Packaging Specification

Total Page:16

File Type:pdf, Size:1020Kb

Packaging Specification Packaging Specification © 2005 Microchip Technology Inc. DS00049AC Note the following details of the code protection feature on Microchip devices: • Microchip products meet the specification contained in their particular Microchip Data Sheet. • Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions. • There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property. • Microchip is willing to work with the customer who is concerned about the integrity of their code. • Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.” Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act. Information contained in this publication regarding device Trademarks applications and the like is provided only for your convenience The Microchip name and logo, the Microchip logo, Accuron, and may be superseded by updates. It is your responsibility to dsPIC, KEELOQ, microID, MPLAB, PIC, PICmicro, PICSTART, ensure that your application meets with your specifications. PRO MATE, PowerSmart, rfPIC, and SmartShunt are MICROCHIP MAKES NO REPRESENTATIONS OR WAR- registered trademarks of Microchip Technology Incorporated RANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, in the U.S.A. and other countries. WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT AmpLab, FilterLab, Migratable Memory, MXDEV, MXLAB, LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, PICMASTER, SEEVAL, SmartSensor and The Embedded MERCHANTABILITY OR FITNESS FOR PURPOSE. Control Solutions Company are registered trademarks of Microchip disclaims all liability arising from this information and Microchip Technology Incorporated in the U.S.A. its use. Use of Microchip’s products as critical components in Analog-for-the-Digital Age, Application Maestro, dsPICDEM, life support systems is not authorized except with express dsPICDEM.net, dsPICworks, ECAN, ECONOMONITOR, written approval by Microchip. No licenses are conveyed, FanSense, FlexROM, fuzzyLAB, In-Circuit Serial implicitly or otherwise, under any Microchip intellectual property Programming, ICSP, ICEPIC, MPASM, MPLIB, MPLINK, rights. MPSIM, PICkit, PICDEM, PICDEM.net, PICLAB, PICtail, PowerCal, PowerInfo, PowerMate, PowerTool, rfLAB, rfPICDEM, Select Mode, Smart Serial, SmartTel and Total Endurance are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. SQTP is a service mark of Microchip Technology Incorporated in the U.S.A. All other trademarks mentioned herein are property of their respective companies. © 2005, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved. Printed on recycled paper. Microchip received ISO/TS-16949:2002 quality system certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona and Mountain View, California in October 2003. The Company’s quality system processes and procedures are for its PICmicro® 8-bit MCUs, KEELOQ® code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified. DS00049AC-page ii © 2005 Microchip Technology Inc. M Packaging Index CERAMIC SIDE BRAZED DUAL IN-LINE FAMILY 8-Lead Ceramic Side Brazed Dual In-line with Window (JW) – 300 mil Body....................................... 3 14-Lead Ceramic Side Brazed Dual In-line with Window (JW) – 300 mil Body................................... 4 28-Lead Ceramic Side Brazed Dual In-line with Window (JW) – 300 mil Body..................................... 5 CERAMIC DUAL IN-LINE (CERDIP) FAMILY 8-Lead Ceramic Dual In-line (JA) – 300 mil Body (CERDIP) ................................................................ 6 8-Lead Ceramic Dual In-line with Window (JW) – 300 mil Body (CERDIP) .......................................... 7 14-Lead Ceramic Dual In-line (JD) – 300 mil Body (CERDIP) .............................................................. 8 14-Lead Ceramic Dual In-line with Window (JW) – 300 mil Body (CERDIP) ........................................ 9 16-Lead Ceramic Dual In-line (JE) – 300 mil Body (CERDIP) ............................................................ 10 18-Lead Ceramic Dual In-line with Window (JW) – 300 mil Body (CERDIP) ...................................... 11 20-Lead Ceramic Dual In-line with Window (JW) – 300 mil Body (CERDIP) ...................................... 12 24-Lead Ceramic Dual In-line (JG) – 600 mil Body (CERDIP)............................................................ 13 28-Lead Ceramic Dual In-line (JJ) – 600 mil Body (CERDIP)............................................................. 14 28-Lead Ceramic Dual In-line with Window (JW) – 300 mil Body (CERDIP) ...................................... 15 28-Lead Ceramic Dual In-line with Window (JW) – 600 mil Body (CERDIP) ...................................... 16 40-Lead Ceramic Dual In-line (JK) – 600 mil Body (CERDIP) ............................................................ 17 40-Lead Ceramic Dual In-line with Window (JW) – 600 mil Body (CERDIP) ...................................... 18 CERAMIC CHIP CARRIER (CERQUAD) FAMILY 68-Lead Ceramic Leaded (CL) Chip Carrier with Window – Square (CERQUAD) ............................. 19 84-Lead Ceramic Leaded (CL) Chip Carrier with Window – Square (CERQUAD) ............................. 20 SMALL OUTLINE TRANSISTOR FAMILY 3-Lead Plastic Transistor Outline (TO) (TO-92) ..................................................................................21 3-Lead Plastic Small Outline Transistor Header (MB) (SOT-89)......................................................... 22 5-Lead Plastic Small Outline Transistor Header (MT) (SOT-89) ......................................................... 23 5-Lead Plastic Transistor Outline (AB) (TO-220).................................................................................24 5-Lead Thin Small Outline Transistor (OS) (TSOT) ............................................................................ 25 3-Lead Plastic Small Outline Transistor (TT) (SOT-23)....................................................................... 26 3-Lead Plastic Small Outline Transistor (TT) (SOT-23A) .................................................................... 27 5-Lead Plastic Small Outline Transistor (OT) (SOT-23) ...................................................................... 28 6-Lead Plastic Small Outline Transistor (CH or OT) (SOT-23)............................................................ 29 3-Lead Plastic Small Outline Transistor (LB) (SC-70)......................................................................... 30 5-Lead Plastic Small Outline Transistor (LT) (SC-70) ......................................................................... 31 Leadless Wedge Module Plastic Small Outline Transistor (WM) (SOT-385) ...................................... 32 DOUBLE DECA-WATT PACKAGE (DDPAK) FAMILY 3-Lead Plastic (EB) (DDPAK).............................................................................................................. 33 5-Lead Plastic (ET) (DDPAK).............................................................................................................. 34 7-Lead Plastic (EK) (DDPAK).............................................................................................................. 35 © 2005 Microchip Technology Inc. DS00049AC-page iii M Packaging Index PLASTIC DUAL IN-LINE (PDIP) FAMILY 8-Lead Plastic Dual In-line (P) – 300 mil Body (PDIP).........................................................................36 14-Lead Plastic Dual In-line (P) – 300 mil Body (PDIP)....................................................................... 37 16-Lead Plastic Dual In-line (P) – 300 mil Body (PDIP)....................................................................... 38 18-Lead Plastic Dual In-line (P) – 300 mil Body (PDIP)....................................................................... 39 20-Lead Plastic Dual In-line (P) – 300 mil Body (PDIP)....................................................................... 40 24-Lead Plastic Dual In-line (P) – 600 mil Body (PDIP)....................................................................... 41 24-Lead Skinny Plastic Dual In-line (SP) – 300 mil Body (PDIP) ........................................................ 42 28-Lead Skinny Plastic Dual In-line (SP) – 300 mil Body (PDIP) ........................................................ 43 28-Lead Plastic Dual In-line (P) – 600 mil Body (PDIP)....................................................................... 44 40-Lead Plastic Dual In-line (P) – 600 mil Body (PDIP)......................................................................
Recommended publications
  • Ceramic Leadless Chip Carrier (LCC)
    Ceramic,Leadless,Chip,Carrier,(L Ceramic Leadless Chip Carrier (LCC) Literature Number: SNOA023 Ceramic Leadless Chip Carrier (LCC) August 1999 Ceramic Leadless Chip Carrier (LCC) 20 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E20A © 2000 National Semiconductor Corporation MS101105 www.national.com 20 Lead Ceramic Leadless Chip Carrier NS Package Number EA20B Ceramic Leadless Chip Carrier (LCC) www.national.com 2 Ceramic Leadless Chip Carrier (LCC) 24 Lead Ceramic Leadless Chip Carrier NS Package Number E24B 28 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E28A 3 www.national.com 28 Lead Ceramic Leadless Chip Carrier, Dual Cavity NS Package Number EA028C Ceramic Leadless Chip Carrier (LCC) www.national.com 4 Ceramic Leadless Chip Carrier (LCC) 32 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E32A 32 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E32B 5 www.national.com 32 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E32C Ceramic Leadless Chip Carrier (LCC) 32 Lead Ceramic Leadless Chip Carrier, Type E NS Package Number EA32B www.national.com 6 Ceramic Leadless Chip Carrier (LCC) 32 Lead Ceramic Leadless Chip Carrier, DIP NS Package Number EA32C 40 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E40A 7 www.national.com 44 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E44A Ceramic Leadless Chip Carrier (LCC) 48 Lead Ceramic Leadless Chip Carrier NS Package Number EA48B www.national.com 8 Ceramic Leadless Chip Carrier (LCC) 68 Lead Ceramic
    [Show full text]
  • Quad Flat No-Lead (QFN) Evauation Test
    National Aeronautics and Space Administration Quad Flat No-Lead (QFN) Evaluation Testing Reza Ghaffarian, Ph.D. Jet Propulsion Laboratory Pasadena, California Jet Propulsion Laboratory California Institute of Technology Pasadena, California 6/17 National Aeronautics and Space Administration Quad Flat No-Lead (QFN) Evaluation Testing NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Success Reza Ghaffarian, Ph.D. Jet Propulsion Laboratory Pasadena, California NASA WBS: 724297.40.43 JPL Project Number: 104593 Task Number: 40.49.02.35 Jet Propulsion Laboratory 4800 Oak Grove Drive Pasadena, CA 91109 http://nepp.nasa.gov 6/17 This research was carried out at the Jet Propulsion Laboratory, California Institute of Technology, and was sponsored by the National Aeronautics and Space Administration Electronic Parts and Packaging (NEPP) Program. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise, does not constitute or imply its endorsement by the United States Government or the Jet Propulsion Laboratory, California Institute of Technology. Copyright 2017. California Institute of Technology. Government sponsorship acknowledged. Acknowledgments The author would like to acknowledge many people from industry and the Jet Propulsion Laboratory (JPL) who were critical to the progress of this activity including the Rochester Institute of Technology (RIT). The author extends his appreciation to program managers of the National Aeronautics and Space
    [Show full text]
  • Packaging Product Specification
    Packaging Product Specification PS007225-0607 Copyright ©2007 by ZiLOG, Inc. All rights reserved. www.zilog.com DO NOT USE IN LIFE SUPPORT Warning: LIFE SUPPORT POLICY ZiLOG'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS PRIOR WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF ZiLOG CORPORATION. As used herein Life support devices or systems are devices which (a) are intended for surgical implant into the body, or (b) support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the labeling can be reasonably expected to result in a significant injury to the user. A critical component is any component in a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system or to affect its safety or effectiveness. Document Disclaimer ©2007 by ZiLOG, Inc. All rights reserved. Information in this publication concerning the devices, applications, or technology described is intended to suggest possible uses and may be superseded. ZiLOG, INC. DOES NOT ASSUME LIABILITY FOR OR PROVIDE A REPRESENTATION OF ACCURACY OF THE INFORMATION, DEVICES, OR TECHNOLOGY DESCRIBED IN THIS DOCUMENT. ZiLOG ALSO DOES NOT ASSUME LIABILITY FOR INTELLECTUAL PROPERTY INFRINGEMENT RELATED IN ANY MANNER TO USE OF INFORMATION, DEVICES, OR TECHNOLOGY DESCRIBED HEREIN OR OTHERWISE. The information contained within this document has been verified according to the general principles of electrical and mechanical engineering. Z8, Z8 Encore!, Z8 Encore! XP, Z8 Encore! MC, Crimzon, eZ80, and ZNEO are trademarks or registered trademarks of ZiLOG, Inc.
    [Show full text]
  • Package Reliability As Affected by Material and Processes
    I,, '• Package Reliability as Affected By Materials and Processes The semiconductor industry is faced with the problem of how to increase the level of reliability of semiconductor parts being used in electronic systems which have had their lifetimes extended through new and.better system designs. By David Nixen, cussed, are all commercially availc1ble and presently The Aerospace Corporation, being used in high volume in industry. It is not the El Segundo, California intention of this article to present any new, revolu­ tionary packaging approach, but rather to compare the advantages and disadvantages of the major types The word "reliability" has been used in the semicon­ as they relate to reliability. uuctor industry over the years in every imaginable The actual choice of which package to use will not way. It may refer to why the cost is so high, the be presented here since that choice is too highly delivery so late, the documentation so voluminous, dependent upon the unique conditions of each indi­ or, it may be why the system is successful. When vidual case. discussed in the true sense of the word, perhaps reliability has no greater importance than in aero­ PACKAGE FAMILIES ,, , space systems. The basic package families are divided into three Until this year, a spacecraft system had a projected groups; these three groups, in turn, can be subdivid­ life of three to five years. Since an orbiting system ed and they, in turn, can also be subdivided. Only cannot be considered in a "repair/replace" categoryr the major families will be discussed, although some a component was required to have an extremely high of the subdivisions will be acknowledged.
    [Show full text]
  • LM117/LM317A/LM317 3-Terminal Adjustable Regulator
    LM117/LM317A/LM317 3-Terminal Adjustable Regulator July 2004 LM117/LM317A/LM317 3-Terminal Adjustable Regulator General Description age, supplies of several hundred volts can be regulated as long as the maximum input to output differential is not ex- The LM117 series of adjustable 3-terminal positive voltage ceeded, i.e., avoid short-circuiting the output. regulators is capable of supplying in excess of 1.5A over a Also, it makes an especially simple adjustable switching 1.2V to 37V output range. They are exceptionally easy to regulator, a programmable output regulator, or by connecting use and require only two external resistors to set the output a fixed resistor between the adjustment pin and output, the voltage. Further, both line and load regulation are better than LM117 can be used as a precision current regulator. Sup- standard fixed regulators. Also, the LM117 is packaged in plies with electronic shutdown can be achieved by clamping standard transistor packages which are easily mounted and the adjustment terminal to ground which programs the out- handled. put to 1.2V where most loads draw little current. In addition to higher performance than fixed regulators, the For applications requiring greater output current, see LM150 LM117 series offers full overload protection available only in series (3A) and LM138 series (5A) data sheets. For the IC’s. Included on the chip are current limit, thermal overload negative complement, see LM137 series data sheet. protection and safe area protection. All overload protection circuitry remains fully functional even if the adjustment ter- minal is disconnected. Features Normally, no capacitors are needed unless the device is n Guaranteed 1% output voltage tolerance (LM317A) situated more than 6 inches from the input filter capacitors in n Guaranteed max.
    [Show full text]
  • Package Information
    PACKAGE INFORMATION Package Thermal Characteristics This document provides test information about the has one site, with minimal exposed copper area. standard packages offered by Allegro MicroSystems. Where two values are shown in this column, it in- The data given is intended as a general reference only dicates that the printed circuit board has multiple and is based on certain simplifications such as con- sites, each having a different amount of exposed stant chip size and standard bonding methods. copper foil. The ground leads (power tabs) of the devices are connected to these areas of copper To use this document, in the Allegro Package Code foil. The two results shown indicate the highest column, locate the package designator for the device. and the lowest test results. To locate package variants, use the JEDEC Package Note that the paired results are text hyperlinks to Outline column to locate the corresponding JEDEC other Web pages. Click the text to open the linked designator, or use the Quantity and Type of Terminals page, which provides information on the test and column to locate the variant by the configuration of printer circuit board layout, as well as intermedi- terminals. ate test results. Three columns of results are presented: • R , R , R . This column provides results θJC θJP θJT on other thermal dissipation paths: • RθJA High K. This test is performed using a high thermal conductivity, mutlilayer printed circuit RθJC [c] Through the device case. board that closely approximates those specified RθJP [p] Through the exposed thermal pad see in JEDEC standard JEDEC51-7 (surface-mount Application Note 26020, Procedure for Mea- devices), JEDEC51-5 (for exposed thermal suring Pad-to-Ambient Thermal Resistance pads), or JEDEC51-10 (through-hole devices).
    [Show full text]
  • Lm317mdt/Nopb
    Distributed by: www.Jameco.com ✦ 1-800-831-4242 The content and copyrights of the attached material are the property of its owner. LM117/LM317A/LM317 3-Terminal Adjustable Regulator June 2006 LM117/LM317A/LM317 3-Terminal Adjustable Regulator General Description age, supplies of several hundred volts can be regulated as long as the maximum input to output differential is not ex- The LM117 series of adjustable 3-terminal positive voltage ceeded, i.e., avoid short-circuiting the output. regulators is capable of supplying in excess of 1.5A over a Also, it makes an especially simple adjustable switching 1.2V to 37V output range. They are exceptionally easy to regulator, a programmable output regulator, or by connecting use and require only two external resistors to set the output a fixed resistor between the adjustment pin and output, the voltage. Further, both line and load regulation are better than LM117 can be used as a precision current regulator. Sup- standard fixed regulators. Also, the LM117 is packaged in plies with electronic shutdown can be achieved by clamping standard transistor packages which are easily mounted and the adjustment terminal to ground which programs the out- handled. put to 1.2V where most loads draw little current. In addition to higher performance than fixed regulators, the For applications requiring greater output current, see LM150 LM117 series offers full overload protection available only in series (3A) and LM138 series (5A) data sheets. For the IC’s. Included on the chip are current limit, thermal overload negative complement, see LM137 series data sheet. protection and safe area protection.
    [Show full text]
  • 8 Evolutionary Advances in Conventional Packaging
    EVOLUTIONARY ADVANCES IN 8 CONVENTIONAL PACKAGING TECHNOLOGIES ÒEven if youÕre on the right track, youÕll get run over if you just sit there.Ó Ñ Will Rogers A very efficient design and manufacturing strategy has evolved in the past 50 years upon which virtually all electronic products are based. There may be significant differences in the outer form factors and other weighing factors of electronics-based products, but all such systems are based on integrated circuit chips, interconnected in a hierarchy of modules up to the complete system. Though there is often more than one ÒrightÓ way to design a system that results in a particular form factor and performance level, a well defined strategy has evolved over the years that stan- dardizes many aspects of the technology to reduce manufacturing costs and time to market. The various levels in this interconnection scheme are diagrammed in Figure 8-1. They consist of the following stages: level 1: from the die, typically into a single chip package level 1.5: from the die to a substrate that could be part of an MCM or wire bonded to a substrate as chip on board (COB) or flip chip attached to a substrate as direct chip attach (DCA) level 2: from the package to the substrate, or MCM to the substrate level 3: from the board to the backplane or from the daughter card to the motherboard level 4: from the backplane to other backplanes in a cabinet level 5: from one cabinet to others with cabling Every electrical system can be broken up into these interconnect levels with a distinct interface between each.
    [Show full text]
  • Standard Package Outlines
    Each Atmel datasheet includes an Ordering Information Section which specifies the package types available. This section provides size specifications and outlines for all package types.(1) Package Description See Page 32A 32-lead, Low-profile (1.4 mm) Plastic Quad Flat Package (LQFP) . .5 44A 44-lead, Thin (1.0 mm) Plastic Quad Flat Package (TQFP) . .5 48A 48-lead, Low Profile (1.4) Plastic Quad Flat Package (LQFP) . .5 Standard 64A 64-lead Thin (1.0 mm) Plastic Quad Flat Package (TQFP) . .5 Package 100A 100-lead, Thin (1.0 mm) Plastic Quad Flat Package (TQFP). .6 144A 144-lead, Low Profile (1.4 mm) Plastic Outlines Quad Flat Package (LQFP) . .6 32B 32-lead, 0.600" Wide, Ceramic Side Braze Dual Inline (Side Braze) . .6 40B 40-lead, 0.600" Wide, Ceramic Side Braze Dual Inline (Side Braze) . .6 352B 352-ball Ball Grid Array (BGA) . .7 432B 432-ball Ball Grid Array (BGA) . .7 8C 8-lead,0.230" Wide, Leadless Array Package (LAP) . .7 8C1 8-lead,0.300" Wide, Leadless Array Package (LAP) . .7 14C1 14-ball (3 x 5 array) 1.0 mm Pitch, 4.5 x 7.0 mm Plastic Chip-Scale Ball Grid Array (CBGA) . .8 24C1 24-ball, Plastic Chip-Size Ball Grid Array Package (CBGA). .8 24C2 24-ball, Plastic Chip-Size Ball Grid Array Package (CBGA). .8 24C3 24-Ball (5 x 5 array), 1.0 mm Pitch, Plastic Chip-scale Ball Grid Array (CBGA). .8 42C1 42-ball, Plastic Chip-Size Ball Grid Array Package (CBGA). .9 42C2 42-ball, Plastic Chip-Size Ball Grid Array Package (CBGA).
    [Show full text]
  • Appendix A* Surface Mount Standards
    Appendix A* Surface Mount Standards This appendix lists various standards, specifications, and guidelines that have an impact on surface mount technology from U.S. and international • bodies, including the U.S. Department of Defense, although DoD is now committed to using industry standards. These documents can be obtained from the following sources: • INSTITUTE FOR INTERCONNECTING AND PACKAGING ELECTRONIC CIRCUITS (IPC): 2215 Sanders Road, Northbrook, IL 60062-6135 Telephone 847-509-9700; FAX 847-509-9798 • ELECTRONIC INDUSTRIES ASSOCIATION (EIA) 2001 Pennsylvania Avenue, NW Washington, D.C. 20006-1813 Telephone 703-907-7500; FAX 703-907-7501 • GLOBAL ENGINEERING DOCUMENTS 2805 McGaw Avenue, Irvine, CA 92713 Telephone: 800-854-7179; FAX 314-726-6418 Military documents are available from: • STANDARDIZATION DOCUMENTS Order Desk, Building 4D, 700 Robbins Avenue, Philadelphia, PA 19111-5094 Telephone 215-697-2667 Central office of the IEC: *Adapted from Surface Mount Council Status of the Technology, Industry Activities and Action Plan, September 8-12, 1996, available from IPC. 726 Appendix A • INTERNATIONAL ELECTROTECHNICAL COMMISSION (1EC) Rue de Varembe, 1211 Geneva 20, Switzerland lEe documents are also available from: • AMERICAN NATIONAL STANDARDS INSTITUTE (ANSI) 11 West 42nd Street, New York, NY 10036 The letter prefix of each document indicates the organization responsible for that document: EIA Electronic Industries Association JEDEC Joint Electron Devices Engineering Council of the EIA IPC Institute for Interconnecting and Packaging
    [Show full text]
  • On Single Chip Package for Dual-In Integrated Circuit Packages Called Marriage IC with Switch Tests Simulation
    EasyChair Preprint № 5850 On Single Chip Package for Dual-In Integrated Circuit Packages Called Marriage IC With Switch Tests Simulation. Frank Appiah EasyChair preprints are intended for rapid dissemination of research results and are integrated with the rest of EasyChair. June 18, 2021 Circuit and System Reference. ****1*** On Single Chip Package for Dual-In Integrated Circuit Packages Called Marriage IC With Switch Tests Simulation. Frank Appiah1, Professional Abstract. This is about creating a single ic or chip or microchip package on two embedded circuits with their own chip package. This called MarriageIC is shown in article [3] but the main focus here is to switch test the interconnection to functional check the Logic. Keywords. Single ic, package, Dual-In, switching test, digital ic. 1 Introduction Making note of the various integrated circuit component package types and how they are protected (with metal shielding or encapsulation, for example) is helpful. Some packages allow easy access to the pins in order to probe the device, such as with Dual Inline Package (DIP), Small Outline Integrated Circuit (SOIC), or Plastic Leadless Chip Carrier (PLCC). As the spacing of the pins becomes more dense-as with Thin Shrink Small Outline Package (TSSOP), probing individual pins becomes more difficult without using high-quality probes or a test clip/adapter such as one provided from Emulation Technology (www.emulation.com). 1 Dr. Frank Appiah is with King's College London, King's Engineers Group Oversea. Contact at [email protected]. 2021. Circuit and System Reference. ****2*** Ball Grid Array (BGA) packaging has all of the device leads located underneath the chip, making it extremely difficult to access the inner pins.
    [Show full text]
  • Of Components, Packaging and Manufacturing Technology
    50Years of Components, Packaging and Manufacturing Technology IEEE CPMT Society 445 Hoes Lane, PO Box 1331 Piscataway, NJ 08855 telephone: +1 732 562 5529 fax: +1 732 981 1769 email: [email protected] IEEE History Center Rutgers University 39 Union Street New Brunswick, NJ 08901 telephone: +1 732 932 1066 fax: +1 732 932 1193 email: [email protected] ® IEEE 50 YEARS of COMPONENTS, PACKAGING, AND MANUFACTURING TECHNOLOGY The IEEE CPMT Society and its Technologies 1950 - 20 0 0 Contents 1950s ..............................................................................................2-6 Acknowledgements • Components and the Search for Reliability Many people gave • AIEE, IRE, EIA Symposium on Improved unstintingly of their Quality Electronic Components time and expertise to • Dummer’s Prediction help with this project. • Standards • Formation of IRE Professional Group on Component Parts My special thanks go to • Circuit Board Developments Jack Balde, Ron Gedney, • Miniaturization, Heat Dissipation, Hybrid Technologies Charles Eldon, Mauro 1960s.............................................................................................7-13 Walker, and Paul Wesling • IRE Professional Group on Product Engineering and Production for their insights; Dimitry • Commercial Applications Grabbe, who provided • Increasing Density on the Circuit Board access to his first-class • Pure Molding Compounds components collection; • VLSI Workshops and Gus Shapiro, who • Hybrid Circuit • Darnell Report on Reliability shared early material • Telstar on the
    [Show full text]