters used in Table 2 are defined as follows: linking these requirements to a given µ Bmob—the effective mobility ( eff) improvement factor (long channel mobility) used for example to account for strained-Si channel material. technological realization. Nonethe- Bfield— the effective field (Eeff) reduction factor used to account for lower effective field (and thus higher less, the required current I resulting mobility) in UTB devices. from the (CV/I )–1 is matched with Bgate—the reduction in the effective electrical oxide thickness in inversion (Tox el) accounting for cancella- tion of the poly-Si gate depletion effect and thus used to account for a metallic gate. the Ion value resulting from the Bd—the body effect coefficient (d) reduction factor used to account for smaller d in UTB devices. spreadsheet model (very close to MAS- Bball—the saturation velocity (Vsat) effective improvement factor used to account (artificially) for (quasi-) ballistic transport. TAR) in which some parameters are Bfring—the fringing capacitance (Cfring) reduction factor used to account for reduced fringing capacitance. boosted to account for new materials Bjunc—the series resistance (Rsd) reduction factor used for example to account for metallic (Schottky) and novel device structures in an junctions. implicit way (without making any direct link between those two). Such an approach is believed to help the reveal undesirable interactions and place these materials under reliability of predictions. The values of the boosters were mechanical stress or lead to their inter-diffusion, which may agreed between the ITRS PIDS and Emerging Research alter their properties. Third, the physics of new device structures Devices (ERD) working groups, but their nature was left to be is not always completely understood. Lastly, even the validity of established through the more in-depth analysis carried out by numerical simulation results and tools are subject to debate, the ERD group. In contrast, the following analysis is aimed at sometimes leading to large discrepancies, depending on the finding this link and at assessing the magnitude of improve- choice of tools, models, and parameters. Frequently, a new ment of the entries presented in the nonclassical CMOS Table structure or material gives mediocre results from first attempts 1(a) and (b). at integration, thus precluding the possibility of calibration of In order to do so, a table of modifications was established simulation tools and of experimental verification of predictions. titled “Technology Performance Boosters,” given in Table 2. Years of difficult R&D efforts are sometimes necessary to prove These modifications used in the MASTAR equations allow the real value of a technological innovation. rough estimations of the performance gains in terms of Ion, Given the strategic importance of this task, an example of C gate, and Ioff. Therefore, in addition to the precautions due one possible emerging device architecture roadmap scenario is to new materials and structures, one needs to be aware that offered and discussed. Considering the precautions and uncer- the employed methodology cannot give more than a first- tainties previously discussed, qualitative guidelines and relative order estimate. The effect of the technology performance estimations are sought rather than quantitative accuracy. boosters is discussed on electrostatic integrity of the device, –1 The methodology employed for this task consists of using on the Ion–Ioff ratio, and on the (CV/I ) . simple and widely recognized analytical expressions describ- ing the conventional planar MOSFET physics. A set of equa- Sustaining the Electrostatic Integrity of Ultra-Scaled CMOS tions (MASTAR) [93]–[94] served as a backup to an Excel The electrostatic integrity (EI) of a device reflects its resis- spreadsheet used for the development of the logic technology tance to parasitic two-dimensional (2-D) effects such as SCE requirements tables in the “Process Integration, Devices and and drain-induced barrier lowering (DIBL). SCE is defined as Structures” (PIDS) chapter of the 2003 ITRS [1]. [The MAS- the difference in threshold voltage between long-channel and TAR executable code file along with the User’s Guide are short-channel FETs measured using small Vds. DIBL is defined available as part of the ITRS 2003 background documentation as the difference in Vt measured for short-channel FETs using via the metalink located in the text of the ITRS 2003 online a small and a nominal value for Vds.

■ 22 IEEE CIRCUITS & DEVICES MAGAZINE ■ JANUARY/FEBRUARY 2005 A good EI means a one-dimensional (1-D) potential distri- for a given technology performance booster, the following bution in a device (as in the long-channel case), whereas poor chronological sequence is suggested as a plausible scenario for EI means a 2-D potential distribution that results in the 2-D their sequential introduction: parasitic effects. A simple relationship between SCE and DIBL ✦ strained-Si channels on one hand and EI on the other has been established, as fol- ✦ UTB single-gate FETs lows [94]–[95]: ✦ metallic-gate electrode (together with high-κ dielectric) ✦ UTB double-gate FETs SCE ≈ 2.0 × d × EI ✦ ballistic or quasi-ballistic transport ✦ DIBL ≈ 2.5 × Vds × EI, reduced fringing (and/or overlap) capacitance ✦ metallic source/drain junction. where d is the source-to-channel junction built-in voltage, Figure 2 shows the evolution of the Ioff –Ion roadmaps Vds is the drain-to-source bias, and EI is given by: (HP, LOP, and LSTP) [1] due to introduction of the technology performance boosters as defined in Table 2, according to the aforementioned sequence and in a cumulative way. The x 2 T T EI ≡ 1 + j ox el dep . 2 planar bulk device is basically sufficient for satisfying the L Lel Lel el CMOS (Ion–Ioff) specifications up to 90-nm node for HP and up to 65-nm node for LOP and LSTP. Beyond these nodes, the In this expression, x j denotes the junction extension depth, introduction of technology performance boosters becomes Lel denotes the electrical channel length (junction-to-junction mandatory for meeting the specifications. Exceeding the spec- distance), Tox el denotes the effective electrical oxide thickness ifications appears possible if all boosters considered are coin- in inversion (equal to the sum of the equivalent oxide thick- tegrated. It is also to be noted that HP products use the ness of the gate dielectric, the poly-Si gate depletion depth, greatest number of performance boosters (all except the and the so-called “dark space”), and Tdep denotes the depletion metallic S/D junctions) to address the entire HP roadmap, depth in the channel. (“Dark space” is the distance the inver- whereas the LSTP roadmap can be satisfied with UTB single sion charge layer peak is set back in the channel from the metallic gate devices. SiO2/Si interface due to quantization of the energy levels in This analysis assumes that the Ioff current is determined by the channel quantum well.) the maximum allowed source/drain subthreshold leakage cur- The strength of nonclassical CMOS structures, in particular rent. The maximum gate leakage current is related to the max- of UTB devices, is clearly shown by this expression when apply- imum source/drain leakage current at threshold. For this to be ing the translations of parameters relevant to UTB devices true, high-κ gate dielectrics need to be introduced in 2006 for (refer to Table 2). Replacing x j and Tdep by TSi (UTB single LOP and LSTP and in 2007 for high-performance logic [1]. gate) or TSi/2 (UTB double gate) permits a considerable reduc- −1 tion in the x j/Lel and Tdep/Lel ratios, with the condition that Boosting the Intrinsic Speed (CV/I ) silicon films of TSi x j, Tdep are available. The key question Certain performance boosters may lead to an increase in Ion at therefore is the extent to which body or channel thickness in the same rate as an increase in Cgate, thus producing a small advanced MOSFETs must be thinned to sustain good EI. or negligible effect on CV/I (for example, see metallic gate in Figure 1 compares the EI between bulk planar and double- Table 2). Others, such as reduced fringing or overlap capaci- gate devices throughout the span of nodes for the 2003 ITRS. It tance, may reduce Cgate without altering Ion. The evolution of –1 is encouraging to see that the TSi scaling, although very aggres- the intrinsic device speed (CV/I ) as impacted by the perfor- sive (4- and 5-nm Si films are required at the end of the mance boosters may thus be somewhat different than the evo- roadmap for HP, and LOP/LSTP, respectively), has the potential lution of the Ion–Ioff. Figure 3 shows rough estimates for the to scale CMOS to the end of the roadmap with the SCE and evolution of the intrinsic device speed for the consecutive DIBL at the same levels as the 90-nm node technologies. [EI ≤ CMOS nodes. Up to the 65-nm node the optimized scaling 10% (meaning DIBL of < 25% Vds) is assumed as the acceptable strategy (basically equal to the ITRS 2001) is sufficient for the range as represented as a yellow region in Figure 1.] Note that LOP and LSTP products to achieve an annual performance the EI of planar bulk or classical devices is outside the allowed increase of 17%-per-year. HP products, again, require the zone at the 100-nm node for HP, near the 65-nm node for LOP, most aggressive use of the performance boosters, such as and between the 90- and 65-nm nodes for LSTP products. requiring strained-Si channels beginning at the 65-nm node. Beyond this node, a sequential introduction of performance Sustaining the Ion – Ioff Ratio boosters is mandatory for maintaining the 17% per year per- The technological maturity of some performance boosters is formance improvement rate. At the 22 nm-node, fringing higher than that of others. For example, strained-silicon chan- (and/or overlap) capacitance needs to be reduced to meet the nel devices have already been announced as being incorporat- speed requirements of HP and LOP products. However, coin- ed into the CMOS 65-nm node, whereas the metallic tegrating the boosters up to and including the quasiballistic source/drain junction concept is in the research phase. With- transport, according to the sequence presented in Table 2, can out attempting precise predictions on the introduction node satisfy the requirements for LSTP. It is encouraging to see

IEEE CIRCUITS & DEVICES MAGAZINE ■ JANUARY/FEBRUARY 2005 23 ■ that the metallic junction booster is not employed within the REFERENCES current roadmap, thus leaving a margin for its prolongation [1] Semiconductor Industry Association (SIA), International Roadmap for Semiconductors, 2003 ed., Austin, TX., Int. SEMATECH, 2003. [Online]. beyond the 22-nm node without any loss in the performance Available: http: //public.itrs.net improvement rate. [2] C. Chiu, “A sub-400 degree C Germanium MOSFET technology with high-κ dielectric and metal gate.” in Proc. IEDM’02, pp. 437–440. SUMMARY AND CONCLUSIONS [3] H. Shang, “High mobility p-channel Germanium MOSFETs with a thin Scaling CMOS to and beyond the 22-nm technology node Ge xxynitride gate dielectric,” presented at IEDM, San Francisco, 2002. (requiring a physical gate length of 9-nm or less) will probably [4] C.W. Leitz, “Hole mobility enhancements in strained Si/Si/sub 1- require the introduction of several new material and struc- y/Ge/sub y/ p-type metal-oxide-semiconductor field-effect transistors tural changes to the MOSFET to sustain performance increas- grown on relaxed Si/sub 1-x/Ge/sub x/ (x

■ 24 IEEE CIRCUITS & DEVICES MAGAZINE ■ JANUARY/FEBRUARY 2005 nels,” IEEE Trans. Electron Devices, vol. 50, no. 5, pp. 1328–1333, May [40] J. Pretet, S. Monfray, S. Cristoloveanu, and T. Skotnicki, “Silicon-on- 2003. nothing MOSFETs: performance, short-channel effects, and backgate coupling,” IEEE Trans. Electron Devices, vol. 51, no. 2, [21] B. Doris, “Extreme scaling with ultra-thin Si channel MOSFETs,” in pp. 240–245, Feb. 2004. IEDM Tech. Dig., San Francisco, IBM, Dec. 8–11, 2002, pp. 267–270. [41] J. Kedzierski, “Complementary silicide source/drain thin-body [22] R. Chau, “A 50 nm depleted-substrate CMOS transistor (DST),” in MOSFETs for the 20 nm gate length regime,” presented at IEDM, San IEDM Tech. Dig., Washington, Intel, Dec. 2–5, 2001, pp. 621–624. Francisco, Dec. 2002. [23] H. VanMeer, “70 nm fully-depleted SOI CMOS using a new fabrication [42] R. Rishton, “New complementary metal-oxide semiconductor scheme: The spacer/replacer scheme, in VLSI Symp., Honolulu, IMEC, technology with self-aligned Schottky source/drain and low-resistance T- June 11–13, 2002, pp. 170–171. gates,” J. Vac. Sci. Technol., p. 2795–2798, 1997. [24] T. Schultz, “Impact of technology parameters on inverter delay of [43] J.P. Snyder, “Experimental investigation of a PtSi source and drain UTB-SOI CMOS,” in Proc. SOI Conf., Williamsburg, Infineon, Oct. 7–10, field emission transistor,” Appl. Phys. Lett., vol. 67, no. 10, 2002, pp. 176–178. Sept. 4, 1995. [25] A. Vandooren, “Ultra-thin body fully-depleted SOI devices with metal [44] T. Ichimori and N. Hirashita, “Fully-depleted SOI CMOSFETs with the gate (TaSiN) gate, high k (HfO2) dielectric and elevated source/drain fully-silicided source/drain structure,” IEEE Trans. Electron Devices, extensions,” in Proc. SOI Conf., Williamsburg, Motorola, Oct. 7–10, vol. 49, no. 12, pp. 2296–2300, Dec. 2002. 2002, pp. 205–206. [45] D. Connelly, C. Faulkner, and D.E. Grupp, “Performance advantage of [26] B. Yu, “Scaling towards 35 nm gate length CMOS,” in Proc. VSLI Schottky source/drain in ultrathin-body silicon-on-insulator and dual- Symp., Kyoto, AMD, June 12–14, 2001, pp. 9–10. gate CMOS,” IEEE Trans. Electron Devices, vol. 50, no. 5, [27] Y.K. Choi, “Ultra-thin body PMOSFETs with selectively deposited Ge pp. 1340–1345, May 2003. source/drain,” in Proc. VSLI symp., Kyoto, UCB, June 12–14, 2001, pp. [46] M. Fritze, C.L. Chen, S. Calawa, D. Yost, B. Wheeler, P. Wyatt, 19–20. C.L. Keast, J. Snyder, and J. Larson, “High-speed Schottky-barrier = [28] K. Uchida, “Experimental study on carrier transport mechanism in pMOSFET with fT 280 GHz,” IEEE Electron Device Lett., vol. 25, ultrathin-body SOI n and p MOSFETs with SOI thickness less than no. 4, pp. 220–222, Apr. 2004. 5 nm,” IEDM Tech. Dig., San Francisco, Toshiba, Dec. 8–11, 2002, pp. [47] S. Zhu, H.Y. Yu, S.J. Whang, J.H. Chen, C. Shen, C. Zhu, S.J. Lee, 47–50. M.F. Li, D.S.H. Chan, W.J. Yoo, A. Du, C.H. Tung, J. Singh, A. Chin, and [29] K. Ishii, E. Suzuki, S. Kanemaru, T. Maeda, K. Nagai, and T. Sekigawa, D.L. Kwong, “Schottky-barrier S/D MOSFETs with high-k gate “Suppressed threshold voltage roll-off characteristic of 40 nm gate dielectrics and metal-gate electrode,” IEEE Electron Device Lett., length ultrathin SOI MOSFET,” Electronics Lett., vol. 34, no. 21, vol. 25, no. 5, pp. 268–270, May 2004. pp. 2069–2070, Oct. 1998. [48] B.-Y. Tsui and C.-P. Lin, “A novel 25-nm modified Schottky-barrier [30] E. Suzuki, K. Ishii, S. Kanemaru, T. Maeda, T. Tsutsumi, T. Sekigawa, FinFET with high performance,” IEEE Electron Device Lett., vol. 25, no. K. Nagai, and H. Hiroshima, “Highly suppressed short-channel effects in 6, pp. 430–432, June 2004. ultrathin SOI n-MOSFETs,” IEEE Trans. Electron Devices, [49] F. Boeuf, “16 nm planar NMOSFET manufacturable within state-of- vol. 47, no. 2, pp. 354–359, Feb. 2000. the-art CMOS process thanks to specific design and optimization,” in [31] Y.-K. Choi, K. Asano, N. Lindert, V. Subramanian, T.-J. King, J. Bokor, Proc. IEDM, Washington, D.C., Dec. 2001, pp. 637–640. and C. Hu, “Ultrathin-body SOI MOSFET for deep-sub-tenth micron [50] H. Lee, “DC and ac characteristics of sub-50-nm MOSFETs with era,” IEEE Electron Device Lett., vol. 21, no. 5, pp. 254–255, May 2000. source/drain-to-gate nonoverlapped structure,” IEEE Trans. Nanotech- [32] M. Jurczak, “SON (Silicon On Nothing)—A new device architecture nology, vol. 1, no. 4, pp. 219–225, Dec. 2002. for the ULSI era,” in Proc. Symp. VLSI Technology, FranceTelecomR&D, [51] H. Lee, J. Lee, and H. Shin, “DC and ac characteristics of sub-50-nm June 1999, pp. 29–30. MOSFETs with source/drain-to-gate non-overlapped structure,” IEEE [33] T. Skotnicki, “Heavily doped and extremely shallow junctions on insu- Trans. Nanotechnology, vol. 1, no. 4, pp. 219–225, Dec. 2002. lator—by SONCTION (SilicON Cut-off junction) process,” in IEDM [52] D. Connelly, C. Faulkner, and D.E. Grupp, “Optimizing Schottky S/D Tech. Dig., STMicroelectronics, Dec. 1999, pp. 513–516. offset for 25-nm dual-gate CMOS performance,” IEEE Electron Device [34] M. Jurczak, “SON (silicon on nothing) – An innovative process for Lett., vol. 24, no. 6, pp. 411–413, June 2003. advanced CMOS,” IEEE Trans. Electron Devices, p. 2179, FranceTele- [53] R. Chau, “Advanced depleted substrate transistor: Single-gate, comR&D, Nov. 2000. double-gate, and tri-gate,” Solid State Device Meeting, pp. 68–69, 2002. [35] S. Monfray, “First 80 nm SON (silicon-on-nothing) MOSFETs with [54] Fu-Liang Yang, “25 nm CMOS Omega FETs,” in Proc. IEDM 2002 perfect morphology and high electrical performance,”in IEDM Tech. TSMC, Dec. 2002, p. 255. Dig., STMicroelectronics, Dec. 2001, pp. 645–648. [55] J. Colinge, “Silicon-on-insolator gate-all-around device,” in Proc. [36] S. Monfray, “SON (silicon-on-nothing) P-MOSFETs with totally sili- IEDM 1990. IEDM 90, IMEC, Dec. 1990, p. 595. cided (CoSi2) polysilicon on 5 nm-thick Si-films: The simplest way to integration of metal gates on thin FD channels,”in IEDM Tech. Dig., [56] B. Doyle, “Tri-gate fully-depleted CMOS transistors fabrication, design STMicroelectronics, Dec. 2002, p. 263. and layout,” in Proc. VLSI 2003, INTEL, June, 2003, p. 133. [37] S. Monfray, “Highly-performant 38 nm SON (silicon-on-nothing) [57] Z. Krivokapic, “High performance 45 nm CMOS technology with P-MOSFETs with 9 nm-thick channels,” Proc. IEEE SOI Conf., STMicro- 20 nm multi-gate devices,” in Proc. SSDM ‘03, AMD, Sept. 2003, p. 760. electronics, Oct. 2002, p. 20. [58] B.S. Doyle, S. Datta, M. Doczy, S. Hareland, B. Jin, J. Kavalieros, [38] T. Sato, “SON (silicon on nothing) MOSFET using ESS (empty space T. Linton, A. Murthy, R. Rios, and R. Chau, “High performance fully- in silicon) technique for SoC applications,” in IEDM Tech. Dig., depleted tri-gate CMOS transistors,” IEEE Electron Device Lett., Toshiba, Dec. 2001, p. 809. vol. 24, no. 4, pp. 263–265, Apr. 2003. [39] M. Jurczak, T. Skotnicki, M. Paoli, B. Tormen, J. Martins, [59] W.-J. Cho, C.-G. Ahn, K. Im, J.-H. Yang, J. Oh, I.-B. Baek, and S. Lee, J.L. Regolini, D. Dutartre, P. Ribot, D. Lenoble, R. Pantel, and S. Monfray, “Fabrication of 50-nm gate SOI n-MOSFETs using novel plasma-doping “Silicon-on-nothing (SON)-an innovative process for advanced CMOS,” technique,” IEEE Electron Device Lett., vol. 25, no. 6, IEEE Trans. Electron Devices, vol. 47, no. 11, pp. 2179–2187, Nov. 2000. pp. 366–368, June 2004.

IEEE CIRCUITS & DEVICES MAGAZINE ■ JANUARY/FEBRUARY 2005 25 ■ [60] Y.-K. Choi, “FinFET process refinements for improved mobility and [80] Y.X. Liu, “Flexible threshold voltage FinFETs with independent dou- gate work function engineering,” in Proc. IEDM, UC California (Berke- ble gates and an ideal rectangular cross-section Si-Fin channel,” in ley), Dec. 2002, p. 259. IEDM Tech. Dig., Washington, DC, Dec. 8–10, 2003, pp. 986–988. [61] J. Kedzierski, “Metal-gate FinFET and fully-depleted SOI devices using [81] K.W. Guarini, “Triple-self-aligned, planar double-gate MOSFETs: total gate silicidation,” in Proc. IEDM, IBM, Dec. 2002, p. 247. Devices and circuits,” in Proc. IEDM 2001, IBM, Dec. 2001, p. 425. [62] B. Yu, “FinFET scaling to 10 nm gate length,” in Proc. IEDM Strategic [82] D.M. Fried, J.S. Duster, and K.T. Kornegay, “Improved independent Technology, Advanced Micro Devices, Dec. 2002, p. 251. gate N-type FinFET fabrication and characterization,” IEEE Electron Device Lett., vol. 24, no. 9, pp. 592–594, Sept. 2003. [63] T. Park, “Fabrication of body-tied FinFETS (Omega MOSFETS) using bulk Si wafers,” in Proc. VLSI, SAMSUNG, June 2003, p. 135. [83] Y. Liu, M. Masahara, K. Ishii, T. Sekigawa, H. Takashima, H. Yamauchi, and E. Suzuki, “A highly threshold voltage-controllable 4T [64] D. Hisamoto, T. Kaga, Y. Kawamoto, and E. Takeda, “A fully depleted FinFET with an 8.5-nm-thick Si-Fin channel,” IEEE Electron Device lean-channel transistor (DELTA)-a novel vertical ultrathin SOI MOS- Lett., vol. 25, no. 7, pp. 510–512, July 2004. FET,” IEEE Electron Device Lett., vol. 11, no. 1, pp. 36–38, Jan. 1990. [84] D.M. Fried, J.S. Duster, and K.T. Kornegay, “High-performance p-type [65] D. Hisamoto, T. Kaga, and E. Takeda, “Impact of the vertical SOI independent-gate FinFETs,” IEEE Electron Device Lett., vol. 25, ‘DELTA’ structure on planar device technology,” IEEE Trans. Electron no. 4, pp. 199–201, Apr. 2004. Devices, vol. 38, no. 6, pp. 1419–1424, June 1991. [85] J. Hergentother, “The vertical replacement-gate (VRG) MOSFET: A [66] D. Hisamoto, W.-C. Lee, J. Kedzierski, H. Takeuchi, K. Asano, C. Kuo, 50-nm vertical MOSFET with lithography-independent gate length,” E. Anderson, T.-J. King, J. Bokor, and C. Hu, “FinFET: A self-aligned IEDM 1999, Dec. 1999, p .3.1.1, AT&T Bell Labs, p. 75. double-gate MOSFET scalable to 20 nm,” IEEE Trans. Electron Devices, vol. 47, no. 12, pp. 2320–2325, Dec. 2000. [86] J.M. Hergenrother, “50 nm Vertical Replacement-gate (VRG) nMOS- FETs with ALD HfO2 and AL2O3 Gate Dielectrics,” in Proc. IEDM 2001 [67] X. Huang, W.-C. Lee, C. Kuo, D. Hisamoto, L. Chang, J. Kedzierski, Dec. 2001, AT&T Bell Labs, pp. 51–54. E. Anderson, H. Takeuchi, Y.-K. Choi, K. Asano, V. Subramanian, T.-J. King, J. Bokor, and C. Hu, “Sub-50 nm P-channel FinFET,” IEEE [87] E. Josse, “High performance 40 nm vertical MOSFET within a conven- Trans. Electron Devices, vol. 48, no. 5, pp. 880–886, May 2001. tional CMOS process flow,” in Proc. VLSI 2001, ST Microelectronics, June 2001, pp. 55–56. [68] N. Lindert, L. Chang, Y.-K. Choi, E.H. Anderson, W.-C. Lee, T.-J. King, J. Bokor, and C. Hu, “Sub-60-nm quasi-planar FinFETs fabricated using [88] P. Verheyen, “A 50 nm vertical Si/sub 0.70/Ge/sub 0.30//Si/sub a simplified process,” IEEE Electron Device Lett., vol. 22, no. 10, 0.85/Ge/sub 0.15/ pMOSFET with an oxide/nitride gate dielectric, Conf.: pp. 487–489, Oct. 2001. 2001 International Symp. on VLSI Technology, Systems, and Applica- tions. Proceedings of Technical Papers (Cat. No.01TH8517), IMEC, Leu- [69] Y.-K. Choi, T.-J. King, and C. Hu, “Nanoscale CMOS spacer FinFET ven, Belgium, pp. 15–18, B. Goebel, Fully Depleted Surrounding Gate for the terabit era,” IEEE Electron Device Lett., vol. 23, no. 1, Transistor (SGT) for 70 nm DRAM and Beyond, in Proc. IEDM 2002, pp. 25–27, Jan. 2002. Infineon, Dec. 2002, p. 275. [70] G. Pei, J. Kedzierski, P. Oldiges, M. Ieong, and E.C.-C. Kan, “FinFET [89] B. Goebel, “Fully Depleted Surrounding Gate Transistor (SGT) for design considerations based on 3-D simulation and analytical modeling,” 70 nm DRAM and Beyond,” in Proc. IEDM 2002, Infineon, Dec. 2002, p. IEEE Trans. Electron Devices, vol. 49, no. 8, pp. 1411–1419, Aug. 2002. 275. [71] J. Kedzierski, J. Ieong, E. Nowak, T.S. Kanarsky, Y. Zhang, R. Roy, [90] M. Masahara, “15-nm-thick Si channel wall vertical double-gate MOS- D. Boyd, D. Fried, and H.-S.P. Wong, “Extension and source/drain design FET,” in Proc. IEDM 2002, AIST, Dec. 2002, p. 949. for high-performance FinFET devices,” IEEE Trans. Electron Devices, vol. 50, no. 4, pp. 952–958, Apr. 2003. [91] A. Nitayama, H. Takato, N. Okabe, K. Sunouchi, K. Hieda, F. Horiguchi, and F. Masuoka, “Multi-pillar surrounding gate transistor [72] S. Monfray, “50 nm—Gate All Around (GAA)—Silicon On Nothing (M-SGT) for compact and high-speed circuits,” IEEE Trans. Electron (SON)—Devices: A simple way to co-integration of GAA transistors with Devices, vol. 38, no. 3, pp. 579–583, March 1991. bulk MOSFET process,” in Proc. VLSI, STMicroelectronics, June 2002, p. 108. [92] S.-H. Oh, D. Monroe, and J.M. Hergenrother, “Analytic description of short-channel effects in fully-depleted double-gate and cylindrical, sur- [73] Lee, “A Manufacturable Multiple Gate Oxynitride Thickness Technolo- rounding-gate MOSFETs,” IEEE Electron Device Lett., vol. 21, no. 9, pp. gy for System on a Chip,” in Proc. IEDM (12/1999), UC Texas, Dec. 1999, 445–447, Sept. 2000. p. 71. [93] T. Skotnicki and F. Boeuf, “CMOS technology roadmap—Approaching [74] S. Harrison et al., “Highly performant double gate MOSFET realized up-hill specials,” in Ninth International Symp. Silicon Materials Science with SON process,” in Proc. IEDM Tech. Dig., Washington, DC, Dec. Technology, Process Integration, ECS 2002. 8–10, 2003, pp. 449–452. [94] T. Skotnicki and F. Boeuf, “Optimal scaling methodologies and tran- [75] H.-S. P. Wong, “Self aligned (top and bottom) double-gate MOSFET sistor performance,” chapter in High-K Gate Dielectric Materials for with a 25 nm thick silicon channel,” in Proc. IEDM 1997, IBM, Dec. VLSI MOSFET Applications, H. Huff and D. Gilmer, Eds. New York: 1997, p. 427. Springer Verlag, in press. [76] G. Neudeck, “Novel silicon epitaxy for advanced MOSFET devices,” in [95] T. Skotnicki, in Proc. ESSDERC 2000, invited talk, Cork, Ireland, Proc. IEDM 2000, Purdue Univ., Dec. 2000, p. 169. Sept. 2000, pp. 19–33. [77] S.-M. Kim, “A novel MBC (Multi-bridge-channel) MOSFET: Fab- rication technologies and characteristics,” in Proc. Si-Nanoworkshop, Thomas Skotnicki and Frederic Boeuf are with ST Microelec- 2003 SAMSUNG, p. 18. tronics in Crolles, France. James A. Hutchby is with Semicon- [78] F. Balestra, S. Cristoloveanu, M. Benachir, J. Brini, and T. Elewa, ductor Research Corp. in Durham, North Carolina. Tsu-Jae “Double-gate silicon-on-insulator transistor with volume-inversion: A new device with greatly enhanced performance,” IEEE Electron Device King is with the University of California in Berkeley, Califor- Lett., vol. EDL-8, pp. 410–412, Sept. 1987. nia. H.-S. Philip Wong is with Stanford University in Palo Alto, [79] I. Yang, IEEE Trans. Electron Devices, p. 822, 1997. California. E-mail: [email protected].

■ 26 IEEE CIRCUITS & DEVICES MAGAZINE ■ JANUARY/FEBRUARY 2005