Lecture 19: Memory
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Error Detection and Correction Methods for Memories Used in System-On-Chip Designs
International Journal of Engineering and Advanced Technology (IJEAT) ISSN: 2249 – 8958, Volume-8, Issue-2S2, January 2019 Error Detection and Correction Methods for Memories used in System-on-Chip Designs Gunduru Swathi Lakshmi, Neelima K, C. Subhas ABSTRACT— Memory is the basic necessity in any SoC Static Random Access Memory (SRAM): It design. Memories are classified into single port memory and consists of a latch or flipflop to store each bit of multiport memory. Multiport memory has ability to source more memory and it does not required any refresh efficient execution of operation and high speed performance operation. SRAM is mostly used in cache memory when compared to single port. Testing of semiconductor memories is increasing because of high density of current in the and in hand-held devices. It has advantages like chips. Due to increase in embedded on chip memory and memory high speed and low power consumption. It has density, the number of faults grow exponentially. Error detection drawback like complex structure and expensive. works on concept of redundancy where extra bits are added for So, it is not used for high capacity applications. original data to detect the error bits. Error correction is done in Read Only Memory (ROM): It is a non-volatile memory. two forms: one is receiver itself corrects the data and other is It can only access data but cannot modify data. It is of low receiver sends the error bits to sender through feedback. Error detection and correction can be done in two ways. One is Single cost. Some applications of ROM are scanners, ID cards, Fax bit and other is multiple bit. -
Lecture 27 Semiconductor Memory: DRAM and Non-Volatile Memory Administrivia
Lecture 27 Semiconductor Memory: DRAM and Non-Volatile Memory Digital Integrated Circuits Interconnect © Prentice Hall 2000 Administrivia l Today: Project phase 3 announcement. l Poster Session Tu 5/8 1-4pm » Location BWRC, 2108 Allston Way l Last lecture on Th 5/3 will cover issues in IC design Digital Integrated Circuits Interconnect © Prentice Hall 2000 1 Lectures Last l ROM and SRAM Today l Introducing the project phase III l DRAM and Non-volatile Digital Integrated Circuits Interconnect © Prentice Hall 2000 Project Phase III A proposed SRAM cell! w/ Control Circuit Digital Integrated Circuits Interconnect © Prentice Hall 2000 2 Tasks l Explain the behavior of the cell in its global contents. Provide transient simulations to illustrate. l Identify weakness of the cell in terms of signal integrity and power dissipation. Quantify your statements. l Propose an implementation that improves power dissipation. Digital Integrated Circuits Interconnect © Prentice Hall 2000 Report l Report » Comparison, Selection, Electrical Design » Cell Layout, Timing Waveforms in SRAM, Simulation » Power and Estimation and Proposal for SRAM power reduction l 3 slides on poster, each of which represents one of the tasks of the previous slide » Explanation of cell operation, comparison, design » Cell Operation in SRAM, Waveforms, Simulation » Proposal of improved SRAM implementation (from a power perspective) Digital Integrated Circuits Interconnect © Prentice Hall 2000 3 SEMICONDUCTOR MEMORIES Digital Integrated Circuits Interconnect © Prentice Hall 2000 3-Transistor DRAM Cell BL1 BL2 WWL WWL RWL RWL X X M3 VDD-VT M2 M1 VDD BL1 CS BL2 VDD-VT DV No constraints on device ratios Reads are non-destructive Value stored at node X when writing a “1” = VWWL-VTn Digital Integrated Circuits Interconnect © Prentice Hall 2000 4 3T-DRAM — Layout BL2 BL1 GND RWL M3 M2 WWL M1 Digital Integrated Circuits Interconnect © Prentice Hall 2000 1-Transistor DRAM Cell BL WL Write "1" Read "1" WL 1 M C X S GND VDD-VT V BL DD VDD/2 VDD/2 CBL sensing Write: CS is charged or discharged by asserting WL and BL. -
Nanotechnology Trends in Nonvolatile Memory Devices
IBM Research Nanotechnology Trends in Nonvolatile Memory Devices Gian-Luca Bona [email protected] IBM Research, Almaden Research Center © 2008 IBM Corporation IBM Research The Elusive Universal Memory © 2008 IBM Corporation IBM Research Incumbent Semiconductor Memories SRAM Cost NOR FLASH DRAM NAND FLASH Attributes for universal memories: –Highest performance –Lowest active and standby power –Unlimited Read/Write endurance –Non-Volatility –Compatible to existing technologies –Continuously scalable –Lowest cost per bit Performance © 2008 IBM Corporation IBM Research Incumbent Semiconductor Memories SRAM Cost NOR FLASH DRAM NAND FLASH m+1 SLm SLm-1 WLn-1 WLn WLn+1 A new class of universal storage device : – a fast solid-state, nonvolatile RAM – enables compact, robust storage systems with solid state reliability and significantly improved cost- performance Performance © 2008 IBM Corporation IBM Research Non-volatile, universal semiconductor memory SL m+1 SL m SL m-1 WL n-1 WL n WL n+1 Everyone is looking for a dense (cheap) crosspoint memory. It is relatively easy to identify materials that show bistable hysteretic behavior (easily distinguishable, stable on/off states). IBM © 2006 IBM Corporation IBM Research The Memory Landscape © 2008 IBM Corporation IBM Research IBM Research Histogram of Memory Papers Papers presented at Symposium on VLSI Technology and IEDM; Ref.: G. Burr et al., IBM Journal of R&D, Vol.52, No.4/5, July 2008 © 2008 IBM Corporation IBM Research IBM Research Emerging Memory Technologies Memory technology remains an -
Semiconductor Memories
Semiconductor Memories Prof. MacDonald Types of Memories! l" Volatile Memories –" require power supply to retain information –" dynamic memories l" use charge to store information and require refreshing –" static memories l" use feedback (latch) to store information – no refresh required l" Non-Volatile Memories –" ROM (Mask) –" EEPROM –" FLASH – NAND or NOR –" MRAM Memory Hierarchy! 100pS RF 100’s of bytes L1 1nS SRAM 10’s of Kbytes 10nS L2 100’s of Kbytes SRAM L3 100’s of 100nS DRAM Mbytes 1us Disks / Flash Gbytes Memory Hierarchy! l" Large memories are slow l" Fast memories are small l" Memory hierarchy gives us illusion of large memory space with speed of small memory. –" temporal locality –" spatial locality Register Files ! l" Fastest and most robust memory array l" Largest bit cell size l" Basically an array of large latches l" No sense amps – bits provide full rail data out l" Often multi-ported (i.e. 8 read ports, 2 write ports) l" Often used with ALUs in the CPU as source/destination l" Typically less than 10,000 bits –" 32 32-bit fixed point registers –" 32 60-bit floating point registers SRAM! l" Same process as logic so often combined on one die l" Smaller bit cell than register file – more dense but slower l" Uses sense amp to detect small bit cell output l" Fastest for reads and writes after register file l" Large per bit area costs –" six transistors (single port), eight transistors (dual port) l" L1 and L2 Cache on CPU is always SRAM l" On-chip Buffers – (Ethernet buffer, LCD buffer) l" Typical sizes 16k by 32 Static Memory -
Via-Programmable Read-Only Memory Design for Full Code Coverage Using a Dynamic Bit-Line Shielding Technique
Via-Programmable Read-Only Memory Design for Full Code Coverage Using A Dynamic Bit-Line Shielding Technique Meng-Fan Chang1, 2, Ding-Ming Kwai2, and Kuei-Ann Wen1 1 Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan 2 Intellectual Property Library Company, Hsinchu, Taiwan [email protected] Abstract 0-cell 1-cell 0-cell Crosstalk between bit lines leads to read-1 failure Metal-3 (BL) in a high-speed via-programmable read only memory (ROM) and limits the coverage of applicable code Via-2 (Code) patterns. Due to the fluctuations in bit-line intrinsic Metal-2 and coupling capacitances, the amount of noise coupled to a selected bit line may vary, resulting in the Via-1 reduction of sensing margin. In this paper, we propose a dynamic bit-line shielding (DBS) technique, suitable Metal-1 to be implemented in compliable ROM, to eliminate the Contact crosstalk-induced read failure and to achieve full code coverage. Experiments of the 256Kb instances with Diffusion Diffusion Diffusion and without the DBS circuit were undertaken using STI STI STI STI 0.25µm and 0.18µm standard CMOS processes. The test results demonstrate the read-1 failures and Fig. 1. Cross-sectional view of ROM array with via-2 confirm that the DBS technique can remove them codes and metal-3 bit lines. successfully, allowing the ROM to operate under a wide range of supply voltage. sectional view of the memory array with via-2 codes 1. Introduction and metal-3 bit lines. This leads to more severe bit-line crosstalk, since the contact and via at the lower levels Mask-programmable read-only memory (ROM) must be stacked and the metal islands for them to land macros are commonly embedded into system-on-chip upon contribute considerable side-wall capacitances to (SoC) designs today. -
Refresh Operation and Semi-Conductor Rom Memories
REFRESH OPERATION AND SEMI-CONDUCTOR ROM MEMORIES The Refresh control block periodically generates Refresh, requests, causing the access control block to start a memory cycle in the normal way. This block allows the refresh operation by activating the Refresh Grant line. The access control block arbitrates between Memory Access requests and Refresh requests, with priority to Refresh requests in the case of a tie to ensure the integrity of the stored data. As soon as the Refresh control block receives the Refresh Grant signal, it activates the Refresh line. This causes the address multiplexer to select the Refresh counter as the source and its contents are thus loaded into the row address latches of all memory chips when the RAS signal is activated. During this time the R/ W line may be low, causing an inadvertent write operation. One way to prevent this is to use the Refresh line to control the decoder block to deactivate all the chip select lines. The rest of the refresh cycle is the same as in a normal cycle. At the end, the Refresh control block increments the refresh counter in preparation for the next Refresh cycle. Even though the row address has 8 bits, the Refresh counter need only be 7 bits wide because of the cell organization inside the memory chips. In a 64k x 1 memory chip, the 256x256 cell array actually consists of two 128x256 arrays. The low order 7 bits of the row address select a row from both arrays and thus the row from both arrays is refreshed! Ideally, the refresh operation should be transparent to the CPU. -
Memory Basics
Memory Basics • RAM: Random Access Memory – historically defined as memory array with individual bit access – refers to memory with both Read and Write capabilities • ROM : Read Only Memory – no capabilities for “online” memory Write operations – Write typically requires high volt ages or erasing by UV light • Volatility of Memory – volatile memory loses data over time or when power is removed • RAM is volatile – non-volatile memory stores data even when power is removed • ROM is non-volatile • Static vs. Dynamic Memory – Static: holds data as long as power is applied (SRAM) – Dynamic: must be refreshed periodically (DRAM) ECE 410, Prof. A. Mason/Prof. F. Salem Lecture Notes 13.1 SRAM Basics • SRAM = Static Random Access Memory – Static: holds data as long as power is applied – Volatile: can not hold data if power is removed • Operation States – 3 states (modes) • hold • write WL • read • Basic 6T (transistor) SRAM Cell – bistable (cross-coupled) INVs for storage – access transistors MAL & MAR MAL MAR • access to stored data for read and write – word line, WL, controls access bit bit • WL = 0, hold operation • WL = 1, read or write operation ECE 410, Prof. A. Mason/Prof. F. Salem Lecture Notes 13.2 SRAM Operations • Hold – word line = 0, access transistors are OFF – data held in latch • Write WL – word line = 1, access tx are ON – new data (voltage) applied to bit and bit_bar – data in latch overwritten with new value MAL MAR • Read bit bit – word line = 1, access tx are ON – bit and bit_bar read by a sense amplifier • Sense Amplifier – basically a simple differential (transconductance) amplifier – comparing the difference between bit and bit_bar • if bit > bit_bar, output is 1 • if bit < bit_bar, output is 0 • allows output to be set quickly without fully charging/discharging bit line ECE 410, Prof. -
Memory We Have Already Mentioned That Digital Computer Works on Stored Programmed Concept Introduced by Von Neumann
www.getmyuni.com Memory We have already mentioned that digital computer works on stored programmed concept introduced by Von Neumann. We use memory to store the information, which includes both program and data. Due to several reasons, we have different kind of memories. We use different kind of memory at different level. The memory of computer is broadly categories into two categories: . Internal and . external Internal memory is used by CPU to perform task and external memory is used to store bulk information, which includes large software and data. Memory is used to store the information in digital form. The memory hierarchy is given by: . Register . Cache Memory . Main Memory . Magnetic Disk . Removable media (Magnetic tape) Register: This is a part of Central Processor Unit, so they reside inside the CPU. The information from main memory is brought to CPU and keep the information in register. Due to space and cost constraints, we have got a limited number of registers in a CPU. These are basically faster devices. Cache Memory: Cache memory is a storage device placed in between CPU and main memory. These are semiconductor memories. These are basically fast memory device, faster than main memory. We cannot have a big volume of cache memory due to its higher cost and some constraints of the CPU. Due to higher cost we cannot replace the whole main memory by faster memory. Generally, the most recently used information is kept in the cache memory. It is brought from the main memory and placed in the cache memory. Now days, we get CPU with internal cache. -
VLSI Memory Lecture-Nahas-181025.Pdf
Introduction to CMOS VLSI Design Semiconductor Memory Harris and Weste, Chapter 12 25 October 2018 J. J. Nahas and P. M. Kogge Modified from slides by Jay Brockman 2008 [Including slides from Harris & Weste, Ed 4, Adapted from Mary Jane Irwin and Vijay Narananan, CSE Penn State adaptation of Rabaey’s Digital Integrated Circuits, ©2002, J. Rabaey et al.] Semiconductor Memory Slide 1 Outline Memory features and comparisons Generic Memory Architecture – Architecture Overview – Row and Column Decoders – Redundancy and Error Correction Static Random Access Memory (SRAM) Dynamic Random Access Memory (DRAM) Flash (EEPROM) Memory Other Memory Types Semiconductor MemoryCMOS VLSI Design Slide 2 1 Memory Features and Comparisons Semiconductor MemoryCMOS VLSI Design Slide 3 Memory Characteristics Read/Write Attributes – Read-Only Memory (ROM): Programmed at manufacture • Being phased out of use in favor of Flash – Read-Write Memory: Can change value dynamically • SRAM, DRAM – Read-Mostly: Can write, but much more slowly than read • EEPROM (Electrically Eraseable, Programable Read Only Memory) (pronounced “Double E Prom”) • Flash (A form of EEPROM) Volatility: sensitivity to losing power – Volatile: loses contents when power turned off – Non-volatile: does not lose contents Semiconductor MemoryCMOS VLSI Design Slide 4 2 Memory Characteristics Addressability – Random-Access: provide address to access a “word” of data • No correlation between successive addresses – Block oriented: read and write large blocks of data at a time – Content-addressable: -
17. Semiconductor Memories
17. Semiconductor Memories Institute of Microelectronic Systems Overview •Introduction • Read Only Memory (ROM) • Nonvolatile Read/Write Memory (RWM) • Static Random Access Memory (SRAM) • Dynamic Random Access Memory (DRAM) •Summary Institute of Microelectronic 17: Semiconductor Memories Systems 2 Semiconductor Memory Classification Non-Volatile Memory Volatile Memory Read Only Memory Read/Write Memory Read/Write Memory (ROM) (RWM) Random Non-Random Mask-Programmable EPROM Access Access ROM E2PROM SRAM FIFO Programmable ROM FLASH DRAM LIFO Shift Register EPROM - Erasable Programmable ROM SRAM - Static Random Access Memory E2PROM - Electrically Erasable DRAM - Dynamic Random Access Memory Programmable ROM FIFO - First-In First-Out LIFO - Last-In First-Out Institute of Microelectronic 17: Semiconductor Memories Systems 3 Random Access Memory Array Organization Memory array • Memory storage cells • Address decoders Each memory cell • stores one bit of binary information (”0“ or ”1“ logic) • shares common connections with other cells: rows, columns Institute of Microelectronic 17: Semiconductor Memories Systems 4 Read Only Memory - ROM • Simple combinatorial Boolean network which produces a specific output for each input combination (address) • ”1“ bit stored - absence of an active transistor • ”0“ bit stored - presence of an active transistor • Organized in arrays of 2N words • Typical applications: • store the microcoded instructions set of a microprocessor • store a portion of the operation system for PCs • store the fixed programs for -
Semiconductor Memories
SEMICONDUCTOR MEMORIES Digital Integrated Circuits Memory © Prentice Hall 1995 Chapter Overview • Memory Classification • Memory Architectures • The Memory Core • Periphery • Reliability Digital Integrated Circuits Memory © Prentice Hall 1995 Semiconductor Memory Classification RWM NVRWM ROM Random Non-Random EPROM Mask-Programmed Access Access 2 E PROM Programmable (PROM) SRAM FIFO FLASH DRAM LIFO Shift Register CAM Digital Integrated Circuits Memory © Prentice Hall 1995 Memory Architecture: Decoders M bits M bits S S0 0 Word 0 Word 0 S1 Word 1 A0 Word 1 S2 Storage Storage s Word 2 Word 2 d Cell A1 Cell r r o e d W o c N AK-1 e S D N-2 Word N-2 Word N-2 SN_1 Word N-1 Word N-1 Input-Output Input-Output (M bits) (M bits) N words => N select signals Decoder reduces # of select signals Too many select signals K = log2N Digital Integrated Circuits Memory © Prentice Hall 1995 Array-Structured Memory Architecture Problem: ASPECT RATIO or HEIGHT >> WIDTH 2L-K Bit Line Storage Cell AK r e d Word Line AK+1 o c e D AL-1 w o R M.2K Sense Amplifiers / Drivers Amplify swing to rail-to-rail amplitude A 0 Column Decoder Selects appropriate AK-1 word Input-Output (M bits) Digital Integrated Circuits Memory © Prentice Hall 1995 Hierarchical Memory Architecture Row Address Column Address Block Address Global Data Bus Control Block Selector Global Circuitry Amplifier/Driver I/O Advantages: 1. Shorter wires within blocks 2. Block address activates only 1 block => power savings Digital Integrated Circuits Memory © Prentice Hall 1995 Memory Timing: Definitions -
Lecture 23. Read-Only Memories & Programmable Logic Arrays
EE 280 Introduction to Digital Logic Design Lecture 23. Read-Only Memories & Programmable Logic Arrays EE280 Lecture 23 23 - 1 Read-Only Memories Memory is like an array of mailboxes (registries of binary data) A stored array of binary data which can be read only, but not changed In general, 2n × m ROM ≡ I/P lines ≡ O/P lines ≡ words* each bits long For each combination of inputs on the n input lines, the corresponding pattern of 0’s and 1’s (a word) is generated on the m output lines - typical sizes range from (32 words x 4 bits) to (512K words x 8 bits) or larger EE280 Lecture 23 23 - 2 1 ROM Realization of Logic Functions A B C F0 F1 F2 F3 0 0 0 A ROM 0 0 1 B 8 words 0 1 0 C x 4 bits 0 1 1 1 0 0 1 0 1 F F F F 1 1 0 0 1 2 3 1 1 1 a. Block diagram b. Truth table for ROM F0 = = A'B' + AC‘ F1 = = B + AC‘ F2 = = A'B' + BC‘ F3 = = AC + B EE280 Lecture 23 23 - 3 ROM Realization of Logic Functions ROM consists of a decoder and a memory array. When a particular input sequence is applied to the n decoder inputs, exactly one of the 2n outputs is set to 1. This output line selects one of the words in the memory array. decoder outputs mi are consecutive minterms ROM outputs Fi are generated by ORing selected minterms Switching elements pass 1 to output, otherwise resistors at the top set output to 0 EE280 Lecture 23 23 - 4 2 Code Conversion Network using ROM The ROM realizes conversion between BDC (8421) code and Excess-3 code Decimal Input Output digit ABCD W X Y Z 0 0000 0 0 1 1 A W 1 0001 0 1 0 0 B X 2 0010 0 1 0 1 ROM C Y 3 0011 0 1 1 0 4 0100