DOCSLIB.ORG

AUTOMATIC TEST ENVIRONMENT SETUP a Project

Total Page：16

File Type：pdf, Size：1020Kb

Download full-text PDF Read full-text
AUTOMATIC TEST ENVIRONMENT SETUP a Project AUTOMATIC TEST ENVIRONMENT SETUP A Project Presented to the faculty of the Department of Computer Engineering California State University, Sacramento Submitted in partial satisfaction of the requirements for the degree of MASTER OF SCIENCE in Computer Engineering by Trupti Deepak Naik SPRING 2015 AUTOMATIC TEST ENVIRONMENT SETUP A Project by Trupti Deepak Naik Approved by: __________________________________, Committee Chair Fethi Belkhouche, Ph.D. __________________________________, Second Reader Preetham Kumar, Ph.D. ____________________________ Date ii Student: Trupti Deepak Naik I certify that this student has met the requirements for format contained in the University format manual, and that this project is suitable for shelving in the Library and credit is to be awarded for the Project. __________________________, Graduate Coordinator ________________ Nikrouz Faroughi, Ph.D. Date Department of Computer Engineering iii Abstract of AUTOMATIC TEST ENVIRONMENT SETUP by Trupti Deepak Naik Manual verification in industry testing is a very complex and tedious process. Verification test engineers need to carefully go through various application screens, make the correct oscilloscope setups to get the expected results, try various input combinations and compare the results with the expected behavior. Furthermore, this type of testing is repetitive in nature. With the introduction of the new chips and/or new firmware releases, Automatic Test Environment (ATE) is becoming widely used to address the limitations of the traditional verification testing methods. This project focuses on creating an automated test environment for Solid State Devices (SSD) hardware verification testing. The project will contribute in making the tedious process of manual testing simpler and more time efficient for verification engineers. The project is implemented using Python Scripting Language and Test Environment Suite libraries from Agilent Command Expert tool. It sends Standard iv Commands for Programmable Instruments (SCPI) commands to instruments like Oscilloscope, power supplies, etc. The project automates both the test setup and the documentation of the test results. ______________________, Committee Chair Fethi Belkhouche, Ph.D. _______________________ Date v ACKNOWLEDGEMENTS I offer my sincere gratitude to my project advisor Dr. Fethi Belkhouche for helping me choose my project topic and for the time he spent with me during the entire project implementation. I would also like to thank him for guiding and correcting my project report. A special thanks to Dr. Preetham Kumar for reviewing my project report. I express my thanks to the Computer Engineering department and all the faculty members without whom this project would have been a distant reality. I also extend my heartiest thanks to my family and my well wishers. vi TABLE OF CONTENTS Page Acknowledgements…………………………………………………………….……......vi List of Tables.....………………………………………………………………………...ix List of Figures...……………………………………………………………………….....x Chapter 1. INTRODUCTION………………………………………………………………..1 2. BACKGROUND…………………….……………………...………..…………..5 2.1 Overview of Manual Testing Procedure…….………………………..……5 2.2 Disadvantages of Manual Testing…………….…..….......…...………........7 2.3 General Purpose Interface Bus (GPIB) History and Challenges...…...…….8 3. AUTOMATIC TEST SETUP ENVIRONMENT………..……………………..12 3.1 Architecture of Automatic Test Environment Setup…………..………….12 3.2 Agilent Command Expert Tool……………..…….……………...……….15 3.3 Advantages of Automatic Test Environment Setup…………….………...20 4. DEMONSTRATION OF AUTOMATION SETUP FOR TESTS……………...21 4.1 Power Consumption Measurement Test……….….......………………......21 4.2 Inrush Current Measurement Test…….……..……..…….…….………....30 4.3 Rail Switching Frequency Test…………..…….…..…………..…….........40 4.4 Voltage Rail and Noise Test………….…….……………….....……….....46 4.5 Capacitor Hold Up Time Measurement Test….…….………...……....…..54 vii 5. CONCLUSION ……………………………………………………….………63 Appendix A Results…………………………………………………..……………64 Appendix B Source Code……...……………………...…...……………………....82 References…..……….…………………………………………….…………………96 viii LIST OF TABLES Tables Page 1. Initial Expenditure in Automation Test Environment ………………………..………….2 2. Cost Benefit with Test Automation ………………………….…….………………….....2 ix LIST OF FIGURES Figures Page 1. Manual Test Process Flowchart………...….…….…………….………………………….5 2. GPIB Measurement Setup …………………………………………………………….…..9 3. Architecture of Automatic Test Environment ………………………………………..….12 4. Instrument Communication Block Diagram ………………………………….………….14 5. Agilent Command Expert: Choose Connection Type………...………………….………15 6. Agilent Command Expert: Choose command set...………..…………………….……….16 7. Agilent Command Expert: Connect and simulate Option…..…………..….…………….17 8. Agilent Command Expert: SCPI Commands...…………………...…..………………….19 9. Power Consumption Measurement Test Setup …………………………………………..22 10. Automatic test environment (ATE) main window (GUI)………………………………..26 11. ‘Power Consumption Test’ input parameters..…………………..……………………….27 12. ‘Power Consumption Test’ default input parameters..…………………..……………….28 13. ‘Power Consumption Test’ HTML Report …………………………………..…………..29 14. Current waveform when SSD’s are powered up…………………..……………………..30 15. Inrush Current Measurement Test Setup.…………………………..…………………….32 16. ‘Inrush Current Test’ input parameters..……………………………….…….…………..34 17. ‘Inrush Current Test’ default input parameters..……………….…………..…………….35 18. ‘Inrush Current Test’ HTML Report ……………………………………...……………..37 19. ‘Rail Switching Frequency Test’ Test Setup ……………………………..……………...41 20. ‘Rail Switching Frequency Test’ input parameters..……………………….....………….43 x 21. ‘Rail Switching Frequency Test’ default input parameters..……………..…...………….44 22. ‘Rail Switching Frequency Test’ HTML Report ………………………..…..….………..45 23. ‘Voltage Rail and Noise Test’ Test Setup.………...………………….…….……...........48 24. ‘Voltage Rail and Noise Test’ input parameters..……………….…………..…………...50 25. ‘Voltage Rail and Noise Test’ default input parameters.………..……………….………51 26. ‘Voltage Rail and Noise Test’ HTML Report …………………………..…….…………52 27. Block Diagram of SSD Power Back up System…………………….………………...….54 28. ‘Hold Up Time Test’ Test Setup.…………………...……..………..….……………..….56 29. ‘Hold Up Time Test’ input parameters..………………………….……….…..……..…..59 30. ‘Hold Up Time Test’ default input parameters.……….……………………….……...…60 31. ‘Hold Up Time’ HTML Report ………………………….…….……………………...…61 32. ATE: Power Consumption Test Result..…………………….…..…………..…………...65 33. ATE: Inrush Current Test Result: PASS.…………………………...…………..………..66 34. ATE: Inrush Current Test Result: FAIL ……………………………………….……...…69 35. ATE: Rail Switching Frequency Test Result: PASS…….……………...........…………..72 36. ATE: Rail Switching Frequency Test Result: FAIL…...……………………………...…74 37. ATE: Voltage Rail and Noise Test Result: PASS….…………………...………………..76 38. ATE: Voltage Rail and Noise Test Result: FAIL……………………………………...…78 39. ATE: Hold Up Time Test Result: PASS.……………….……………...……….………..80 40. ATE: Hold Up Time Test Result: FAIL ………………………………………………...81 xi 1 Chapter 1 INTRODUCTION Verification and validation are the key factors that play a vital role in any hardware product lifecycle. These two techniques are required in the design, construction, operation and maintenance stages of any hardware development activity. Verification and validation improve hardware quality and help deliver the best possible hardware to the users. In the field of Computer Engineering, verification engineers establish validation environments and test suites. They are typically responsible for creating validation standards, developing test protocols, implementing test protocols, analyzing test results and documenting the results for further analysis. Their duties also include maintaining the equipment used for testing and optimizing test procedures. Studies done on the benefit analysis of automation [Ref. 1], confirmed that automation benefits are substantial on the long run even when the initial expenditure is high. Table 1, illustrates cost analysis of automation during the initial setup and table 2 shows the benefits of automation. Even though the initial setup for test automation is costly, it can be observed that after the initial period, return on investment (ROI) on test automation is very high. Test engineers are not required to spend their valuable 2 time on repetitive testing. Automation will make significant amount of gain in test execution expenditure. Table 1: Initial Expenditure in Automation Test Environment [Ref. 1] Test Parameters Test Parameters Test Type Automation Manual Tool Cost $134,000 Zero Cost of scripting/test design $30,000 $12500 Cost of executing/running test Zero $102000 Cost of maintenance $11,520 (24 weeks) Zero Total $175,520 $114,500 Return On Investment -45.53% Table 2: Cost Benefit with Test Automation [Ref. 1] Test Parameters 2nd Year(2 cycles) Test Type Automation Manual Test Tool Cost Zero Zero Cost of scripting/test design Zero Zero Cost of executing/running test Zero $204,000 Cost of maintenance $23 040 Zero Total $23 040 $204,000 Return On Investment 135% 3 Automatic test environment also increases the depth and coverage of testing and helps in improving reliability by reducing human errors. It contributes in building efficient product by providing fast, repetitive and reusable test environment and hence reduces the overall cost of the product. Typically in any hardware related testing; verification engineers spend the majority of their time on preparing test setups
Load more

Recommended publications
  • A Labview Research Projects
    A LabVIEW Research Projects The brief description of research projects collected from IEEE journals, Research Labs and Universities are given in this appendix. A.1 An Optical Fibre Sensor Based on Neural Networks for Online Detection of Process Water Contamination It is often required to know the contamination of process water systems from known contaminants e.g., oil, heavy metals, or particulate matter. Most of the governments are forcing rules to monitor the output water from all industrial plants before they may be discharged into existing steams or waterways. There is therefore a clear need for a sensor that is capable of effectively monitoring these output discharges. Optical fibers provide a means of constructing such sensors in an effective manner. Optical fibers are passive and therefore do not them selves contaminate the environment in which they are designed to work. The proposed sensor system is to be operated from and LED or broad- band light source and the detector will monitor changes in the received light spectrum resulting from the interaction of the fibre sensor with its environ- ment. The signals arising from these changes are often complex and require large amounts of processing power. In this proposed project it intended to use Artificial Neural Networks to perform the processing and extract the true sensor signal from the received signal. A.2 An Intelligent Optical Fibre-Based Sensor System for Monitoring Food Quality It is proposed to develop an intelligent instrument for quality monitoring and classification of food products in the meat processing and packaging industry. The instrument is intended for use as an effective means of testing food prod- ucts for a wide range of parameters.
    [Show full text]
  • Drivers" Labview Advanced Programming Techinques Boca Raton: CRC Press LLC,2001
    Bitter, Rick et al "Drivers" LabVIEW Advanced Programming Techinques Boca Raton: CRC Press LLC,2001 5 Drivers This chapter discusses LabVIEW drivers. A driver is the bottom level in the three- tiered approach to software development; however, it is possibly the most important. If drivers are used and written properly, the user will benefit through readability, code reuse, and application speed. LabVIEW drivers are designed to allow a programmer to direct an instrument, process, or control. The main purpose of a driver is to abstract the underlying low- level code. This allows someone to instruct an instrument to perform a task without having to know the actual instrument command or how the instrument communi- cates. The end user writing a test VI does not have to know the syntax to talk to an instrument, but only has to be able to wire the proper inputs to the instrument driver. The following sections will discuss some of the common communication meth- ods that LabVIEW supports for accessing instruments and controls. After the dis- cussion of communication standards, we will go on to discuss classifications, inputs and outputs, error detection, development suggestions, and, finally, code reuse. The standard LabVIEW driver will be discussed first. This standard driver is the basis for most current LabVIEW applications. In an effort to improve application performance and flexibility, a new style of driver has been introduced. The Inter- changeable Virtual Instrument (IVI) driver is a new driver technology and will be described in depth later in this chapter. 5.1 COMMUNICATION STANDARDS There are many ways in which communications are performed every day.
    [Show full text]
  • Programming Guide, Agilent PSG Family Signal Generators
    Programming Guide Agilent Technologies PSG Family Signal Generators This guide applies to the signal generator models and associated serial number prefixes listed below. Depending on your firmware revision, signal generator operation may vary from descriptions in this guide. E8241A: US4124 E8244A: US4124 E8251A: US4124 E8254A: US4124 Part Number: E8251-90025 Printed in USA February 2002 © Copyright 2001, 2002 Agilent Technologies Inc. ii Contents 1. Getting Started . 1 Introduction to Remote Operation . 2 Interfaces. 3 IO Libraries. 3 Programming Language. 4 Using GPIB . 5 1. Installing the GPIB Interface Card . 5 2. Selecting IO Libraries for GPIB. 7 3. Setting Up the GPIB Interface. 7 4. Verifying GPIB Functionality . 8 GPIB Interface Terms. 8 GPIB Function Statements . 9 Using LAN . 14 1. Selecting IO Libraries for LAN . 14 2. Setting Up the LAN Interface . 15 3. Verifying LAN Functionality . 15 Using VXI-11 . 17 Using Sockets LAN . 19 Using TELNET LAN . 20 Using FTP . 24 Using RS-232 . 26 1. Selecting IO Libraries for RS-232 . 26 2. Setting Up the RS-232 Interface . 27 3. Verifying RS-232 Functionality . 28 Character Format Parameters . 29 2. Programming Examples. 31 Using the Programming Examples . 32 Programming Examples Development Environment . 33 Running C/C++ Programming Examples . 33 GPIB Programming Examples . 34 Before Using the Examples . 34 Interface Check using Agilent BASIC . 35 Interface Check Using NI-488.2 and C++ . 36 Interface Check using VISA and C . 37 Local Lockout Using Agilent BASIC . 38 Local Lockout Using NI-488.2 and C++ . 39 Queries Using Agilent BASIC . 41 iii Contents Queries Using NI-488.2 and C++.
    [Show full text]
  • Survey of Electronic Hardware Testing Types, ATE Evolution & Case Studies
    Published by : International Journal of Engineering Research & Technology (IJERT) http://www.ijert.org ISSN: 2278-0181 Vol. 6 Issue 11, November - 2017 Survey of Electronic Hardware Testing Types, ATE Evolution & Case Studies Manjula C Dr. D. Jayadevappa Assistant Professor, EEE Dept., Professor, The Oxford College of Engineering, Bangalore Electronics Instrumentation Dept., JSSATE, Bangalore Abstract - I have undertaken exhaustive survey, to bring out this technical paper covering - Testing principle, Levels, Types, Process, VLSI or Chip testing, Automatic Test equipment (ATE) – configuration, evolution, three case studies of FPGA interfaced with ATE, FPGA generating ATG for ATE and FPGA used with PC scope for VLSI / Chip testing etc. Keywords- Types of testing, Principle of testing, Levels of testing, ATE, Evolution of ATE Testing. INTRODUCTION Fig.1: Basic Testing Approach Testing is an experiment in which the system is exercised C. Level of Testing and its resulting response is analyzed to check its behavior Testing a die (chip) can occur at the following levels: [1]. If incorrect behavior is detected, the system is diagnosed Wafer level and locates the cause of the misbehavior. Diagnosis requires Packaged chip level the knowledge of the internal structure of the system under Board level test. System level A. Importance of Testing Field level In Today‘s Electronics world, more time is required for testing rather than design and fabrication. When the D. Types of Testing circuit/device is developed, it is necessary to determine the Manual testing and Automated Testing: functional and timing specifications of the circuit/device. Devices can be tested in two ways, manually and When the multiple copies of a circuit are manufactured, it is automatically.
    [Show full text]
  • Design of Jig for Automated PCB Testimg
    International Journal of Advanced Research in Electronics and Communication Engineering (IJARECE) Volume 4, Issue 4, April 2015 Design of Jig for Automated PCB Testimg Nilangi U. Netravalkar Sonia Kuwelkar Microelectronics, ETC dept., Asst. Prof. ETC dept., Goa College of Engineering, Goa College of Engineering Goa University, India. Goa University, India. Abstract— Paper includes hardware designing of PCB II. WHY AUTOMATED TESTING? test jig using Raspberry Pi that will be used for automated Automatic test equipment enables printed circuit board test testing of master card PCB used in X ray machines. and equipment test to be undertaken very faster than if it were Automated Test Euipment (ATE) will verify the PCB’s done manually. As time of production staff forms a major functionality and its behavior. The test procedure includes element of the overall production cost of an item of electronics sending of command frame from test jig to the DUT using equipment, it is necessary to reduce the production times as Raspberry Pi controller and receiving the response frame possible which can be achieved with the use of ATE, from the DUT. The command frame and the response automatic test equipment. frame are then compared which determines the test to be pass or fail. The test procedures includes testing of digital ATE systems are designed to reduce the amount of test time inputs outputs of the DUT and also other functionalities of needed to verify that a particular device works or to quickly the master card. The test is usually performed according find its faults before the part has a chance to be used in a final to the OEM test engineer, who defines the specifications consumer product.
    [Show full text]
  • Test and Characterization Methodologies for Advanced Technology Nodes Darayus Adil Patel
    Test and characterization methodologies for advanced technology nodes Darayus Adil Patel To cite this version: Darayus Adil Patel. Test and characterization methodologies for advanced technology nodes. Elec- tronics. Université Montpellier, 2016. English. NNT : 2016MONTT285. tel-01808874 HAL Id: tel-01808874 https://tel.archives-ouvertes.fr/tel-01808874 Submitted on 6 Jun 2018 HAL is a multi-disciplinary open access L’archive ouverte pluridisciplinaire HAL, est archive for the deposit and dissemination of sci- destinée au dépôt et à la diffusion de documents entific research documents, whether they are pub- scientifiques de niveau recherche, publiés ou non, lished or not. The documents may come from émanant des établissements d’enseignement et de teaching and research institutions in France or recherche français ou étrangers, des laboratoires abroad, or from public or private research centers. publics ou privés. Délivré par Université de Montpellier Préparée au sein de l’école doctorale I2S Et de l’unité de recherche LIRMM Spécialité : SYAM Présentée par DARAYUS ADIL PATEL TEST AND CHARACTERIZATION METHODOLOGIES FOR ADVANCED TECHNOLOGY NODES Soutenue le 5 Juillet 2016 devant le jury composé de M. Daniel CHILLET Professeur, Université de Président du Jury / Rennes Rapporteur M. Salvador MIR Directeur de Recherche Rapporteur CNRS, TIMA Mme. Sylvie NAUDET Team Leader, Examinateur STMicroelectronics M. Alberto BOSIO MCF HDR, Université de Examinateur Montpellier M. Patrick GIRARD Directeur de Recherche Directeur de Thèse CNRS, LIRMM M. Arnaud
    [Show full text]
  • GPIB, USB and Instrument Control for Easy PC-To-Instrument Connections
    GPIB, USB and Instrument Control For Easy PC-to-Instrument Connections Keysight instrument control hardware enable: • Easy connection to GPIB instruments based on simple plug-and-play setup and configuration • Use of PC-standard interfaces that are prevalent even on notebook PCs, such as USB and LAN • A wide selection of interfaces to fit your test system application – PCI, PCIe®, USB and LAN • Use of industry-standard I/O libraries which makes integration of existing instruments and software programs in a single system easy, even if you use multiple instrument vendors. Find us at www.keysight.com Page 1 Connecting is as Easy as 1-2-3 1. Install Keysight IO 3. Hook up the instrument 2. Detect instruments and Libraries Suite software control hardware (USB, devices, then configure on your PC LAN, RS-232 or GPIB interfaces with cables) between your Connection Expert instruments and your PC 1. Establish a connection in less than 15 minutes o Keysight IO Libraries Suite eliminates the many working hours it takes to connect and configure PC-controlled test systems, especially if it involves instruments from multiple vendors. In fact, with IO Libraries, connecting your instruments to a PC is as easy as connecting a PC to a printer. 2. Easily mix instruments from different vendors o Keysight IO Libraries Suite eliminates headaches associated with trying to combine hardware and software from different vendors. The software is compatible with GPIB, USB, LAN and RS-232 test instruments that adhere to the supported interface standards, no matter who makes them. o When you install the IO Libraries Suite, the software checks for the presence of other I/O software on your computer.
    [Show full text]
  • Instrument Control Toolbox 2 Control and Communicate with Test and Measurement Instruments
    Instrument Control Toolbox 2 Control and communicate with test and measurement instruments The Instrument Control Toolbox lets you com- municate with instruments, such as oscilloscopes, function generators, and analytical instruments, directly from MATLAB®. With the toolbox, you KEY FEATURES can generate data in MATLAB to send out to ■ Instrument driver support for IVI, VXIplug&play, and an instrument, or read data into MATLAB for MATLAB instrument drivers analysis and visualization. ■ Support for GPIB and VISA standard protocols (GPIB, The toolbox provides a consistent interface to GPIB-VXI, VXI, USB, TCP/IP, serial) all devices independent of hardware manufac- turer, protocol, or driver. The toolbox supports ■ Support for networked instruments using the TCP/IP and IVI, VXIplug&play, and MATLAB instrument UDP protocols drivers. Support is also provided for GPIB, VISA, ■ Graphical user interface for identifying, configuring, and com- TCP/IP, and UDP communication protocols. municating with instruments Working with the Instrument Control ■ Hardware availability, management, and configuration tools Toolbox ■ Instrument driver development and testing tools The Instrument Control Toolbox provides a variety of ways to communicate with instru- ■ Functions for reading and writing binary and text (ASCII) data ments, including: ■ Synchronous and asynchronous (blocking and nonblocking) • Instrument drivers read-and-write operations • Communication protocols ■ Event handling for time-out, bytes read, data written, • Graphical user interface (TMTool) and other events The Instrument Control Toolbox is based ■ Recording of data transferred to and from instruments on MATLAB object technology. The toolbox includes functions for creating objects that contain properties related to your instrument and to your instrument control session. For demos, application examples, Instrument Drivers tutorials, user stories, and pricing: Instrument drivers let you communicate with • Visit www.mathworks.com an instrument independent of device protocol.
    [Show full text]
  • Electronic Circuit Board Testing Equipment Series Catalog
    Electronic Circuit Board Testing Equipment Series Catalog AutomaticAutomatic TestTest EquipmentEquipment FLYING PROBE TESTER IN-CIRCUIT TESTER BARE BOARD TESTER DATA CREATION SYSTEM 2 From Ueda, Shinshu This year, HIOKI marks the 80th anniversary of its establishment in 1935. As a professional electrical measurement tool provider, we will continue to develop products that offer the solutions our customers need. Our factory at HIOKI headquarters integrates all our departments ― development, production, sales and service ― in Ueda City, Nagano Prefecture, widely known as the Shinshu area, abundant with greenery. This factory enables us to promptly respond to customer demand through in-house development and in-house production. SOLUTION FACTORY The HIOKI Solution Factory integrates all our tasks to provide high-quality products to our customers. Nagano Prefecture Measurement Technologies to Support New Testing Frontiers 3 Design Sales Call center Service Development Solution sales helps customers realize their dreams Development Add ever-greater value Repair and calibration by establishing Board design unique development technologies Production The HIOKI production system ensures high product quality, low cost and short lead times Shipment Vacuum deposition Board mounting Printing instruction manuals Assembly Measurement Technologies to Support New Testing Frontiers 4 INDEX Just because you can’t see it, doesn’t mean we can’t test it. Flying Probe Type High-density, Multi-layer Board Solutions ● Assurance of minute via resistance values and
    [Show full text]
  • Lightlab Documentation Release 1.1.0
    Lightlab Documentation Release 1.1.0 Alex Tait, Thomas Ferreira de Lima Jul 14, 2020 Contents: 1 Pre-requisites 3 1.1 Hardware.................................................3 1.2 pyvisa...................................................3 2 Installation 5 2.1 Installation Instructions.........................................5 2.2 Getting Started to Python, Jupyter, git.................................. 15 2.3 Making your changes to lightlab..................................... 26 2.4 Tutorials................................................. 56 2.5 Miscellaneous Documentation...................................... 81 3 API 91 3.1 lightlab package............................................. 91 3.2 tests package............................................... 187 Bibliography 189 Python Module Index 191 Index 193 i ii Lightlab Documentation, Release 1.1.0 This package offers the ability to control multi-instrument experiments, and to collect and store data and methods very efficiently. It was developed by researchers in an integrated photonics lab (hence lightlab) with equipment mostly controlled by the GPIB protocol. It can be used as a combination of these three tasks: 1. Consolidated multi-instrument remote control 2. Virtual laboratory environments: repeatable, shareable 3. Utilities for experimental research: from serial comm. to testing, analysis, gathering, post- processing – to paper-ready plotting 4. All structured in python Fig. 1: lightlab in a Jupyter notebook We wrote this documentation with love to all young experimental researchers that are not necessarily familiar with all the software tools introduced here. We attempted to include how-tos at every step to make sure everyone can get through the initial steps. Warning: This is not a pure software package. Lightlab needs to be run in a particular configuration. Before you continue, carefully read the Pre-requisites and the Getting Started to Python, Jupyter, git sections.
    [Show full text]
  • USB and LAN Interfaces for Connecting Measurement Instruments
    Keysight Technologies Impedance Analyzers and Vector Network Analyzers Optimizing Connections Using USB and LAN Interfaces Application Note Introduction Since the Keysight E4990A and E4991B impedance analyzers were released, all Keysight impedance analyzers, the E4982A LCR meter and benchtop vector network analyzers now have Universal Serial Bus (USB) and Local Area Network (LAN) interfaces (Figure 1). Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, General Purpose Interface Bus (GPIB), LAN, and USB are the most popular interfaces for connecting measurement instruments to PCs. Although GPIB has been the standard interface for connecting test instruments to PCs and for providing programmable instrument control for decades, no major enhancements have been done since the 1990s. On the other hand, USB and LAN are computer-industry standard I/O technologies, and most of PCs offer built-in USB and LAN interfaces. The USB and LAN standards have been continuously enhanced and the performances have improved rapidly in response to the growing needs for high-speed digital applications (Figure 2). This application note describes the benefits of using modern USB and LAN interfaces compared to GPIB. Impedance Analyzers Vector Network Analyzers E4990A E4991B PNA Family ENA Series (5 Hz to 20 GHz) (20 Hz to 120 MHz) (1 MHz to 3 GHz) (300 kHz to 1.1 THZ) E5061B/63A, E5071C/72A, E5080A E4982A LCR Meter (1 MHz to 3 GHz) Figure 1. Keysight benchtop impedance analyzers and vector network analyzers GPIB IEEE 488 GPIB (488.1) IEEE 488.2 SCPI IEEE Ethernet 802.3 Ethernet Gbit 10 Gbit LAN / LXI 10 Mb/s Standard 100 Mb/s Ethernet Ethernet LXI 1970 1980 1990 2000 2010 72 75 83 87 95 98 04 05 96 03 08 13 USB USB 1.0 USB 2.0 USBTMC USB 3.0 USB 3.1 (12 Mb/s) (480 Mb/s) (5 Gb/s) (10 Gb/s) Figure 2.
    [Show full text]
  • Keysight Technologies Simpliied PC Connections for GPIB Instruments
    Keysight Technologies Simpliied PC Connections for GPIB Instruments Application Note Introduction If you are an R&D, manufacturing or test engineer in the electronics industry, chances are you use your test instru- ments for more than simple benchtop measurements. At some point, most engineers need to program and control test instruments and communicate with them from a PC or laptop. Until recently, there hasn’t been a quick and easy way to physically connect test instruments to your computer, much less an easy way to get your PC and test equipment to communicate smoothly with each other. If you are like most engineers, you have wasted a lot of time and effort getting your instruments hooked up, dealing with driver issues and writing code, all in a simple quest to make your test instruments talk to each other and to your PC. There are some new solutions available to save you time with these connectivity issues so you can have more time to spend on more productive tasks. The purpose of this paper is to walk you through the choices you need to make when you are setting up your automated tests and introduce you to some of the hardware options available that can simplify your connection, communication, and programming tasks. Making the hardware connection is just the irst step in mastering the whole connectivity challenge. For assistance with other aspects of connectivity, register for free information on the Keysight Connectivity at www.keysight.com/ ind/IO. Making the Physical Connection In the past, RS-232 and GPIB have been the primary interfaces used for connecting instruments to PCs in test and measurement applications.
    [Show full text]