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Derickson.book Page 911 Thursday, November 8, 2007 11:11 AM Index 2B1Q, 142–143 optical sampling demonstrations, 427 4B3T modified monitored state (MMS43), optical waveform measurement techniques, 423 142–143 optical waveform sampling, 423–426 4B5B block substitution, 70–74 See also All-optical sampling implementations, 4B5B encoder efficiency, 89 experimental; Fiber FWM-based sampling 8B10B system, performance analysis of; Optical block substitution, 74–77 sampling principles; Sampling gate control words, 154, 162 implementations; Third-order nonlinearity- encoder efficiency, 89 based sampling; Timebase designs encoding rules, 862–872 All-optical sampling implementations, 10GBase control codes, 157 experimental 10GBase stress testing, 619–628 analog-to-digital conversion of acquired 10GBase-KR, 642, 651–654 samples, 480–482 10GBase-LR, 619 χ2-based sampling in bulk KTP, 482–484 10GBase-LRM, 634 χ2-based sampling using quasi-phase matching 64B66B encoder in PPLN, 484–486 code blocks, 160 χ3-based Kerr switch with parametric gain in control characters, 157 HNLF, 487–488 deserializer architecture, 158 χ3-based sampling system using XPM-induced frame structure, 161 frequency shift in HNLF, 486–487 scrambler, 162–163 coherent detection sampling (linear sampling), serializer architecture, 158 489–491 fiber FWM-based sampling in HNLF, 488–489 A gain-transparent ultrafast nonlinear interferometer, 489–490 Accelerated BER measurements, 192 optimization for 40 Gbit/s signals, 491–492 Active bias T, 122–123, 902–910 sampling pulse sources, 475–480 Add/drop multiplexers (ADMs), 590 selected implementations, 482–492 Adjustable offset amplifiers, 552 All-zero state, 821–823, 827 ADSL (Asymmetric DSL), 140, 144–145 Alternate mark inverted (AMI) encoding rule, Aggregate deterministic jitter, 403 97–99 Aggregate total jitter, 403–404 Amplification, 384 Aliasing, 258, 262, 298–299, 480, 640 clock phase noise, 40 All-optical sampling for high-speed waveform parametric amplification, 436, 488 analysis variable gain preamplifier, 245–246 electronic sampling, comparison with, 422–423 See also Preemphasis 911 Derickson.book Page 912 Thursday, November 8, 2007 11:11 AM 912 Index Amplified spontaneous emission (ASE), 486, 581, Attenuators 607–613, 616–617 fixed step, 836–837 Amplifiers optical, 567–569, 636 buffer, 123, 880, 908–910 variable optical, 131–138 error, 66, 511–512, 516–521, 873–875 Autocorrelation, 423, 450, 825–826 optical, 362, 578, 581, 609–610, 617 Automatic mask testing, 364–365 power, 122–123 Avalanche photodetectors (APDs), 424, 457, 464, See also Erbium-doped fiber amplifiers 492, 564, 572, 623–624 (EDFAs); Semiconductor optical amplifiers Average optical power, 619–623 (SOAs); Transimpedance amplifiers (TIAs) Averaging AM-to-PM conversion, 115 in configuration of network analyzer hardware, Analog CDR circuits, 11 727 Analog phase detection, 512–513 magnitude spectra, 296 Analog receiver characteristics, estimating noise, 473 digitally, 585–588 reducing noise impact on eye diagrams, 345–346 Analog-to-digital conversion (ADC) of acquired See also Trace averaging samples, 480–482 Analog-to-digital converters (ADC), 92–95, 98, 245 B Analog-to-digital sampling, 92–94 Analysis methods (approaches) B8ZS encoding, 99 comparison for DDJ and DCD, 293–295 Backplane, 172, 175, 606 comparison for PJ, 296–299 communication, 642, 651–654 pattern-correlation-based for DDJ and DCD, test sytem, 702–703 291–293 See also Backplane modeling residual for PJ extraction, 296 Backplane modeling spectrum analysis for composite jitter, 300–302 daughtercards assembly, 703 spectrum analysis for PJ extraction, 295–296 eye diagrams, 708–709 spectrum analysis for RJ extraction, 283–289 impedance values, 706 spectrum-based for DDJ and DCD, 289–291 SPICE simulation, 705 tail-fit for RJ extraction, 286–289 topological model, 702 Analysis of waveforms, 350–353 waveforms, 703–704 APDs. See Avalanche photodetectors (APDs) Ball grid array (BGA), 696–697 Arbitrary waveform generators (AWGs), 547–549 Band-pass filters Architecture insertion loss, 768–770 FBDIMM, 795–797, 804–806 measurements summary, 770–771 forwarded clock systems, 816 receivers based on, 720 network analyzers, 716–719 return loss, 767–768 PCI Express, 789–795, 800–804 Band-pass response, 98, 112–114, 880–902 real-time oscilloscopes, 245–250 Bandwidth sampling oscilloscopes, 335 cost of, 332 SATA, 797–800, 807–810 effect on waveform results, 353–358 ARCNET, 87–88 front-end, 256–257 Asymmetric crosstalk, 144 full width at half maximum (FWHM), 613 Atomic clocks, 106 and ISI, 40 Attenuation, 26, 616, 633, 653 limitations, 40 ratios, 836–837 relationship equations, 303, 331–332 See also Deemphasis sample rates, 331–335 Derickson.book Page 913 Thursday, November 8, 2007 11:11 AM Index 913 Bang-bang phase detectors, 513–514 loopback configurations, 174 Barkhausen criteria, 506 mean time between errors (MTBE), 171 Baseline wander, 13, 15, 108–113, 845–846 pattern generator (PG), 171–173 Bathtub curve, 325 receiver setup, 175–176 linear scale, 202–203 sampling rate, 266 logarithmic scale, 203 SERDES devices, 172–174 Q scale, 203–205 setup, 171–174 Behavioral modeling, 695–696 synchronization, 176–177 BER (bit error ratio), 170–171, 222–225 system bit error ratio, 193 confidence intervals for, 583 target bit error ratio, 177–178 level in RJ/DJ separation settings, 313 test pattern selection, 174–175 BER calculations in real communications systems testing in Ethernet, 597–602 BERT testing in Ethernet, 597–602 BERT scan measurements frame error ratio, estimating, 599–600 base bit error ratio, 222–225 frame-by-frame testing, advanced, 600–601 bathtub curve, 202–205 frame-by-frame testing, simple, 598–599 BERT eye masks, 237–238 sequencing, 602 bit error ratio eye diagram, 229–233 SONET/SDH, analyzing BER measurements contour plots, 231–232 in, 592–596 fast total jitter optimization, 219–222 SONET/SDH description, 589–592 full eye scan, 228–238 BER eye diagram gradient maps, 233–234 contour plots, 231–232 jitter histogram, 205–206 pseudo-color plots, 229–230 logarithmic scale, 203 three-dimensional plots, 232 low-frequency jitter, 225–226 BER measurements in Ethernet measurement procedure, 213–215 BERT testing, 597–602 median filter, 206 frame error ratio, estimating, 599–600 number of errors optimization, 218–219, 222 frame-by-frame testing, advanced, 600–601 periodic jitter level, 207–210 frame-by-frame testing, simple, 598–599 phase margin, 210 sequencing, 602 pseudo-color plots, 229–230 BER measurements in SONET/SDH Q factor method, 210–213 analysis of, 592–596 random jitter level, 207 SONET/SDH description, 589–592 sample delay scan, 200–226 BER tests and signaling for chip-to-chip link sample point optimization, 215–218 systems sample threshold scan, 226–228 FBDIMM architecture and testing, 804–806 scope-like eye diagram, 233–234 JNB testing for multiple-Gb/s standards, 810 spectral jitter decomposition, 238–241 PCI Express architecture and testing, 800–804 successive refinement algorithms, 237 SATA architecture and testing, 806–810 three-dimensional plots, 232 BER vs. OSNR, 609–618 total jitter, 210 Berlekamp-Massey algorithm, 823 Bessel filter design, 369–371 BERT (bit error ratio testing) Bessel null measurement method, 553–555 accelerated BER measurements, 192 Bessel-shaped receiver, 481 band-pass response, 112–113 Bessel-Thomson (BT) filter, 625, 638–639, BER statistics, 178–192 646–648, 843–844 bit error rate, 171 Bessel-Thomson reference receiver, 268 definitions, 170–171 Bias networks, 85, 112, 122–123, 886, 892, error detector (ED), 171–174 900–901 Derickson.book Page 914 Thursday, November 8, 2007 11:11 AM 914 Index Bias Ts, 121–123, 845–846, 902–910 χ3-based sampling using XPM-induced frequency Bimodal digital data signal, 200–201 shift in HNLF, 486–487 Binary data properties, 13 Cables Binary line codes, 14–20 coaxial cable standards, 857 Binary-to-ternary conversion, 98 matching, 775–777 BIP (binary interleaved parity) codes, 592–596 phase matching of, 773–775 Bipolar return-to-zero (BPRZ) code, 20 See also Coaxial cables Birefringent phase matching, 428–430, 443 Calibration in jitter tolerance testing Bit error rate, 171 description, 553 Bit error ratio (BER). See BER (bit error ratio) J1/J0 measurement method, 555 Bit error ratio testing (BERTs). See BERT (bit measuring SJ with spectrum analyzer, 553–555 error ratio testing) Calibration options in frequency domain Bit labels, 264 measurements Bit periods, 31–33, 196 calibration process, 749 Bit stuffing, 97, 102, 104 one-port calibration, 747–748 Black box models, 695–696 response calibration, 747 Blackman-Harris window, 283 two-port calibration, 748 Block codes, 22–23 CAN (Controller Area Network), 88 BNC connectors, 858 Capacitance Bondwire, 659–660, 668 coaxial structures, 848–849 Bounded uncorrelated jitter (BUJ), 289, 320–321, fringing, 676 550 lossless transmission line, 659 Bounding box, 234–235 parasitic, 111–112, 564, 873, 880, 885, 890, BRI (Basic Rate Interface), 142, 144 899–901 Brownian noise, 281 power plane, 124 Buffer amplifier, 123, 880, 908–910 susceptance, 854–855 BUJ (bounded uncorrelated jitter), 289, 320–321, Capacitive discontinuity, 673, 692 550 Capacitive termination, 669–670 Bulk crystal length, optimum, 443–444 Capacitor coupling network, 107–108, 110–113 Bulk KTP, χ2-based sampling in, 482–484 Capturing waveform records, 262 Bulk nonlinear crystals, χ2-based gates in, Carrier sense multiple access collision detect 443–444 (CSMACD), 68, 150, 862n, 871n Butterworth filters, 256, 324, 843–844 Carrierless Amplitude
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