Proceedings of the 50th Hawaii International Conference on System Sciences | 2017 Reverse Engineering Integrated Circuits Using Finite State Machine Analysis Jessica Smithy, Kiri Oler∗, Carl Miller∗, David Manz∗ ∗Pacific Northwest National Laboratory Email: fi
[email protected] yWashington State University Email:
[email protected] Abstract are expensive and time consumptive but extremely accurate. Due to the lack of a secure supply chain, it is not possible Alternatively, there are a variety of non-destructive imaging to fully trust the integrity of electronic devices. Current methods for determining if an unknown IC is different from methods of verifying integrated circuits are either destruc- an ’assumed-good’ benchmark IC. However, these methods tive or non-specific. Here we expand upon prior work, in often only work for large or active differences, and are which we proposed a novel method of reverse engineering based on the assumption that the benchmark chip has not the finite state machines that integrated circuits are built been corrupted. What is needed, and what we will detail upon in a non-destructive and highly specific manner. In in the following sections, is an algorithm to enable a fast, this paper, we present a methodology for reverse engineering non-destructive method of reverse engineering ICs to ensure integrated circuits, including a mathematical verification of their veracity. We must assume the worst case scenario in a scalable algorithm used to generate minimal finite state which we have no prior knowledge, no design documents, machine representations of integrated circuits. no labeling, or an out-of-production IC. The mathematical theory behind our approach is pre- 1.