Microarchitecture-Level SoC Design 27 Young-Hwan Park, Amin Khajeh, Jun Yong Shin, Fadi Kurdahi, Ahmed Eltawil, and Nikil Dutt Abstract In this chapter we consider the issues related to integrating microarchitectural IP blocks into complex SoCs while satisfying performance, power, thermal, and reliability constraints. We first review different abstraction levels for SoC design that promote IP reuse, and which enable fast simulation for early functional validation of the SoC platform. Since SoCs must satisfy a multitude of interrelated constraints, we then present high-level power, thermal, and reliability models for predicting these constraints. These constraints are not unrelated and their interactions must be considered, modeled and evaluated. Once constraints are modeled, we must explore the design space trading off performance, power and reliability. Several case studies are presented illustrating how the design space can be explored across layers, and what modifications could be applied at design time and/or runtime to deal with reliability issues that may arise. Acronyms AHB Advanced High-performance Bus APB Advanced Peripheral Bus ASIC Application-Specific Integrated Circuit BER Bit Error Rate BLB Bit Lock Block Y.-H. Park Digital Media and Communications R&D Center, Samsung Electronics, Seoul, Korea e-mail:
[email protected] A. Khajeh Broadcom Corp., San Jose, CA, USA e-mail:
[email protected] J. Yong Shin • F. Kurdahi () • A. Eltawil • N. Dutt Center for Embedded and Cyber-Physical Systems, University of California Irvine, Irvine, CA, USA e-mail:
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