2018 LATS19th IEEE Latin-American Test Symposium São Paulo, Brazil, 12th - 16th March 2018 CALL FOR PAPERS www.lats.tttc-events.org © Lennart B. Poehls 2018 LATS19th IEEE Latin-American Test Symposium São Paulo, Brazil, 12th - 16th March 2018 General Co-Chairs: CALL FOR PAPERS Fabian Vargas – PUCRS, Brazil
[email protected] The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recognized Yervant Zorian – SYNOPSYS, USA forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin
[email protected] America, to present and discuss various aspects of system, board, and component testing and fault-tolerance with Past General Chair: design, manufacturing and field considerations in mind. Presented papers are also published in the IEEE Xplore Raoul Velazco – TIMA-INPG, France Digital Library. The best papers of the 19th LATS will be invited to re-submit to IEEE Design & Test,Journal of Electronic Program Co-Chairs: Testing: Theory and Applications - JETTA (Springer), Journal of Low Power Electronics - JOLPE (American Scientific Letícia Bolzani Poehls – PUCRS, Brazil Publishers), and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD). Fernanda Lima Kastensmidt – UFRGS, Brazil Tutorial Co-Chairs: Topics of interest include but are not limited to: Matteo Sonza Reorda – Politecnico di Torino, Italy - Analog Mixed Signal Test - Economics of Test - Radiation/EMI Tiago Balen – UFRGS, Brazil - Automatic Test