Building Your Prototype
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FC-PBGA, Flip Chip Plastic Ball Grid Array
TM Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, C-Ware, t he Energy Efficient Solutions logo, mobileGT, PowerQUICC, QorIQ, StarCore and Symphony are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. BeeKit, BeeStack, ColdFire+, CoreNet, Flexis, Kinetis, MXC, Platform in a Package, Processor Expert, QorIQ Qonverge, Qorivva, QUICC Engine, SMARTMOS, TurboLink, VortiQa and Xtrinsic are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. © 2011 Freescale Semiconductor, Inc. Table of Contents Slide 1. FC-PBGA Package Configurations 3 2. Printed Circuit Board Design for FC-PBGA 11 3. Surface Mount Assembly 16 4. Component Level Qualification 29 5. Board-Level Reliability 31 6. Thermal Performance 38 Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, C-Ware, the Energy Efficient Solutions logo, mobileGT, PowerQUICC, QorIQ, StarCore and Symphony are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. BeeKit, BeeStack, ColdFire+, CoreNet, Flexis, Kinetis, MXC, Platform in a TM 2 Package, Processor Expert, QorIQ Qonverge, Qorivva, QUICC Engine, SMARTMOS, TurboLink, VortiQa and Xtrinsic are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. © 2011 Freescale Semiconductor, Inc. TM FC-PBGA Package Configurations Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, C-Ware, t he Energy Efficient Solutions logo, mobileGT, PowerQUICC, QorIQ, StarCore and Symphony are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. BeeKit, BeeStack, ColdFire+, CoreNet, Flexis, Kinetis, MXC, Platform in a Package, Processor Expert, QorIQ Qonverge, Qorivva, QUICC Engine, SMARTMOS, TurboLink, VortiQa and Xtrinsic are trademarks of Freescale Semiconductor, Inc. -
Manufacturing and Reliability Challenges with QFN
Manufacturing and Reliability Challenges With QFN Dr. Craig Hillman and Cheryl Tulkoff DfR Solutions SMTA DC Chapter Ashburn, VA February 25, 2009 QFN as a ‘Next Generation’ Technology What is ‘Next Generation’ Technology? Materials or designs currently being used, but not widely adopted (especially among hi-rel manufacturers) Carbon nanotubes are not ‘Next Generation’ Not used in electronic applications Ball grid array is not ‘Next Generation’ Widely adopted © 2004 - 2007 2 Introduction (cont.) Why is knowing about ‘Next Generation’ Technologies important? These are the technologies that you or your supply chain will use to improve your product Cheaper, Faster, Stronger, ‘Environmentally-Friendly’, etc. And sooner then you think! © 2004 - 2007 3 Reliability and Next Gen Technologies One of the most common drivers for failure is inappropriate adoption of new technologies The path from consumer (high volume, short lifetime) to high rel is not always clear Obtaining relevant information can be difficult Information is often segmented Focus on opportunity, not risks Can be especially true for component packaging BGA, flip chip, QFN © 2004 - 2007 4 Component Packaging Most of us have little influence over component packaging Most devices offer only one or two packaging styles Why should you care? Poor understanding of component qualification procedures Who tests what and why? © 2004 - 2007 5 Component Testing Reliability testing performed by component manufacturers is driven by JEDEC JESD22 series (A & B) Focus is -
Land Grid Array (LGA) Package Rework
Freescale Semiconductor Document Number: AN3241 Application Note Rev. 1.0, 10/2009 Land Grid Array (LGA) Package Rework 1 Introduction Contents 1 Introduction . 1 This application note describes rework considerations 2 What is LGA? . 3 for the Land Grid Array (LGA) style package. 3 LGA Rework . 5 4 Package Removal . 6 Freescale has introduced radio frequency (RF) modules 5 LGA Reliability . 14 such as the MC1320x and MC1321x in LGA packages as 6 References . 14 an alternative package to ball grid array (BGA). The LGA packages reduce the amounts of lead in finished products and are Reduction of Hazardous Substances (RoHS) compliant, optimized for improved radio-frequency (RF) performance for wireless applications, and/or reduce the overall height of the package by eliminating the stand-off height associated with BGA balls. For assistance with any questions about the information contained in this note or for more details about the MC1320x and MC1321x devices, visit www.freescale.com/802154. or contact the appropriate product applications team. © Freescale Semiconductor, Inc., 2009. All rights reserved. Introduction 1.1 Acronyms and Abbreviations BGA Ball Grid Array BT Bismaleimide Triazine CBGA Ceramic Ball Grid Array CTE Coefficient of Thermal Expansion EU European Union ESD Electrostatic Discharge HCTE High Coefficient of Thermal Expansion HDI High Density Interconnect LGA Land Grid Array LTCC Low Temperature Co-fired Ceramic MSLn Moisture Sensitivity Level n NSMD Non-Solder Mask Defined OSP Organic Solderability Protectant PCB Printed Circuit Board RF Radio Frequency RoHS Reduction of Hazardous Substances SMD Solder Mask Defined SMT Surface Mount Technology Land Grid Array (LGA) Package Rework Application Note, Rev. -
Recommendations for Board Assembly of Infineon Ball Grid Array Packages
Recommendations for Board Assembly of Infineon Ball Grid Array Packages Additional Information Please read the Important Notice and Warnings at the end of this document Revision 4.0 www.infineon.com page 1 of 18 2020-11-09 Recommendations for Board Assembly of Infineon Ball Grid Array Packages Table of Contents Table of Contents Table of Contents ........................................................................................................................... 2 Acronyms and Abbreveations ........................................................................................................... 3 1 Package Description ............................................................................................................... 4 1.1 BGA Package Type ................................................................................................................................... 4 1.3 Package Features and General Handling Guidelines ............................................................................. 5 2 Printed Circuit Board .............................................................................................................. 7 2.1 Routing .................................................................................................................................................... 7 2.2 Pad Design ............................................................................................................................................... 7 3 PCB Assembly ....................................................................................................................... -
PDF Package Information
This version: Apr. 2001 Previous version: Jun. 1997 PACKAGE INFORMATION 1. PACKAGE CLASSIFICATIONS This document is Chapter 1 of the package information document consisting of 8 chapters in total. PACKAGE INFORMATION 1. PACKAGE CLASSIFICATIONS 1. PACKAGE CLASSIFICATIONS 1.1 Packaging Trends In recent years, marked advances have been made in the electronics field. One such advance has been the progression from vacuum tubes to transistors and finally, to ICs. ICs themselves have been more highly integrated into LSIs, VLSIs, and now, ULSIs. With increased functions and pin counts, IC packages have had to change significantly in the last few years in order to keep-up with the advancement in semiconductor development. Functions required for conventional IC packages are as follows: 1) To protect IC chips from the external environment 2) To facilitate the packaging and handling of IC chips 3) To dissipate heat generated by IC chips 4) To protect the electrical characteristics of the IC Standard dual-in-line packages (DIP), which fulfill these basic requirements, have enjoyed wide usage in the electronics industry for a number of years. With increasing integration and higher speed ICs, and with the miniaturization of electronic equipment, newer packages have been requested by the industry which incorporate the functions listed below: 1) Multi-pin I/O 2) Ultra-miniature packages 3) Packages suited to high density ICs 4) Improved heat resistance for use with reflow soldering techniques 5) High throughput speed 6) Improved heat dissipation 7) Lower cost per pin In response to these requests, OKI has developed a diversified family of packages to meet the myriad requirements of today’s burgeoning electronics industry. -
Quad Flat No-Lead (QFN) Evauation Test
National Aeronautics and Space Administration Quad Flat No-Lead (QFN) Evaluation Testing Reza Ghaffarian, Ph.D. Jet Propulsion Laboratory Pasadena, California Jet Propulsion Laboratory California Institute of Technology Pasadena, California 6/17 National Aeronautics and Space Administration Quad Flat No-Lead (QFN) Evaluation Testing NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Success Reza Ghaffarian, Ph.D. Jet Propulsion Laboratory Pasadena, California NASA WBS: 724297.40.43 JPL Project Number: 104593 Task Number: 40.49.02.35 Jet Propulsion Laboratory 4800 Oak Grove Drive Pasadena, CA 91109 http://nepp.nasa.gov 6/17 This research was carried out at the Jet Propulsion Laboratory, California Institute of Technology, and was sponsored by the National Aeronautics and Space Administration Electronic Parts and Packaging (NEPP) Program. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise, does not constitute or imply its endorsement by the United States Government or the Jet Propulsion Laboratory, California Institute of Technology. Copyright 2017. California Institute of Technology. Government sponsorship acknowledged. Acknowledgments The author would like to acknowledge many people from industry and the Jet Propulsion Laboratory (JPL) who were critical to the progress of this activity including the Rochester Institute of Technology (RIT). The author extends his appreciation to program managers of the National Aeronautics and Space -
Classification of Semiconductor Package
www.connect.co.jp www.jccherry.com Technical Data Classification of semiconductor package SIP ZIP Single In-line Package Zigzag In-line Package A package having leads on a single side of the body. A package having Zig-zag formed leads on a single side of the body. DIP PGA Dual In-line Package Pin Grid Array A package having leads in parallel rows A package having pins on top or bottom on two opposite sides of the body for face in a matrix layout of at least three through-hole insertion. rows and three columns. SDIP Shrink DIP A package which reduced the lead pitch of DIP. SOP SON Small Outline Package Small Outline Non-leaded Package A package having gull-wing-shaped leads A package having single-inline terminal on two opposite sides of the body. pads along two opposite edges of the bottom face. The terminal pads may or may not be exposed on the package sides. TSOP Thin SOP SOJ A package height of SOP exceeds 1.0 mm, Small Outline J-leaded Package and 1.2 mm or less. A package having J-shaped leads on two opposite sides of the body. SSOP Shrink SOP A package which reduced the lead pitch of SOP. 50-01 www.connect.co.jp www.jccherry.com Classification of semiconductor package QFP LGA Quad Flat Package Land Grid Array A package having gull-wing-shaped leads A package having lands on top or bottom on four sides of the body. face in a matrix of at least three rows and three columns. -
Design for Flip-Chip and Chip-Size Package Technology
As originally published in the IPC APEX EXPO Proceedings. Design for Flip-Chip and Chip-Size Package Technology Vern Solberg Solberg Technology Consulting Madison, Wisconsin Abstract As new generations of electronic products emerge they often surpass the capability of existing packaging and interconnection technology and the infrastructure needed to support newer technologies. This movement is occurring at all levels: at the IC, at the IC package, at the module, at the hybrid, the PC board which ties all the systems together. Interconnection density and methodology becomes the measure of successfully managing performance. The gap between printed boards and semiconductor technology (wafer level integration) is greater than one order of magnitude in interconnection density capability, although the development of fine-pitch substrates and assembly technology has narrowed the gap somewhat. All viable efforts are being used in filling this void utilizing uncased integrated circuits (flip-chip) and incorporating more than one die or more than one part in the assembly process. This paper provides a comparison of different commonly used technologies including flip-chip, chip-size and wafer level array package methodologies detailed in a new publication, IPC-7094. It considers the effect of bare die or die-size components in an uncased or minimally cased format, the impact on current component characteristics and reviews the appropriate PCB design guidelines to ensure efficient assembly processing. The focus of the IPC document is to provide useful and practical information to those who are considering the adoption of bare die or die size array components. Introduction The flip-chip process was originally established for applications requiring aggressive miniaturization. -
Case Study | Land Grid Array (LGA) Μmodule
Case Study | Land Grid Array (LGA) μModule 645 Harvey Road Manchester, NH 03103 (603) 669‐9181 About EPE Corp. HIGH RELIABILITY EMS provider EPE Corp. Establishes Expertise in Land Grid Array Assembly and Wins Customer Certification www.epecorp.com EPE is a leading supplier of The land grid array (LGA) is a packaging technology with a square grid of flat contacts high‐reliability Electronic that are meant to interconnect with an opposing grid of contacts on a printed circuit Manufacturing Services. Our board (PCB). Also referred to as a QFN "Quad Flat No Lead" or MLFP "Micro Lead deep manufacturing and Frame Plastic" package, LGA packaging is related to ball grid array (BGA) and pin grid engineering expertise, strong array (PGA) packaging, but unlike pin grid arrays, land grid array packages are financial position, and designed to either fit into a socket or be soldered down using surface mount passionate dedication to technology. PGA packages cannot be soldered down using surface mount technology. quality and integrity are at the Further, land grid array packages in non‐socketed configurations use a flat contact foundation of an established which is soldered directly to the PCB, wheras BGA packages have balls as their structure that supports the contacts in between the IC and the PCBs. electronic manufacturing needs of customers in diverse The assembly of LGA packages using soldered surface mount technology is inherently industries – and a demanding challenging because the interface between the flat contacts and the PCB surface can marketplace trap air pockets, causing voids during processing. Such voids are exceptionally difficult to eliminate and to repair or rework the packages are both time consuming and carry GOAL signifciantly high costs. -
An Introduction to Plastic Pin Grid Array (PPGA) Packaging
E AP-577 APPLICATION NOTE An Introduction to Plastic Pin Grid Array (PPGA) Packaging April 1996 Order Number: 243103-001 7/1/96 9:08 AM 243103_1.doc Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this document. Except as provided in Intel’s Terms and Conditions of Sale for such products, Intel assumes no liability whatsoever, and Intel disclaims any express or implied warranty, relating to sale and/or use of Intel products including liability or warranties relating to fitness for a particular purpose, merchantability, or infringement of any patent, copyright or other intellectual property right. Intel products are not intended for use in medical, life saving, or life sustaining applications. Intel retains the right to make changes to specifications and product descriptions at any time, without notice. The Pentium® processor may contain design defects or errors known as errata. Current characterized errata are available on request. *Third-party brands and names are the property of their respective owners. Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing your product order. Copies of documents which have an ordering number and are referenced in this document, or other Intel literature, may be obtained from: Intel Corporation P.O. Box 7641 Mt. Prospect, IL 60056-7641 or call 1-800-879-4683 COPYRIGHT © INTEL CORPORATION 1996 7/1/96 9:08 AM 243103_1.doc AP-577 CONTENTS PAGE PAGE 1.0. INTRODUCTION................................................5 4.0. -
501-5736 Lever Actuated Land Grid Array 1207 Position Socket ( Socket
Lever Actuated Land Grid Array 1207 Qualification test report Position Socket 501-5736 ( Socket F 1207 ) th 25 SEP 2006 Rev.B 1. Introduction 1.1 Testing was performed on the LGA1207 socket to determine if it meets the requirements of product specification 108-78375 1.2 Scope This report covers the electrical, mechanical and environmental performance requirements of the LGA1207 socket. 1.3 Product description LGA1207 socket has arrayed contacts and solder to printed circuit board (PCB). The socket is used by compressing its contacts to the arrayed CPU land in the normal direction of the PCB. The CPU lands are arrayed with same grid pitch to the socket and has gold plating finish on the surface. LGA1207 socket is actuated by the lever and generates required compression force by the back plate attach to the bottom side of the PCB and the socket actuation mechanism. 1.4 Conclusion 1.2 This test report confirmed that Tyco socket F 1207 satisfied the requirements of the product specification of 108-78375 Rev.A 1.5 Test samples Samples were taken randomly from current production. The following samples were used : Part Number Description LF-LGA1207 socket ( Lead free ) 0-1871554-1 Right / U-lever shape Leaded-LGA1207 socket ( Leaded ) 0-1871554-2 Right / U-lever shape Fig. 1 TYCO Electronics AMP K.K. : Tel 044-844-8079 Fax 044-812-3203 1 of 17 Copyright 2000 by Tyco Electronics AMP K.K. All Right Reserved. RESTRICTED TO AMD Lever Actuated Land Grid Array 1207 Qualification test report Position Socket ( Socket F 1207 ) 501-5736 2. -
Ball Grid Array (BGA) Packaging 14
Ball Grid Array (BGA) Packaging 14 14.1 Introduction The plastic ball grid array (PBGA) has become one of the most popular packaging alternatives for high I/O devices in the industry. Its advantages over other high leadcount (greater than ~208 leads) packages are many. Having no leads to bend, the PBGA has greatly reduced coplanarity problems and minimized handling issues. During reflow the solder balls are self-centering (up to 50% off the pad), thus reducing placement problems during surface mount. Normally, because of the larger ball pitch (typically 1.27 mm) of a BGA over a QFP or PQFP, the overall package and board assembly yields can be better. From a performance perspective, the thermal and electrical characteristics can be better than that of conventional QFPs or PQFPs. The PBGA has an improved design-to-produc- tion cycle time and can also be used in few-chip-package (FCPs) and multi-chip modules (MCMs) configurations. BGAs are available in a variety of types, ranging from plastic overmolded BGAs called PBGAs, to flex tape BGAs (TBGAs), high thermal metal top BGAs with low profiles (HL- PBGAs), and high thermal BGAs (H-PBGAs). The H-PBGA family includes Intel's latest packaging technology - the Flip Chip (FC)-style, H-PB- GA. The FC-style, H-PBGA component uses a Controlled Collapse Chip Connect die packaged in an Organic Land Grid Array (OLGA) substrate. In addition to the typical advantages of PBGA pack- ages, the FC-style H-PBGA provides multiple, low-inductance connections from chip to package, as well as, die size and cost benefits.