DOCSLIB.ORG

Safety Data Sheet

Total Page：16

File Type：pdf, Size：1020Kb

Download full-text PDF Read full-text
Safety Data Sheet SAFETY DATA SHEET Revision Date 29-Jun-2018 Revision Number 1 SECTION 1: IDENTIFICATION OF THE SUBSTANCE/MIXTURE AND OF THE COMPANY/UNDERTAKING 1.1. Product identification Product Description: Cadmium arsenide Cat No. : 22773 CAS-No 12006-15-4 Molecular Formula As2 Cd3 1.2. Relevant identified uses of the substance or mixture and uses advised against Recommended Use Laboratory chemicals. Uses advised against No Information available 1.3. Details of the supplier of the safety data sheet Company Alfa Aesar . Avocado Research Chemicals, Ltd. Shore Road Port of Heysham Industrial Park Heysham, Lancashire LA3 2XY United Kingdom Office Tel: +44 (0) 1524 850506 Office Fax: +44 (0) 1524 850608 E-mail address [email protected] www.alfa.com Product Safety Department 1.4. Emergency telephone number Call Carechem 24 at +44 (0) 1865 407333 (English only); +44 (0) 1235 239670 (Multi-language) SECTION 2: HAZARDS IDENTIFICATION 2.1. Classification of the substance or mixture CLP Classification - Regulation (EC) No 1272/2008 Physical hazards Based on available data, the classification criteria are not met Health hazards Acute oral toxicity Category 3 (H301) Acute Inhalation Toxicity - Dusts and Mists Category 2 (H330) Environmental hazards ______________________________________________________________________________________________ ALFAA22773 Page 1 / 10 SAFETY DATA SHEET Cadmium arsenide Revision Date 29-Jun-2018 ______________________________________________________________________________________________ Acute aquatic toxicity Category 1 (H400) Chronic aquatic toxicity Category 1 (H410) 2.2. Label elements Signal Word Danger Hazard Statements H301 - Toxic if swallowed H330 - Fatal if inhaled H350i - May cause cancer by inhalation H410 - Very toxic to aquatic life with long lasting effects Precautionary Statements P264 - Wash face, hands and any exposed skin thoroughly after handling P304 + P340 - IF INHALED: Remove to fresh air and keep at rest in a position comfortable for breathing P310 - Immediately call a POISON CENTER or doctor/ physician P280 - Wear protective gloves/ protective clothing/ eye protection/ face protection 2.3. Other hazards No information available SECTION 3: COMPOSITION/INFORMATION ON INGREDIENTS 3.1. Substances Component CAS-No EC-No. Weight % CLP Classification - Regulation (EC) No 1272/2008 Cadmium arsenide (Cd3As2) 12006-15-4 EEC No. 234-484-1 <=100 Acute Tox. 3 (H301) Acute Tox. 2 (H330) Carc. 1B (H350i) Aquatic Acute 1 (H400) Aquatic Chronic 1 (H410) Full text of Hazard Statements: see section 16 SECTION 4: FIRST AID MEASURES 4.1. Description of first aid measures ______________________________________________________________________________________________ ALFAA22773 Page 2 / 10 SAFETY DATA SHEET Cadmium arsenide Revision Date 29-Jun-2018 ______________________________________________________________________________________________ General Advice Show this safety data sheet to the doctor in attendance. Immediate medical attention is required. Eye Contact In the case of contact with eyes, rinse immediately with plenty of water and seek medical advice. Rinse immediately with plenty of water, also under the eyelids, for at least 15 minutes. Skin Contact Wash off immediately with plenty of water for at least 15 minutes. Immediate medical attention is required. Ingestion Do not induce vomiting. Call a physician or Poison Control Center immediately. Inhalation Move to fresh air. If not breathing, give artificial respiration. Do not use mouth-to-mouth method if victim ingested or inhaled the substance; give artificial respiration with the aid of a pocket mask equipped with a one-way valve or other proper respiratory medical device. Immediate medical attention is required. Self-Protection of the First Aider Ensure that medical personnel are aware of the material(s) involved, take precautions to protect themselves and prevent spread of contamination. 4.2. Most important symptoms and effects, both acute and delayed None reasonably foreseeable. 4.3. Indication of any immediate medical attention and special treatment needed Notes to Physician Treat symptomatically. SECTION 5: FIREFIGHTING MEASURES 5.1. Extinguishing media Suitable Extinguishing Media Not combustible. Extinguishing media which must not be used for safety reasons No information available. 5.2. Special hazards arising from the substance or mixture Do not allow run-off from fire fighting to enter drains or water courses. Hazardous Combustion Products arsenic oxides, Cadmium oxide. 5.3. Advice for firefighters As in any fire, wear self-contained breathing apparatus pressure-demand, MSHA/NIOSH (approved or equivalent) and full protective gear. Thermal decomposition can lead to release of irritating gases and vapors. SECTION 6: ACCIDENTAL RELEASE MEASURES 6.1. Personal precautions, protective equipment and emergency procedures Ensure adequate ventilation. Use personal protective equipment. Avoid dust formation. Keep people away from and upwind of spill/leak. Evacuate personnel to safe areas. 6.2. Environmental precautions ______________________________________________________________________________________________ ALFAA22773 Page 3 / 10 SAFETY DATA SHEET Cadmium arsenide Revision Date 29-Jun-2018 ______________________________________________________________________________________________ Do not flush into surface water or sanitary sewer system. Do not allow material to contaminate ground water system. Prevent product from entering drains. Local authorities should be advised if significant spillages cannot be contained. Should not be released into the environment. 6.3. Methods and material for containment and cleaning up Sweep up or vacuum up spillage and collect in suitable container for disposal. Avoid dust formation. 6.4. Reference to other sections Refer to protective measures listed in Sections 8 and 13. SECTION 7: HANDLING AND STORAGE 7.1. Precautions for safe handling Wear personal protective equipment. Do not get in eyes, on skin, or on clothing. Avoid dust formation. Use only under a chemical fume hood. Do not breathe vapors/dust. Do not ingest. Hygiene Measures Handle in accordance with good industrial hygiene and safety practice. Keep away from food, drink and animal feeding stuffs. Do not eat, drink or smoke when using this product. Remove and wash contaminated clothing before re-use. Wash hands before breaks and at the end of workday. 7.2. Conditions for safe storage, including any incompatibilities Keep container tightly closed in a dry and well-ventilated place. 7.3. Specific end use(s) Use in laboratories SECTION 8: EXPOSURE CONTROLS/PERSONAL PROTECTION 8.1. Control parameters Exposure limits List source(s): UK - EH40/2005 Containing the workplace exposure limits (WELs) for use with the Control of Substances Hazardous to Health Regulations (COSHH) 2002 (as amended). Updated by September 2006 official press release and October 2007 Supplement. Component The United Kingdom European Union Ireland Cadmium arsenide (Cd3As2) STEL: 0.075 mg/m3 15 min STEL: 0.3 mg/m3 15 min TWA: 0.025 mg/m3 8 hr TWA: 0.1 mg/m3 8 hr Biological limit values This product, as supplied, does not contain any hazardous materials with biological limits established by the region specific regulatory bodies Monitoring methods BS EN 14042:2003 Title Identifier: Workplace atmospheres. Guide for the application and use of procedures for the assessment of exposure to chemical and biological agents. MDHS14/3 General methods for sampling and gravimetric analysis of respirable and inhalable dust MDHS10/2 Cadmium and inorganic compounds of cadmium in air Laboratory method using flame atomic absorption spectrometry ______________________________________________________________________________________________ ALFAA22773 Page 4 / 10 SAFETY DATA SHEET Cadmium arsenide Revision Date 29-Jun-2018 ______________________________________________________________________________________________ or electrothermal atomic absorption spectrometry MDHS41/2 Arsenic and inorganic compounds of arsenic (except arsine) in air Laboratory method using continuous flow or flow injection analysis hydride generation atomic absorption spectrometry Derived No Effect Level (DNEL) No information available Route of exposure Acute effects (local) Acute effects Chronic effects Chronic effects (systemic) (local) (systemic) Oral Dermal Inhalation Predicted No Effect Concentration No information available. (PNEC) 8.2. Exposure controls Engineering Measures Ensure adequate ventilation, especially in confined areas. Wherever possible, engineering control measures such as the isolation or enclosure of the process, the introduction of process or equipment changes to minimise release or contact, and the use of properly designed ventilation systems, should be adopted to control hazardous materials at source Personal protective equipment Eye Protection Safety glasses with side-shields (European standard - EN 166) Hand Protection Protective gloves Glove material Breakthrough time Glove thickness EU standard Glove comments Butyl rubber See manufacturers - EN 374 (minimum requirement) recommendations Skin and body protection Long sleeved clothing Inspect gloves before use. Please observe the instructions regarding permeability and breakthrough time which are provided by the supplier of the gloves. (Refer to manufacturer/supplier for information) Ensure gloves are suitable for the task: Chemical compatability, Dexterity, Operational conditions, User susceptibility, e.g. sensitisation effects, also take into consideration the specific
Load more

Recommended publications
  • (12) United States Patent (10) Patent No.: US 8,333,879 B2 M00re Et Al
    US0083.33879B2 (12) United States Patent (10) Patent No.: US 8,333,879 B2 M00re et al. (45) Date of Patent: Dec. 18, 2012 (54) ELECTRODEPOSITION OF DELECTRIC (56) References Cited COATINGS ON SEMCONDUCTIVE SUBSTRATES U.S. PATENT DOCUMENTS 3,455,806 A 7/1969 Spoor et al. (75) Inventors: Kelly L. Moore, Dunbar, PA (US); 3,663,389 A 5, 1972 Koral et al. Michael J. Pawlik, Glenshaw, PA (US); 3,749,657 A 7, 1973 Le Bras et al. Michael G. Sandala, Pittsburgh, PA 3,793,278 A 2f1974 De Bona (US); Craig A. Wilson, Allison Park, PA 3,928, 157 A 12/1975 Suematsu et al. 3,947.338 A 3, 1976 Jerabek et al. (US) 3,947,339 A 3, 1976 Jerabek et al. 3,962,165 A 6, 1976 Bosso et al. (73) Assignee: PPG Industries Ohio, Inc., Cleveland, 3,975,346 A 8, 1976 Bosso et al. OH (US) 3,984,299 A 10, 1976 Jerabek (*) Notice: Subject to any disclaimer, the term of this (Continued) patent is extended or adjusted under 35 FOREIGN PATENT DOCUMENTS U.S.C. 154(b) by 0 days. EP OO12463 A1 6, 1980 (21) Appl. No.: 13/240,455 OTHER PUBLICATIONS (22) Filed: Sep. 22, 2011 Kohler, E. P. "An Apparatus for Determining Both the Quantity of Gas Evolved and the Amount of Reagent Consumed in Reactions (65) Prior Publication Data with Methyl Magnesium Iodide'. J. Am. Chem. Soc., 1927, 49 (12), US 2012/OOO6683 A1 Jan. 12, 2012 3181-3188, American Chemical Society, Washington, D.C. Related U.S.
    [Show full text]
  • March 8, 1966 F. H. DIL, JR 3,239,393 METHOD for PRODUCING SEMICONDUCTOR ARTICLES Filed Dec
    March 8, 1966 F. H. DIL, JR 3,239,393 METHOD FOR PRODUCING SEMICONDUCTOR ARTICLES Filed Dec. 31, 1962 2. Sheets-Sheet FG. MATER ALS STEPS SEMCONDUCTOR COMPOUND CRYSTAL POLISH CHEMICAL POLISH ACCEPTOR DFFUSANT SOURCE INTRODUCE COMPOUND MEASURED CHARGE HAVING AN ON OF DFFUSANT FROM SAME PERODC COMPOUND GROUP AS CRYSTAL ANION EVACUATE HEAT TO VAPOR DIFFUSE FOR MEASURED TIME ATTACH ELECTRODES INVENTOR. FREDERICK H. DLL JR ATTORNEY March 8, 1966 F., H., DL, JR 3,239,393 METHOD FOR PRODUCING SEMCONDUCTOR ARTICLES Filed Dec. 31, 962 2. Sheets-Sheet 2 Šes is series NNNNN r N NNNNNNNN 3,239,393 United States Patent Office Patented Mar. 8, 1966 2. to produce precisely the desired results. For instance, 3,239,393 when metallic zinc is used as the diffusant material for METHOD FOR PRODUCING SEMCONDUCTOR a gallium arsenide substrate, it is very difficult to obtain ARTICLES the pure zinc metal with no zinc oxide film upon the metal. Frederick H. Dii, Jr., Patnam Waley, N.Y., assigor to 5 Furthermore, the metal is so tough that it is difficult to International Business Machines Corporation, New divide a pure metal sample into smaller pieces in order York, N.Y., a corporation of New York to obtain exactly the correct quantity for the diffusion Filed Dec. 31, 1962, Ser. No. 248,679 process. The zinc oxide on the surface of the metallic Zinc 7 Claims. (C. 48-189) diffusant material is very undesirable for a number of This invention relates to an improved diffusion process IO reasons. The oxygen is not wanted in the diffusion Vapor, for the production of Semiconductor devices, and more and the zinc oxide tends to form a protective coating particularly to an improved vapor diffusion process in over the zinc which inhibits the formation of the desired which the introduction of unwanted impurities is very zinc metal vapor which is required for the diffusion proc effectively and simply avoided, and which possesses other CSS.
    [Show full text]
  • Chemical Names and CAS Numbers Final
    Chemical Abstract Chemical Formula Chemical Name Service (CAS) Number C3H8O 1‐propanol C4H7BrO2 2‐bromobutyric acid 80‐58‐0 GeH3COOH 2‐germaacetic acid C4H10 2‐methylpropane 75‐28‐5 C3H8O 2‐propanol 67‐63‐0 C6H10O3 4‐acetylbutyric acid 448671 C4H7BrO2 4‐bromobutyric acid 2623‐87‐2 CH3CHO acetaldehyde CH3CONH2 acetamide C8H9NO2 acetaminophen 103‐90‐2 − C2H3O2 acetate ion − CH3COO acetate ion C2H4O2 acetic acid 64‐19‐7 CH3COOH acetic acid (CH3)2CO acetone CH3COCl acetyl chloride C2H2 acetylene 74‐86‐2 HCCH acetylene C9H8O4 acetylsalicylic acid 50‐78‐2 H2C(CH)CN acrylonitrile C3H7NO2 Ala C3H7NO2 alanine 56‐41‐7 NaAlSi3O3 albite AlSb aluminium antimonide 25152‐52‐7 AlAs aluminium arsenide 22831‐42‐1 AlBO2 aluminium borate 61279‐70‐7 AlBO aluminium boron oxide 12041‐48‐4 AlBr3 aluminium bromide 7727‐15‐3 AlBr3•6H2O aluminium bromide hexahydrate 2149397 AlCl4Cs aluminium caesium tetrachloride 17992‐03‐9 AlCl3 aluminium chloride (anhydrous) 7446‐70‐0 AlCl3•6H2O aluminium chloride hexahydrate 7784‐13‐6 AlClO aluminium chloride oxide 13596‐11‐7 AlB2 aluminium diboride 12041‐50‐8 AlF2 aluminium difluoride 13569‐23‐8 AlF2O aluminium difluoride oxide 38344‐66‐0 AlB12 aluminium dodecaboride 12041‐54‐2 Al2F6 aluminium fluoride 17949‐86‐9 AlF3 aluminium fluoride 7784‐18‐1 Al(CHO2)3 aluminium formate 7360‐53‐4 1 of 75 Chemical Abstract Chemical Formula Chemical Name Service (CAS) Number Al(OH)3 aluminium hydroxide 21645‐51‐2 Al2I6 aluminium iodide 18898‐35‐6 AlI3 aluminium iodide 7784‐23‐8 AlBr aluminium monobromide 22359‐97‐3 AlCl aluminium monochloride
    [Show full text]
  • Thermomagnetic Effects in Cadmium Arsenide
    Thermomagnetic effects in cadmium arsenide Citation for published version (APA): Blom, F. A. P. (1970). Thermomagnetic effects in cadmium arsenide. Technische Hogeschool Eindhoven. https://doi.org/10.6100/IR155506 DOI: 10.6100/IR155506 Document status and date: Published: 01/01/1970 Document Version: Publisher’s PDF, also known as Version of Record (includes final page, issue and volume numbers) Please check the document version of this publication: • A submitted manuscript is the version of the article upon submission and before peer-review. There can be important differences between the submitted version and the official published version of record. People interested in the research are advised to contact the author for the final version of the publication, or visit the DOI to the publisher's website. • The final author version and the galley proof are versions of the publication after peer review. • The final published version features the final layout of the paper including the volume, issue and page numbers. Link to publication General rights Copyright and moral rights for the publications made accessible in the public portal are retained by the authors and/or other copyright owners and it is a condition of accessing publications that users recognise and abide by the legal requirements associated with these rights. • Users may download and print one copy of any publication from the public portal for the purpose of private study or research. • You may not further distribute the material or use it for any profit-making activity or commercial gain • You may freely distribute the URL identifying the publication in the public portal.
    [Show full text]
  • Topological Insulator State and Collapse of the Quantum Hall Effect in a Three-Dimensional Dirac Semimetal Heterojunction
    PHYSICAL REVIEW X 10, 011050 (2020) Topological Insulator State and Collapse of the Quantum Hall Effect in a Three-Dimensional Dirac Semimetal Heterojunction David A. Kealhofer ,1 Luca Galletti ,2 Timo Schumann ,2 Alexey Suslov ,3 and Susanne Stemmer2,* 1Department of Physics, University of California, Santa Barbara, California 93106-9530, USA 2Materials Department, University of California, Santa Barbara, California 93106-5050, USA 3National High Magnetic Field Laboratory, Tallahassee, Florida 32310, USA (Received 10 July 2019; revised manuscript received 25 November 2019; accepted 23 December 2019; published 27 February 2020) Thin films promise new opportunities for the manipulation of surface states of topological semimetals with the potential to realize new states that cannot be obtained in bulk materials. Here, we report transport studies of gated Hall bar structures fabricated from approximately 50-nm-thick, (001)-oriented epitaxial films of cadmium arsenide, a prototype three-dimensional Dirac semimetal, in magnetic fields up to 45 T. The films exhibit a quantized Hall effect with pronounced odd-integer plateaus that is strikingly different from that of the more widely studied (112)-oriented films. We show that the unusual quantum Hall effect is a consequence of the inverted bulk band structure of cadmium arsenide that creates topological-insulator- like states at the bottom and top interfaces, each exhibiting a half-integer quantum Hall effect. A small potential offset between the two surfaces results in the crossing of the Landau levels and gives rise to the filling factor sequences observed in the experiments. Moreover, at large negative values of gate bias, the filling factor ν ¼ 1 is abruptly preempted by an insulating state that is accompanied by the collapse of the well-developed quantum Hall effect.
    [Show full text]
  • Field-Effect Transistors with the Three-Dimensional Dirac Semimetal Cadmium Arsenide
    Field-effect transistors with the three- dimensional Dirac semimetal cadmium arsenide Cite as: Appl. Phys. Lett. 115, 062101 (2019); https://doi.org/10.1063/1.5103268 Submitted: 25 April 2019 . Accepted: 12 July 2019 . Published Online: 06 August 2019 Omor F. Shoron , Timo Schumann, Manik Goyal, David A. Kealhofer , and Susanne Stemmer Appl. Phys. Lett. 115, 062101 (2019); https://doi.org/10.1063/1.5103268 115, 062101 © 2019 Author(s). Applied Physics Letters ARTICLE scitation.org/journal/apl Field-effect transistors with the three-dimensional Dirac semimetal cadmium arsenide Cite as: Appl. Phys. Lett. 115, 062101 (2019); doi: 10.1063/1.5103268 Submitted: 25 April 2019 . Accepted: 12 July 2019 . Published Online: 6 August 2019 Omor F. Shoron,1 Timo Schumann,1 Manik Goyal,1 David A. Kealhofer,2 and Susanne Stemmer1,a) AFFILIATIONS 1Materials Department, University of California, Santa Barbara, California 93106-5050, USA 2Department of Physics, University of California, Santa Barbara, California 93106-9530, USA a)Email: [email protected] ABSTRACT Cadmium arsenide (Cd3As2) is a three-dimensional Dirac semimetal with many unique electronic properties that are of interest for future device applications. Here, we demonstrate field effect transistors using Cd3As2 as the channel material. We show that current densities exceed 5 A/mm and that very low contact resistances can be achieved even in unoptimized device structures. These properties make Cd3As2 of great interest for future high-speed electronics. We report on the current modulation characteristics of field effect transistors as a function of tem- perature. At low temperatures, the modulation exceeds 70%. We discuss material and device engineering approaches that can improve the device performance at room temperature.
    [Show full text]
  • The University of Chicago Next Generation Synthetic
    THE UNIVERSITY OF CHICAGO NEXT GENERATION SYNTHETIC ROUTES TO COLLOIDAL III-V QUANTUM DOTS A DISSERTATION SUBMITTED TO THE FACULTY OF THE DIVISION OF THE PHYSICAL SCIENCES IN CANDIDACY FOR THE DEGREE OF DOCTOR OF PHILOSOPHY DEPARTMENT OF CHEMISTRY BY VISHWAS SRIVASTAVA CHICAGO, ILLINOIS AUGUST 2018 TABLE OF CONTENTS List of Figures ................................................................................................................... vii List of Tables ................................................................................................................... xiv Acknowledgments..............................................................................................................xv Abstract ........................................................................................................................... xvii CHAPTER 1: An Introduction to colloidal semiconductor nanocrystals ....................1 CHAPTER 2: Aminoarsines as arsenic precursors for the synthesis of metal arsenide nanocrystals ......................................................................................................................14 2.1 Introduction .................................................................................................................14 2.2 DIBAL-H mediated synthesis of InAs Nanocrystals ..................................................16 2.3 Effect of DIBAL-H concentration and temperature on NC size .................................18 2.4 Structural Characterization of InAs NCs ....................................................................21
    [Show full text]
  • Free Download
    ALB Materials Inc 2360 Corporate Circle . Suite 400 Website: www.albmaterials.com Henderson, NV 89074-7739 E-mail: [email protected] Item No. Product Name CAS Number Formula Purity ALB‐semi‐AlSb Aluminum Antimonide [25152‐52‐7] AlSb 5N ALB‐semi‐Al2Se3 Aluminum Selenide [1302‐82‐5] Al2Se3 5N ALB‐semi‐Al2S3 Aluminum Sulfide [1302‐81‐4] Al2S3 5N ALB‐semi‐Al2Te3 Aluminum Telluride [12043‐29‐7] Al2Te3 5N ALB‐semi‐Sb Antimony [7440‐36‐0] Sb 5N, 6N ALB‐semi‐Sb2Se3 Antimony Selenide [1315‐05‐5] Sb2Se3 5N ALB‐semi‐Sb2S3 Antimony Sulfide [1345‐04‐6] Sb2S3 5N ALB‐semi‐Sb2Te3 Antimony Telluride [1327‐50‐0] Sb2Te3 4N, 5N ALB‐semi‐SbI3 Antimony(III) Iodide [7790‐44‐5] SbI3 4N ALB‐semi‐Sb2O3 Antimony(III) Oxide [1309‐64‐4] Sb2O3 5N ALB‐semi‐Sb2O5 Antimony(V) Oxide [1314‐60‐9] Sb2O5 5N ALB‐semi‐As2Se3 Arsenic Selenide [1303‐36‐2] As2Se3 5N ALB‐semi‐As2S3 Arsenic Sulfide [1303‐33‐9] As2S3 5N ALB‐semi‐Bi2O3 Bismuth Oxide [1304‐76‐3] Bi2O3 5N ALB‐semi‐Bi2Se3 Bismuth Selenide [12068‐69‐8] Bi2Se3 5N ALB‐semi‐Bi2S3 Bismuth Sulfide [1345‐07‐9] Bi2S3 5N ALB‐semi‐Bi2Te3 Bismuth Telluride [1304‐82‐1] Bi2Te3 4N, 5N ALB‐semi‐Cd Cadmium [7440‐43‐9]Inc Cd 5N, 6N, 7N ALB‐semi‐CdSb Cadmium Antimonide [12050‐27‐0] CdSb 5N ALB‐semi‐Cd3As2 Cadmium Arsenide [12006‐15‐4] Cd3As2 5N ALB‐semi‐CdSe Cadmium Selenide [1306‐24‐7] CdSe 4N, 5N ALB‐semi‐Cd2SnO4 Cadmium Stannate [12185‐56‐7] Cd2SnO4 5N ALB‐semi‐CdS Cadmium Sulfide [1306‐23‐6] CdS 4N, 5N ALB‐semi‐CdTe Cadmium Telluride [1306‐25‐8] CdTe 5N ALB‐semi‐Cu2S Copper Sulfide [22205‐45‐4] Cu2S 5N ALB‐semi‐GaSb Gallium Antimonide
    [Show full text]
  • Material Safety Data Sheet
    LTS Research Laboratories, Inc. Safety Data Sheet Cadmium Arsenide Metal ––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––– 1. Product and Company Identification ––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––– Trade Name: Cadmium arsenide metal Chemical Formula: Cd3As2 Recommended Use: Scientific research and development Manufacturer/Supplier: LTS Research Laboratories, Inc. Street: 37 Ramland Road City: Orangeburg State: New York Zip Code: 10962 Country: USA Tel #: 855-587-2436 / 855-lts-chem 24-Hour Emergency Contact: 800-424-9300 (US & Canada) +1-703-527-3887 (International) ––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––– 2. Hazards Identification ––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––– Signal Word: Danger Hazard Statements: H300+H330: Fatal if swallowed or if inhaled H350: May cause cancer Precautionary Statements: P260: Do not breathe dust/fume/gas/mist/vapours/spray P284: Wear respiratory protection P301+P310: IF SWALLOWED: Immediately call a POISON CENTER or doctor/physician P320: Specific treatment is urgent (see on this label) P405: Store locked up P501: Dispose of contents/container in accordance with local/regional/national/international regulations HMIS Health Ratings (0-4): Health: 3 Flammability: 0 Physical: 1 ––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––– 3. Composition –––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––
    [Show full text]
  • Solid State Physics for the Structure of Uranium Oxide and Zinc Arsenide
    SOLID STATE PHYSICS FOR THE STRUCTURE OF URANIUM OXIDE AND ZINC ARSENIDE by Lydia S Harris A senior thesis submitted to the faculty of Brigham Young University - Idaho in partial fulfillment of the requirements for the degree of Bachelor of Science Department of Physics Brigham Young University - Idaho December 2019 Copyright c 2019 Lydia S Harris All Rights Reserved BRIGHAM YOUNG UNIVERSITY - IDAHO DEPARTMENT APPROVAL of a senior thesis submitted by Lydia S Harris This thesis has been reviewed by the research committee, senior thesis coor- dinator, and department chair and has been found to be satisfactory. Date Lance J Nelson, Advisor Date David Oliphant, Senior Thesis Coordinator Date Evan Hansen, Committee Member Date Todd Lines, Chair ABSTRACT SOLID STATE PHYSICS FOR THE STRUCTURE OF URANIUM OXIDE AND ZINC ARSENIDE Lydia S Harris Department of Physics Bachelor of Science Material properties are based on the structure of the material. Two ways to determine the structure of a material are a computational search for the ground state structures, and an experimental look using X-ray diffraction. In this work, these two ways are described and utilized to find the structure of two materials, uranium dioxide and zinc arsenide. Experimental techniques such as X-ray diffraction are used in order to better understand existing materials, but computational searches can be used in materials discovery. The consequences of using computational techniques is that new alloys with desirable properties can be discovered using inexpensive computer resources, however, the existence of such alloys must be validated experimentally. ACKNOWLEDGMENTS I would like to thank my parents, family, and friends for their support in my life, a.k.a.
    [Show full text]
  • Structural Characterisation of High-Mobility Cd3as2 Films
    www.nature.com/scientificreports OPEN Structural characterisation of high-mobility Cd3As2 flms crystallised on SrTiO3 Received: 13 December 2017 Yusuke Nakazawa1, Masaki Uchida 1, Shinichi Nishihaya1, Markus Kriener2, Yusuke Kozuka1, Accepted: 22 January 2018 Yasujiro Taguchi2 & Masashi Kawasaki1,2 Published: xx xx xxxx Cd3As2 has long been known as a high-mobility semiconductor. The recent fnding of a topological semimetal state in this compound has demanded growth of epitaxial flms with high crystallinity and controlled thickness. Here we report the structural characterisation of Cd3As2 flms grown on SrTiO3 substrates by solid-phase epitaxy at high temperatures up to 600 °C by employing optimised capping layers and substrates. The As triangular lattice is epitaxially stacked on the Ti square lattice of the (001) SrTiO3 substrate, producing (112)-oriented Cd3As2 flms exhibiting high crystallinity with a rocking-curve width of 0.02° and a high electron mobility exceeding 30,000 cm2/Vs. The systematic characterisation of flms annealed at various temperatures allowed us to identify two- step crystallisation processes in which out-of-plane and subsequently in-plane directions occur with increasing annealing temperature. Our fndings on the high-temperature crystallisation process of Cd3As2 enable a unique approach for fabricating high-quality Cd3As2 flms and elucidating quantum transport by back gating through the SrTiO3 substrate. Since the topological Dirac semimetal state in Cd3As2 has been theoretically predicted and experimentally ver- ifed1–3, a variety of its syntheses, such as by melt growth1–5, Cd fux growth6–9, chemical vapour transport10–13, 14 and chemical vapour deposition have been reported so far. On the other hand, Cd3As2 has long been known as a high-mobility semiconductor15, and growth of rather thick flms, mainly by thermal evapouration and pulsed-laser evapouration, has been reported since the 1970s16–22.
    [Show full text]
  • List of Semiconductor Materials - Wikipedia, the Free Encyclopedia Page 1 of 4
    List of semiconductor materials - Wikipedia, the free encyclopedia Page 1 of 4 List of semiconductor materials From Wikipedia, the free encyclopedia Semiconductor materials are insulators at absolute zero temperature that conduct electricity in a limited way at room temperature. The defining property of a semiconductor material is that it can be doped with impurities that alter its electronic properties in a controllable way. Because of their application in devices like transistors (and therefore computers) and lasers, the search for new semiconductor materials and the improvement of existing materials is an important field of study in materials science. The most commonly used semiconductor materials are crystalline inorganic solids. These materials can be classified according to the periodic table groups from which their constituent atoms come. Semiconductor materials are differing by their properties. Compound semiconductors have advantages and disadvantages in comparison with silicon. For example gallium arsenide has six times higher electron mobility than silicon, which allows faster operation; wider band gap, which allows operation of power devices at higher temperatures, and gives lower thermal noise to low power devices at room temperature; its direct band gap gives it more favorable optoelectronic properties than the indirect band gap of silicon; it can be alloyed to ternary and quaternary compositions, with adjustable band gap width, allowing light emission at chosen wavelengths, and allowing e.g. matching to wavelengths with lowest losses in optical fibers. GaAs can be also grown in a semiinsulating form, which is suitable as a lattice-matching insulating substrate for GaAs devices. Conversely, silicon is robust, cheap, and easy to process, while GaAs is brittle, expensive, and insulation layers can not be created by just growing an oxide layer; GaAs is therefore used only where silicon is not sufficient.[1] Some materials can be prepared with tunable properties, e.g.
    [Show full text]