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Electronic Circuit Board Testing Equipment Series Catalog

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Electronic Circuit Board Testing Equipment Series Catalog Electronic Circuit Board Testing Equipment Series Catalog AutomaticAutomatic TestTest EquipmentEquipment FLYING PROBE TESTER IN-CIRCUIT TESTER BARE BOARD TESTER DATA CREATION SYSTEM 2 From Ueda, Shinshu This year, HIOKI marks the 80th anniversary of its establishment in 1935. As a professional electrical measurement tool provider, we will continue to develop products that offer the solutions our customers need. Our factory at HIOKI headquarters integrates all our departments ― development, production, sales and service ― in Ueda City, Nagano Prefecture, widely known as the Shinshu area, abundant with greenery. This factory enables us to promptly respond to customer demand through in-house development and in-house production. SOLUTION FACTORY The HIOKI Solution Factory integrates all our tasks to provide high-quality products to our customers. Nagano Prefecture Measurement Technologies to Support New Testing Frontiers 3 Design Sales Call center Service Development Solution sales helps customers realize their dreams Development Add ever-greater value Repair and calibration by establishing Board design unique development technologies Production The HIOKI production system ensures high product quality, low cost and short lead times Shipment Vacuum deposition Board mounting Printing instruction manuals Assembly Measurement Technologies to Support New Testing Frontiers 4 INDEX Just because you can’t see it, doesn’t mean we can’t test it. Flying Probe Type High-density, Multi-layer Board Solutions ● Assurance of minute via resistance values and detection of formation defects ● Probing of high-density boards FC-CSP/Ceramic Board ● High-speed measurement of interposer and FPC Solutions package boards ● Capacitance O/S detection function ● High-resistance insulation testing ● Testing of panelized boards ● S tandard 4-terminal measurement function Large ● F l exible support for clamping thin boards ● 100-GΩ high resistance testing Bare board testing ● Automatic transport Testable board size support ■ X-Y BOARD HiTESTER ■ FLYING PROBE TESTER 1270/1271 FA1116 Testable board size Testable board size 1271 : 50×70 mm to 610×510 mm 50×50 mm to 610×510 mm ■ 1270 : 50×50 mm to 400×330 mm See page 12. FLYING PROBE TESTER Small See page 13. FA1282 Testable board size 50×50 mm to 400×330 mm See page 14. Large High-density Populated Board Solutions ● Testing in multi-product small-lot ■ FLYING PROBE TESTER production environments FA1240-51/-52 ● P s eudo-contact testing of IC leads Testable board size Populated board testing Populated ( S t a n d ard 4-terminal measurement 50×50 mm to 510×460 mm Testable board size function) See page 22. ● A ctive test (option) Example of an inline configuration with model FA1240 ■ FLYING PROBE TESTER FA1240-53 Testable board size 50×50 mm to 400×330 mm See page 22. Small 5 Moving fixture type Measurement Units Support for Device Embedded Substrates ● LSI reliability testing (I/O pin leakage current testing, LSI standby current consumption testing, Diode-based connection reliability testing) ● Complex component separation testing (when used with a scanner board equipped with guard feature) ● High-current continuity testing up to 150 mA ● Insulation testing with automatic protection for embedded devices ● Four-terminal continuity testing that assures ■ Test head (fixture) System Expandability pattern resistance 1165-05/-06/-07 ● Testing number of embedded devices ● Ideal for embedding in automatic testing systems ● Multipurpose design ■ BARE BOARD TESTER enables measurement FA1232 between user-specified (Double-sided alignment) points, data collection, Testable board size and other functionalities. 45 × 50 mm to 170 × 305 mm See page 10. ■ BARE BOARD HiTESTER ■ BARE BOARD HiTESTER 1230 1231 (Measurement/Control unit only) (Double-sided alignment) See page 8. Testable board size 15×15 mm to 55×55 mm See page 9. High-speed Testing Solutions ■ Test fixture ● Support for testing in mass production environments CP1167 ● Electrolytic capacitor reverse insertion detection See page 27. function (option) ● Macro test ● Active test (option) ■ IN-CIRCUIT HiTESTER ■ IN-CIRCUIT HiTESTER 1220-50 (Desktop type) See page 20. 1220-51 1220-52 1220-55 (Offline type) (Space-saving model) (Inline use only) Testable board size Testable board size Testable board size 390×300 mm 390×300 mm 390×300 mm See page 20. See page 20. See page 20. 6 Bare Board Electrical Connected through HIOKI format Fixture typeFixture Testing System Electrical testing equipment series All pieces of HIOKI testing equipment, from bare board testers to populated board testers, are connected through the HIOKI format. HIOKI excels in product development with a complementary relationship between populated board testing and bare board testing. FLY-LINE 1741 FIT-LINE UA1780 Bare Board Testing Equipment Testing Board Bare FLYING PROBE TESTER Connect to complement FLYING PROBE TESTER Populated Board Testing Equipment Testing Board Populated FAIL VISUALIZER UA1782 BARE BOARD TESTER Flying probe type probe Flying IN-CIRCUIT HiTESTER 7 Connected through HIOKI format Our bare board testing equipment contains a range of component testing expertise Hioki has Electrical testing equipment series accumulated through years of experience in populated board testing. typeFixture Robust support for testing device embedded substrates Bringing together populated Extensive continuity/insulation electronic component testing functionality measuring technologies Technique that detects any latent defects The bare board tester also utilizes ■ High-current continuity testing up to 200 mA the full range of HIOKI’s in-circuit Jig type achieves 150 mA Equipment Testing Board Bare tester measurement technologies. ● High-reliability continuity testing with high-current application ● High-speed continuity testing for dramatically ■ LSI reliability testing (EAD testing) reduced measurement times ● I/O pin leakage current testing ● Near-open test feature for detecting latent defects ● LSI standby current consumption testing ■ Insulation testing with automatic protection for ● Diode-based connection reliability testing device embedded substrates ● Low-power mode (0.1V measurement) ● Automatic protection of embedded devices during insulation testing ■ Complex component separation testing ● Automatic, low-voltage short testing of nets Equipment Testing Board Populated (when used with a scanner board equipped connecting embedded devices with guard feature) ● Micro-short test feature R L • • VL V ● Guard settings • ● Impulse testing feature for detecting latent defects VR eliminate the effects • ● ARC detection of surrounding circuit I • ■ Four-terminal continuity testing that assures components R C I • trace resistance ● Phase separation uses VR • • ● Trace resistance testing using low-resistance AC measurement VC V testing down to 400 μΩ ■ Testing of other components (DC/AC testing) ● Testing based on theoretical resistance values ● Capacitors (10 pF to 4 mF) ● Detection of via defects on HDI substrates ● Inductance (1 μH to 100 mH) ● D i o d e s R C ● Zener diodes ● Voltage/current R C C R R measurement ● MLCC (multi-layer ceramic capacitors) Supported board type includes Feel free to contact HIOKI at any time ■ HDI substrates to assure trace resistance type probe Flying ● The use of theoretical resistance values generated by SIM-LINE and high-precision 4-terminal resistance measurement assures pattern reliability. ■ Device embedded substrates ● HIOKI utilizes measurement expertise developed for in-circuit testers to provide testing of embedded passive and active devices that’s one step ahead of the competition. 0.1 V low-voltage measurement not affected by semiconductors ■ Flexible boards ● Support for thin boards of 0.05 mm ● A tension clamp to securely hold flexible boards. 8 Bare Board BARE BOARD HiTESTER 1230 Testing Equipment BARE BOARD HiTESTER 1230 Fixture typeFixture Measurement unit with support for testing device embedded substrates Bare Board Testing Equipment Testing Board Bare ■ BARE BOARD HiTESTER 1230 Features ■ (option) Populated Board Testing Equipment Testing Board Populated Benefit from HIOKI’s extensive populated board tester know-how Embedded LSI testing The 1236 can perform the following tests on embedded LSIs: Testing of device embedded substrates • Connection reliability test • Inter-pin open/short test • Current consumption (standby power) test ■ Guarding measurement ■ Icons facilitating intuitive operation The 1230 lets you set guard potentials for up to 5 points, helping you to exclude circuit wraparound as a cause of erroneous readings. *Example: Enter pin 49 as the guard point based on net information. ■ 1230 Specifications Flying probe type probe Flying Maximum number of test points 8,192 pins (4,096 top, 4,096 bottom) (*When using 4 scanner boxes) Maximum number of test steps 10,000 steps Continuity testing: 350 μs; insulation measurement: from 5 ms; Measurement time capacitance and inductance measurement: from 4 ms; resistance measurement: from 1.8 ms Computer (Windows XP), 17” LCD display (stamdard accessory) General specifications Insulation/continuity testing with high-speed function 4-terminal measurement support (with mixed 2-terminal/4-terminal steps) Power supply 200 V AC ±10% (single-phase), 50/60 Hz, Power consumption: 500 VA (main unit), 600 VA (scanner box) Main unit: 328 (W) × 222 (H) × 255 (D) mm HiTESTER dimensions Scanner box: 353 (W) × 327 (H) × 265 (D) mm Main unit: 8.62 kg (with all options) (* CPU board, AD board, IO board, HV board, DC board,
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