<<

Part 2: Plasmonic Motivation – Device densities

www. intel.com ¾ Device densities are exponentially increasing Why not electronics?

As data rates AND component packing densities INCREASE, electrical interconnects become progressively limited by RC-delay:

A L

1 A R ∝ L / A ⊕ C ∝ L ⇒ B ∝ ∝ max RC L2 A ⇒ B ≤ 1015 × (bit/s)(A << L2 !) max L2

Electronics is aspect-ratio limited in speed! Why not ?

The bit rate in optical communications is fundamentally limited

only by the carrier frequency: Bmax < f ~ 100 Tbit/s (!), but light propagation is subjected to diffraction:

core

aπ λ cladding δ λ 2π 2π n = n + n = n +δn ⇒ V = a n2 δ− n2 ≅ a 2δn n core clad core clad λ well − guided mode : V ∝ ⇒ a ≅ / 2 2n n − mode size : δn<<1(!)

Photonics is diffraction- limited in size! Metal : An Introduction Majority of optical components based on dielectrics • High speed, high bandwidth (ω), but… • Does not scale well Needed for large scale integration Problems

Bending losses Diffraction Limit

nCLAD nCORE

Optical mode in > λ0/2nCORE

Solutions ?

Some fundamental problems!

Some: Photonic functionality based on metals?!

J. D. Joannopoulos, et al, , vol.386, p.143-9 (1997) Nanophotonics with : A logical next step?

• The operating speed of data transporting and processing systems

Photonics (μm-scale structures ~ 1μm) 1T Plasmonics?(nm-scale structures) DWDM WDM CMOS Electronics 1G 130 nm Coaxial circuits 1.8 μm 1M

Transcontinental cable Communication networks 1k Telephone

Operating speed (Hz) speed Operating CMOS Electronics Plasmonics Telegraph 1 1825 1850 1875 1900 1925 1950 1975 2000 2025 2050 Time

Š The ever-increasing need for faster information processing and transport is undeniable

ŠElectronic components are running out of steam due to issues with RC-delay times Motivation – nm scale THz speed

Speed ?? Photonics nm, THz THz, µm

Electronics nm, GHz Device size

¾ Something with best of both worlds? Why nanophotonics needs plasmons?

Courtesy of M. Brongersma Optical Properties of an Electron Gas (Metal) Dielectric constant of a free electron gas (no interband transitions)

• Consider a time varying field: EE(tit)=−Re{ (ωω) exp( )} d 2r • Equation of motion electron (no damping) me2 = − E 2 dt d p 2 me2 = E • Dipole moment electron pr(tet)=− () dt

• Harmonic time dependence pp(tit)=−Re{ (ω) exp( ω )}

• Substitution p into Eq. of motion: −=meω 22pE(ωω) ( ) e2 1 • This can be manipulated into: pE()ω =− ω2 ()ω εχ m 2 2 Np(ω) Ne 1 ω p • The dielectric constant is: r =+111 = =−22 =− ε 00E()ωεωωm

ε r ω ωp Dispersion Relation for EM Waves in Electron Gas Determination of dispersion relation for bulk plasmons ε ∂2 Er( ,t) • The wave equation is given by: r =∇2 E ()r,t c22∂t • Investigate solutions of the form: Er( ,Re,exptiit)=⋅−{ Er( ωω) ( kr )}

222 ωεr = ck ωωω2 2 22222⎛⎞ωp ω p ⎜⎟1−=−=ck • Dielectric constant: ε =−1 ⎜⎟2 p r ω 2 ⎝⎠ω ωω=+222ck • Dispersion relation: ω p ω = ck

ωp

No allowed propagating modes (imaginary k) k Note1: Solutions lie above line

Note2: Metals: ħωp ≈ 10 eV; ħωp < 0.5 eV (depending on dopant conc.) Plasmon-Polaritons What is a plasmon ?

• Compare electron gas in a metal and real gas of molecules

• Metals are expected to allow for electron density waves: plasmons Bulk plasmon • Metals allow for EM wave propagation above the plasma frequency They become transparent! z E Strong local field Dielectric

Metal I H Note: This is a TM wave

• Sometimes called a surface plasmon-polariton (strong coupling to EM field) Local Field Intensity Depends on

z z

D << λo

I I

Long wavelength Short wavelength

Characteristics plasmon-polariton • Strong localization of the EM field • High local field intensities easy to obtain

Applications: • Guiding of light below the diffraction limit (near-field optics) • Non-linear optics • Sensitive optical studies of surfaces and interfaces •Bio-sensors • Study film growth •…… Dispersion Relation Surface-Plasmon Polaritons

Plot of the dispersion relation ω 1/2 ⎛⎞εεmd • SPP dispersion: kx = ⎜⎟ c ⎝⎠εεmd+ ε r • Plot dielectric constants ε dielectric d metal ω ω p −ε d ω sp

ωω 1/2 ⎛⎞εε ω md k = ε d •Low ω: kx =≈⎜⎟ ε d cclim c εm →−∞ ⎝⎠εεmd+ ω ωsp

•At ω = ωsp (when εm = -εd): kx →∞

• Note: Solution lies below the light line k Why Plasmonics?

ω ε mε d D k sp = c ε m + ε d λsp E εd > 0 Dispersion Relation for SPPs: - - -+ + + - - - + + + εm < 0 H

optical ω nm-scale λ

ε md()ωεω≈ − ()

λp ~ very small

SP can reach nanoscale at optical frequencies! SPPs are “x-ray waves” with optical frequencies Dispersion Relation Surface-Plasmon Polaritons

Dispersion relation plasma modes and SPP

Metal/air ωSP, Air ω Metal/dielectric with εd SP,ε d

• Note: Higher index medium on metal results in lower ωsp ω 2 ω 2 ω ω ωp 22 2 2 p p ω = ωsp when:ε md=−1 2 =−ε ω −=−ωεωpd ω = = 1+ ε d 1+ ε d Excitation Surface-Plasmon Polaritons (SPPs) with Light Problem SPP modes lie below the light line • No coupling of SPP modes to far field and vice versa (reciprocity theorem) • Need a “trick” to excite modes below the light line Trick 1: Excitation from a high index medium

• Excitation SPP at a metal/air interface from a high index medium n = nh ω ω c ω = c = k knh ωsp

ωe kh > ksp

k Air ksp kh k • SPP at metal/air interface can be excited from a high index medium! • How does this work in practice ? Excitation Surface-Plasmon Polaritons with Light

Kretchmann geometry (Trick 1) From dispersion relation ksp

• Makes use of SiO2 prism k

//,SiO2 • Create evanescent wave by TIR θ k • Strong coupling when k to k SiO2 //,SiO2 sp E H • Reflected wave reduced in intensity

ω ω c ω = c = k kn ωsp

ωe

k k k Note: we are matching energy and momentum Air ksp SiO2 Surface-Plasmon is Excited at the Metal/Air Interface Kretchmann geometry

k spAir, • Makes use of SiO2 prism k spSiO, Θ 2 • Enables excitation surface plasmons k at the Air/Metal interface SiO2 E H • Surface plasmons at the metal/glass interface can not be excited!

ω Light line air Light line glass

ω spAIR, Surface plasmon Metal/Air interface ω s pSiO, 2 Surface plasmon Metal/Glass interface ω e ω kk= εθsin = //,SiO2 dc sp k k Air k SiO k 2 spSiO, 2 k s pAir, Quantitative Description of the Coupling to SPP’s Calculation of reflection coefficient d • Solve Maxwell’s equations for 2 1 • Assume plane polarized light 0

• Find case of no reflection E H D

2 2 E p rrpp+ exp() 2 ikd • Solution (e.g. transfer matrix theory! ) R ==r 01 12z 1 ppp() Errikd0011211exp2+ z

Plane polarized light p p ⎛⎞⎛⎞kkzi zk kk zi zk where r ik are the amplitude reflection coefficients rik =−⎜⎟⎜⎟ + ⎝⎠⎝⎠εikεεε ik Also known as Fresnel coefficients (p 95 optics, by Hecht)

Notes: Light intensity reflected from the back surface depends on the film thickness There exists a film thickness for perfect coupling (destructive interference between two refl. beams) When light coupled in perfectly, all the EM energy dissipated in the film) Dependence on Film Thickness

Critical angle

R E Θ H

detector θ

Raether, “Surface plasmons”

• Width resonance related to damping of the SPP • Light escapes prism below critical angle for total internal reflection • Technique can be used to determine the thickness of metallic thin films Quantitative Description of the Coupling to SPP’s Intuitive picture: A resonating system ε r ' metal • When ε m >> 1 …well below ωsp: ω s p ω ω p − ε d

'' ' • and ε mm<< ε …low loss…

Reflection coefficient has Lorentzian line shape (characteristic of resonators) R 4Γ Γ 1 R =−1 irad 2 2 ⎡⎤0 Γi + Γrad ()kkxx−+Γ+Γ() i rad ⎣⎦⎢⎥0 0 kx kx Where Γi : Damping due to resistive heating Γrad: Damping due to re-radiation into the prism 0 : The resonance wave vector (maximum coupling) kx

Note: R goes to zero when Γi = Γrad Current Use of the Surface Plasmon Resonance Technique Determination film thickness of deposited films • Example: Investigation Langmuir-Blodget-Kuhn (LBK) films

Critical angle Reflectance

Incident Angel (degree) • Coupling angle strongly dependent on the film thickness of the LBK film • Detection of just a few LBK layers is feasible Hiroshi Kano, “Near-field optics and Surface plasmon Polaritons”, Springer Verlag Surface Plasmon Sensors

Advantages • Evanescent field interacts with adsorbed molecules only

• Coupling angle strongly depends on εd • Use of well-established surface chemistry for Au (thiol chemistry)

http://chem.ch.huji.ac.il/~eugeniik/spr.htm#reviews Imaging SPP waves

• Near-field optics is essential

• Tip “taps” into the near-field Purdue Near-Field Optical Microscope

• Nanonics MultiView 2000 •NSOM / AFM • Tuning Fork Feedback Control – Normal or Shear Force • Aperture tips down to 50 nm • AFM tips down to 30 nm • Radiation Source – 532 nm Picture taken from Nanonics Excitation Surface-Plasmon Polaritons with Gratings (trick 2)

Grating coupling geometry (trick 2) •Bloch: Periodic dielectric constant couples waves for which the k-vectors differ by a reciprocal lattice vector G • Strong coupling occurs when kkG= ± m //,SiO2 sp E

ω H where: k ==k ε sinθ k θ //,SiO2 e d c e ω 1/2 k//,SiO ksp P ⎛⎞εεmd 2 ksp = ⎜⎟ c ⎝⎠εεmd+ G = 2π P ω ω = c • Graphic representation k ωsp

ωe

2π 2π − k//,SiO k// P 2 P Excitation Surface-Plasmon Polaritons with Dots (Trick 3)

Dipolar radiation pattern

E

d = 200nm

h = 60nm

E 700 nm E-fields

• Strong coupling: kk= ±Δk //,SiO2 sp dot Radiation Spatial of the dot contains • Dipole radiation in direction of charge oscillation! significant contributions of Δkdot values upto 2π/d H. Ditlbacher, Appl. Phys. Lett. 80, 404 (2002) • Reason: Plasmon wave is longitudinal Excitation SPPs on stripes with d < λ Excitation using a launch pad

Atomic Force Microscopy image

200 nm

Al

Near Field Optical Microscopy image

End stripe

Note oscillations

J.R. Krenn et al., Europhys.Lett. 60, 663-669 (2002) 2D Metallo-dielectric Photonic Crystals

Full photonic bandgap for SPPs Scanning Electron Microscopy image (tilted) • Hexagonal array of metallic dots

metal glass

300 nm

300 nm

S.C. Kitson, Phys Rev Lett. 77, 2670 (1996) ω ω =c k • Array causes coupling between waves ωsp for which:

Gap ωe Gap ksp = π/P or λsp=2π/ksp= 2P

• Gap opens up at the zone boundary 2π π π 2π − − k// P P P P Guiding SPPs in 2D metallo-dielectric Photonic Crystals

Guiding along line defects in hexagonal arrays of metallic dots (period 400 nm) • Scanning electron microscopy images Linear guides Close-up Y-Splitter

• SPP is confined to the plane • Full photonic bandgap confines SPP to the line defect created in the array

S.I. Bozhevolnyi, Phys Rev Lett. 86, 3008 (2001) Guiding SPPs in 2D metallo-dielectric Photonic Crystals First results • Scanning electron microscopy images

Atomic Force Microscopy image Near-field Optical Microscopy image

Dot spacing: d = 380 nm

Excitation: λe = 725 nm SPP: λsp = 760 nm = 2d

S.I. Bozhevolnyi, Phys Rev Lett. 86, 3008 (2001) Intermediate Summary Coupling light to surface plasmon-polaritons ω • Kretchman geometry kk//,SiO= εθ dsin = sp 2 c E Θ H • Grating coupling kkG//,Air= sp ± m

• Coupling using a metal dot (sub-λ structure)

Guiding geometries • Stripes and wires

• Line defects in hexagonal arrays (2d photonic crystals)

• Next lecture: arrays Guiding of light along an array of Au ?

● Near field optical excitation ● SEM of array of 50 nm Au particles

λ = 600 nm, ω = 3.1x1015 rad/s

600 nm

d = 75 nm

● Light and are electromagnetic waves described by Maxwell’s equations

S.A. Maier, M.L. Brongersma H.A. Atwater, Appl. Phys. Lett. 78, 16, 2001

EM Near-field Interaction between Nanoparticles

- - - - 50 nanometer- Au, Ag, or Cu particle ------

- - -

E field -

------

+ ++ + ++ - + ++ + ++

+ + + + + +

+ + +

+ + ++ + + + + +

+ +

+ + + + + + + +

+ + + +

------+

------

- - -

- -

+

+

+ + +

- -

Mode size << - - λ -

+ +

+ + +

● Light can penetrate metallic nanoparticles and set the electrons in motion ● This collective electron motion is called a plasmon ● Plasmonics: Guiding “light” along metallic nanostructures ● Loss per unit length ≈ 3 dB/μm …. Loss per device may be manageable Excitation of a Single Metal Nanoparticle

Energy (eV) 4 3.5 3 2.5 2 1.5 500 R = 5 nm Ag cluster Particle 400 D = 10 nm ) Volume = V ) n=3.3 2 0 2 300 n=1.5 εM = ε1,M + iε2,M (nm

(nm abs

ext 200 σ E-field σ 1 ++++ + 100

-- - -- σω0 ε 300 400ω 500 600 700 800 900 Host matrix λ (nm) 2 εH = ε1,H = nH εω( ) ()= 9 3/2V 1,M absc H 0 ()2 ()2 ⎣⎦⎡⎤ε1,MHMωε++2 εω 2,

G. Mie Ann. Phys. 25, 377 (1908) Origin Enhanced Absorption Cross-section

Poynting vector Energy flux (Poynting vector) for a plane wave incident on a metallic nanoparticle

Off resonance On resonance

σabs

C. F. Bohren, D. R. Huffman, Absorption and Scattering of Light by Small Particles, Wiley, New York 1983 Properties of a Chain of Metal Nanoparticles

pm d

••••• m-3 m-2 m-1 m m+1 m+2 m+3 m+4 m+5 •••••

• Near-field interaction sets up dipole (plasmon) waves • Two types: Transverse (T) & Longitudinal (L) modes

• Interaction strength related to dipole field EP

-3 EP= EF + EM + ER Where EF ∝ R Förster field -2 EM ∝ R -1 ER ∝ R Radiation field When d << λ Förster field dominant Ö n.n. interaction dominates Dispersion Relation for Plasmon Modes

Equation of motion of dipole at m: ω •• 2 γ 2 p i,m ()t = − 0 pi,m t − ()iω1 []pi,m−1 t + pm+1 ()t () ω 2 ρVe Where = 1 πε 23 p p 4 0emnd T,m T,m+1 γT = 1: γ≡ a polarization dependent constant

γL = -2: pL,m pL,m+1

Propagating wave solution: pi,m (t )= Pi exp i(ωt ± kmd ) Dispersion Relation for Plasmon Modes

2 ω ω ω1 ω0 + 2 ω 2 ω0 ω Transverse γ 1 = 0 + i cos()kd ω 0 ω0 ω 2 ρVe Where 1 = 23

πε 2 4 0mnde ω1 ω ω0 - 2 ω0 ω 2 Longitudinal d γ 1 v g,i = = − i d sin()kd dk ω0

-π -π π 0 π d 2d 2d d k

6 Example: Ag particles, R = 10 nm vg,T = 3.4 x 10 m/s Ö 14 -1 d = 40 nm; n = 1.5 ΔωT= 1.8 x 10 s (E = 115 meV) Propagation Through Corners

IN ω T L T ωo

L

π π OUT − 0 d k d

Calculation of power transmission coefficient, ηT (ω, pol): • Continuity amplitude of plasmon wave • Continuity energy flux in plasmon wave

Maximum ηT at ω0 SEM Images of Nanoparticle Arrays

50 nm

• Array of 50 nm diameter Au dots spaced by 75 nm • Good control over particle size, shape, interparticle spacing The Future of Metal Optics Photonics • Basic building blocks *

1 μm • More complex architectures

• Applications in biology for “Optical microscopy” ?

• Applications in high-density optical data storage ?

• Fundamental studies of light-matter interaction

* R.M. Dickson et al., J. Phys. Chem. B 104, 6095-6098 (2000) Conceptual Si photonic chip

Y. A. Vlasov, IBM Si switch

Y. A. Vlasov, et al, Nature, 2005 ¾ PC based Mach-Zehnder interferometer Fiber to Si-PC coupling

Y. A. Vlasov, et al, Opt. Express, 2003 ¾ There can be 30dB loss due to geometrical mismatch ¾ Specialized fiber to Si coupling using polymer based coupler Si-PC switch operation

Y. A. Vlasov, et al, Nature, 2005

¾ Use thermo-optic effect to modulate transmission ¾ Switching speed ~ 100ns (~10MHz) ¾ Power ~ 1mW (~105 devices for 100W) Controlling light with light

M. F. Yanik, et al, Opt. Lett., 2003 ¾ Two crossing PC ¾ Use Kerr nonlinearity to control the signal ¾ All-optical transistor operation Optical bistability behavior

M. F. Yanik, et al, Opt. Lett., 2003 ¾ Transistor and memory operation ¾ Coupling to the fiber can be done as earlier Optical transistor operation

¾ Size ~ µm2 ¾ Power ~ mW (~105 devices for 100W) ¾ Speed ~ 10GHz Optical memory effect

M. F. Yanik, et al, Opt. Lett., 2003 ¾ Information can be latched • Nanoantenna: metal particles of nanometer scale, often paired

Hecht et al. Chimia, 2006 Jain et al. Nano Lett., 2007 Aizpurua et al. Phys. Rev. B, 2005

Fromm et al. Nano Lett., 2004

Søndergaard et al. Phys. Rev. B, 2007 • Applications of nanoantenna: sensors, NSOM, etc. Cubukcu et al. Appl. Phys. Lett., 2007 Farahani et al. Bergman, Stockman 2007 Phys. Rev. Lett., 2003 Fabrication and surface characterization

• Fabrication: – unit cell: 400 nm × 200 nm – Gold Thickness: 40 nm – Electron beam lithography

• Scanning electron microscopy (SEM) characterization – Major axis ~ 110 nm – Minor axis ~ 55 nm – Gap ~ 17 nm

• Atomic force microscopy (AFM) – Surface roughness ~ 1 nm Far-field spectra measurement

• Far-field transmittance and reflectance measurement: normal incidence, two polarizations – Primary polarization (P): electric field parallel to the major axis – Secondary polarization (N): electric field normal to the major axis

1 P N Tp k 0.5 Rp Tn Rn 0 400 600 800 wavelength (nm) Near field characteristics of nanoantenna

• Field enhancement: strongly localized in 3-D space Nanophotonics enabled by plasmonics

Courtesy of M. Brongersma