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ZEISS Microscopy: Поглед Към Портфолиото 4 Корелативна Микроскопия

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ZEISS Microscopy: Поглед Към Портфолиото 4 Корелативна Микроскопия ZEISS Индустриален качествен контрол "Дни на безразрушителния контрол 2018" Anton Tonchev 2018-06-07 Agenda 1 Светът на ZEISS 2 От суровина до краен продукт. Being sure. 3 ZEISS Microscopy: Поглед към портфолиото 4 Корелативна микроскопия. Нови хоризонти в науката Carl Zeiss Bulgaria, Anton Tonchev 2017-03-07 2 Светът на ZEISS ZEISS Group Пазари Компанията . Индустриални решения . Изследователска дейност ZEISS е водеща световна група от фирми в . Медицинска техника оптичната и в оптоелектронната индустрия. Оптика за крайни потребители Carl Zeiss AG не публична компания, а е изцяло притежавана от фондация Carl Zeiss Основни направления SMT / Полупроводникова индустрия Наука & контрол на качеството Медицинска техника Оптика за крайни потребители Повече от 35 Нобелови лауреати са използвали ZEISS микроскопи, за да направят света по-добър Alvar Gullstrand Manfred Eigen Sir Paul M. Nurse Andre Geim Eric Betzig (Chemistry) Stefan W. Hell (Physiology or Medicine) Leland H. Hartwell Konstantin Timothy Hunt Novoselov William E. (Physiology or Medicine) (Physics) Moerner (Chemistry) Eric A. Cornell Robert Koch Christiane (Physics) Sir John B. (Physiology or Nüsslein- Gurdon Medicine) Volhard Shinya John O'Keefe (Physiology or Craig C. Mello Yamanaka May-Britt Moser Medicine) Andrew Z. Fire (Physiology or Edvard I. Moser (Physiology or Medicine) (Physiology or Medicine) Medicine) 1905 1906 1911 1925 1952 1953 1967 1991 1995 1999 2001 2002 2006 2008 2010 2011 2012 2013 2014 Sidney Brenner H. Robert Horvitz Richard Adolf Bert Sakmann Dan Erwin Neher John E. Sulston Shechtman Zsigmondy (Physiology or (Physiology or (Chemistry) (Chemistry) Medicine) Medicine) Harald zur Hausen (Physiology or Medicine) Günter Blobel Osamu Shimomura (Physiology or Medicine) Santiago Ramón y Martin Chalfie Cajal Camillo Golgi Frits Zernike Ahmed A. Zewail Roger Tsien (Physiology or Medicine) (Physics) (Chemistry) (Chemistry) 6 Предизвикателства с различен мащаб Пълна информация от микро до нано… Being sure. От суровина до краен продукт Производство на метали Сложен процес с много неизвестни Единственият производител с пълно портфолио за всички приложения… Микроструктура на материали Как да свържем информация от обработка, структура и различни механизми m cm mm μm nm Å ZEISS Microscopy Широко портфолио… Stereo Sub-micron Widefield Polarized Confocal Nanoscale Helium Ion C-SEM FE-SEM FIB-SEM LM XRM LM LM LM XRM Microscope 1 μm 700 nm 250 nm 200 nm 200 nm < 50 nm < 2 nm < 1 nm < 1 nm < 0.5 nm …за многобройни предизвикателства в света на научните изследвания. Качествен контрол от марко до микро …често се налага да се правят комплексни анализи на различни по големина обекти cm mm μm nm Fractured Chain Printed Circuit Board Fibers Cathode of a Lithium Atomized Iron Powder Ion Accumulator Портфолиото в детайл ZEISS Microscopy Системи за визуална инспекция Greenough-type stereo microscope: - Stemi 305: 5:1 zoom - Stemi 508: 8:1 zoom Automated Digital Microscope: - Максимална резолюция ~ 1 μm - Максимално увеличени 1,011x CMO optics SteREO Discovery: - V8 8:1/ V12 12:1/ V20 20:1 - Моторизиран - FL/ POL ZEISS Microscopy Прави микроскопи Primotech Axio Lab.A1 Materials Axio Scope.A1 Materials Axio Imager Materials ZEISS Microscopy Инвертни микроскопи Axio Vert.A1 Materials: - 5x кодиран ревловер за обективи - Светло поле, тъмно поле, DIC, C-DIC, флуоресценция и поляризация - VisiLED/HAL 100 осветление Axio Observer 3/5/7 Materials: - 6x кодиран револвер за обективи - Моторизирана система - Светло поле, тъмно поле, DIC, C-DIC, флуоресценция, фазов контраст и поляризация - microLED/HAL 100/HBO - Корелативна микроскопия - Конфокална микроскопия ZEISS Microscopy Специализиран софтуер за анализ на материали Graphite in Cast Iron CircularPolarization Differential with additionalPolarizationDarkfieldBrightfield Interference lambda Contrast compensator (C-DIC) ZEISS Axio Imager 2 Specimen preparation and image interpretation: Dr. H.-L. Steyer, Kesselsdorf, Germany Carl Zeiss Microscopy Grain Size in the Eye of the Beholder... Eyepiece reticle with ASTM E112 Possible sources of human error • Estimations rely on operator • Vary by operator • Data entered manually Carl Zeiss Microscopy Modern Digital Metallurgical Laboratory Digital Stereo Upright Inverted Widefield Polarized Confocal LIGHT MICROSCOPES LIGHT • Comparative Diagrams to compare to standards, images, and custom views • Standards available: EN ISO 643, ASTM E 112, ASTM E 1382, BS 4990, SEP 151061, EN 10247, DIN 5060 Grain Structure Analysis Starts with an image with good contrast Aluminum imaged with polarizer with lambda plate (full wave) Determine Grain Size Automatically or interactively with high precision and reproducibility Multiphase Alloy Analysis Quantification and reporting Analyze distribution of different phases: • Solid vs air/void • Mixture or metallic phase Brass, etched (bright field) Brass, segmented • Intermetallic compound Report with multiphase analysis results Report with multiphase analysis results Non-metallic Inclusions (NMI) Automatic detection, measurement, and reporting Sulfide inclusions in steel • Large sample surface areas to be scanned automatically: inclusions are recorded in their entirety • Objectives for outstanding contrast and resolution • Fully motorized for reproducible system settings LSM конфокална микроскопия ZEISS LSM 800 за материали Конфокален микроскоп за изследване на материали и качествен контрол Carl Zeiss Microscopy 8/4/2018 27 ZEISS LSM 800 за материали Възможни приложения Surface Metrology Structural Analysis of Composite Layer Thickness Measurement Find deposits of raw materials Carl Zeiss Microscopy 8/4/2018 28 ZEISS LSM 800 за материали Възможни приложения Aluminum structure in Printed graphite structure, color coded height map Paper surface with indent from pen, 3D-view of Circular Differential Contrast (C-DIC) C Epiplan-APOCHROMAT 20x/0.7 color coded height map EC Epiplan-NEOFLUAR 10×/0.25 C Epiplan-APOCHROMAT 20x/0.7 Surface texture of geometric standard (ISO 5436-1, type C) Fiber composite. Comparison of different Erosion on electrical switch. Evaluation of material 3D-view of color coded height map with profile view contrast methods erosion and accumulation. 7x1 tiles image to get the evaluation length of 4mm Left Brightfield, right Fluorescence 5x5 tiles image C Epiplan-APOCHROMAT 10x/0.4 C Epiplan-APOCHROMAT 20x/0.7 Carl Zeiss Microscopy 8/4/2018 29 Сканиращ електронен микроскоп за Материалознание ZEISS CSEM продуктово семейство. EVO Най-високо качество на изображението в всички режими на вакуум EVO High Definition Imaging in All Vacuum Modes New Variable Pressure & Extended Pressure Detectors . VPSE-G4 provides the improved VP imaging up to 400 Pa . C2D provides an upgrade over VPSE-G4 for the best VP imaging up to 750 Pa . C2DX provides the best EP imaging up to VPSE G4 Max: 400 Pa 3000 Pa C2D Max: 750 Pa C2DX Max: 3000 Pa Min P = 10 Pa Q: What adds Electron Optics to Light Optics? A: Different and Complementary Contrast Methods Light Microscopy Scanning Electron Microscopy Industrial diamonds Contrast from color and reflections Contrast from shades of grey and edges Three Contrast Methods unique to SEM Surface Morphology Phase Contrast Elemental Chemistry Secondary Electron Image (SE) Backscattered Electron Image (BSE) Mo Elemental Map Stainless Steel Fracture Dissimilar joint between low alloy steel and nickel alloy Secondary Electron Imaging Yields high detail Surface Morphology Zinc-phosphate E-coating as applied to car body panels, delineated by “edginess” of SE contrast mechanism Backscattered Electron Imaging Yields a Snapshot of Compositional Differences Tyre Cord steel threat in rubber, revealed by phase contrast scaling with the density of the materials Steel = high density = bright, Rubber = low density = dark Energy Dispersive Spectrometry (EDS) Major and minor element analysis EDS analysis Information from EDS . Most common analytical method used in electron microscopy X-ray spectrum . Fast acquisition . Accurate to 0.1 wt.% for most elements . Single point, area and line scans . Elemental quantification . Element distribution maps Quant Elemental maps Elem. Wt.% Ni 58.8 Co 12.4 Cr 19.0 Mo 4.2 Ti 3.1 Fe 0.8 Electron Back Scattered Diffraction (EBSD) Crystallography EBSD Information from EBSD . Commonly used in Metals & Steel applications . Provides point analysis, phase discrimination, Fore-scatter Imaging Orientation Maps crystal orientation, texture & grains Strain analysis Microstructural data Elemental maps Crystal Orientation Pole figures ZEISS Microscopy SEM images with measurement ZEISS Microscopy …and EDS element analysis Нов стандарт в изследването на Материали Корелативна микроскопия Защо корелативна микроскопия? Всичко на едно място – от микро до нано Carl Zeiss Microscopy 42 Защо корелативна микроскопия? Функционална и структурна информация в едно LM LM EM EDX-overlay EM An alternative mode of correlative microscopy is to take th two images from the same sample at the same location and overlay them to generate a new level of information. Board (Electronics) Correlative Microscopy with Shuttle & Find LM 5x SEM VPSE 200x Correlation Application Challenge Solution • Application Board failure • Searching for the root cause • The correlation of images analysis of a failure (root cause of a enables an assumption for the temperature impact) root cause • e.g. metallic particles, bores in • The particle is the reason for solder, corrosion, bad the failure / temperature impact interfaces, defect phases Li-ion Batteries Correlative Microscopy
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