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Electronic Packaging Technologies 1
ElectronicElectronic PackagingPackaging TechnologiesTechnologies Sergio Lopez-Buedo, Eduardo Boemo Universidad Autonoma de Madrid e-mail: [email protected] Electronic Packaging Technologies 1 Introduction to Electronic Packaging • Electronic Packaging is a multi-disciplinary subject – Mechanical, Electrical and Industrial Engineering, Chemistry, Physics and even Marketing • Electronic Packaging: Housing and interconnection of integrated circuits to form electronic systems • Electronic Packaging must provide – Circuit support and protection – Heat dissipation – Signal distribution – Manufacturability and serviceability – Power distribution Electronic Packaging Technologies 2 Issues in Electronic Packaging Electrical analysis and testing Mechanical analysis and Reliability, Chemistry, testing Physics, Mat. performance, cost, Eng.. market need/timing, manufacturability, yields…other Thermal Manufacturing analysis and and Industrial testing Eng.. Market analysis Electronic Packaging Technologies 3 Hierarchy of Interconnection Levels • Level 0 – Gate-to-gate interconnections on the silicon die • Level 1 – Connections from the chip to its package • Level 2 – PCB, from component to component or to external connector • Level 3 – Connections between PCBs, including backplanes or motherboards • Level 4 – Connections between subassemblies, for example a rack • Level 5 – Connections between physically separate systems, using for example an Ethernet LAN Electronic Packaging Technologies 4 Blue Gene: Example of Connection Hierarchy Electronic -
2005 Injection Molded & Micro Fabrication Electronic Packaging
2005 INJECTION MOLDED & MICRO FABRICATION ELECTRONIC PACKAGING Dr. Ken Gilleo ET-Trends LLC Warwick, RI Dennis Jones Matrix, Inc. Providence, RI Abstract Thermoset epoxies, discovered nearly 80 years ago, remain the workhorse plastic for electronic packaging and printed circuit boards, but this could change with increasing technical, economic and regulatory demands. Modern halogen-free thermoplastics now boast superior properties and highly automated high-efficiency high-volume processes. Injection molding can readily produce intricate 3D structures suitable for electronic component packaging and 3D molded circuits. Although there is a well-established packaging infrastructure tied to thermoset epoxies there is a much larger world-wide manufacturing base that excels in thermoplastics. Nearly 16-billion pounds of thermoplastics are molded into various parts each year in the USA alone; 30 times higher than for epoxies. We believe that the time is right for adding thermoplastic packages, interconnects and circuitry to 21st century electronics. This paper will discuss concepts, novel designs, new processes and the advancements for injection molded packaging and highlight their impressive attributes; the lowest moisture uptake, the fastest processing and the highest stability in the world of polymers. While MEMS (Micro-Electro-Mechanical Systems) packaging will be a central theme, general component packaging will also be discussed including power packages and digital camera modules. The discussion will include the development of new BGA concepts that utilize automatic insert-molding of tiny metal balls to create the 1st (to chip) and 2nd level (to circuit board) interconnect system. Assembly topics will cover package sealing methods that include laser welding. New Multi-Chip Package (MCP) ideas based on insert-molded flexible circuitry will be described that could find use in stackable designs. -
Ceramic Leadless Chip Carrier (LCC)
Ceramic,Leadless,Chip,Carrier,(L Ceramic Leadless Chip Carrier (LCC) Literature Number: SNOA023 Ceramic Leadless Chip Carrier (LCC) August 1999 Ceramic Leadless Chip Carrier (LCC) 20 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E20A © 2000 National Semiconductor Corporation MS101105 www.national.com 20 Lead Ceramic Leadless Chip Carrier NS Package Number EA20B Ceramic Leadless Chip Carrier (LCC) www.national.com 2 Ceramic Leadless Chip Carrier (LCC) 24 Lead Ceramic Leadless Chip Carrier NS Package Number E24B 28 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E28A 3 www.national.com 28 Lead Ceramic Leadless Chip Carrier, Dual Cavity NS Package Number EA028C Ceramic Leadless Chip Carrier (LCC) www.national.com 4 Ceramic Leadless Chip Carrier (LCC) 32 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E32A 32 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E32B 5 www.national.com 32 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E32C Ceramic Leadless Chip Carrier (LCC) 32 Lead Ceramic Leadless Chip Carrier, Type E NS Package Number EA32B www.national.com 6 Ceramic Leadless Chip Carrier (LCC) 32 Lead Ceramic Leadless Chip Carrier, DIP NS Package Number EA32C 40 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E40A 7 www.national.com 44 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E44A Ceramic Leadless Chip Carrier (LCC) 48 Lead Ceramic Leadless Chip Carrier NS Package Number EA48B www.national.com 8 Ceramic Leadless Chip Carrier (LCC) 68 Lead Ceramic -
PDF Package Information
This version: Apr. 2001 Previous version: Jun. 1997 PACKAGE INFORMATION 1. PACKAGE CLASSIFICATIONS This document is Chapter 1 of the package information document consisting of 8 chapters in total. PACKAGE INFORMATION 1. PACKAGE CLASSIFICATIONS 1. PACKAGE CLASSIFICATIONS 1.1 Packaging Trends In recent years, marked advances have been made in the electronics field. One such advance has been the progression from vacuum tubes to transistors and finally, to ICs. ICs themselves have been more highly integrated into LSIs, VLSIs, and now, ULSIs. With increased functions and pin counts, IC packages have had to change significantly in the last few years in order to keep-up with the advancement in semiconductor development. Functions required for conventional IC packages are as follows: 1) To protect IC chips from the external environment 2) To facilitate the packaging and handling of IC chips 3) To dissipate heat generated by IC chips 4) To protect the electrical characteristics of the IC Standard dual-in-line packages (DIP), which fulfill these basic requirements, have enjoyed wide usage in the electronics industry for a number of years. With increasing integration and higher speed ICs, and with the miniaturization of electronic equipment, newer packages have been requested by the industry which incorporate the functions listed below: 1) Multi-pin I/O 2) Ultra-miniature packages 3) Packages suited to high density ICs 4) Improved heat resistance for use with reflow soldering techniques 5) High throughput speed 6) Improved heat dissipation 7) Lower cost per pin In response to these requests, OKI has developed a diversified family of packages to meet the myriad requirements of today’s burgeoning electronics industry. -
Quad Flat No-Lead (QFN) Evauation Test
National Aeronautics and Space Administration Quad Flat No-Lead (QFN) Evaluation Testing Reza Ghaffarian, Ph.D. Jet Propulsion Laboratory Pasadena, California Jet Propulsion Laboratory California Institute of Technology Pasadena, California 6/17 National Aeronautics and Space Administration Quad Flat No-Lead (QFN) Evaluation Testing NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Success Reza Ghaffarian, Ph.D. Jet Propulsion Laboratory Pasadena, California NASA WBS: 724297.40.43 JPL Project Number: 104593 Task Number: 40.49.02.35 Jet Propulsion Laboratory 4800 Oak Grove Drive Pasadena, CA 91109 http://nepp.nasa.gov 6/17 This research was carried out at the Jet Propulsion Laboratory, California Institute of Technology, and was sponsored by the National Aeronautics and Space Administration Electronic Parts and Packaging (NEPP) Program. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise, does not constitute or imply its endorsement by the United States Government or the Jet Propulsion Laboratory, California Institute of Technology. Copyright 2017. California Institute of Technology. Government sponsorship acknowledged. Acknowledgments The author would like to acknowledge many people from industry and the Jet Propulsion Laboratory (JPL) who were critical to the progress of this activity including the Rochester Institute of Technology (RIT). The author extends his appreciation to program managers of the National Aeronautics and Space -
Parasitic Oscillation and Ringing of Power Mosfets Application Note
Parasitic Oscillation and Ringing of Power MOSFETs Application Note Parasitic Oscillation and Ringing of Power MOSFETs Description This document describes the causes of and solutions for parasitic oscillation and ringing of power MOSFETs. © 2017 - 2018 1 2018-07-26 Toshiba Electronic Devices & Storage Corporation Parasitic Oscillation and Ringing of Power MOSFETs Application Note Table of Contents Description ............................................................................................................................................ 1 Table of Contents ................................................................................................................................. 2 1. Parasitic oscillation and ringing of a standalone MOSFET .......................................................... 3 2. Forming of an oscillation network ....................................................................................................... 3 2.1. Oscillation phenomenon ..................................................................................................................... 3 2.1.1. Feedback circuit (positive and negative feedback) ......................................................................... 4 2.1.2. Conditions for oscillation ...................................................................................................................... 5 2.2. MOSFET oscillation .............................................................................................................................. 5 2.2.1. -
Building Your Prototype
Building Your Prototype Prototype Construction Techniques Part Numbers Package Types Specification Sheets Schematic Diagrams Practical Advice T. Grotjohn, [email protected] Prototype Construction Techniques 1) Protoboard Use DIP components Keep your wires neat and color coded Prone to bad connections Maximum operating speed: ~ few MHz 2) Wire Wrap Often done using wire wrap sockets on a vector board Use DIP components Wire used is good for digital signals Be careful with high current lines because the wire is small. Typical wire: 30 gauge 0.34 Ω/m 28 gauge 0.21 Ω/m 3) Soldered Board Single solder points board Tied solder points board (Your mini project #1) PCB: printed circuit board PCB can be made for ECE 480 projects in the ECE Shop: See the shop’s web page. (Also see the next page) . Printed Circuit Board System General Information T-Tech Protyping Machine ECE 482 Student Project Design Department of Electrical and Computer Engineering, 1999 Michigan State University, East Lansing, Michigan, USA Part Numbers Typical Part Number: DM8095N Prefix: Indicates the manufacture of the part. See two pages in Attachment 1. Suffixes: Indicates temperature range: “military”, “industrial”, “commercial” Also the suffixes are used to indicate package types. The ECE shop deals most often with the following electronic part suppliers. Allied Electronics (www.alliedelec.com) Digi Key (www.digikey.com) Newark Electronics (www.newark.com) For other (non-electronic) supplies, suppliers often used are Grainger (www.grainger.com) McMaster Carr (www.mcmaster.com) Package Types DIP: Dual Inline Package Easiest to use. Works in protoboards, solder boards, wire wrapping, easiest to solder components to PCB This is your choice for ECE 480. -
Packaging Product Specification
Packaging Product Specification PS007225-0607 Copyright ©2007 by ZiLOG, Inc. All rights reserved. www.zilog.com DO NOT USE IN LIFE SUPPORT Warning: LIFE SUPPORT POLICY ZiLOG'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS PRIOR WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF ZiLOG CORPORATION. As used herein Life support devices or systems are devices which (a) are intended for surgical implant into the body, or (b) support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the labeling can be reasonably expected to result in a significant injury to the user. A critical component is any component in a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system or to affect its safety or effectiveness. Document Disclaimer ©2007 by ZiLOG, Inc. All rights reserved. Information in this publication concerning the devices, applications, or technology described is intended to suggest possible uses and may be superseded. ZiLOG, INC. DOES NOT ASSUME LIABILITY FOR OR PROVIDE A REPRESENTATION OF ACCURACY OF THE INFORMATION, DEVICES, OR TECHNOLOGY DESCRIBED IN THIS DOCUMENT. ZiLOG ALSO DOES NOT ASSUME LIABILITY FOR INTELLECTUAL PROPERTY INFRINGEMENT RELATED IN ANY MANNER TO USE OF INFORMATION, DEVICES, OR TECHNOLOGY DESCRIBED HEREIN OR OTHERWISE. The information contained within this document has been verified according to the general principles of electrical and mechanical engineering. Z8, Z8 Encore!, Z8 Encore! XP, Z8 Encore! MC, Crimzon, eZ80, and ZNEO are trademarks or registered trademarks of ZiLOG, Inc. -
Package Reliability As Affected by Material and Processes
I,, '• Package Reliability as Affected By Materials and Processes The semiconductor industry is faced with the problem of how to increase the level of reliability of semiconductor parts being used in electronic systems which have had their lifetimes extended through new and.better system designs. By David Nixen, cussed, are all commercially availc1ble and presently The Aerospace Corporation, being used in high volume in industry. It is not the El Segundo, California intention of this article to present any new, revolu tionary packaging approach, but rather to compare the advantages and disadvantages of the major types The word "reliability" has been used in the semicon as they relate to reliability. uuctor industry over the years in every imaginable The actual choice of which package to use will not way. It may refer to why the cost is so high, the be presented here since that choice is too highly delivery so late, the documentation so voluminous, dependent upon the unique conditions of each indi or, it may be why the system is successful. When vidual case. discussed in the true sense of the word, perhaps reliability has no greater importance than in aero PACKAGE FAMILIES ,, , space systems. The basic package families are divided into three Until this year, a spacecraft system had a projected groups; these three groups, in turn, can be subdivid life of three to five years. Since an orbiting system ed and they, in turn, can also be subdivided. Only cannot be considered in a "repair/replace" categoryr the major families will be discussed, although some a component was required to have an extremely high of the subdivisions will be acknowledged. -
LM117/LM317A/LM317 3-Terminal Adjustable Regulator
LM117/LM317A/LM317 3-Terminal Adjustable Regulator July 2004 LM117/LM317A/LM317 3-Terminal Adjustable Regulator General Description age, supplies of several hundred volts can be regulated as long as the maximum input to output differential is not ex- The LM117 series of adjustable 3-terminal positive voltage ceeded, i.e., avoid short-circuiting the output. regulators is capable of supplying in excess of 1.5A over a Also, it makes an especially simple adjustable switching 1.2V to 37V output range. They are exceptionally easy to regulator, a programmable output regulator, or by connecting use and require only two external resistors to set the output a fixed resistor between the adjustment pin and output, the voltage. Further, both line and load regulation are better than LM117 can be used as a precision current regulator. Sup- standard fixed regulators. Also, the LM117 is packaged in plies with electronic shutdown can be achieved by clamping standard transistor packages which are easily mounted and the adjustment terminal to ground which programs the out- handled. put to 1.2V where most loads draw little current. In addition to higher performance than fixed regulators, the For applications requiring greater output current, see LM150 LM117 series offers full overload protection available only in series (3A) and LM138 series (5A) data sheets. For the IC’s. Included on the chip are current limit, thermal overload negative complement, see LM137 series data sheet. protection and safe area protection. All overload protection circuitry remains fully functional even if the adjustment ter- minal is disconnected. Features Normally, no capacitors are needed unless the device is n Guaranteed 1% output voltage tolerance (LM317A) situated more than 6 inches from the input filter capacitors in n Guaranteed max. -
An Introduction to Plastic Pin Grid Array (PPGA) Packaging
E AP-577 APPLICATION NOTE An Introduction to Plastic Pin Grid Array (PPGA) Packaging April 1996 Order Number: 243103-001 7/1/96 9:08 AM 243103_1.doc Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this document. Except as provided in Intel’s Terms and Conditions of Sale for such products, Intel assumes no liability whatsoever, and Intel disclaims any express or implied warranty, relating to sale and/or use of Intel products including liability or warranties relating to fitness for a particular purpose, merchantability, or infringement of any patent, copyright or other intellectual property right. Intel products are not intended for use in medical, life saving, or life sustaining applications. Intel retains the right to make changes to specifications and product descriptions at any time, without notice. The Pentium® processor may contain design defects or errors known as errata. Current characterized errata are available on request. *Third-party brands and names are the property of their respective owners. Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing your product order. Copies of documents which have an ordering number and are referenced in this document, or other Intel literature, may be obtained from: Intel Corporation P.O. Box 7641 Mt. Prospect, IL 60056-7641 or call 1-800-879-4683 COPYRIGHT © INTEL CORPORATION 1996 7/1/96 9:08 AM 243103_1.doc AP-577 CONTENTS PAGE PAGE 1.0. INTRODUCTION................................................5 4.0. -
An Improved and Low-Resistive Package for High-Current Power MOSFET WALTER Ralf
An improved and low-resistive package for high-current power MOSFET WALTER Ralf AN IMPROVED AND LOW-RESISTIVE PACKAGE FOR HIGH- CURRENT MOSFET Ralf Walter, Ralf Siemieniec, Marion Hoja INFINEON TECHNOLOGIES AUSTRIA AG Siemensstrasse 2 A-9500 Villach, Austria Tel. +43 51777 3877 E-Mail: [email protected] URL: http://www.infineon.com Acknowledgements The authors want to thank Ulrich Fröhler for the careful simulations of the transient thermal behavior of the discussed devices. We also like to thank Herbert Danler-Swatt, Josef Hoeglauer and Andrew Wood for many helpful discussions and hints. Keywords MOSFET, power semiconductor device, packaging, device application, reliability Abstract Over the years improved silicon technologies for low-voltage power MOSFETs have led to a very low on-resistance of the die which is now comparable or even lower than that of the device package. Modern SMD packages offer a significant reduction of the package-related resistive contribution to the overall on-resistance but are limited in the maximum useable chip size due to their small form factor. Larger dies are usually mounted into through-hole-packages or their derivatives resulting in certain limitations of their performance. In this work a new package solution especially suited for high current applications linked to high reliability requirements such as industrial motor drives or servers is discussed from the user’s perspective. The need for a new power package Low-voltage power MOSFETs based on charge-compensation using a field-plate offer a significant reduction of the area-specific on-resistance. The first commercially available devices of this type were introduced in 2001, and since that time such power MOSFETs have become more and more dominant in the market.