HP References in This Manual This Manual May Contain Refere

Total Page:16

File Type:pdf, Size:1020Kb

HP References in This Manual This Manual May Contain Refere Errata Title & Document Type: Manual Part Number: Revision Date: HP References in this Manual This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett- Packard's former test and measurement, semiconductor products and chemical analysis businesses are now part of Agilent Technologies. We have made no changes to this manual copy. The HP XXXX referred to in this document is now the Agilent XXXX. For example, model number HP8648A is now model number Agilent 8648A. About this Manual We’ve added this manual to the Agilent website in an effort to help you support your product. This manual provides the best information we could find. It may be incomplete or contain dated information, and the scan quality may not be ideal. If we find a better copy in the future, we will add it to the Agilent website. Support for Your Product Agilent no longer sells or supports this product. You will find any other available product information on the Agilent Test & Measurement website: www.tm.agilent.com Search for the model number of this product, and the resulting product page will guide you to any available information. Our service centers may be able to perform calibration if no repair parts are needed, but no other support from Agilent is available. MET6LoGY JAN 21 1986 thERATING AND SERVICE MANUAL i 434.2A. HEWLETT I?!! PACKARD COPYRIGHT AND DISCLAIMER NOTICE Copyright - Agilent Technologies, Inc. Reproduced with the permission of Agilent Technologies Inc. Agilent Technologies, Inc. makes no warranty of any kind with regard to this material including, but not limited to, the implied warranties of merchantability and fitness for a particular purpose. Agilent Technologies, Inc. is not liable for errors contained herein or for incidental or consequential damages in connection with the furnishing, performance, or use of this material or data. CERTI FI CATI 0 N, The Hewlett-Packard Company certifies that this instrument was thoroughly tested and inspected and found to meet its published specifications when it was shipped from the factory. The Hewlett- Packard -Company further certifies that its calibration meusure- ments are traceable to the U.S. National Bureau of Standards to the extent allowed by the Bureau’s calibration facility. WARRANTY AND ASSISTANCE All Hewlett-Packard products are warranted against defects in materials and workmanship. This warranty applies for one year from the date of delivery, or, in the case of certain major compo- nents listed in the operating manual, for the specified period. We will repair or replace products which prove to be defective during the warranty period provided they are returned to Hewlett- Packard. No other warranty is expressed or implied. We are not liable for consequential damages. Service contracts or customer assistance agreements are available for Hewlett-Packard products that require maintenance and re- pair on-site. For any assistance, contact your nearest Hewlett-Packard Salesand Service Office. Addresses are provided at the back of this manual. OPERATING AND SERVICE MANUAL MODEL 4342A Q METER SERIAL NUMBERES COVERED This manual applies directly to Model 43428 Q Meter with serial prefixed 12125. Backdating changes in SectionVII cover instruments with serials 12125-00590 and below. Instruments with higher serial prefix will be covered in an Updating Manual Supplement at the first of the manual. OPTIONS COVERED This manual cover-es Option 001 instruments as well as the standard instrument. aCOPYRIGHT: YOKOGAWA-HEWLETT-PACKARD, LTD., 1970 9-1, TAKAKURA-CHO, HACHIOJI-SHI, TOKYO, JAPAN Manual Part No. 04342-90009 Microfiche Part No. 04342-90059 Printed: MAR. 1983 HEWLETT PACKARD Table of Contents Model 4342A TABLE OF CONTENTS Section Title Page I GENERAL INFORMATION ................................... 1-I l-l. Introduction.. ....................................... l-l 1-3. How the 4342A Measures ............................. l-2 l-8. Instruments Covered by Manual ....................... l-2 1-13. Specifications ....................................... l-3 1-15. Accessories Supplied ................................ 1-3 1-17. Accessories Available ............................... I-3 l-19. Options.. ........................................... l-3 II INSTALLATION ........................................... 2-l 2-l. Introduction ......................................... 2-i 2-3. Initial Inspection ..................................... 2-l 2-4. Mechanical Check .............................. 2-I 2-6. Performance Check ............................. 2-I 2-8. Damage Claim ................................. i:: 2-11. Storage and Shipment ................................. 2-12. Packaging ..................................... 2-l 2-13. Environment ................................... 2-I 2-14. Power Connection .................................... i-t 2-15. Line Voltage ................................... - 2-16. Power Cable ................................... 2-1 III OPERATION ........................................................................................ ;-; 3-l. Introduction - 3-3. Panel Controls, Connectors and Indicators ............. 3-l 3-5. Q Measurement General .............................. 3-l 3-8. Go/No-Go Function .................................. 3-l 3-10. Measurement Terminals .............................. 3-5 3-12. How to Connect Unknown .............................. 3-5 3-14. Measurement Parameters and Connection Methods ...... 3-5 3-16. Direct Method Limitations ....................... 3-5 3-18. Expansion of Measurement Ranges ............... 3-6 3-20. Capacitance Measurement ....................... 3-6 3-22. Resistance Measurement ........................ 3-6 3-24. High Q Measurement ........................... 3-7 3-26. Supplemental Equipment Used in Parallel and Series Methods ......................... 3-7 3-30. Basic Q Meter Measurements ......................... 3-11 3-31. Quality Factor and Inductance Measurements (Direct Connection) ........... 3-11 3-33. Q Measurement ................................ 3-11 3-35. dQ Measurement ............................... 3-12 3-37. Inductance Measurement ........................ 3-12 3-39. Inductance Measurement (at a desired frequency). .. 3-13 3-41. Measurement Requiring Corrections ................... 3-13 3-42. Effects of Distributed Capacitance ................ 3-13 3-45. Measuring Distributed Capacitance (Preferred Method) ......................... 3-14 3-47. Measuring Distributed Capacitance (Approximate Method, Cd IlOpF) ............ 3-15 3-49. Correction for Q ............................... 3-16 3-55. Parallel and Series Connection Measurement Methods ... 3-1’7 3-56. General ....................................... 3-17 3-60. Additional Error Discussion ................... 3-17 3-64. Parallel Measurements ............................... 3-18 3-65. High Inductance Measurement .................... 3-18 3-67. Low CapacitanceMeasurement (~45OpF) .......... 3-19 3-69. High Resistance Measurement ................... 3-20 3-71. Dielectric Measurement ........................ 3-21 Model 43426 Table of Contents Section Title Page 3-73. Series Measurements ................................ 3-23 3-74. Low Inductance Measurement .................... 3-23 3-76. High Capacitance Measurement (>450pF) ......... 3-24 3-78. Self-resonant Frequency Measurement of High Capacitors .......................... 3-24 3-80. Low Resistance Measurement .................... 3-26 IV THEORY OF OPERATION ................................... 4-l 4-l. Introduction.. ....................................... 4-1 4-3. Q Determination and Measurement ..................... 4-l 4-6. Simplified Block Diagram ............................. 4-l 4-8. Block Diagram Description ........................... 4-l 4-10. Oscillator and Impedance Converter (AlAl) ....... 4-l 4-12. RF Power Amplifier (AlA2) ..................... 4-l 4-14. ALC Amplifier (P/O A8) ........................ 4-2 4-16. Q/AQ Range Attenuator (A3) ..................... 4-2 4-18. Tuning Capacitor and Injection Transformer (A2). .. 4-2 4-21. RF Amplifier and Detector (A5) .................. 4-2 4-24. DC Amplifier (A6) .............................. 4-2 4-26. Q Limit Selector (A7) ........................... 4-2 4-28. Circuit Details ...................................... 4-2 4-29. LC Oscillator (P/O AlAl) ....................... 4-2 4-31. Impedance Converter (P/O AlAl) and RF Power Amplifier (AlA2) .... 4-3 4-33. ACL Amplifier (P/O A8) ........................ 4-3 4-35. Q Range Attenuator (A3) ........................ 4-3 4-37. Impedance Converter, RF Amplifier and Detector (A5) ...... 4-3 4-39. DC Amplifier (A6) .............................. 4-3 4-41. Q Limit Selector (A7) ........................... 4-3 4-43. Power Supply (P/O ~8) ......................... 4-3 V MAINTENANCE ............................................ 5-l 5-l. Introduction ......................................... 5-l 5-3. Test Equipment Required ............................. 5-l 5-5. Q Accuracy Considerations ........................... 5-l 5-7. Option .............................................. 5-l 5-9. Performance Checks ................................. 5-3 5-11. Frequency Accuracy Check.. .................... 5-3 5-12. QRange Check.. ............................... 5-3 5-13. AQ Range Check ............................... 5-4 5-14. Capacitance Accuracy Check .................... 5-4 5-15. Q Limit Operation Check ........................ 5-5 5-16. Adjustment and Calibration Procedures ................ 5-8 5-18.
Recommended publications
  • Electrical & Electronics Measurement Laboratory Manual
    DEPT. OF I&E ENGG. DR, M, C. Tripathy CET, BPUT Electrical & Electronics Measurement Laboratory Manual By Dr. Madhab Chandra Tripathy Assistant Professor DEPARTMENT OF INSTRUMENTAION AND ELECTRONICS ENGINEERING COLLEGE OF ENGINEERING AND TECHNOLOGY BHUBANESWAR-751003 PAGE 1 | EXPT - 1 ELECTRICAL &ELECTRONICS MEASUREMENT LAB DEPT. OF I&E ENGG. DR, M, C. Tripathy CET, BPUT List of Experiments PCEE7204 Electrical and Electronics Measurement Lab Select any 8 experiments from the list of 10 experiments 1. Measurement of Low Resistance by Kelvin’s Double Bridge Method. 2. Measurement of Self Inductance and Capacitance using Bridges. 3. Study of Galvanometer and Determination of Sensitivity and Galvanometer Constants. 4. Calibration of Voltmeters and Ammeters using Potentiometers. 5. Testing of Energy meters (Single phase type). 6. Measurement of Iron Loss from B-H Curve by using CRO. 7. Measurement of R, L, and C using Q-meter. 8. Measurement of Power in a single phase circuit by using CTs and PTs. 9. Measurement of Power and Power Factor in a three phase AC circuit by two-wattmeter method. 10. Study of Spectrum Analyzers. PAGE 2 | EXPT - 1 ELECTRICAL &ELECTRONICS MEASUREMENT LAB DEPT. OF I&E ENGG. DR, M, C. Tripathy CET, BPUT DO’S AND DON’TS IN THE LAB DO’S:- 1. Students should carry observation notes and records completed in all aspects. 2. Correct specifications of the equipment have to be mentioned in the circuit diagram. 3. Students should be aware of the operation of equipments. 4. Students should take care of the laboratory equipments/ Instruments. 5. After completing the connections, students should get the circuits verified by the Lab Instructor.
    [Show full text]
  • A History of Impedance Measurements
    A History of Impedance Measurements by Henry P. Hall Preface 2 Scope 2 Acknowledgements 2 Part I. The Early Experimenters 1775-1915 3 1.1 Earliest Measurements, Dc Resistance 3 1.2 Dc to Ac, Capacitance and Inductance Measurements 6 1.3 An Abundance of Bridges 10 References, Part I 14 Part II. The First Commercial Instruments 1900-1945 16 2.1 Comment: Putting it All Together 16 2.2 Early Dc Bridges 16 2.3 Other Early Dc Instruments 20 2.4 Early Ac Bridges 21 2.5 Other Early Ac Instruments 25 References Part II 26 Part III. Electronics Comes of Age 1946-1965 28 3.1 Comment: The Post-War Boom 28 3.2 General Purpose, “RLC” or “Universal” Bridges 28 3.3 Dc Bridges 30 3.4 Precision Ac Bridges: The Transformer Ratio-Arm Bridge 32 3.5 RF Bridges 37 3.6 Special Purpose Bridges 38 3,7 Impedance Meters 39 3.8 Impedance Comparators 40 3.9 Electronics in Instruments 42 References Part III 44 Part IV. The Digital Era 1966-Present 47 4.1 Comment: Measurements in the Digital Age 47 4.2 Digital Dc Meters 47 4.3 Ac Digital Meters 48 4.4 Automatic Ac Bridges 50 4.5 Computer-Bridge Systems 52 4.6 Computers in Meters and Bridges 52 4.7 Computing Impedance Meters 53 4.8 Instruments in Use Today 55 4.9 A Long Way from Ohm 57 References Part IV 59 Appendices: A. A Transformer Equivalent Circuit 60 B. LRC or Universal Bridges 61 C. Microprocessor-Base Impedance Meters 62 A HISTORY OF IMPEDANCE MEASUREMENTS PART I.
    [Show full text]
  • Electrical and Electronic Measurements
    Contents Manual for K-Notes ................................................................................. 2 Error Analysis .......................................................................................... 3 Electro-Mechanical Instruments ............................................................. 6 Potentiometer / Null Detector .............................................................. 15 Instrument Transformer ....................................................................... 16 AC Bridges ............................................................................................. 18 Measurement of Resistance ................................................................. 21 Cathode Ray Oscilloscope (CRO) ........................................................... 25 Digital Meters ....................................................................................... 28 Q–meter / Voltage Magnifier ................................................................ 30 © 2014 Kreatryx. All Rights Reserved. 1 Error Analysis Static characteristics of measuring system 1) Accuracy Degree of closeness in which a measured value approaches a true value of a quantity under measurement. When accuracy is measured in terms of error : Guaranteed accuracy error (GAE) is measured with respect to full scale deflation. Limiting error (in terms of measured value) GAE * Full scale deflection LE Measured value 2) Precision Degree of closeness with which reading in produced again & again for same value of input quantity. 3) Sensitivity
    [Show full text]
  • Download EMI Hand Book 2014-15
    7.4 SUBJECT DETAILS 7.4 ELECTRONIC MEASUREMENTS AND INSTRUMENTATION 7.4.1 Objective and Relevance 7.4.2 Scope 7.4.3 Prerequisites 7.4.4 Syllabus i. JNTU ii. GATE iii. IES 7.4.5 Suggested Books 7.4.6 Websites 7.4.7 Experts’ Details 7.4.8 Journals 7.4.9 Findings and Developments 7.4.10 Session Plan 7.4.11 Student Seminar Topics 7.4.12 Question Bank i. JNTU ii. GATE iii. IES 7.4.13 Assignment questions 7.4.1 OBJECTIVE AND RELEVANCE The prime objective of learning this subject is to study various electronic instruments ranging from meters to electronics instrumentation system. With the advancement of technology in integrated circuits, instruments are becoming more and more compact and accurate. In view to this, sophisticated types of instruments covering digital instruments are dealt in a simple, step -by-step manner for easy understanding. The basic concepts, working principles, capabilities and limitations of various instruments are discussed in this subject, which will guide the learners to select the transducer for particular instrumentation applications. 7.4.2 SCOPE The students get clear idea about concepts of measurement techniques and instrumentation systems. It basically provides the information about different measurement techniques in ac and dc modes. It also focuses on design and applications of CRO and other frequency measuring devices. Finally it makes students familiar with different types of transducers for measuring parameters. 7.4.3 PREREQUISITES Basic knowledge in the fundamentals of electronics, circuit analysis is required. A student is expected to have thorough knowledge in network theory along with the basic idea of different physical parameters and impact of those parameters on measurement systems.
    [Show full text]
  • International Institute of Information Technology Hinjawadi, Pune - 411 057
    International Institute of Information Technology Hinjawadi, Pune - 411 057 Department of Electronics & Telecommunication LABORATORY MANUAL FOR ELECTRONICS MEASURING INSTRUMENTS AND TOOLS (SE E&TC 2012 - SEM I) www.isquareit.edu.in Work Load Exam Schemes Practical Term Work Practical Oral 02 hrs per week 50 -- -- List of Assignments Sr. Time Span Title of Assignment No. (No. of weeks) 1 Carry out Statistical Analysis of Digital Voltmeter 01 2 Multimeter. 01 3 Cathode Ray Oscilloscope. 01 4 Digital Storage Oscilloscope. 01 5 True RMS Meter. 01 6 LCR- Q Meter. 01 7 Spectrum Analyzer. 02 8 Frequency Counter. 01 9 Calibration of Digital Voltmeter. 01 10 Function generator/Arbitrary waveform generator. 01 Text Books: 1. R Albert D Helfrick, William Cooper, “Modern Electronic Instrumentation and Measuring Techniques” PHI EEE. 2. H S Kalsi, “Elctronic Instrumentation”, 3rd edition McGraw Hill. 3. M S Anand, “Electronic Instruments and Instrumentation Technology, PHI EEE, fourth reprint. ASSIGNMENT NO.1 Reference Books: TITLE: Statistical analysis using voltmeter PROBLEM STATEMENT: Carry out Statistical Analysis of Digital Voltmeter. Calculate mean, standard deviation, average deviation, and variance. Calculate probable error. Plot Gaussian curve. OBJECTIVE: 1. To understand importance of statistical analysis. 2. To understand analysis parameters.. REQUIREMENT: Resistance, DC power supply, bread board, digital voltmeter. THEORY: Arithmetic Mean: The most probable value of a measured value is the arithmetic mean of the number of readings taken. The best approximation will be made when the number of readings of the same quantity is very large. Theoretically, an infinite number of readings would give the best result, although in practice, only a finite number of measurements can be made.
    [Show full text]
  • Question Bank Modern Electronic Instrumentation
    Question Bank Modern Electronic Instrumentation . DEPARTMENT OF ELECTRONICS AND INSTRUMENTATION ENGINEERING Dr. Mahalingam College of Engineering and Technology Department of Electronics and Instrumentation Unit – I (Two Marks with answers) 1. Calculate the value of the multiplier resistance on 50V range of a DC voltmeter that uses 500μA meter movement with an internal resistance of 1KΩ. The sensitivity of a 500μA meter movement is given by S = 1/Im = 1/500μA = 2KΩ / V. The value of the multiplier resistance can be calculated by Rs = S * Range – Rm = 2KΩ / V * 50V - 1KΩ = 100 KΩ - 1 KΩ = 99KΩ 2. State the advantages of ramp type DVM. It has a better resolution and it can be adjusted because the resolution of digital readout is proportional to the frequency of local oscillator. The polarity of the signal which is to be measured can be indicated by adding external logic. In this the analog to digital signal converted into time and the time can be easily digitized. It is easy to design and cost is low. 3. Define Loading effect in voltmeter. A voltmeter is connected in parallel with the circuit across which the voltage is being measured. The loading effect of the meter will be minimal if the meter resistance is much larger than the circuit resistance. Ideally, the voltmeter resistance should be infinite. 4. List the sources of errors present in the Q meters. At high frequencies, the electronic voltmeter may suffer from losses due to the transit time effect. The effect of shunt resistance is to introduce an additional resistance in the tank circuit, which can balance the meter, but only for certain period of time.
    [Show full text]
  • 8060A True-Rms Multimeter 300V
    ® This manual pertains to instruments with serial number 6851XXX or higher. 8060A True-rms Multimeter 300V Instruction Manual PN 648169 June 1997 Rev. 2, 3/00 © 1997, 1999, 2000 Fluke Corporation. All rights reserved. Printed in U.S.A. All product names are trademarks of their respective companies. LIMITED WARRANTY & LIMITATION OF LIABILITY Each Fluke product is warranted to be free from defects in material and workmanship under normal use and service. The warranty period is one year and begins on the date of shipment. Parts, product repairs, and services are warranted for 90 days. This warranty extends only to the original buyer or end-user customer of a Fluke authorized reseller, and does not apply to fuses, disposable batteries, or to any product which, in Fluke's opinion, has been misused, altered, neglected, contaminated, or damaged by accident or abnormal conditions of operation or handling. Fluke warrants that software will operate substantially in accordance with its functional specifications for 90 days and that it has been properly recorded on non-defective media. Fluke does not warrant that software will be error free or operate without interruption. Fluke authorized resellers shall extend this warranty on new and unused products to end-user customers only but have no authority to extend a greater or different warranty on behalf of Fluke. Warranty support is available only if product is purchased through a Fluke authorized sales outlet or Buyer has paid the applicable international price. Fluke reserves the right to invoice Buyer for importation costs of repair/replacement parts when product purchased in one country is submitted for repair in another country.
    [Show full text]
  • A Corner of the Awatea's Radio Cabin. -Photo Co11rtesy A.W.A. V
    A corner of the Awatea's radio cabin. -Photo co11rtesy A.W.A. v. Regarding the principle involved there is little fundamental d ifference betwe~n an Os­ cillator and a Signal Generator, yet p rices ra nge from approximately £40 to £ 150 and over-WHY? Because the instrument selling in the lotter price class is invariably a PRECISION 1.N­ STRUMENT and-as precision is NECESSARY in commercial radio design and production­ it is usual to PAY THE PRICE. Precisio'n is also very necessary for good service work. It was with the object of giving the service­ man the maximum of efficiency and precision at a PRICE WITHIN REASON that the " PALEC" G SERIES St:RVICE OSCILLATORS were progressively evolved. That a GOOD OSCILLATOR is a VITALLY IMPORTANT TOOL is now universally recognised. NOTE OUR SPECIFICATIONS-better still, VISIT US, and see a stock model demonstrat­ ed. We claim the following "HIGH PRICED" features :- Frequency Accuracy of HALF OF ONE PER CENT. on a direct reading dial; incorporation of a LOW IMPEDANCE 4-step PAD TYPE attenuator; reliability of REPEAT HEADINGS even over a period of years; unusually LOW LEAKAGE level; SINE WAVE Modulation at a mean value of 30 per cent.; incorporation of a compensated R.F. stage for maximum STAB ILITY, AMPLITUDE LEVE L and minimum ~~>~: · .:::·~~~ FREQUENCY MODULATION; six fundamental bands from 160 k.c. to 24 megacycles; full '-4. ... ... range external Dummy Antenna. ·" ... - ·~ OSCILLATOR MODELS AND PRICES. 0 £11 15 0 :;~~: : g!o, AA~C. :~~~~~~d,' with · b~iit '-i~ ' o~tp'u't ' M.;t~~ ':: .
    [Show full text]
  • Measurements
    MEASUREMENTS For ELECTRICAL ENGINEERING INSTRUMENTATION ENGINEERING MEASUREMENTS SYLLABUS Measurement concept, Classification of Measurement, Types of errors & Standard Measurement technics Analog Circuits, Measurement of Resistance, Inductance, Capacitance, Bridge Measurement, Concept of Cathode Ray Oscilloscope, CRO, Volt meter & Frequency measurement, ANALYSIS OF GATE PAPERS Electrical Engineering Instrumentation Engineering 1 Mark 2 Mark 1 Mark 2 Mark Exam Year Ques. Ques. Total Ques. Ques. Total 2003 3 8 19 5 4 13 2004 3 7 17 5 9 23 2005 3 5 13 3 7 17 2006 2 4 10 2 5 12 2007 1 1 3 3 4 11 2008 1 2 5 2 6 14 2009 2 2 6 3 3 9 2010 2 1 4 4 4 12 2011 3 1 5 - 3 6 2012 3 1 5 3 1 5 2013 2 1 4 - 2 4 2014 Set-1 2 2 6 1 1 3 2014 Set-2 2 2 6 2014 Set-3 2 2 6 2015 Set-1 2 1 4 2 2 6 2015 Set-2 3 7 17 2016 Set-1 0 0 0 4 3 10 2016 Set-2 1 2 5 2017 Set-1 2 2 6 2 4 10 2017 Set-2 2 1 4 2018 2 1 4 2 4 10 © Copyright Reserved by Gateflix.in No part of this material should be copied or reproduced without permission CONTENTS Topics Page No 1. CHARACTERISTIC, ERRORS & STANDARDS 1.1 Measurements 01 1.2 Classification of Instruments 01 1.3 Types of Errors 04 1.4 Standards 05 Gate Questions 07 2. ANALOG INSTRUMENTS 2.1 Introduction 09 2.2 Indication Instrument 09 2.3 Types of Supports 11 2.4 Damping Forces 12 2.5 Electromechanical Indicating Instruments 13 2.6 PMMC Instruments 13 2.7 DC Ammeters 14 2.8 Voltmeter Multipliers 15 2.9 Moving Iron Instruments 16 2.10 Classification of Moving Iron Instruments 17 2.11 Electrodynamometer Type 18 2.12 Measurement of Power and Energy 22 Gate Questions 29 3.
    [Show full text]
  • Electronic Instrumentation and Measurement Techniques”, PHI, 5Th Edition, 2002
    DEPARTMENT OF ECE ELECTRONIC MEASUREMENTS & INSTRUMENTATION LECTURE NOTES ON ELECTRONIC MEASUREMENTS & INSTRUMENTION (2018 – 2019) III B. Tech II Semester (JNTUA-R15) Mr. C VAMSI KRISHNA, Assistant Professor CHADALAWADA RAMANAMMA ENGINEERING COLLEGE (AUTONOMOUS) Chadalawada Nagar, Renigunta Road, Tirupati – 517 506 Department of Electronics and Communication Engineering Page 1 DEPARTMENT OF ECE ELECTRONIC MEASUREMENTS & INSTRUMENTATION ELECTRONIC MEASUREMENTS AND INSTRUMENTATION Page 2 DEPARTMENT OF ECE ELECTRONIC MEASUREMENTS & INSTRUMENTATION SYLLABUS UNIT-I Performance characteristics of Instruments: Static characteristics, Accuracy, Precision, Resolution, Sensitivity, static and dynamic calibration, Errors in Measurement, and their statistical analysis, dynamic characteristics-speed of Response, fidelity, Lag and dynamic error. DC ammeters, DC voltmeters-multirange, range extension/solid state and differential voltmeters, AC voltmeters –multirange, range extension. Thermocouple type RF ammeter, ohm meters, series type, shunt type, multimeter for voltage, current and resistance measurements. UNIT-II Oscilloscopes: Standard specifications of CRO,CRT features, derivation of deflection sensitivity, vertical and horizontal amplifiers, horizontal and vertical deflection systems, sweep trigger pulse, delay line, sync selector circuits, probes for CRO – active, passive, and attenuator type, triggered sweep CRO, and Delayed sweep, dual trace/beam CRO, Measurement of amplitude, frequency and phase (Lissajous method).Principles of sampling oscilloscope,
    [Show full text]
  • A DIGITAL PHASE ANGLE METER for POWER FREQUENCY MEASUREMENTS by JOHN P. GILES B.Sc., B.E. PROJECT REPORT for the DEGREE of MASTE
    A DIGITAL PHASE ANGLE METER FOR POWER FREQUENCY MEASUREMENTS BY JOHN P. GILES B.Sc., B.E. PROJECT REPORT FOR THE DEGREE OF MASTER OF ENGINEERING SCIENCE IN THE SCHOOL OF ELECTRICAL ENGINEERING UNIVERSITY OF NEW SOUTH WALES DECEMBER 1974 UNIVERSITY OF N.S.W. 46353 -2. SEP 75 LIBRARY DECLARATION It is hereby declared that the work described in this thesis has been performed by the author and has not previously been submitted for a post-graduate degree to any other University or institution. ABSTRACT A Digital phase angle meter is described which is primarily designed for power frequency phase angle measurements in the range 40 - 1000 Hz. The instrument is designed for measuring slowly changing signals of the type found in standardization or calibration of industrial phase angle indicators or transducers, where the 1 second or 10 second aperture time is of no consequence. The result is displayed digitally directly in degrees. No setting up procedures are necessary before taking a measurement. The accuracy of the instrument described is 0.5 of a degree plus or minus one digit. A frequency measuring function is also provided for measurements in the range 1 - 2000Hz. The factors which limit phase angle measure­ ment accuracy are described, together with the methods by which the induced errors are reduced or eliminated. ACKNOWLEDGMENTS This investigation was conducted as part of the require­ ments for a Master of Engineering Science in the School of Electrical Engineering of the University of New South Wales* The guidance of Associate Professor G* J. Johnson in this project is sincerely appreciated* The comments of Mr* F* Lewin on the draft copy are gratefully acknowledged* 1 CONTENTS page number ABSTRACT ACKNOWLEDGMENTS TABLE OF CONTENTS 1 1.
    [Show full text]
  • Measurements Corporation Model 65-B Signal Generator Manual
    www.SteamPoweredRadio.Com lABORATOR~ STAN □ AR □ S MODEL 65-B D001WT01'T•1'TEW JERSEY I www.SteamPoweredRadio.Com NO PART OF THIS MANUAL MAY BE REPRODUCED IN WHOLE OR IN PART EXCEPT SY PERMISSION OF MEASUREMENTS CORP• • COPYRIGHT 1944 BY MEASUREMENTS CORPORATION EDITED BY J. B. MINTER, Chief Engineer MEASUREMENTS CORPORATION BOONTON, N. J . PRINTED IN U.S. A. 2 www.SteamPoweredRadio.Com I. OPERATING INSTRUCTIONS: a. SETTING UP: b. ZERO ADJUSTMENT: c. CARRIER FREQUENCY SETTING : d. MODULATION: e. CARRIER OUTPUT: Cf) II. OVERALL RECEIVER MEASUREMENT TECHNIQUE : a. SENSITIVITY: b. SELECTIVITY: c. IMAGE RATIO: d. AUDIO FIDELITY : e. AUDIO DISTORTION: f. A.V.C. CHARACTERISTICS : 3 www.SteamPoweredRadio.Com Ill. USE OF STANDARD SIGNAL GENERATOR IN DESIGN, DEVELOPMENT, AND RESEARCH: a. STAGE GAIN MEASUREMENTS : b. CONVERSION GAIN MEASUREMENTS : c. R. F. STAGE GAIN MEASUREMENTS d. ANTENNA STEP-UP MEASUREMENTS : e. SUPERHET OSCILLATOR TRACKING: f. MEASUREMENT OF CIRCUIT "Q" WITH STANDARD SIGNAL GENERATOR : 9. MEASUREMENT OF SMALL CAPACITIES: h. MEASUREMENTS OF ATTENUATION CHARACTERISTICS OF R. F. FILTERS : 1. MEASUREMENT OF SURGE IMPEDANCE AND ATTENUATION OF TRANSMISSION LINES: J. USE OF A SIGNAL GENERATOR AS A BRIDGE DRIVER : k. MEASUREMENT OF RADIO NOISE OR INTERFERENCE : 4 www.SteamPoweredRadio.Com IV. SERVICE AND MAINTENANCE : a. MEASUREMENTS AND CHECK PRIOR TO REMOVAL FROM OUTER CASE : b. REMOVAL FROM CASE : c. R. F. UNIT : d. MODULATION AND POWER UNIT : e. ATTENUATOR UNIT : (Fig. 23) f. REPLACEMENT OF TUBES: EB V. CORRELATION BETWEEN DIFFERENT SIGNAL GENERATORS : 5 www.SteamPoweredRadio.Com 7 LIST OF ILLUSTRATIONS I L - FIG. I-'FRONT PANEL-LABELED CONTROLS.......................................................................................... .... .......... 12 FIG. 2-INPUT CONNECTIONS FOR RECEIVERS .....................................................................
    [Show full text]