RMo1B-5 22nm Ultra-Thin Body and Buried Oxide FDSOI RF Noise Performance Ousmane M. Kane#1, Luca Lucci$, Pascal Scheiblin$, Sylvie Lepilliet*, François Danneville* #CEA Leti, Lille University, France $CEA Leti, France *CNRS, Université Lille, ISEN, Université Valenciennes, UMR 8520 - IEMN, Lille, France
[email protected] Abstract—The drastic downscaling of the transistor size along lower Cgg capacitance and a higher transconductance, resulting with advances in material sciences allowed the development of low from enhanced stress response [4]. Each NMOS device was power CMOS technologies with competitive RF figure of merits accompanied by a dedicated open and short structure for de- suitable for millimeter applications. In this context, this paper embedding at lower metal reference plane and all of these presents the RF and noise characterization (up to 110 GHz) of an transistors were characterized. But, a selected device, whose advanced 22 nm UTBB FDSOI technology developed by Globalfoundries. In addition to the excellent DC performance, the dimensions are reported in Table 1, was chosen for this paper. technology presents promising RF characteristics. Indeed, a Table 1. Device geometry maximum transconductance of 1.78 S/mm and a Fmax of 435 GHz are achieved. The technology also offers a state-of-the-art Gate length Unit gate finger Number of gate Total gate width minimum noise figure (NFmin) of 0.45 dB at 20 GHz (with an (Lg) [nm] width (Wf) [µm] fingers (Nf) (Wtot) [µm] associated Gain of 13 dB) for a drain current of 185 mA/mm. 18 0.3 192 57.60 Keywords— CMOS, FDSOI, noise measurement, millimeter wave.