Definition of Surface texture and Stylus instrument Confirm to ISO’02 ISO4287:’97 Profile by Stylus and phase correct filter ISO4287:’97 and ISO3274:’96 Sampling length and Evaluation length

Total profile Primary profile Ｐ Form deviation profile

=Mean line for roughness profile Primary profile P Mean line Measure perpendicular to lay =Waviness profile on old DIN & JIS X-axis Z-axis Stylus method probe P-parameter

λs profile filter λc profile filter Real surface λf profile filter

Phase correct filter Traced profile perpendicular 50% transmission at cutoff Roughness profile R Profile peak Mean line to real surface No phase shift / low distortion Top of profile peak Stylus tip geometry Waviness profile W θ ° ･Stylus deformation Roughness profile R (Filtered center line waviness profile) θ=60 ( or 90°) cone ・ Noise rtip rｔｉｐ=2µm( or 5, 10µm) R-parameter W-parameter 100% Selection of λs & Stylus tip rtip Profile valley Profile element width Xs Sampling length lr Bottom of profile valley Roughness profile λc (mm) λc／λs rtip (µm) Waviness profile = Cutoff λc lr lr lr lr 0.08 30 2.5 2 50% 0.25 100 Evaluation length ln = n×lr （n: Default 5）

0.8 300 2 (5 at Rz >3µm) Pre travel Post travel lp (λ /2) lp (λ /2) 2.5 8 5 or 2 c Traversing length Lt = Lp + Ln + Lp c

Transmission 0 8 25 10, 5 or 2 λs Cutoff (Wavelength) λｃ λc Wavelength λ λf

ISO4288:’96 Measuring condition: R-parameter Evaluation procedure of roughness ISO4288:’96 Indication of surface texture ISO1302:’02 Note.： Non-periodic profile Measuring condition 1. View the surface and decide whether profile is periodic or non-periodic. Default item（red）is not indicated. Periodic profile 2. When the tolerance limit is specified, use the table shown on the left for condition. Additional item（blue）is indicated if necessary. Ra,Rq,Rsk,Rku Rz,Rv,Rp,Rc, or RSm Sampling Evaluatio not allowed Required or R∆q or Rt length : lr n length 3. When the tolerance limit is not specified. = ln (mm) Ra (µm) Rz (µm) RSm (mm) Cutoff = 3.1 Estimate roughness and measure it in corresponding condition in the table. λc (mm) 5 × lr Material removal Manufacturing method Surface parameter and condition Over> Less≤ Over> Less≤ Over> Less≤ 3.2 Change condition according with above result and measure it again.

0.006 0.02 0.025 0.1 0.013 0.04 0.08 0.4 3.3 Repeat “3.2” if the result does not reached the condition. c ground

3.4 When the result reaches the condition, it will be the final value. a Example U 0.008-2.5/Rz3max 12.3 0.02 0.1 0.1 0.5 0.04 0.13 0.25 1.25 Check it in shorter sampling length at non-periodic and change it if it meets. 0.1 2 0.5 10 0.13 0.4 0.8 4 edb 3 L “2RC”0.008-0.8/Ra75 0.2 4. Compare the result toward tolerance limit in accordance with following rule, =

2 10 10 50 0.4 1.3 2.5 12.5 Upper limit - the 16% rule (Default)

10 80 50 200 1.3 4 8 40 Measure on the most critical surface. If not more than 16% of all value based Machining Surface lay and orientation The second surface parameter

allowance(mm) ═, ┴, X, M, C, R, P and condition on sampling length are exceed the limit, surface is acceptable. ISO4288:’96 Measuring condition : P-parameter - The first value does not exceed 70% of the limit. - The first three values do not exceed the limit. Stylus radius λs λc No. of lp = n S.length lp E.length ln - Not more than one of the first six value exceed the limit. Upper U Filter Transmission Parameter No. of Comparison rule Value limit 2µm 2.5µm Length of Length of - Not more than two of the first twelve value exceed the limit. or Phase band λs - λc S.length Lower L correct (mm) n 16% (µm) feature feature or when µ+σ does not exceed the limit, the result is acceptable. or Default is table Profile Type （Defaut 5） or 5µm 8µm — 1 (Plane, 2RC on left max Line) Lower limit - the 16% rule (shown as L) 10µm 25µm Measure the surface that can be expected the lowest roughness. If not more than 16% of all sampling length are less than the limit, Measuring condition: W-parameter ISO1302:’02 or when µ-σ is not less than the limit, the result is acceptable. U”2RC” 0.008-2.5/Rz3max 12.3 No. of lw = m S. length lw E. length ln λc λf Max value - the max rule (when “max” suffix is added)

λc (for roughness) n λc (n: specified) m: specified λf mλf The value is acceptable when none of value in entire surface is over the limit.

SURFCOM ACCRETECH Basic surface texture parameters and curves Confirm to ISO4287:'97

Amplitude parameters (peak and valley) Amplitude average parameters Spacing parameters Hybrid parameters Height characteristic average parameters

Rp Rt Ra RSm RΔq Rsk Pp Maxmum profile peak height Pt Total height of profile Pa Arithmetical mean deviation PSm Mean width of the profile elements PΔq Root mean square slope Psk Skewness Wp Wt (Pt = Rmax at JIS’82) Wa WSm (RSm = Sm at ISO4287 ‘84) WΔq Wsk Quotient of mean cube value of the The largest profile peak height Zp within Sum of height of the largest profile peak Arithmetic mean of the absolute Mean value of the profile element width Root mean square value of the ordinate ordinate values Z(x) and cube Pq,Rq,Wq a sampling length. height Rp and the largest profile valley ordinate values Z(x) within a sampling Xs within a sampling length. slopes dZ/dX within a sampling length. respectively, within a sampling length.

Rv within an evaluation length. length. 1 m 1 1 lr Rp, Pp, Wp = max(Z(x)) RSm, PSm, WSm = ── ∑ Xsi Rsk = ─── ── ∫ Z3(x) dx I=1 RΔq, 1 L d 2 3 0 Rt, Pt, Wt = max(Rpi)+max(Rvi) 1 L m Rq lr PΔq, = ──∫ ─ Z(x) dx Rp Ra, Pa, Wa = ── ∫ | Z(x) | dx 0 Zp1 0 WΔq L dx Zp2 Rp5 L Zpi Rp2 Ra Xs1 Xs2 Xs3 Xsi Xsm dZ(x)/dx Rsk>0

Rt

Rsk<0 Sampling length L lr Rv2 Rv4

Evaluation length ln Sampling length L Sampling length L Sampling length L Probability density

Rv Rc Rq Parameter from bearing ratio curve and profile height amplitude curve Rku Pv Maximum profile valley depth Pc Mean height of profile elements Pq Root mean square deviation Pku Kurtosis of profile Wv Wc Wq Material ratio curve of the profile Profile height amplitude curve Wku (Abbott Firestone curve) The largest profile valley depth Zp Mean value of the profile element Root mean square value of the ordinate Sample probability density function of Quotient of mean quartic of the ordinate within a sampling length. heights Zt within a sampling length values Z(x) within a sampling length. Curve representing the material ratio of ordinate Z(x) within an evaluation values Z(x) and 4th power of Pq,Rq,Wq the profile as a functional of level c. length. 1 m respectively, within a sampling length. Rv, Pv, Wv = min(Z(x)) Rc, Pc, Wc = ── ∑ Zti 1 L 1 1 lr 2 I=1 Rq, Pq, Wq = ∫ Z (x) dx Ml(c)1 Ml(c)i ─── ── ∫ 4 m 0% Rku = Z (x) dx L 0 4 0 Zt1 Ztm Rq lr Zt2 Zt3 c Zti Rq2 Rt Rku>3

Rv 100%

0% 100% 0 Probability Zv1 Zv2 Zvi Sampling length L Rmr(c) density Sampling length L Evaluation length ln Rku<3 Profile height Profile element: Sampling length L Profile Bearing ratio curve amplitude curve Profile peak & the adjacent valley Probability density

Rz RzJIS Ten point height of roughness Ra75 Center line average Rmr(c) Rδc Rmr Pz Maximum height of profile profile (Rz at JIS’94) (Old Ra,AA,CLA) Pmr(c) Material ratio of profile Pδc Profile section height difference Pmr Relative material ratio Wz (Rz = Ry at ISO4287 ‘84) Sum of mean value of largest peak to Wmr(c) (Rmr(c) = ex- tp) Wδc Wmr the fifth largest peak and mean value of Arithmetic mean of the absolute Sum of height of the largest profile peak largest valley to the fifth largest valley ordinate value Z(x) in a sampling length Ratio of the material length of the profile Vertical distance between two section Material ratio determined at a profile height Rp and the largest profile valley within a sampling length. of roughness profile with 2RC filter of elements Ml(c) at a given level c to the levels of given material ratio. section level Rδc, related to a reference Rv within a sampling length. 1 75% transmission. evaluation length. c 5 Rδc = c(Rmr1)-c(Rmr2) : Rmr1

RzJIS C0 Rz c c(Rmr1)

Rδc Rδc Rv Rt Zv5th Zv Zv Zv3rd 4th 2nd c(Rmr2) C1 Zv1st Sampling length L

Sampling length L 100% or 100% or Sampling length L Rt(µm) Rt(µm) Annex of JIS only and confirm to JIS’94 Annex of JIS only Evaluation length ln Different from Rz at old ISO,ANSI &JIS Different from Rz at JIS’82 Same as Ra at old ISO,ANSI & DIN 0% Rmr1 Rmr2 100% 0%Rmr0 Rmr 100%

SURFCOM ACCRETECH Confirm to ISO4287:’96, ISO12085:’96 Expanded surface texture parameters and curves & ISO13565-1:'96 / -2:’96 / -3:’98

Traditional local parameters Parameters of surfaces having stratified functional properties ISO13565's Motif parameters of ISO12085:’96 Hint of surface texture measurement

RmaxDIN: Maximum peak to valley height Filtering process of ISO13565-1:’96 Measuring condition of ISO13565-1 Motif: A portion of the primary profile Measuring condition Roughness parameter conversion RzDIN: Average peak to valley height Calculate mean line 1 from a primary profile Cutoff value λc Evaluation length ln between the highest points of two local Default A=0.5mm、B=2.5mm, ln=16mm The parameter ratio Ra／Rz (Rmax,Ry)=0.25 with phase correct filter. 0.8mm 4 mm peaks of the profile, which are not is applicable only to triangle profile. Mean line 1 necessarily adjacent. A(mm) B(mm) ln (mm) λs (µm) Zi is the maximum Peak to valley height of a 2.5mm 12.5mm Actual profiles have different parameter ratios sampling length lr. according to the form of profile. 40% length secant of smallest gradient separate the 0.02 0.1 0.64 2.5 RmaxDIN is the maximum Zi of 5 adjoining Motif depths Hj & Hj+1: Depth measured Primary profile X material ratio curve into core area & projected areas. sampling length lr in an evaluation length ln. perpendicular to the general direction of the 0.1 0.5 3.2 Rectangle: Ra/Rz=0.5 Calculate Rpk & Rvk with equivalent triangles of primary profile. RzDIN is arithmetic mean of 5 Zi. Calculate profile 2 with cutting valley lower projected areas. than mean line 1. 0.5 2.5 16 8 Sinusoidal: Ra/Rz=0.32 1 n Valley area A2 Peak area A1 Motif length Ari or AWi: Length measured RzDIN = Σ Zi Profile 2 0 2.5 i=1 Equivalent parallel to the general direction of the profile. 12.5 80 25 n Mean line 1 Equivalent Triangle: Ra/Rz=0.25 Z5=RmaxDIN triangle Z2 Rpk area A1 triangle Indication of ISO1302:’02 Z1 Z3 Z4 Calculate mean line 3 from profile 2 with area A2 local peak of profile local peak of profile Roughness motif Lathed, Milled: Ra/Rz=0.16 to 0.26 phase correct filter. Equivalent straight line Profile 2 Mean line 3 Rk λs– A / ln /R parameter limit value Ground, Sand blasted: Ra/Rz=0.10 to 0.17

Hj Hj+1 Calculate roughness profile 4 by taking mean Waviness motif Rvk lr line 3 off from a primary profile. Honing, Lapped: Ra/Rz=0.05 to 0.12 ln=5lr ARi(AWi) A – B / ln / W parameter limit value Rt(µm) 100% Pulse (Duty ratio 5%): Ra/Rz=0.095 0% Mr1 Mr2 German old standard DIN4768/1:’90 40% roughness profile 4 Secant with (default value need not to be indicated) smallest gradient R3z: Base roughness depth Height characterization using the linear material ratio curve ISO13565-2:’96 Roughness motif: Motif derived by using the ideal operator with limit value A. Display aspect ratio & Stylus fall depth in Rk: core roughness depth: Depth of the roughness core profile Limit value A: Maximum length of roughness motif to separate waviness motif. valley 3Zi is the height of the 3rd height peak from Rpk:reduced peak height: Average height of protruding peaks above roughness core profile. Upper envelope line of the primary profile (Waviness profile): Straight lines joining the Roughness profile usually displayed as much the 3rd depth valley in a sampling length lr. Rvk:reduced valley depths: Average depth of valleys projecting through roughness core highest points of peaks of the primary profile, after conventional discrimination of peaks. magnified height deviations than wavelength. AR: Mean spacing of roughness motifs: The arithmetical mean value of the lengths AR of Displayed valley looks sharp but actually profile. i R3z is arithmetic mean of 3Zi’s of 5 sampling Mr1: material portion 1: Level in %, determined for the intersection line which separates the roughness motifs, within the evaluation length, i.e. wide. Stylus can contact to bottom of valley.

lengths in an evaluation length ln. protruding peaks from the roughness core profile. 1 n Depth error ε with stylus unable to contact on

1 n Mr2: material portion 2: Level in %, determined for the intersection line which separates the AR= Σ ARi (n: Total number of roughness motifs) triangle valley is; ε= rtip(1/cosθ - 1) R3z = Σ 3zi deep valleys from the roughness core profile. n I=1 θ<15˚, or H/L=0.1-0.01 on machined surface. i=1 R: Mean depth of roughness motifs: The arithmetical mean value of the depths H of n Roughness core area 0 j rtip=2µm Roughness profile 4 roughness motifs, within the evaluation length, i.e. High magnification ratio Equivalent straight line 1 m profile on display Peak area Rpk R= Σ Hj m=2n x2000 m j=1 3z5 Rx: Maximum depth of roughness motifs: The maximum value of the depths Hj of 3z1 3z2 3z3 3z4 roughness motifs, within the evaluation length. Rk Waviness profile x20 Primary profile Actual magnification ratio profile on surface

rtip=2µm Rvk x2000 θ lr H Hj+1 ln=5×lr Valley area j Evaluation length ln Roughness motif x2000 ε H Rt(µm) 0% Mr1 Mr2 100% ARi ln L

Pc Peak density /cm: ASME B46.1:’95 Height characterization using the material probability curve of ISO13565-3 Waviness motif: Motif derived on upper envelope line by using ideal operator with limit value Profile distortion with cutoff PPI Peaks per inch: SAEJ911 Draw a material ratio curve on normal probability paper from the roughness profile 4 (primary B Roughness profile will have bigger profile HSC High spot count profile) of an evaluation length. Limit value B: Maximum length of waviness motif distortion & smaller amplitude when cutoff λc is short. Separate the material probability curve to 2 area, upper plateau area and lower valley area. AW: Mean spacing of waviness motifs: The arithmetical mean value of the lengths Awi of Pc is the number of peaks counted when a Rpq (Ppq) parameter: slope of a linear regression performed through the plateau region. waviness motifs, within the evaluation length, i.e. Primary profile P 1 n profile intersects a lower boundary line -H Rvq (Pvq) parameter: slope of a linear regression performed through the valley region. Rmq (Pmq) parameter: relative material ratio at the plateau to valley intersection. AW= Σ Awi (n: Total number of waviness motifs) and an upper line +H per unit length 1 cm. PPI shows Pc in 1 inch (25.4mm) unit length. n I=1 UPL LPL UVL LVL Roughness profile R phase correct λc 0.8mm HSC shows the number of peaks when the Roughness profile 4 Plateau region W: mean depth of waviness motifs: The arithmetical mean value of the depths HWj of

lower boundary level is equal to zero. 0.1% 1 10 30 50% 70 90 99 99.9% waviness motifs, within the evaluation length, i.e. 2µm 1 m

W = Σ HWj m=2n count 1st count m H 1µm Rpq Rmq m j=1 Roughness profile R phase correct λc count 2nd Wx: Maximum depth of waviness: The largest depth HWj, within the evaluation length. 0.25mm Wte: Total depth of waviness: Distance between the highest point and the lowest point of 0µm Rvq waviness profile.Waviness profile

HWj Wx -1µm HW j+1 Roughness profile with 2RC filter λc 0.25mm -H have big distortion according to phase shift. Mean line Reset Reset or -2µm Reset unit length(1cm or 1 inch) valley region -3s -2s s 0 -s 2s 3s AWi zero Evaluation length ln Waviness motif Material ratio Mr(%) on Standard probability scale ln

SURFCOM ACCRETECH Comparison of national standards of surface texture measurement ID. of national JIS B0601-’82 ANSI B46.1-’85 NF E05-015(’84) ISO468-'82 BS1134 part 1-’88 DIN4768-’90 JIS B0601-’94 ASME B46.1-’95 ISO4287:’97 (JISB0601:’01) standard JIS B0031-’82 NF E05-016(’78) ISO4287/1-’84 BS1134 part 2-'90 DIN4771-'77 JIS B0031-’94 ISO4288:’96 (JISB0633:’01) NF E05-017(’72) ISO4288-’85 DIN4775-'82 ISO12085:’96 (JISB0631:’00) country ISO1302-'78 DIN4776-’90 ISO13565’s, (JISB0671’s) Specification DIN4777-’90 ISO1302:’02 former Japan former U.S.A. former France former ISO former U.K. former Germany former Japan U.S.A. EU, U.K. & Japan Primary Profile format Analog signal Analog signal with Analog signal Analog signal Analog signal Digital data Digital data Digital data with λs filter Digital data with λs filter profile P without filtering low pass filtering without filtering without filtering without filtering without filtering without filtering Evaluation length 1 sampling length ——— not defined ——— ——— 0,5, 1,5, 5, 15 ——— ——— = 1 sampling length 0.25,0.8,2.5,8,&25 & 50mm = Length of the measured feature P profile Maximum height Rmax(S indication) ——— Pt ——— ——— Pt ——— ——— Pt, Pz(=Pt) Ten point height Rz (Z indication) ——— ——— ——— ——— ——— ——— ——— ——— parameter Other ——— ——— Pp, Pa, (Tp)c, ——— ——— ——— ——— ——— Pp,Pv,Pc,Pa,Pq,Psk,Pku,PSm, P parameters P∆q,Pmr(c),Pδc,Pmr,Ppq,Pvq,Pmq Motif parameters ——— ——— R, AR, Kr, W, ——— ——— ——— ——— ——— R, AR, Rx, W, AW, Wx, Wte W’max, W’t, AW, Kw Indication of Rmax=1.6 ——— Pt 0.8 - 1.6 ——— ——— ——— ——— 15 / Pt 1,6 U 0.008- / Pt 1.5 maximum height Rmax=0.8 <1.5µm Roughness Unit of height µm µm or µin. µm µm µm (µin) µm µm µm (or µin.) µm profile R Unit of length mm mm or in. mm mm mm(inch) mm mm mm (or in.) mm Filter 2RC 2RC 2RC 2RC 2RC Phase correct Phase correct Phase correct(or 2RC) Phase correct Long cutoff λc λB λc λc λB λc λc λc λc Short cutoff ——— cutoff value 2.5µm ——— ——— ——— ——— ——— λs λs Sampling length L=3 x λc or over L:1.3-5mm@λB 0.25 l l lr lc lr Cutoff length : l lr Evaluation length TL=L=3 x λc or over L:2.4-8mm@λB0.8 L = n x l ln = n x l le = 5 x lr 5 x lc le = 5 x lr L = 5 x l le = 5 x lr L:5-15mm @λB2.5 Calculate for each sampling length lr R profile Maximum height ——— Peak-to-Valley Ry Ry ——— Rt Maximum height Ry Rt Maximum height Rz in 1 lr Height (Rmax,Ry) in 1 lr or total height Rt in 1 le Height Maximum peak to ——— ——— Rmax Rymax Ry Maximum two point ——— Rmax Rz max valley height height Rmax parameter Ten point height ——— (Rz) Rz Rz Rz ——— Ten point height Rz ——— ——— Average peak to ——— ——— ——— Ry5 ——— Ten point height Rz Maximum height Ry Rz Average method Rz valley height Other peak height ——— (Rp) Rp Rp, Rpmax, Rp5, ——— ——— ——— Rp, Rpm, Rv Rp, Rv, Rc parameters Rm, Rc

lr & λc for 0.25mm Rmax, Rz ≤ 0.8µm ——— not defined 0,1

R profile Mean spacing ——— Roughness spacing Sm Sm Sm ——— Sm Sm RSm other RMS slope ——— ——— ∆q ∆q ——— ——— ——— ∆q R∆q parameter material ratio ——— (tp) ——— tp tp ——— tp tp Rmr(c) Other parameters ——— (Peak count Pc) S, ∆a, λa, λq S, ∆a, λa, λq, S ——— S Htp, ∆a, SAE Peak PPI, Rδc, Rmr, Rpk, Rvk, Rk, Mr1, Mr2, Lo, D Peak density Pc Rpq, Rvq, Rmq Comparison rule Average average value of all average value of all not defined ——— ——— ——— average value of all not defined average value of all sampling of measured sampling lengths sampling lengths sampling lengths lengths value with 16% rule ——— ——— not defined 16% rule default 16% rule 16% rule for Ra, Rz ——— not defined 16% rule default tolerance limits Maximum rule ——— ——— not defined Max rule for Max rule for Max rule for ——— not defined Max rule for parameter with parameter with Rmax parameter with suffix "max" suffix "max" suffix "max" SURFCOM ACCRETECH

SURFCOM ACCRETECH