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Improvement of Silicon Oxide Quality Using Heat Treatment

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University of Kentucky UKnowledge Theses and Dissertations--Electrical and Computer Engineering Electrical and Computer Engineering 2012 IMPROVEMENT OF SILICON OXIDE QUALITY USING HEAT TREATMENT Lei Han University of Kentucky, [email protected] Right click to open a feedback form in a new tab to let us know how this document benefits ou.y Recommended Citation Han, Lei, "IMPROVEMENT OF SILICON OXIDE QUALITY USING HEAT TREATMENT" (2012). Theses and Dissertations--Electrical and Computer Engineering. 5. https://uknowledge.uky.edu/ece_etds/5 This Master's Thesis is brought to you for free and open access by the Electrical and Computer Engineering at UKnowledge. It has been accepted for inclusion in Theses and Dissertations--Electrical and Computer Engineering by an authorized administrator of UKnowledge. For more information, please contact [email protected]. STUDENT AGREEMENT: I represent that my thesis or dissertation and abstract are my original work. Proper attribution has been given to all outside sources. I understand that I am solely responsible for obtaining any needed copyright permissions. I have obtained and attached hereto needed written permission statements(s) from the owner(s) of each third-party copyrighted matter to be included in my work, allowing electronic distribution (if such use is not permitted by the fair use doctrine). I hereby grant to The University of Kentucky and its agents the non-exclusive license to archive and make accessible my work in whole or in part in all forms of media, now or hereafter known. I agree that the document mentioned above may be made available immediately for worldwide access unless a preapproved embargo applies. I retain all other ownership rights to the copyright of my work. I also retain the right to use in future works (such as articles or books) all or part of my work. I understand that I am free to register the copyright to my work. REVIEW, APPROVAL AND ACCEPTANCE The document mentioned above has been reviewed and accepted by the student’s advisor, on behalf of the advisory committee, and by the Director of Graduate Studies (DGS), on behalf of the program; we verify that this is the final, approved version of the student’s dissertation including all changes required by the advisory committee. The undersigned agree to abide by the statements above. Lei Han, Student Dr. Zhi Chen, Major Professor Dr. Zhi Chen, Director of Graduate Studies IMPROVEMENT OF SILICON OXIDE QUALITY USING HEAT TREATMENT THESIS A thesis submitted in partial fulfillment of the requirements for the degree of Master of Science in Electrical Engineering in the College of Engineering at the Universit y of Kentucky By Lei Han Lexington, Kentucky Directors: Dr. Zhi Chen, Professor of Electrical Engineering Department Lexington, Kentucky 2012 Copyright © Lei Han 2012 ABSTRACT OF THESIS IMPROVEMENT OF SILICON OXIDE QUALITY USING HEAT TREATMENT In decades, the tremendous development of integrated circuits industry could be mostly attributed to SiO2, since its satisfactory properties as a gate dielectric candidate. The effectivity of SiO2 has been challenged since dielectric layer was scaled down below 3nm, when the gate leakage current of SiO2 became unacceptable. Institution to silicon- based CMOS techniques were proposed, but they have their own limitations. Nowadays, materials with high dielectric constants are mainstream gate dielectric materials in industry, but a SiO2 interfacial layer is still necessary to avoid gap between gate dielectric layer and Si substrate, and to minimize interface trap charges. In this thesis work, by ap- plying lateral heating process on Si wafer with thermally grown ultrathin SiO2, the gate leakage current density could be reduced by 3-5 order of magnitude. MOS capacitors were fabricated, and electrical properties were tested with semiconductor parameter ana- lyzer and LCR meter. The underlying mechanism of this appealing phenomenon was ex- plored. Since unacceptable gate leakage current is one of the main reasons which prevent the scaling trend in semiconductor industry, this technology brings a possibility to post- pone the end of scaling trend, and pave a way for extensive application in industry. A new method for fabrication of MOS capacitors metal gate has been developed, and lift-off process has been replaced by wet etching process. This method provides better contact between dielectric layer and metal gate, meanwhile much easier operation. KEYWORDS: Gate Leakage Current, Silicon Oxide, Leatral Heating Process, Silicon Structure Change, Wet Etching Lei Han June 2, 2012 IMPROVEMENT OF SILICON OXIDE QUALITY USING HEAT TREATMENT By Lei Han Dr. Zhi Chen Director of Thesis Dr. Zhi Chen Director of Graduate Studies June 2, 2012 ACKNOWLEDGMENTS I would like to thank my academic advisor, Dr Zhi David Chen, for the opportunity he gave me to pursue my degree in the filed of semiconductor devices, and all the guidance and help I’ve received from him all through these years. This thesis would be impossible without his extensive knowledge and innovative ideas in this field. Special thanks should be accorded to Dr Chuck May and Brian Wajdyk for providing technical assistance at the Center for Nanoscale Science and Technology at University of Kentucky, and for helping me solving technical problems in my fabrication process. I would also like to thank Dr. Todd Hastings, Dr. Vijay Singh, and Dr. Fuqian Yang, for serving as committee members, and for the insightful guidance I’ve received from them. Thanks to my labmate, Yichun Wang, for the time and effort she spent on my fabrica- tion training process. I would also like to thank all my group members, Dr. Youngsik Song, Dr. Chi Lu, Dr. Shibin Li, Dr. Ibrahim Yucedag, Jun Fang, Chenglin Yi, Mengmei Liu, Bojie Chen, Riasad Badhan. Last but not least, I would like to express my deepest gratitude to my parents, for the endless love and support I have always been with since I was born. iii TABLE OF CONTENTS ACKNOWLEDGMENTS ................................................................................................. iii LIST OF TABLES ...............................................................................................................v LIST OF FIGURES ........................................................................................................... vi Chapter 1 Introduction .........................................................................................................1 1.1 History of Device Scaling in Integrated Circuits .......................................................1 1.2 The Benefits of Device Scaling .................................................................................3 1.3 Scaling of the Gate Dielectrics ...................................................................................5 1.4 Moore’s Law Is Approaching an Limitation ..............................................................7 1.5 The Novel Phenomenon of Gate Dielectric Leakage Current Reduction ..................9 1.5.1 Theoretical background: Hydrogen/Deuterium isotope effect ..........................9 1.5.2 Phonon energy coupling enhancement effect ..................................................11 1.6 Motivation ................................................................................................................13 Chapter 2 MOS Capacitors Fabrication .............................................................................18 2.1 RCA Clean ...............................................................................................................18 2.2 Thermal Growth of Silicon Oxide ...........................................................................19 2.3 Introduction and Improvement of Heat Treatment Equipment ................................21 2.4 Lift-off Process for Patterning of MOS Capacitors Gates .......................................22 2.5 Back-side contact and post metallization annealing ................................................24 2.6 Current-Voltage, Capacitance-Voltage characteristics measurement ......................24 Chapter 3 Wet Etch Process for Patterning of MOS Capacitors Gates .............................28 Chapter 4 Rapid Thermal Process with Moisture ..............................................................39 Chapter 5 Lateral Heating Process Experiments and Results ............................................44 5.1 Background ..............................................................................................................44 5.2 Effect of Direct Hanging and Heat Transportation ..................................................45 5.3 Effect of Sandwich Structure ...................................................................................53 Chapter 6 Conclusion and Future Work ............................................................................59 6.1 Conclusion ...............................................................................................................59 6.2 Future Work .............................................................................................................59 Reference... ........................................................................................................................61 Vita……............... ..............................................................................................................65 iv LIST OF TABLES Table 1.1: Performance parameters improvement by constant-field scaling, α is the scaling factor for dimensions[9][10]. ....................................................................5
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