DRAM Terms and Glossary Rev 5A DIMM Dual In-Line Memory Module NF No Function, DNU, T 1T, 2T, 3T, Etc
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2GB DDR3 SDRAM 72Bit SO-DIMM
Apacer Memory Product Specification 2GB DDR3 SDRAM 72bit SO-DIMM Speed Max CAS Component Number of Part Number Bandwidth Density Organization Grade Frequency Latency Composition Rank 0C 78.A2GCB.AF10C 8.5GB/sec 1066Mbps 533MHz CL7 2GB 256Mx72 256Mx8 * 9 1 Specifications z Support ECC error detection and correction z On DIMM Thermal Sensor: YES z Density:2GB z Organization – 256 word x 72 bits, 1rank z Mounting 9 pieces of 2G bits DDR3 SDRAM sealed FBGA z Package: 204-pin socket type small outline dual in line memory module (SO-DIMM) --- PCB height: 30.0mm --- Lead pitch: 0.6mm (pin) --- Lead-free (RoHS compliant) z Power supply: VDD = 1.5V + 0.075V z Eight internal banks for concurrent operation ( components) z Interface: SSTL_15 z Burst lengths (BL): 8 and 4 with Burst Chop (BC) z /CAS Latency (CL): 6,7,8,9 z /CAS Write latency (CWL): 5,6,7 z Precharge: Auto precharge option for each burst access z Refresh: Auto-refresh, self-refresh z Refresh cycles --- Average refresh period 7.8㎲ at 0℃ < TC < +85℃ 3.9㎲ at +85℃ < TC < +95℃ z Operating case temperature range --- TC = 0℃ to +95℃ z Serial presence detect (SPD) z VDDSPD = 3.0V to 3.6V Apacer Memory Product Specification Features z Double-data-rate architecture; two data transfers per clock cycle. z The high-speed data transfer is realized by the 8 bits prefetch pipelined architecture. z Bi-directional differential data strobe (DQS and /DQS) is transmitted/received with data for capturing data at the receiver. z DQS is edge-aligned with data for READs; center aligned with data for WRITEs. -
Memory & Devices
Memory & Devices Memory • Random Access Memory (vs. Serial Access Memory) • Different flavors at different levels – Physical Makeup (CMOS, DRAM) – Low Level Architectures (FPM,EDO,BEDO,SDRAM, DDR) • Cache uses SRAM: Static Random Access Memory – No refresh (6 transistors/bit vs. 1 transistor • Main Memory is DRAM: Dynamic Random Access Memory – Dynamic since needs to be refreshed periodically (1% time) – Addresses divided into 2 halves (Memory as a 2D matrix): • RAS or Row Access Strobe • CAS or Column Access Strobe Random-Access Memory (RAM) Key features – RAM is packaged as a chip. – Basic storage unit is a cell (one bit per cell). – Multiple RAM chips form a memory. Static RAM (SRAM) – Each cell stores bit with a six-transistor circuit. – Retains value indefinitely, as long as it is kept powered. – Relatively insensitive to disturbances such as electrical noise. – Faster and more expensive than DRAM. Dynamic RAM (DRAM) – Each cell stores bit with a capacitor and transistor. – Value must be refreshed every 10-100 ms. – Sensitive to disturbances. – Slower and cheaper than SRAM. Semiconductor Memory Types Static RAM • Bits stored in transistor “latches” à no capacitors! – no charge leak, no refresh needed • Pro: no refresh circuits, faster • Con: more complex construction, larger per bit more expensive transistors “switch” faster than capacitors charge ! • Cache Static RAM Structure 1 “NOT ” 1 0 six transistors per bit 1 0 (“flip flop”) 0 1 0/1 = example 0 Static RAM Operation • Transistor arrangement (flip flop) has 2 stable logic states • Write 1. signal bit line: High à 1 Low à 0 2. address line active à “switch” flip flop to stable state matching bit line • Read no need 1. -
Fully-Buffered DIMM Memory Architectures: Understanding Mechanisms, Overheads and Scaling
Fully-Buffered DIMM Memory Architectures: Understanding Mechanisms, Overheads and Scaling Brinda Ganesh†, Aamer Jaleel‡, David Wang†, and Bruce Jacob† †University of Maryland, College Park, MD ‡VSSAD, Intel Corporation, Hudson, MA {brinda, blj}@eng.umd.edu Abstract Consequently the maximum number of DIMMs per channel in Performance gains in memory have traditionally been successive DRAM generations has been decreasing. SDRAM obtained by increasing memory bus widths and speeds. The channels have supported up to 8 DIMMs of memory, some diminishing returns of such techniques have led to the types of DDR channels support only 4 DIMMs, DDR2 channels proposal of an alternate architecture, the Fully-Buffered have but 2 DIMMs, and DDR3 channels are expected to support DIMM. This new standard replaces the conventional only a single DIMM. In addition the serpentine routing required for electrical path-length matching of the data wires becomes memory bus with a narrow, high-speed interface between the challenging as bus widths increase. For the bus widths of today, memory controller and the DIMMs. This paper examines the motherboard area occupied by a single channel is signifi- how traditional DDRx based memory controller policies for cant, complicating the task of adding capacity by increasing the scheduling and row buffer management perform on a Fully- number of channels. To address these scalability issues, an alter- Buffered DIMM memory architecture. The split-bus nate DRAM technology, the Fully Buffered Dual Inline Mem- architecture used by FBDIMM systems results in an average ory Module (FBDIMM) [2] has been introduced. improvement of 7% in latency and 10% in bandwidth at The FBDIMM memory architecture replaces the shared par- higher utilizations. -
Different Types of RAM RAM RAM Stands for Random Access Memory. It Is Place Where Computer Stores Its Operating System. Applicat
Different types of RAM RAM RAM stands for Random Access Memory. It is place where computer stores its Operating System. Application Program and current data. when you refer to computer memory they mostly it mean RAM. The two main forms of modern RAM are Static RAM (SRAM) and Dynamic RAM (DRAM). DRAM memories (Dynamic Random Access Module), which are inexpensive . They are used essentially for the computer's main memory SRAM memories(Static Random Access Module), which are fast and costly. SRAM memories are used in particular for the processer's cache memory. Early memories existed in the form of chips called DIP (Dual Inline Package). Nowaday's memories generally exist in the form of modules, which are cards that can be plugged into connectors for this purpose. They are generally three types of RAM module they are 1. DIP 2. SIMM 3. DIMM 4. SDRAM 1. DIP(Dual In Line Package) Older computer systems used DIP memory directely, either soldering it to the motherboard or placing it in sockets that had been soldered to the motherboard. Most memory chips are packaged into small plastic or ceramic packages called dual inline packages or DIPs . A DIP is a rectangular package with rows of pins running along its two longer edges. These are the small black boxes you see on SIMMs, DIMMs or other larger packaging styles. However , this arrangment caused many problems. Chips inserted into sockets suffered reliability problems as the chips would (over time) tend to work their way out of the sockets. 2. SIMM A SIMM, or single in-line memory module, is a type of memory module containing random access memory used in computers from the early 1980s to the late 1990s . -
Product Guide SAMSUNG ELECTRONICS RESERVES the RIGHT to CHANGE PRODUCTS, INFORMATION and SPECIFICATIONS WITHOUT NOTICE
May. 2018 DDR4 SDRAM Memory Product Guide SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE. Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind. This document and all information discussed herein remain the sole and exclusive property of Samsung Electronics. No license of any patent, copyright, mask work, trademark or any other intellectual property right is granted by one party to the other party under this document, by implication, estoppel or other- wise. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar applications where product failure could result in loss of life or personal or physical harm, or any military or defense application, or any governmental procurement to which special terms or provisions may apply. For updates or additional information about Samsung products, contact your nearest Samsung office. All brand names, trademarks and registered trademarks belong to their respective owners. © 2018 Samsung Electronics Co., Ltd. All rights reserved. - 1 - May. 2018 Product Guide DDR4 SDRAM Memory 1. DDR4 SDRAM MEMORY ORDERING INFORMATION 1 2 3 4 5 6 7 8 9 10 11 K 4 A X X X X X X X - X X X X SAMSUNG Memory Speed DRAM Temp & Power DRAM Type Package Type Density Revision Bit Organization Interface (VDD, VDDQ) # of Internal Banks 1. SAMSUNG Memory : K 8. Revision M: 1st Gen. A: 2nd Gen. 2. DRAM : 4 B: 3rd Gen. C: 4th Gen. D: 5th Gen. -
Architectural Techniques to Enhance DRAM Scaling
Architectural Techniques to Enhance DRAM Scaling Submitted in partial fulfillment of the requirements for the degree of Doctor of Philosophy in Electrical and Computer Engineering Yoongu Kim B.S., Electrical Engineering, Seoul National University Carnegie Mellon University Pittsburgh, PA June, 2015 Abstract For decades, main memory has enjoyed the continuous scaling of its physical substrate: DRAM (Dynamic Random Access Memory). But now, DRAM scaling has reached a thresh- old where DRAM cells cannot be made smaller without jeopardizing their robustness. This thesis identifies two specific challenges to DRAM scaling, and presents architectural tech- niques to overcome them. First, DRAM cells are becoming less reliable. As DRAM process technology scales down to smaller dimensions, it is more likely for DRAM cells to electrically interfere with each other’s operation. We confirm this by exposing the vulnerability of the latest DRAM chips to a reliability problem called disturbance errors. By reading repeatedly from the same cell in DRAM, we show that it is possible to corrupt the data stored in nearby cells. We demonstrate this phenomenon on Intel and AMD systems using a malicious program that generates many DRAM accesses. We provide an extensive characterization of the errors, as well as their behavior, using a custom-built testing platform. After examining various potential ways of addressing the problem, we propose a low-overhead solution that effec- tively prevents the errors through a collaborative effort between the DRAM chips and the DRAM controller. Second, DRAM cells are becoming slower due to worsening variation in DRAM process technology. To alleviate the latency bottleneck, we propose to unlock fine-grained paral- lelism within a DRAM chip so that many accesses can be served at the same time. -
DDR and DDR2 SDRAM Controller Compiler User Guide
DDR and DDR2 SDRAM Controller Compiler User Guide 101 Innovation Drive Software Version: 9.0 San Jose, CA 95134 Document Date: March 2009 www.altera.com Copyright © 2009 Altera Corporation. All rights reserved. Altera, The Programmable Solutions Company, the stylized Altera logo, specific device designations, and all other words and logos that are identified as trademarks and/or service marks are, unless noted otherwise, the trademarks and service marks of Altera Corporation in the U.S. and other countries. All other product or service names are the property of their respective holders. Altera products are protected under numerous U.S. and foreign patents and pending ap- plications, maskwork rights, and copyrights. Altera warrants performance of its semiconductor products to current specifications in accordance with Altera's standard warranty, but reserves the right to make changes to any products and services at any time without notice. Altera assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly agreed to in writing by Altera Corporation. Altera customers are advised to obtain the latest version of device specifications before relying on any published information and before placing orders for products or services. UG-DDRSDRAM-10.0 Contents Chapter 1. About This Compiler Release Information . 1–1 Device Family Support . 1–1 Features . 1–2 General Description . 1–2 Performance and Resource Utilization . 1–4 Installation and Licensing . 1–5 OpenCore Plus Evaluation . 1–6 Chapter 2. Getting Started Design Flow . 2–1 SOPC Builder Design Flow . 2–1 DDR & DDR2 SDRAM Controller Walkthrough . -
AXP Internal 2-Apr-20 1
2-Apr-20 AXP Internal 1 2-Apr-20 AXP Internal 2 2-Apr-20 AXP Internal 3 2-Apr-20 AXP Internal 4 2-Apr-20 AXP Internal 5 2-Apr-20 AXP Internal 6 Class 6 Subject: Computer Science Title of the Book: IT Planet Petabyte Chapter 2: Computer Memory GENERAL INSTRUCTIONS: • Exercises to be written in the book. • Assignment questions to be done in ruled sheets. • You Tube link is for the explanation of Primary and Secondary Memory. YouTube Link: ➢ https://youtu.be/aOgvgHiazQA INTRODUCTION: ➢ Computer can store a large amount of data safely in their memory for future use. ➢ A computer’s memory is measured either in Bits or Bytes. ➢ The memory of a computer is divided into two categories: Primary Memory, Secondary Memory. ➢ There are two types of Primary Memory: ROM and RAM. ➢ Cache Memory is used to store program and instructions that are frequently used. EXPLANATION: Computer Memory: Memory plays a very important role in a computer. It is the basic unit where data and instructions are stored temporarily. Memory usually consists of one or more chips on the mother board, or you can say it consists of electronic components that store instructions waiting to be executed by the processor, data needed by those instructions, and the results of processing the data. Memory Units: Computer memory is measured in bits and bytes. A bit is the smallest unit of information that a computer can process and store. A group of 4 bits is known as nibble, and a group of 8 bits is called byte. -
You Need to Know About Ddr4
Overcoming DDR Challenges in High-Performance Designs Mazyar Razzaz, Applications Engineering Jeff Steinheider, Product Marketing September 2018 | AMF-NET-T3267 Company Public – NXP, the NXP logo, and NXP secure connections for a smarter world are trademarks of NXP B.V. All other product or service names are the property of their respective owners. © 2018 NXP B.V. Agenda • Basic DDR SDRAM Structure • DDR3 vs. DDR4 SDRAM Differences • DDR Bring up Issues • Configurations and Validation via QCVS Tool COMPANY PUBLIC 1 BASIC DDR SDRAM STRUCTURE COMPANY PUBLIC 2 Single Transistor Memory Cell Access Transistor Column (bit) line Row (word) line G S D “1” => Vcc “0” => Gnd “precharged” to Vcc/2 Cbit Ccol Storage Parasitic Line Capacitor Vcc/2 Capacitance COMPANY PUBLIC 3 Memory Arrays B0 B1 B2 B3 B4 B5 B6 B7 ROW ADDRESS DECODER ADDRESS ROW W0 W1 W2 SENSE AMPS & WRITE DRIVERS COLUMN ADDRESS DECODER COMPANY PUBLIC 4 Internal Memory Banks • Multiple arrays organized into banks • Multiple banks per memory device − DDR3 – 8 banks, and 3 bank address (BA) bits − DDR4 – 16 banks with 4 banks in each of 4 sub bank groups − Can have one active row in each bank at any given time • Concurrency − Can be opening or closing a row in one bank while accessing another bank Bank 0 Bank 1 Bank 2 Bank 3 Row 0 Row 1 Row 2 Row 3 Row … Row Buffers COMPANY PUBLIC 5 Memory Access • A requested row is ACTIVATED and made accessible through the bank’s row buffers • READ and/or WRITE are issued to the active row in the row buffers • The row is PRECHARGED and is no longer -
Improving DRAM Performance by Parallelizing Refreshes
Improving DRAM Performance by Parallelizing Refreshes with Accesses Kevin Kai-Wei Chang Donghyuk Lee Zeshan Chishti† [email protected] [email protected] [email protected] Alaa R. Alameldeen† Chris Wilkerson† Yoongu Kim Onur Mutlu [email protected] [email protected] [email protected] [email protected] Carnegie Mellon University †Intel Labs Abstract Each DRAM cell must be refreshed periodically every re- fresh interval as specified by the DRAM standards [11, 14]. Modern DRAM cells are periodically refreshed to prevent The exact refresh interval time depends on the DRAM type data loss due to leakage. Commodity DDR (double data rate) (e.g., DDR or LPDDR) and the operating temperature. While DRAM refreshes cells at the rank level. This degrades perfor- DRAM is being refreshed, it becomes unavailable to serve mance significantly because it prevents an entire DRAM rank memory requests. As a result, refresh latency significantly de- from serving memory requests while being refreshed. DRAM de- grades system performance [24, 31, 33, 41] by delaying in- signed for mobile platforms, LPDDR (low power DDR) DRAM, flight memory requests. This problem will become more preva- supports an enhanced mode, called per-bank refresh, that re- lent as DRAM density increases, leading to more DRAM rows freshes cells at the bank level. This enables a bank to be ac- to be refreshed within the same refresh interval. DRAM chip cessed while another in the same rank is being refreshed, alle- density is expected to increase from 8Gb to 32Gb by 2020 as viating part of the negative performance impact of refreshes. -
Dual-DIMM DDR2 and DDR3 SDRAM Board Design Guidelines, External
5. Dual-DIMM DDR2 and DDR3 SDRAM Board Design Guidelines June 2012 EMI_DG_005-4.1 EMI_DG_005-4.1 This chapter describes guidelines for implementing dual unbuffered DIMM (UDIMM) DDR2 and DDR3 SDRAM interfaces. This chapter discusses the impact on signal integrity of the data signal with the following conditions in a dual-DIMM configuration: ■ Populating just one slot versus populating both slots ■ Populating slot 1 versus slot 2 when only one DIMM is used ■ On-die termination (ODT) setting of 75 Ω versus an ODT setting of 150 Ω f For detailed information about a single-DIMM DDR2 SDRAM interface, refer to the DDR2 and DDR3 SDRAM Board Design Guidelines chapter. DDR2 SDRAM This section describes guidelines for implementing a dual slot unbuffered DDR2 SDRAM interface, operating at up to 400-MHz and 800-Mbps data rates. Figure 5–1 shows a typical DQS, DQ, and DM signal topology for a dual-DIMM interface configuration using the ODT feature of the DDR2 SDRAM components. Figure 5–1. Dual-DIMM DDR2 SDRAM Interface Configuration (1) VTT Ω RT = 54 DDR2 SDRAM DIMMs (Receiver) Board Trace FPGA Slot 1 Slot 2 (Driver) Board Trace Board Trace Note to Figure 5–1: (1) The parallel termination resistor RT = 54 Ω to VTT at the FPGA end of the line is optional for devices that support dynamic on-chip termination (OCT). © 2012 Altera Corporation. All rights reserved. ALTERA, ARRIA, CYCLONE, HARDCOPY, MAX, MEGACORE, NIOS, QUARTUS and STRATIX words and logos are trademarks of Altera Corporation and registered in the U.S. Patent and Trademark Office and in other countries. -
NON-CONFIDENTIAL for Publication COMP
EUROPEAN COMMISSION Brussels, 15.1.2010 SG-Greffe(2010) D/275 C(2010) 150 Subject: Case COMP/C-3/ 38 636 Rambus (Please quote this reference in all correspondence) […]* 1. I refer to Hynix' complaint to the Commission of 18 December 2002 lodged jointly with Infineon pursuant to Article 3 of Council Regulation No. 17/621 against Rambus Inc. ("Rambus"), an undertaking incorporated in 1990 in California and reincorporated in Delaware, USA, in 1997, with its principal place of business in Los Altos, California, regarding alleged violations of Article 101 and Article 102 of the Treaty on the Functioning of the European Union ("TFEU")2 in connection with computer memory chips which are known as synchronous DRAM chips ("the Complaint"). I also refer to the letters listed here below, by which Hynix provided additional information/explanations on the above matter, as well as the Commission’s letter of 13 October 2009 ["Article 7 letter"] addressed to Hynix in that matter and the response to the Article 7 letter of 12 November 2009. […] 2. For the reasons set out below, the Commission considers that there is no sufficient degree of Community interest for conducting a further investigation into the alleged infringement and rejects your complaint pursuant to Article 7(2) of the Commission Regulation (EC) 773/20043. * This version of the Commission Decision of 15.1.2010 does not contain any business secrets or other confidential information. 1 Regulation No. 17 of the Council of 6 February 1962, First Regulation implementing Articles 85 and 86 of the Treaty (OJ No. 13, 21.2.1962, p.