〉 〉 f 〉 λ c λ λ elength v Standards -parameter Wa deviation profile deviation f profile filter W λ rm Cutoff (Wavelength) Cutoff (Wavelength) viness profile W viness profile ・ Fo roughness profile =Mean line for profile on old DIN & JIS =Waviness Wa profile) (Filtered center line waviness c λ does not exceed the limit, the result is acceptable. does not exceed σ is not less than the limit, the result is acceptable. + σ - μ μ P-parameter R-parameter Primary profile P c profile filter Max value - the max rule (when “max” suffix is added) “max” - the max rule (when Max value Upper limit - the 16% rule (Default) as L) limit - the 16% rule (shown Lower λ Roughness profile profile Waviness Roughness profile R Measure the surface that can be expected the lowest roughness. the lowest that can be expected Measure the surface If not more than 16% of all sampling length are less than the limit, or when Measure on the most critical surface. If not more than 16% of all value If not more than 16% of all value Measure on the most critical surface. is acceptable. the limit, surface based on sampling length are exceed 70% of the limit. does not exceed The first value - the limit. do not exceed The first three values - the limit. exceed - Not more than one of the first six value the limit. exceed value of the first twelve - Not more than two or when The value is acceptable when none of value in entire surface is over the is over in entire surface when none of value is acceptable The value limit. Phase correct filter 50% at cutoff transmission No phase shift / low distortion s λ m) 0 μ m) 50% μ otal profile ( T 100% • Stylus deformation • Noise tip s profile filter

λ Transmission 2 5 or 2 10, 5 or 2 2 (5 at RZ > 3 Real surface tip aced profile sr Tr perpendicular to real surface λ c/ probe λ m) Stylus method μ Contour Measuring Instruments Measuring Contour ・ ) cone ° Z axis tip r c & Stylus Tip r c & Stylus θ λ m (or 5, 10 (or 90 ° μ X axis

= 2 the table. again. it in shorterCheck sampling length at non-periodic and change it if it meets. = 60 tip Stylus tip geometry r θ

ule, c (mm) Measure perpendicular to lay or condition. 8 25 8 25 2.5 8 300 0.080.250.8 2.5 100 30 r 3.2 result and measure it Change condition according with above 3.3 if the result does not reached the condition. “3.2” Repeat 3.4final value. When the result reaches the condition, it will be the 3.1 condition in Estimate roughness and measure it in corresponding f periodic. λ Selection of Evaluation procedure of roughness procedure Evaluation ’96 ISO4288: Profile by Stylus and phase correct filter Stylus and phase correct by Profile ’96 ’97 and ISO3274: ISO4287: 4. limit in accordance with following tolerance Compare the result toward 3. limit is not specified. When the tolerance 2. on the left shown limit is specified, use the table When the tolerance 1. and decide whether profile is periodic or non- the surface View

Definition of Surface texture and Stylus instrument Stylus and texture of Surface Definition Surface Texture Surface Characteristics of Surface Explanation

・ Contour Measuring Instruments

Surface Texture 230 Surface Texture ・ Contour Measuring Instruments 231 n R n f R λ eature f E. length E. Length of E. length E. w p m) R R μ fm ( length eature f c/2) λ alue limit S. Length of V λ (Plane, Line) (Plane, length p ( ost travel S. P R 0.8/Ra75 0.2 1 － ule p = n r 2.5/Rz3max 12.3 No. of No. r R － Mean line w = m R No. of No. Comparison 16% or max 0.008 R ” m: specified m: c round – λ g U 0.008 Mean line 2RC “ n L c Profile element width Xs f m Note.: item (red) is not indicated. Default is indicated if necessary. Additional item (blue) m λ ＝ λ n s (Default 5) (Default μ μ m 8 λ No. of S. length of S. No. μ r 2.5 (n: specified) (n: 25 R 02 (n: Default 5) Default (n: , 3

: r m m Example Lp c max 12.3 c Roughness profile R R μ μ m λ ＋ 2 5 λ × adius μ r n Stylus Ln ameter r 10 ＝ ＋ (for roughness) (for Measuring condition: W-parameter Measuring condition: ISO1302 Measuring condition : P-parameter Measuring condition : ’96 ISO4288: Primary profile P n Pa Bottom of profile valley Lp R Profile valley Profile Type

5/Rz3 ＝ r R Lt r R × length 5 n (mm) = Evaluation R and condition c (mm) λ

acing length － r = s Tr Evaluation length Evaluation The second surface parameter parameter The second surface λ ansmission band R Default is table below is table Default c (mm) CutOff length: r Tr Measuring Condition λ Sampling R ≤ U “2RC” 0.008–2. op of profile Profile peak T peak r c a b or Phase correct 2RC R 0.4 1.3 2.5 12.5 or RSm iodic profile r Manufacturing methodManufacturing and condition parameter Surface Filter d Pe Over> Less c λ , X, M, C, R, P , X, M, C, 0 ≤ ⊥ , or e ＝ Lower L Lower Upper U m) RSm (mm) = Cutoff Sampling length μ Surface lay and orientation lay Surface c/2) or Rt λ 05 p ( Rz,Rv,Rp,Rc, Over> Less Pre travel R Required ≤ 01 q m) Rz ( ∆ Machining μ Material removal Non-periodic profile allowance (mm) allowance not allowed or R Ra ( 0.0060.02 0.020.121 0.1 0.025 2 0.1 0.1 0.5 0.013 0.5 0.04 10 0.04 0.08 0.13 0.13 0.4 0.25 0.4 0.8 1.25 4 Over> Less Ra,Rq,Rsk,Rku 10 80 50 200 1.3 4 8 40 Measuring condition: R-parameter Measuring condition: ’96 ISO4288: Indication of surface texture ’02 ISO 1302: Sampling length and Evaluation length Evaluation length and Sampling ’97 ISO4287: 2 75 Ra Rq Ra 〉 (x) dx 2 〉

0 L 〉

L 0

n 1 0 L r 1 L n 1 r = Z (x) dx Sampling length L Sampling length L Sampling length L 75 Standards Center line average (Old Ra, AA, CLA) Root mean square deviation Ra Arithmetical mean deviation ・ 75 Ra, Pa, Wa = Z (x) dx Ra, Pa, Wa = Amplitude average parameters average Amplitude Rq, Pq, Wq = Z alues Z(x) within a sampling length. alues Z(x) within a sampling Arithmetic mean of the absolute ordinate value Arithmetic mean of the absolute ordinate value Z(x) in a sampling length of roughness profile with 2RC filter of 75% transmission. Annex of JIS only Annex & DIN ANSI Same as Ra at old ISO, Ra Ra Pa Wa Rq Pq Wq Root mean square value of the ordinate values of the ordinate values Root mean square value Z(x) within a sampling length. Arithmetic mean of the absolute ordinate v jis Rt Rz Ztm 4th Zp 1st 1st Zti Zv Rp5 m Zp Σ l = 1 n Zti Rv4 2nd R 1 Zv m 3rd 4th Zp 5 Zv Σ Zt3 j = 1 2nd 1 5 Sampling length L 3rd Sampling length L Zp Evaluation length Evaluation Zt2 Zv Rv2 = (Zpj + Zvj) Rp2 jis en point height of roughness profile T (Rz at JIS’94) Rc, Pc, Wc = Mean height of profile elements otal height of profile 5th T (Pt = Rmax at JIS’82) Rz r Zv 5th jis r Zt1 aluation length. Zp Sum of height of the largest profile peak height Sum of height of the largest Rv within an valley Rp and the largest profile ev Mean value of the profile element heights Zt Mean value within a sampling length. Annex of JIS only and confirm to JIS’94 Annex from Rz at JIS’82 Different Profile element: Profile peak & the adjacent valley Rz of largest peak to the fifth Sum of mean value to of largest valley largest peak and mean value within a sampling length. the fifth largest valley Rc Pc Wc Rt, Pt, Wt = max (Rpi) + max (Rvi) Rt, Pt, Wt = max Rt Pt Wt Rv Rz Rp ) ) ) ) x x ( ( 84) ’ Rp Contour Measuring Instruments Measuring Contour Amplitude parameters (peak and valley) (peak and parameters Amplitude Zvi Rv ・ Zpi Zv2 Sampling length L Sampling length L Rz = Rp + Rv Sampling length L Zp2

Maximum height of profile Maximum (Rz = Ry at ISO4287 Rv, Pv, Wv = min (Z Maximum profile valley depth profile valley Maximum Maximum profile peak height Maximum Rp, Pp, Wp = max (Z Rp, Pp, Wp = max

Zv1 Zp1 The largest profile valley depth Zp within a The largest profile valley sampling length. Sum of height of the largest profile peak height Rv within a Rp and the largest profile valley sampling length. Different from Rz at old ISO, ANSI & JIS from Rz at old ISO, Different Rz Pz Wz Rv Pv Wv Rp Pp Wp

The largest profile peak height Zp within a The largest profile peak sampling length. Surface Texture Surface Characteristics of Surface Explanation Basic surface texture parameters and curves parameters surface texture Basic

・ Contour Measuring Instruments

Surface Texture 232 Surface Texture ・ Contour Measuring Instruments 233 c δ Rku > 3 Rku < 3 Rsk > 0 Rsk < 0 R (Rmr0) . 3 4 0 C =

r r 0 Probability density Probability density 0 R 0 R ) 1 C r r c, δ 1 1 R R R --

0 4 3 tosis of profile 1 1 r Rq Rq = C

Ku Skewness 1 0% Rmr0 Rmr 100% related to a reference c related to a reference 0 Rmr = Rmr (c C Relative material ratio Relative c, m) C1 C0 δ μ Rsk = Z (x) dx Rsk = Rku = Z (x) dx alues Z(x) and cube Pq, Rq, Wq respectively, Wq respectively, Rq, alues Z(x) and cube Pq, Rt ( 100% or Quotient of mean quartic of the ordinate values Wq respectively, of Pq, Rq, Z(x) and 4th power within a sampling length. Rsk Psk Wsk Rku Pku Wku Quotient of mean cube value of the ordinate of the value Quotient of mean cube v within a sampling length. Height characteristic average parameters average Height characteristic Material determined ratio at a profile section R level Rmr Pmr Wmr 2 c δ R Probability density amplitude curve d dx L 0 dZ (x) / dx 1 L c(Rmr2) : c(Rmr2) : Rmr1

W 0% W P Ve material ratio. given R R 100% Rt Rt c c Xsi (%) i m Σ 84) i = 1 ’ (c) 1 n m n R R R M m Σ i = 1 (c) i (c) r n Profile R 100 r Sampling length L Material of profile ratio tp) (Rmr(c) = ex- Evaluation length Evaluation Evaluation length Evaluation Mean width of the profile elements Mean width of the profile (RSm = Sm at ISO4287 Spacing parameters ) ) ) c c c ( (c) 1 M ( ( arameter from bearing ratio curve and profile height amplitude curve ratio curve bearing and profile arameter from Xs1 Xs2 Xs3 Xsi Xsm (c) M r P aluation length. RSm, PSm, WSm = RSm, PSm, WSm R Rmr (c) = M M RSm PSm WSm Mean value of the profile element width Xs of the profile element Mean value within a sampling length. Material curve profile of the ratio Firestone curve) (Abbott Curve representing the material of the ratio c. profile as a functional of level Ratio of the material length of the profile c to the level elements Ml(c) at a given ev Pmr Wmr Rmr n R 〉 Rvq 〉 99 〉 Equivalent triangle area A2 Rmq Equivalent straight line Evaluation length Valley area A2 Secant with smallest gradient Equivalent straight line c λ 40% & ISO13565-1: ’96 / -2: ’96 / -3: ’98 & ISO13565-1: Equivalent triangle area A1 Rpq Confirm to ISO4287: ’96, ISO12085: ’96 Confirm to ISO4287: Peak area A1 Standards 0.8 mm2.5 mm 12.5 mm 4 mm 0 0% Mr1 Mr2 100% Cutoff value ・ 0% Mr1 Mr2 100% m) Rk 0 µ Rvk m) Rpk Measuring conditions of ISO13565-1 40% length secant of smallest gradient separate 40% length secant of smallest core area & projected the material ratio curve into areas. equivalent triangles of Calculate Rpk & Rvk with projected areas. μ Rk UPL LPL UVL LVL Rvk Rpk Rt ( Rt ( Material ratio Mr (%) on Standard probability scale -3s -2s s 0 -s 2s 3s 0.1% 1 10 30 50% 70 90 99.9% Roughness core area n X R n Mean line 3 R Mean line 1 : Depth of the roughness core profile core profile. : Average height of protruding peaks above roughness core profile. : Average depth of valleys projecting through roughness which separates : Level in %, determined for the intersection line the protruding peaks from the roughness core profile. which separates : Level in %, determined for the intersection line the deep valleys from the roughness core profile. Plateau region Primary profile Roughness profile 4 Peak area Evaluation length Evaluation length parameter: slope of a linear regression performed through the plateau region. parameter: slope of a linear regression performed through the valley region. parameter: relative material ratio at the plateau to valley intersection. ） Valley area ） ） Roughness profile 4 Pmq Valley region core roughness depth reduced peak height reduced valley depths material portion 1 material portion 2 Ppq Pvq Profile 2 Profile 2 Mean line 1 （ （ （ m m m m m µ µ µ µ µ Roughness profile 4 0 1 2 -2 -1 Rvq Rmq Rpq Height characterization using the material probability curve of ISO13565-3 Draw a material ratio curve on normal probability paper from the roughness profile 4 (primary profile) of an evaluation length. Separate the material probability curve to 2 area, upper plateau area and lower valley area. Rk Rpk Rvk Mr1 Mr2 Calculate mean line 1 from a primary profile Calculate mean line 1 from with phase correct filter. valley lower Calculate profile 2 with cutting than mean line 1. profile 2 with Calculate mean line 3 from phase correct filter. Calculate roughness profile 4 by taking mean line 3 off from a primary profile. Filtering process of ISO13565-1:’96 Height characterization using the linear material ratio curve ISO13565-2:’96 Height characterization using the linear material Parameters of surfaces having stratified functional properties ISO13565's properties stratified functional of surfaces having Parameters n. H -H or zero r. R 3z5 R Reset Zi n. count m Z5 = RmaxDIN R 3zi

n 3z4 Σ i = 1 n Σ Z4 i = 1 r r R × 1 n R Contour Measuring Instruments Measuring Contour × 1 n Z3 ・ Mean line n = 5 r. r in an evaluation length r in an evaluation length 3z3 n = 5 R R R Maximum peak to valley height Maximum peak to valley height Average peak to valley R unit length (1cm or 1 inch) Z2 3z2 R3z = Reset RzDIN =

Reset Peak density /cm: ASME B46.1: ’95 Peaks per inch: SAEJ911 High spot count Base roughness depth r r count 2nd 3z1 Traditional local parameters Traditional R

R Z1 count 1st Pc is the number of peaks counted when a profile intersects a lower boundary line –H and an upper line +H per unit length 1 cm. PPI shows Pc in 1 inch (25.4mm) unit length. HSC shows the number of peaks when the lower boundary level is equal to zero. R3z is arithmetic mean of 3Zi’s of 5 sampling lengths in an evaluation length 3Zi is the height of the 3rd height peak from the 3rd depth valley in a sampling length Pc PPI HSC R3z German old standard DIN4768/1: ’90 RmaxDIN RzDIN RzDIN is arithmetic mean of 5 Zi. RzDIN is arithmetic mean Zi is the maximum Peak to valley height of a Zi is the maximum Peak sampling length RmaxDIN is the maximum Zi of 5 adjoining RmaxDIN is the maximum sampling length

Expanded surface texture parameters and curves texture parameters surface Expanded Surface Texture Surface Characteristics of Surface Explanation

・ Contour Measuring Instruments

Surface Texture 234 Surface Texture ・ Contour Measuring Instruments 235 m μ = 2 tip r H c 0.25mm c 0.8mm c 0.25mm λ λ θ λ c is short. λ m ε μ = 2 – 1) tip θ r L (1/cos

tip with stylus unable to contact on triangle r ε = ε 20 × <15˚, or H/L=0.1-0.01 on machined surface. 2000 Profile distortion with cutoff Roughness parameter conversion Roughness parameter Display aspect ratio & Stylus fall depth in valley 2000 2000 Roughness profile R phase correct Roughness profile with 2RC filter Primary profile P Roughness profile R phase correct High magnification ratio profile on display Actual magnification ratio profile on surface Roughness profile will have bigger profile distortion & smaller amplitude when cutoff The parameter ratio Ra/Rz (Rmax, Ry)=0.25 is The parameter ratio Ra/Rz profile. applicable only to triangle parameter ratios Actual profiles have different profile. according to the form of Rectangle: Ra/Rz=0.5 Sinusoidal: Ra/Rz=0.32 Triangle: Ra/Rz=0.25 Lathed, Milled: Ra/Rz=0.16 to 0.26 Ground, Sand blasted: Ra/Rz=0.10 to 0.17 Honing, Lapped: Ra/Rz=0.05 to 0.12 Pulse (Duty ratio 5%): Ra/Rz=0.095 have big distortion according to phase shift. × Roughness profile usually displayed as much magnified height deviations than wavelength. Stylus Displayed valley looks sharp but actually wide. can contact to bottom of valley. Depth error valley is; θ Hint of surface texture measurement Hint of surface texture × × ） m Wx limit limit value value （μ s λ

n=16mm ） R mm Roughness motif （ n R R parameter W parameter

j + 1 ） m = 2n Straight lines joining the n n mm m = 2n Waviness profile R HW R （ (n: Total number of waviness motifs)

j (default value need not to be indicated) (n: Total number of roughness motifs) B ） j sA HW AWi AB λ H ARi 0.020.10.52.5 0.1 0.5 2.5 0.64 12.5 3.2 16 2.5 80 2.5 8 25 n = 1 m Σ Σ A (mm j = 1 Default A=0.5mm, B=2.5mm, Default A=0.5mm, B=2.5mm, ’02 Indication of ISO1302: Roughness motif Measuring condition n n n R m j Waviness motif The maximum value of the depths Hj of Σ Σ j = 1 i = 1 Primary profile R R 1 The arithmetical mean value of the lengths 1 n m The arithmetical mean value of the lengths HW 1 n 1 m The arithmetical mean value of the depths Hj of The arithmetical mean value of the depths HWj of AWi = The largest depth HWj, within the evaluation length. j + 1 W = j + 1 R = Distance between the highest point and the lowest point H AW H AR = local peak of profile j+1 ARi & H Motif parameters of ISO12085: ’96 of ISO12085: Motif parameters j Motif derived by using the ideal operator with limit value A. Motif derived by using the ideal operator with limit Motif derived on upper envelope line by using ideal operator with limit value B Waviness motif Maximum length of roughness motif to separate waviness motif. Maximum length of roughness motif to separate Maximum length of waviness motif ARi (AWi) Waviness profile j H local peak of profile j W: mean depth of waviness motifs: Wx: Maximum depth of waviness: waviness motifs, within the evaluation length, i.e. Wte: Total depth of waviness: of waviness profile. H Motif length Ari or AWi Motif length Ari or to the general Length measured parallel direction of the profile. Motif depths H to the Depth measured perpendicular profile. general direction of the primary Motif profile between the A portion of the primary peaks of the highest points of two local adjacent. profile, which are not necessarily R: Mean depth of roughness motifs: Rx: Maximum depth of roughness motifs: Upper envelope line of the primary profile (Waviness profile): Upper envelope line of the primary profile (Waviness conventional discrimination of peaks. highest points of peaks of the primary profile, after AR: Mean spacing of roughness motifs: i.e. ARi of roughness motifs, within the evaluation length, roughness motifs, within the evaluation length, i.e. roughness motifs, within the evaluation length. Roughness motif: Limit value A: Limit value B: Waviness motif: AW: Mean spacing of waviness motifs: Awi of waviness motifs, within the evaluation length, i.e. m m m m μ μ m μ m μ q, μ N8 N7 μ R 10 0,5 50 λ

〉 ≤ ≤ ≤ 0,1 2 × a, ≤ ≤ 10 q c m ≤ 〉 λ tp R Sk Ry Rz Ra Rq λ Sm Δ Ry = 1.6 mm Ry5 μ 2RC Lo, D Lo, a, ——— ——— ——— ——— ——— ——— ——— ——— Rymax 〉 Rm, Rc n = n Δ ormer ISO R ISO468-'82 f ISO1302-'78 ISO4288-’85 Analog signal without filtering S, 3.2 1.6 2 < Ra ISO4287/1-’84 with suffix "max" 16% rule default 0,1 < Ra Rp, Rpmax, Rp5, Rp, 0,02 < Ra 10 < Rz, Ry 0,5 < Rz, Ry 0,1 < Rz, Ry Max rule for parameter parameter Max rule for q λ R

Standards a, × q c m λ Pt R Ry Rz Ra Rq Rp λ Sm Δ mm μ 2RC a, Rmax Sk, Ek ——— ——— ——— ——— Δ ・ L = n not defined not defined not defined not defined not defined not defined not defined not defined not defined not defined Pp, Pa, (Tp)c, Pa, Pp, R, AR, Kr, W, W, R, AR, Kr, S, Analog signal ormer France without filtering Ra 1.6 - 3.2 f NF E05-015(’84) NF E05-016(’78) NF E05-017(’72) W’max, W’t, AW, Kw W’t, AW, W’max, Pt 0.8 - 0.6 Rmac 1.6 m m m μ m μ μ μ B 0.8 B 2.5 B 0.25 in. 0.05 0.5 λ λ λ ≤ ≤ 0.16 μ ≤ B Ra λ (tp) (Rz) (Rp) (Rq) 2RC ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— m or mm or in. μ eak-to-Valley eak-to-Valley ormer U.S.A. 63 P f erage value of all value erage (Peak count Pc) (Peak 125 low pass filtering pass low sampling lengths ANSI B46.1-’85 Height (Rmax, Ry) Analog signal with cutoff value 2.5 cutoff value Roughness spacing L:2.4-8mm@ av L:5-15mm @ 0.02 < Sm 0.063 < Sm (Skewness, Kurtosis) (Skewness, L:1.3-5mm@ 0.0063 < Sm m m m μ μ m μ μ m 25 6.3 ≤ ≤ μ 100 c or over 0.8 ≤ ≤ c m λ c or over

indication) , Rz , Rz λ Rmax=1.6 Rmax=0.8 × mm 12.5 μ 2RC 3.2 1.6 λ S

indication) indication) ≤ ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— × a optional Z max , Rz max Ra ormer Japan Analog signal max without filtering f erage value of all value erage JIS B0601-’82 JIS B0031-’82 Rz ( Ra ( L=3 sampling lengths 1 sampling length R Rmax ( 12.5 < Ra av TL=L=3 0.25, 0.8, 2.5, 8, & 25 6.3 < R 0.8 < R

country m standard μ age m Filter 0.8mm 2.5mm ID. of national ID. 0.8mm 2.5mm μ 0.25mm 0.25mm Aver < 1.5 16% rule m alley height alley height alley RMS slope Long cutoff parameters Short cutoff erage peak to erage v v Indication of material ratio Unit of height Unit of length μ Profile format en point height en point height Mean spacing Maximum ruleMaximum T T Sampling length maximum height maximum Maximum height Maximum Maximum height Maximum Av Motif parameters Evaluation length Evaluation Evaluation length Evaluation Other parameters Maximum peak to Maximum Other peak height Other P parameters Arithmetic average root mean square kurtosis Skewness, Contour Measuring Instruments Measuring Contour ・ Indication of Ra in case of Rz < 1.5 c for λ in case of 1.5 < Ra < 3.1 Indication of Maximum height Indication of Maximum c for Ra on c for

eraging Height r & λ P profile profile P R profile profile R Primary R profile av parameter parameter parameter parameter parameter Roughness R R profile other

r & tolerance limits tolerance R Comparison rule of non-periodic profile measured value with with measured value peak height parameter Specification

Comparison of national standards of surface texture measurement texture of surface national standards of Comparison Surface Texture Surface Characteristics of Surface Explanation

・ Contour Measuring Instruments

Surface Texture 236 Surfcom ・ Contourecord Options 237 r R r e R R m m m m m s filter m μ r μ μ μ μ λ μ R 2 0.1 10 × 0.5 50 q ≤ ≤ 10 r ≤ c s ≤ ≤ m ≤ Pmr, Ppq, Pvq, Pmq Ppq, Pvq, Pmr, Δ Ra Rq R λ λ mm μ c, RSm R ——— Rmr(c) ——— Rz max e = 5 δ Rsk, Rku Rp, Rv, Rc Rv, Rp, Pt, Pz(=Pt) R Phase correct ISO1302:’02 erage method Rz erage 2 < Ra Rpq, Rvq, Rmq 0.1 < Ra 10 < Rz 0.5 < Rz 16% rule default 16% rule default 0.1 < Rz 0.02 < Ra EU, U.K. & Japan U.K. EU, Av = 1 sampling length U 0.008-2.5/Rz 1.5 L -0.25/Rz 0.7 U 0.008- /Pt 1.5 U“2RC” -0.8/Ra75 3.1 U“2RC” -0.8/Ra75 1.5 L“2RC” Rmr, Rpk, Rvk, Rk, Mr1, Mr2, Rmr, or total height Rt in 1 R, AR, Rx, W, AW, Wx, Wte Wx, AW, W, R, AR, Rx, Maximum height Rz in 1 Maximum c, ISO13565’s, (JIS B0671’s) ISO13565’s, ISO4287:’97 (JIS B0601:’01) ISO4287:’97 (JIS B0633:’01) ISO4288:’96 erage value of all sampling lengths value erage ISO12085:’96 (JIS B0631:’00) q, Pmr(c), P δ = Length of the measured feature = Length of the measured Pp, Pv, Pc, Pa, Pq, Psk, Pku, PSm, Pq, Psk, Pa, Pc, Pv, Pp, R av Δ Calculate for each sampling length each Calculate for Max rule for parameter with suffix "max" parameter Max rule for P m m R m m s filter Digital data with m m μ μ μ μ λ μ μ in.) 2 2 R 0.1 0.1 ≤ ≤ μ × ≤ ≤ 10 10 q c s ≤ ≤ tp Rt Rz Ra Rq Rmax = 1.6 λ λ Sm Δ .S.A. Rmax ——— U ——— ——— ——— ——— ——— m (or Rsk, Rku L = 5 a, SAE Peak PPI, a, SAE Peak mm (or in.) not defined not defined not defined Rp, Rpm, Rv Rp, μ eak density Pc Δ 2 < Ra 2 < Ra 0.1 < Ra 0.1 < Ra P ASME B46.1-’95 Cutoff length : Cutoff length : 3.2 1.6 0.02 < Ra 0.02 < Ra Phase correct (or 2RC) Digital data with Htp, Htp, m m m m μ μ μ m m μ r μ μ 10 0.5 50 R r ≤ 2 ≤ ≤ 0.1 × ≤ ≤ 10 r R c m ≤ c 0.25 S tp Ra R λ Sm mm μ Ry1.6~0.8 λ ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— in 1 e = 5 Digital data R ormer Japan Phase correct f JIS B0601-’94 JIS B0031-’94 2 < Ra without filtering erage value of all value erage 0.1 < Ra en point height Rz sampling lengths 0.02 < Ra T Maximum height Ry Maximum av 10 < Rz, Ry Maximum height Ry Maximum 0.5 < Rz, Ry 0.1 < Rz, Ry 1.6~3.2 m m m m m m μ μ μ μ μ μ 2 0,1 c 10 50 0,5 ≤ ≤ 10 c ≤ c ≤ ≤ m ≤ R Rt Pt Ra λ × Rmax = 1,6 R mm μ 15 / Pt 1,6 Rmax ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— 5 & 50mm Digital data Max rule for Max rule for DIN4771-'77 DIN4775-'82 DIN4776-’90 DIN4777-’90 DIN4768-’90 height Rmax Phase correct 0,5, 1,5, 5, 15 without filtering 2 < Ra 0,1 < Ra ormer Germany 10 < Rz en point height Rz 0,5 < Rz f 0,1 < Rz 3,2 1,6 0,02 < Ra T 16% rule for Ra, Rz 16% rule for Maximum two point two Maximum m m m m m m μ r μ μ μ N8 N7 μ μ R 2 in) 0,1 × 10 50 0,5 ≤ ≤ 10 r ≤ ≤ ≤ B μ ≤ S tp Ry Rz Ra R λ Sm 2RC Ry =1.6 m ( ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— ——— e = 5 16% rule ——— μ mm (inch) ormer U.K. R f Analog signal without filtering 2 < Ra 0,1 < Ra with suffix "max" 10 < Rz 0,5 < Rz 0,1 < Rz 3.2 1.6 0,02 < Ra BS1134 part 2-'90 BS1134 part 1-’88 Max rule for parameter parameter Max rule for