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Bibliography Books on Solid State Physics Ashcroft, N. w., and Mennin, N. D., Solid State Physics (Saunders, Philadelphia, 1976). An advanced text. Blakemore, J. S., Solid State Physics (Cambridge University Press, Cambridge, 1985). An introduction to solid-state physics; deals more thoroughly with semiconductors and excess carrier phenomena. Bube, R. H. Electronic Properties of Crystalline Solids (Academic Press, New York, 1974). An advanced text with more thorough treatment of optical properties and re combination processes. Bums, G. Solid State Physics (Academic Press, Orlando, 1985). An introduction to basic concepts of solid-state physics; also deals with such topics in solid-state physics as surface science and artificial structures. Kittel, C. Introduction to Solid State Physics (Wiley, New York, 1986). An advanced text useful for reference. Smith, R. A. Semiconductors (Cambridge University Press, Cambridge, 1978). A thor ough account of the basic theory of semiconductors. Wert, C. A., and Thomson, R. M. Physics of Solids (McGraw-Hill, New York, 1970). An introductory text. For additional references on various topics in solid state physics, see texts by Blakemore (1985) and Bums (1985). Books on Optical Properties of Inorganic Solids Abeles, F. (Editor). Optical Properties of Solids (North-Holland, Amsterdam, 1972). Balkanski, M. (Editor). Handbook on Semiconductors. Vol. 2. Optical Properties of Sol- ids. (North-Holland, Amsterdam, 1980). Bergh, A. A., and Dean, P. J. Light-Emitting Diodes (Clarendon Press, Oxford, 1976). Blakemore, J. S. Semiconductor Statistics (Pergamon, New York, 1962). Bube, R. H. Photoconductivity of Solids (Wiley, New York, 1960). Curie, D. Luminescence in Crystals (Methuen, London, 1963). Di Bartolo, B. (Editor). Luminescence of Inorganic Solids (Plenum, New York, 1978). 273 274 BIBUOGRAPHY Goldberg, P. (Editor). Luminescence of Inorganic Solids (Academic Press, New York, 1966). Greenaway, D. L., and Harbeke, G. Optical Properties and Band Structure of Semicon- ductors (Pergamon, Oxford, 1968). Leverenz, H. W. An Introduction to Luminescence of Solids (Dover, New York, 1968). Lumb, M. D. (Editor). Luminescence Spectroscopy (Academic Press, New York, 1978). Moss, T. Optical Properties of Semiconductors (Butterworths, London, 1959). Moss, T. S., Burrell, G. J., and Ellis, B. Semiconductor Opto-Electronics (Wiley, New York, 1973). Pankove,1. I. Optical Processes in Semiconductors (Dover, New York, 1971). A valuable source with much technical information on optical properties and processes in semiconductors. Rose, A. Concepts in Photoconductivity and Allied Problems (Wiley, New York, 1963). Seraphin, B. O. (Editor). Optical Properties of Solids-New Developments (North-Hol land, Amsterdam, 1976). Townsend, P. D., and Kelly, 1. C. Colour Centres and Imperfections in Insulators and Semiconductors (Chatto and Windus, Sussex University, 1973). Willardson, R. K., and Beer, A. C. (Editors), Semiconductors and Semimetals. Vol. 3. Optical Properties of III-V Compounds. (Academic Press, New York, 1967). Williams, E. W., and Hall, R. Luminescence and the Light Emitting Diode (Pergamon, Oxford, 1978). Books Devoted to Scanning Electron Microscopy Ehrenberg, W., and Gibbons, D. J. Electron Bombardment Induced Conductivity (Academic Press, London, 1981). Goldstein, 1. I., Newbury, D. E., Echlin, P., Joy, D. c., Fiori, C., and Lifshin, E. (Edi tors). Scanning Electron Microscopy and X-ray Microanalysis (Plenum, New York, 1981). Goldstein, 1. I., and Yakowitz, H. (Editors). Practical Scanning Electron Microscopy (Plenum, New York, 1975). Heinrich, K. F. J. Electron Beam X-ray Microanalysis (Van Nostrand, New York, 1981). Holt, D. B., and Joy, D. C. (Editors). SEM Microcharacterization of Semiconductors (Academic Press, London, 1989). Holt, D. B., Muir, M. D., Grant, P. R., and Boswarva, I. M. (Editors). Quantitative Scanning Electron Microscopy (Academic Press, London, 1974). Joy, D. C., Romig, Jr., A. D., and Goldstein, J. I. (Editors). Principles ofAnalytical Elec tron Microscopy (Plenum, New York, 1986). Newbury, D. E., Joy, D. c., Echlin, P., Fiori, C. E., and Goldstein, 1. I. Advanced Scan ning Electron Microscopy and X-ray Microanalysis (Plenum, New York, 1986). Oatley, C. W. Scanning Electron Microscopy. I. The Instrument (Cambridge University Press, Cambridge, 1972). Reimer, L., Scanning Electron Microscopy (Springer-Verlag, New York, 1985). Thornton, P. R. Scanning Electron Microscopy-Application to Materials and Device Science (Chapman and Hall, London, 1972). Wells, O. C. Scanning Electron Microscopy (McGraw-Hill, New York, 1974). References Akagi, K., Kukimoto, H., and Nakayama, T. (1978). J. Luminescence 17, 237. Alexander, E., Kalman, Z. H., Mardix, S., and Steinberger, I. T. (1970). Phi/os. Mag. 21, 1237. Alig, R. C. (1983). Phys. Rev. B27, 968. Alig, R. C., and Bloom, S. (1977). J. Electrochem. Soc. 124, 1136. Alig, R. C., Bloom, S., and Inoue, M. (1981). J. Phys. (Paris) 42, C6-484. Alig, R. c., Bloom, S., and Struck, C. (1980). Phys. Rev. B22, 5565. Angus, 1. c., and Hayman, C. C. (1988). Science 241, 913. Artamonov, O. M., and Samarin, S. N. (1979). Radiation Effects 40,201. Ashen, D. J., Dean, P. 1., Hurle, D. T. J., Mullin, 1. B., and White, A. M. (1975). J. Phys. Chem. Solids 36, 1041. Atkinson, D. I. H., and McMillan, P. W. (1974). J. Mater. Sci. Lett. 9, 692. Aven, M., and Devine, 1. Z. (1973). J. Luminescence 7, 195. Aven, M., and Prener, J. S. (Editors) (1967). Physics and Chemistry of II-VI Compounds, North Holland, Amsterdam. Bakker, J., de Poorter, J., Bartels, W. 1., V. Dongen, T., Nijman, w., and Stady, W. T. (1980). J. Electron. Mater. 9, 311. Balk, L. 1. (1988). Advances in Electronics and Electron Physics 71, 1. Balk, L. 1., and Kubalek, E. (1973). Beitr. Electronenmikroskop. Direktabb. Oberfl. 6, 551. Balk, L. J., and Kubalek, E. (1977). In Scanning Electron Microscopy 1977/1, ed. O. Johari, SEM Inc., Chicago, p. 739. Balk, L. J., Kubalek, E., and Menzel, E. (1976). In Scanning Electron Microscopy 1976, ed. O. Johari, SEM Inc., Chicago, p. 257. Balk, L. J., and Kultscher, N. (1983). In Microscopy of Semiconducting Materials, Oxford, lOP Conf. Ser. No. 67 (lOP, Bristol), p. 387. Barker, C. E. (1987). In Process Mineralogy VI, ed. R. D. Hagni, The Metallurgical Society of AIME, p. 159. Barker, C. E., and Wood, T. (1987). In Process Mineralogy VI, ed. R. D. Hagni, The Metallurgical Society of AIME, p. 137. Barrett, D. L., McGuigan, S., Hobgood, H. M., Eldridge, G. w., and Thomas, R. N. (1984). J. Crystal Growth 70, 179. Batstone, 1. L., and Steeds, J. W. (1985). In Microscopy of Semiconducting Materials (lOP, Bristol), p. 383. Bebb, H. B., and Williams, E. W. (1972). In Semiconductors and Semimetals, Vol. 8, eds. R. K. Willardson and A. C. Beer, Academic Press, New York, p. 181. Bensahel, D. and Dupuy, M. (l979a). Phys. Stat. Sol. aSS, 203. Bensahel, D. and Dupuy, M. (I 979b). Phys. Stat. Sol. a56, 99. 275 276 REFERENCES Bensahel, D., Dupuy, M., and Pfister, J. C. (l979a). Phys. Stat. Sol. ASS, 211. Bensahel, D., Magnea, N., and Dupuy, M. (1979b). Solid State Commun. 30,467. Bergh, A. A., and Dean, P. 1. (1976). Light Emitting Diodes, Clarendon Press, Oxford. Bhargava, R. N. (1982).1. Cryst. Growth 59, 15. Bimberg, D., Christen, 1., Fukunaga, T, Nakashima, H., Mars, D. E., and Miller, 1. N. (1987).1. Vac. Sci. Technol. B5, 1191. Bimberg, D., Christen, J., Fukunaga, T, Nakashima, H., Mars, D. E., and Miller, 1. N. (1988). Superlattices and Microstructures 4, 257. Bimberg, D., Christen, 1., Steckenborn, A., Weimann, G., and Schlapp, W. (1985b). 1. Lumines cence 30, 562. Bimberg, D., Christen, J., Werner, A., Kunst, M., Weimann, G., and Schlapp, W. (1986). Appl. Phys. Lett. 49, 76. Bimberg, D., Miinzel, H., Steckenborn, A., and Christen, J. (I 985a). Phys. Rev. B 31,7788. Bishop, H. E. (1974). In Quantitative Scanning Electron Microscopy, eds. D. B. Holt, M. D. Muir, P. R. Grant, and I. M. Boswarva, Academic Press, New York, p. 41. Blakemore, J. S., and Rahimi, S. (1984). In Semiconductors and Semimetals, Vol. 20, eds. R. K. Willardson and A. C. Beer, Academic Press, New York, 1984, p. 233. Bode, M., Jakubowicz, A., and Habermeier, H. U. (1987). In Proceedings of the Second Interna tional Symp. on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Elsevier, New York, p. 155. Bond, E. F., Haggis, G. H., and Beresford, D. (1974).1. Microscopy 100, 271. Booker, G. R. (1981). In Microscopy of Semiconducting Materials (lOP, Bristol), p. 203. Booker, G. R., Ourmazd, A., and Darby, D. B. (1979).1. Phys. 40, Suppl. 6, p. C6-19. Boulou, M., and Bois, D. (1977).1. App/. Phys. 48,4713. Brafman, 0., and Steinberger, I. T (1966). Phys. Rev. 143, 501. Brandt, G., and Mikus, M. (1987). Wear 115, 243. Breitenstein, O. (1982). Phys. Stat. Sol. 871, 159. Breitenstein, O. (1987). In Microscopy of Semiconducting Materials (lOP, Bristol), p. 787. Breitenstein, 0., and Heydenreich, 1. (1983).1. Phys. Colloq. 44, C4, 207. Breitenstein, 0., and Heydenreich, J. (1985). Scanning 7,273. Breitenstein, 0., and Heydenreich, J. (1989). In SEM Microcharacterization of Semiconductors, eds. D. B. Holt and D. C. Joy, Academic Press, London, 1989. Breitenstein, 0., and Wosinski, T. (1983). Phys. Stat. Sol. 877, KI07. Bresse,1. F., and Papadopoulo, A. C. (1987). Appl. Phys. Lett. 51, 183. Bresse, 1. F., and Papadopoulo, A. C. (1988). 1. Appl. Phys. 64, 98. Bril, A., and Klasens, H. A. (1952). Philips Res. Repts. 7,401. Brillson, L. J. (1985). Appl. Surf. Sci. 22/23, 94'3. Brillson, L. J., Richter, H. w., Slade, M. L., Weinstein, B. A., and Shapira, Y. (1985).1. Vae. Sci. Techno/. A3, 1011. Brillson, L. J., and Viturro, R. E. (1988). Scanning Microscopy 2, 789. Brocker, W., and Pfefferkorn, G. (1978). In Scanning Electron Microscopy /97811, ed. O. lohari, SEM Inc., Chicago, p. 333. Brocker, W., and Pfefferkorn, G. (1979). In Scanning Electron Microscopy 19791II, ed. O. Johari, SEM Inc., Chicago, p.