TID and SEE Evaluation of EEE Parts for COROT DPU and STEREO SEPT/IMPACT

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TID and SEE evaluation of EEE parts for COROT DPU and STEREO SEPT/IMPACT

1. STEREO SEPT/IMPACT: overview, SEPT instrument

2. TID results: TLC2262, LMC6062, MAX478, ADP3300, ADG704, ADG713, PDFE

3. SEE results: MAX892, ADG704, ADG713, TLC2262, SEPT EM

4. COROT DPU: overview, MDPU

5. SEE results LP2953A

Bengt Johlander ESA/ESTEC, SCI-AP [email protected] Science Payload and Advanced Concepts Office

B. Johlander, 11-05-2004 Page 1 STEREO – Solar Terrestrial Relations Observatory

NASA/GSFC program John Hopkins APL prime contractor Twin 610 kg S/C Launch Feb. 2006 Minimum two years operations Approx. 400 MEuro program

First 3-D stereoscopic images to study CME

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B. Johlander, 11-05-2004 Page 2 SEPT- Solar Electron and Proton Telescope

Part of In-Situ instrumentation suite (IMPACT) Scientific collaboration Univ. of Kiel (D) and Research and Scientific Support Dept. (ESA) Measures Electrons 60 – 400 keV Measures Protons 40 – 7000 keV Complete instrument: 550 g Electronics: 90 g (highly integrated, several up- screened commercial plastic parts)

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B. Johlander, 11-05-2004 Page 3 TID testing (1)

National Semi LMC6062 Micro power Dual OP-AMP, rail – rail output, low offset and low input bias current Output stage fails around 8.5 kRad but recovers during anneal Large spread in offset voltage, also during anneal Not selected. Vos [mV] Science Payload and Advanced Concepts Office

B. Johlander, 11-05-2004 Page 4 TID testing (2)

Maxim MAX478 Micro-power Dual OP- AMP, rail – rail output, low offset and low input bias current Two parts not functional at 8-13 kRad Ib outside limit at 2.2 kRad Large spread Not selected.

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B. Johlander, 11-05-2004 Page 5 TID testing (3)

Texas Instruments TLC2262 Micro-power Dual OP-AMP, [mV] rail – rail output, low offset and Vos low input bias current High input impedance (Ib) OK at 15 kRad Offset voltage recovers after annealing, small spread Selected for SEPT

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B. Johlander, 11-05-2004 Page 6 TID testing (4) Analog Devices ADG704 CMOS, 2.5 Ohm, 4 channel analog multiplexer Large increase supply current but acceptable Leakage current increase but acceptable Small spread. Selected.

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B. Johlander, 11-05-2004 Page 7 TID testing (5)

Analog Devices ADG713 CMOS, 2.5 Ohms, Quad analog SPST switch Large increase in supply current but acceptable On resistance stable Small spread Selected.

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B. Johlander, 11-05-2004 Page 8 TID testing (6)

Analog Devices ADP3300 50 mA low drop-out, 5V linear regulator Drop-out voltage for small loads most affected, Drop-Out Voltage at 10 mA as a function of Dose, considered acceptable Gamma 5.2 rad(water)/min (ADP3300) Accuracy and ground current OK to >20 kRad. Selected.

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B. Johlander, 11-05-2004 Page 9 TID testing (7) Particle Detector Front End ASIC

(PDFE) v2.1 BO2 TID test preliminary results

0.25 Mixed CMOS ASIC, Dual charge annealing at RT for 72 hours Part 1 (stopped at 20.3 krad) + 72 hours annealing Initial consumption (mA) Increase at EOTest (mA) 0.24 I_Dig 0.8 59.3 annealing at RT for 8 hours amplifier/shaper, programmable I_Ana 8.4 4 discriminators and 8-bit ADC 0.23 I_ADC 4.2 9.4 0.22 STEREO 5 year extended Current consumption for analog and 0.21 mission 0.2 digital supply increase from 8 kRad, annealing at RT during 14 hours 0.19 Part2 27.4 rad (H2O)/min Test board current (A) functional at 24 kRad. Part1 27.4 rad(H2O)/min 0.18 Part1 (after 2.4 krad) Part 4 20.3 rad (H2O)/min 0.17 Iso-chronal Annealing test give part 5 3.9 rad (H2O)/min Part1 annealing 0.16 Computer problem activation energy of 0.32-0.51 eV. Part 6 0.7 rad (H2O)/min 0.15 0 2000 4000 6000 8000 10000 12000 14000 16000 18000 20000 22000 24000 26000 Estimated max allowed supply Total dose (rad H2O) current for in orbit dose rate is reached around 20 kRad.

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B. Johlander, 11-05-2004 Page 10 SEPT Single Events Effects Mitigation Strategy

PDFE ASIC known to be SEL sensitive (GCR) => on-board SEL protection necessary All digital control functions selected (FPGA, SOI memory…) and designed (e.g. SET filtering) to be SEE insensitive. Analog parts analysed for in-circuit SEE effects and classified Complete instrument re-configuration after each measurement integration (1 min) Verification of critical SEE effects for parts and SEL mitigation strategy of complete instrument.

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B. Johlander, 11-05-2004 Page 11 SET effects in SEL protection circuitry Maxim MAX 892 High side, low resistance, P- channel switch with adjustable current limit Critical SET effects: false indication of current overload and/or output voltage drop-out Test results: SET on error output depends on load, < 65 us. Probably SET in current-limit amplifier. No SET effect on P-channel switch (no output drop-out).

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B. Johlander, 11-05-2004 Page 12 MAX892, Output voltage, MAX 892 SET test results LET=57.8 MeV/mg/cm2, 5 mA load 7

Maxim MAX892 Current-Limited P-Channel Switch 4 - Heavy Ion SET Results (UCL0303). 3 Output [V] 2 1.0E-04 1

1.0E-05 0 /bit) 2 -200 -100 0 100 200 300 400 us

1.0E-06

s/n # 01- I = 44 mA s/n # 06- I = 44 mA MAX892, Fault output, 1.0E-07 Test Level

Cross Section - (cm s/n # 01- I = 5.5 mA LET=57.8 MeV/mg/cm2, 5 mA load s/n # 06- I = 5.5 mA

1.0E-08 6 0 10203040506070 5 2 Ion LET - MeV/(mg/cm ) 4

1 Fault output [V} 0 -200 -100 0 100 200 300 400 -1

-2 Science Payload and Advanced Concepts Office us B. Johlander, 11-05-2004 Page 13 SEL testing Analog integrated parts

Analog IC’s used for house keeping and calibration pulser, not critical for SET, only SEL. Texas TLC2262 Dual OP-amp: No Latch-up for LET=68 MeV/(mg/cm2). Analog Devices ADP3300 (linear voltage regulator): No Latch-up for LET=58 MeV/(mg/cm2). Analog Devices ADG704 (4-channel MUX) and ADG713 (Quad SPST switch) Latch-up sensitive.

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B. Johlander, 11-05-2004 Page 14 Analog Devices ADG704, 4-channel Analog MUX, SEL results ADG704 SEL Results (UCL0303). and ADG713 1.0E-04

1.0E-05 /bit) 2

1.0E-06 Estimated maximum event Test Level, No SEL 1.0E-07

rate (SEL): Cross Section - (cm

ADG704: < 0.7 SEL/Year 1.0E-08 0 5 10 15 20 25 30 ADG713: < 0.9 SEL/Year Ion LET - MeV/(mg/cm 2)

Parts protected by Analog Devices ADG713, Quad SPST switch, MAX892. SEL Results (UCL0303).

1.0E-04

1.0E-05 /bit) 2

1.0E-06 Test Level, No SEL 1.0E-07 Cross Section - (cm

1.0E-08 0Science 5 Payload 10 and 15 Advanced 20 Concepts 25 Office 30 2 Ion LET - MeV/(mg/cm )

B. Johlander, 11-05-2004 Page 15 PDFE SEL protection verification

Cf-252 testing PDFE SEE tests (Californium 252) performed on complete 4 instrument breadboard.

4 configuration errors No performance 3 degradation.

9 digital latchup A SEL Digital part: 4.0E-6 2 D SEL

cm2/device SEE type SEU

94 analog latchup Analog part: 4.2E-5 1 cm2/device SEU Cross Section - 0 Digital/Analog part: 0:00:00 4:48:00 9:36:00 14:24:00 19:12:00 24:00:00 28:48:00 2 1.8E-6 cm /device Time (HH:MM:SS)

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B. Johlander, 11-05-2004 Page 16 COROT – Convection, Rotation and Planetary Transits

CNES program with ESA support Proteus mini-satellite (670 kg), polar orbit The detection and the study of stars vibrations (stellar seismology). The search for extrasolar planets and more particularly the telluric planets. Launch June 2006

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B. Johlander, 11-05-2004 Page 17 COROT Data Processing Unit

Based on Mosaic-20 (20 MHz 21020 DSP). EADS/Astrium responsible for electronics design and electronics assembly. SCI-A overall responsible, components, mechanics and environmental tests. Participation to COROT as Scientific collaboration with Research and Scientific Support Dept (ESA). 16 Mbit R/H SRAM (Honeywell HX 6228), 320 Mbit rad tolerant SRAM (Samsung 4008V1C), 32 Mbit EEPROM (Hitachi HN58C1001) Telecommand I/F: MIL-STD-1553, Data I/F: Spacewire 2.2 kg, typical 7 W. Two hot redundant units on COROT.

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B. Johlander, 11-05-2004 Page 18 National Semi LP2953A voltage regulator

LP2953A: adjustable, micro-power, low drop-out linear regulator Used to supply Actel RT54SX32S core, 2.5V Critical SET effect: output voltage drop-out or over voltage spike.

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B. Johlander, 11-05-2004 Page 19 LP2953A SET test setup

3.3V input voltage, 2.5 V output 40 mA load Monitor input voltage, output voltage and Error output.

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B. Johlander, 11-05-2004 Page 20 LP2953A initial SET test results

Cf-252 pre-testing showed small (<50 mV) output spikes

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B. Johlander, 11-05-2004 Page 21 LP2953A LLN SET initial results

Out of two tested samples, one sample displayed large output voltage drop-outs with a strange cross section….

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B. Johlander, 11-05-2004 Page 22 LP2953A LLN SET re-test Input voltage Output voltage

Three additional samples were tested for SET, no large drop-outs observed for 1E6 particles/cm2. Error output When triggering on Error output, <50 mV output spikes were observed.

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B. Johlander, 11-05-2004 Page 23 Electrical test LP2953A

The single sample LP2953A that was found to be sensitive to large output voltage drop-outs was also found to be sensitive to light illumination (not the case for other samples). Electrical parametric testing showed the same sample internal bandgap reference was defective that is turned caused the regulation loop to switch off the output when hit by ion. No physical evidence for damage has been found but damage from de-capsulation suspected cause. Remaining flight lot has been 100% electrically re-tested, no failures.

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B. Johlander, 11-05-2004 Page 24