Chapter 10. Junctions Junctions
• Surface ~ simplest one; junction between vacuum/surface • Metal/Metal qq potential is set up MM12 • Metal/Semiconductor Blocking contact ~ Schottky barrier Ohmic contact ~ low resistance • Semiconductor/Semiconductor a. Homojunction ~ both side of junctions are same b. Heterojunction ~ each side is different c. Iso-type ~ types are same to both sides < n types or p types > d. Anisotype < p + n > • M/I/M, MIS, SIS, MOS Surfaces
Termination of the periodic potential Chemisorption of oxygen on n-type → localized states at the surface Semiconductor surface
Surface state bending of band gives Ɛ
positively charged O - depletion region Ec 2 chemisorption + + separation of charge EF - d - negatively charged surface
Ev state
- • As more O2 are formed, the energy bands bend at the surface of the semiconductor because of the local field that is built up. Metal/Metal
qcp Ɛ q qB q A A contact qB potential
B B A A
• Transfer of electron until EF are same for both of metals
• A potential difference cp known as the contact potential is set up between two metals.
• If qqqqqABcpAB ,
• EF has to be same in thermal equilibrium for whole system Although an internal field exists, no potential can be measured in an external circuit connecting the two metals together. Local electric field is measured by the Kelvin Probe method – vibrating method Metal/Semiconductor – Schottky Barrier
q D qS S ≡ electron qM qM affinity S q E - S b - ++
Wd
qEE () SS cF Blocking contact
• Blocking contact if 𝑞Φ 𝑞Φ for n-type and 𝑞Φ 𝑞Φ for p-type • A flow of electrons from the semiconductor to the metal in order to equalize the Fermi energies in the two materials.
• An internal field 𝑞Φ is developed in the semiconductor.
• 𝑞Φ 𝑞 Φ Φ : diffusion potential, built-in potential
• 𝐸 𝑞Φ 𝜒 : Energy barrier Metal/Semiconductor – Schottky Barrier
• The width of the depletion region + Ionized donor density = ND E r 0 dE Nq D dx r 0 d E dx d 2 Nq D Boundary conditions 2 : Poisson's equation dx r 0 𝜕𝜙 𝐸 𝑥 𝑊 Nq 2 𝜕𝑥 0 at qW D 2 𝜙 𝜙 at 𝑥 𝑊 DD 𝜙 0 at 𝑥 0 2 r 0 Metal/Semiconductor – Schottky Barrier
• In the depletion region Wd, potential change Φ
𝑥 𝑊 ,Φ Φ / 2𝜀 𝜀 𝑞Φ 𝑞Φ 𝑊 𝑞 𝑁
→ The more donors, the smaller 𝑊 .
• If we include the effects of an applied voltage Φapp , / 2𝜀 𝜀 𝑞Φ 𝑞Φ 𝑞Φ 𝑊 The more donors or the larger 𝑞 𝑁 applied voltage can recued the contact resistance. → The larger applied voltage, the smaller 𝑊 . Metal/Semiconductor – Schottky Barrier metal semiconductor depletion region
Wd conductor dielectric nearly conductor
1 / 2𝜀 𝜀 𝑞Φ 𝑞Φ 𝐶/𝐴 𝑊 𝑞 𝑁 1 M SD 𝜀 𝜀 𝐴 slope ∝ 𝐶 𝑁 𝑑 1 2 𝑞Φ 𝑞Φapp app 𝐶/𝐴 𝜀 𝜀 𝑞 𝑁 Method to measure 𝑁 and Φ Metal/Semiconductor – Schottky Barrier
• JV characteristics of Schottky barrier (n-type semiconductor)
J qq () + DMS + qMS
V EE q Metal - Metal + cF SS