DOCSLIB.ORG

Scanning Tunneling Microscope Control System for Atomically

Total Page：16

File Type：pdf, Size：1020Kb

Download full-text PDF Read full-text
Scanning Tunneling Microscope Control System for Atomically Innovations in Scanning Tunneling Microscope Control Systems for This project will develop a microelectromechanical system (MEMS) platform technology for scanning probe microscope-based, high-speed atomic scale High-throughput fabrication. Initially, it will be used to speed up, by more than 1000 times, today’s Atomically Precise single tip hydrogen depassivation lithography (HDL), enabling commercial fabrication of 2D atomically precise nanoscale devices. Ultimately, it could be used to fabricate Manufacturing 3D atomically precise materials, features, and devices. Graphic image courtesy of University of Texas at Dallas and Zyvex Labs Atomically precise manufacturing (APM) is an emerging disruptive technology precision movement in three dimensions mechanosynthesis (i.e., moving single that could dramatically reduce energy are also needed for the required accuracy atoms mechanically to control chemical and coordination between the multiple reactions) of three dimensional (3D) use and increase performance of STM tips. By dramatically improving the devices and for subsequent positional materials, structures, devices, and geometry and control of STMs, they can assembly of nanoscale building blocks. finished goods. Using APM, every atom become a platform technology for APM and deliver atomic-level control. First, is at its specified location relative Benefits for Our Industry and an array of micro-machined STMs that Our Nation to the other atoms—there are no can work in parallel for high-speed and defects, missing atoms, extra atoms, high-throughput imaging and positional This APM platform technology will accelerate the development of tools and or incorrect (impurity) atoms. Like other assembly will be designed and built. The system will utilize feedback-controlled processes for manufacturing materials disruptive technologies, APM will first microelectromechanical system (MEMS) and products that offer new functional be commercialized in early premium functioning as independent STMs that can qualities and ultra-high performance. Advancements may lead to a wide range markets, such as nanoelectronics for operate 100 to 1000 times faster than state- of-the-art systems and with sub-nanometer of high value energy-saving products, quantum computing. accuracy, improving the precision of including applications such as: diffraction writing atomic features on a surface while arrays with unprecedented optical One potential approach to fabricating performance, molecule-specific membrane atomically precise (AP) nanoscale protecting the STM tip in both imaging and writing modes. The speed and filters, catalytic surfaces, and improved devices is based on turning a scanning boiling interfaces for heat transfer. tunneling microscope (STM) used throughput will be increased to a rate that could enable industrial-scale fabrication of to image atoms into a tool for Applications in Our Nation’s manufacturing at the atomic scale. devices with nanoscale features. Today’s STMs work at speeds useful for This project’s initial approach to Industry imaging and writing but are too slow to STM-based APM is based on the only This technology is expected to have be commercially viable in manufacturing existing technology used to fabricate AP broad applicability and enable high- applications. The objective of this two dimensional (2D) devices—hydrogen throughput APM of devices. Initial research project is to speed up and depassivation lithography (HDL). industrial use could involve making improve STM control so large arrays of Today’s HDL uses a single tip to image nanoimprint lithography and roll-to-roll STMs can quickly and precisely fabricate and lithographically ‘write’ with atomic AP templates that can fabricate devices commercial quantities of AP materials, resolution. with previously unattainable electronic features, and devices. properties. The templates are an attractive Ultimately, high-throughput MEMS- high value market. Integrated circuit Multiple STM tips operating precisely based systems may also be used in metrology, photomask inspection, and in parallel require streamlined geometry conjunction with other scanning metrology systems integrated into roll- and increased control to achieve the high probe microscopes, such as an atomic to-roll manufacturing processes are all throughput necessary for commercial force microscope (AFM), to enable viability. STM nanopositioners with viable applications for such a system. ADVANCED MANUFACTURING OFFICE ADVANCED MANUFACTURING OFFICE Project Description Pathways Technology Transition The project objective is to build a The project will first design and fabricate Successful execution of this project will platform technology for high-throughput all the necessary prototype components complete the first step needed to make APM based on innovations that required to perform high-speed and AP 2D nanoscale devices commercially dramatically increase the speed and high-throughput HDL imaging and viable. In the long term, the technologies accuracy of STMs. The first innovation writing. These include a high-speed being pursued offer a path to developing is to use new MEMS actuators instead macroscale nanopositioner to enable controllable nano-mechanical systems. of the piezoelectric actuators currently implementation of high-speed scan In the short term, there will be the used in STMs. Piezoelectric actuators patterns; micro-machined MEMS STMs; opportunity to market individual are highly resonant systems that require and atomic force microscopy (AFM) technologies developed throughout this low-bandwidth (slow) controllers and micro-cantilevers with self-sensing and project, such as the MEMS STM and suffer from hysteresis and creep, which self-actuation functionalities. Feedback AFM. For example, a possible path limits their positioning precision. The control algorithms will be developed to for advancing the technology toward second innovation is to streamline the operate the system with high accuracy the marketplace would be UT-Dallas connection geometry to enable precise and with control loops to guarantee licensing the MEMS STM scanner and fast operation of arrays of multiple stability, robustness, and repeatability of technology to Zyvex Labs. Zyvex has STM tips to increase throughput. operation. successfully commercialized a number of Initially, the technology will be used to Subsequently, components will be complex nanotechnology systems in the make 2D devices with HDL on hydrogen- assembled resulting in a single tip past. terminated silicon. In this method, the system that can be tested in imaging and tip of an STM injects electrons into the lithography modes. At the conclusion Project Partners chemical bond holding the hydrogen of this project, the high-speed imaging University of Texas at Dallas atom to the silicon surface, causing capability developed will be used to Richardson, TX it to break. Each removed hydrogen determine an appropriate location for Principal Investigator: Dr. Reza is then replaced with a dopant atom. lithography, and the system will perform Moheimani This technique has been used to make HDL with atomic precision, with one Email: [email protected] single-electron transistors, quantum or several MEMS STMs operating Zyvex Labs dots with only a few atoms, and 2D simultaneously. Follow-up research Richardson, TX quantum metamaterials for research will demonstrate multiple tips that are purposes. HDL coupled with the needed for parallel operation. These National Institute of Standards and MEMS STM could lead to additive systems could be scaled up into one- or Technology manufacturing with atomic precision. two-dimensional STM arrays consisting Gaithersburg, MD The envisioned system will enable AP of hundreds of nanopositioners operating lithography at speeds and throughputs in parallel to enable high-speed and high- For additional information, 2-3 orders of magnitude beyond what throughput imaging and lithography. please contact is feasible with current technology. It Milestones Tina Kaarsberg, PhD will enable the programmable atomic- Technology Manager scale positional control needed to This three-year project began in 2018: U.S. Department of Energy fabricate the smallest building blocks • Develop new non-raster modes Advanced Manufacturing Office and the positional assembly of these of imaging for scanning probe Phone: 202-586-5112 building blocks into atomically precise microscopes and build a high-speed Email: [email protected] ■ systems and sub-systems to create more long-range nanopositioner (2019) complex atomic-scale electronic devices and systems. This multidisciplinary • Improve STM control system to enable project will combine innovations in new modes of HD lithography and mechatronic system design, feedback spectroscopy (2020) control, high-precision engineering, and • Demonstrate MEMS STMs and an microfabrication technologies to achieve array of high-frequency MEMS AFM the increased speed, throughput, and cantilevers (2020) accuracy necessary for commercially viable APM. • Demonstrate a closed-loop control system that can achieve a lateral Barriers bandwidth of 20 kHz, with the controller achieving a positioning • Achieving needed imaging speed, accuracy of ± 0.1 nanometer (2021) parallel operation of probes, and atomic-precision positioning • Extreme multidisciplinary nature of the For more information, visit: project. energy.gov/eere/amo DOE/EE-1842 • September 2019.
Load more

Recommended publications
  • Diamondoid Mechanosynthesis Prepared for the International Technology Roadmap for Productive Nanosystems
    IMM White Paper Scanning Probe Diamondoid Mechanosynthesis Prepared for the International Technology Roadmap for Productive Nanosystems 1 August 2007 D.R. Forrest, R. A. Freitas, N. Jacobstein One proposed pathway to atomically precise manufacturing is scanning probe diamondoid mechanosynthesis (DMS): employing scanning probe technology for positional control in combination with novel reactive tips to fabricate atomically-precise diamondoid components under positional control. This pathway has its roots in the 1986 book Engines of Creation, in which the manufacture of diamondoid parts was proposed as a long-term objective by Drexler [1], and in the 1989 demonstration by Donald Eigler at IBM that individual atoms could be manipulated by a scanning tunelling microscope [2]. The proposed DMS-based pathway would skip the intermediate enabling technologies proposed by Drexler [1a, 1b, 1c] (these begin with polymeric structures and solution-phase synthesis) and would instead move toward advanced DMS in a more direct way. Although DMS has not yet been realized experimentally, there is a strong base of experimental results and theory that indicate it can be achieved in the near term. • Scanning probe positional assembly with single atoms has been successfully demonstrated in by different research groups for Fe and CO on Ag, Si on Si, and H on Si and CNHCH3. • Theoretical treatments of tip reactions show that carbon dimers1 can be transferred to diamond surfaces with high fidelity. • A study on tip design showed that many variations on a design turn out to be suitable for accurate carbon dimer placement. Therefore, efforts can be focused on the variations of tooltips of many kinds that are easier to synthesize.
    [Show full text]
  • Manufacturing
    Best Practices for Businesses to Reopen MANUFACTURING • Face coverings are encouraged but not required if an employee can isolate or separate their work area, either by PREPARE THE closing doors or using other physical PREPARE THE barriers to maintain six foot distance BUILDING from other individuals at all times, WORKFORCE • Zone the factory floor and encourage including individuals in adjacent • Train employees in current COVID-19 employees to remain in their cubicles or hallways. health and workplace guidelines designated area to the extent possible. to include procedures for social • Even when practicing social distancing, distancing, timeclock usage, use • Place partitions such as plexiglass to masks or face coverings must be worn when walking through hallways or of common areas, disinfecting separate people that work together in expectations and proper PPE usage. the production process. when two or more people are together in a space such as an office, conference Training should be included in daily • Increase ventilation rates and the room, or restroom. safety meetings to frequently remind percentage of outdoor air that employees and employers of their circulates into the system. • Face coverings are not required if responsibilities. wearing a face covering would subject • Assemble a team whose the person to an unsafe working • Offer teleworking where appropriate. responsibilities include implementing condition, as determined by federal, Give employees flexibility regarding and monitoring guidelines provided by state, or local occupational safety returning to the factory / office. the CDC, OSHA, the State, and by the regulators or workplace guidelines. For • Implement a daily screening process company. exceptions to this requirement, please for workers and other personnel which see the latest .
    [Show full text]
  • Manufacturing Engineering Technology
    MANUFACTURING ENGINEERING TECHNOLOGY “Modern manufacturing activities have become exceedingly complex because of rapidly increasing technology. This has increased the demand for highly skilled manufacturing technologists, engineers, and managers.” – Society of Manufacturing Engineers Manufacturers in the United States account for 12.5% of the total economic output employing almost 9% of the nation’s workforce. (National Association of Manufacturers, 2015) DEGREE Top 3 Reasons to Choose BACHELOR OF SCIENCE (B.S.) Manufacturing Engineering Technology (MFET) Manufacturing Engineering Students in the major are introduced to the fundamentals of Technology engineering, materials, and production processes used within industry. AT MILLERSVILLE UNIVERSITY The program provides in-depth technical content in advanced manufacturing with an emphasis on automated manufacturing and 1. Despite misconceptions that “manufacturing is dead” or computer integrated manufacturing. Students to design, develop, and that “all manufacturing has moved overseas” the National construct projects in laboratory-based courses. Technologies Network for Manufacturing Innovation (commonly commonly used in industry are emphasized throughout the curriculum. known as Manufacturing USA) estimates that the Seniors are encouraged to participate in a cooperative education or manufacturing workforce employs approximately 12 internship experience to further enhance their knowledge in technical million people nationwide. areas within an industrial environment. 2. Manufacturers in Pennsylvania
    [Show full text]
  • Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: a Review
    polymers Review Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review Phuong Nguyen-Tri 1,2,*, Payman Ghassemi 2, Pascal Carriere 3, Sonil Nanda 4 , Aymen Amine Assadi 5 and Dinh Duc Nguyen 6,7 1 Institute of Research and Development, Duy Tan University, Da Nang 550000, Vietnam 2 Département de Chimie, Biochimie et Physique, Université du Québec à Trois-Rivières (UQTR), Trois-Rivières, QC G8Z 4M3, Canada; [email protected] 3 Laboratoire MAPIEM (EA 4323), Matériaux Polymères Interfaces Environnement Marin, Université de Toulon, CEDEX 9, 83041 Toulon, France; [email protected] 4 Department of Chemical and Biological Engineering, University of Saskatchewan, Saskatoon, SK S7N 5A2, Canada; [email protected] 5 ENSCR—Institut des Sciences Chimiques de Rennes (ISCR)—UMR CNRS 6226, Univ Rennes, 35700 Rennes, France; [email protected] 6 Faculty of Environmental and Food Engineering, Nguyen Tat Thanh University, 300A Nguyen Tat Thanh, District 4, Ho Chi Minh City 755414, Vietnam; [email protected] 7 Department of Environmental Energy Engineering, Kyonggi University, Suwon 16227, Korea * Correspondence: [email protected]; Tel.: +819-376-5011 (ext. 4505) Received: 5 March 2020; Accepted: 13 May 2020; Published: 17 May 2020 Abstract: Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science.
    [Show full text]
  • Handheld Microscope Users Guide
    Handheld Microscope Users Guide www.ScopeCurriculum.com ii Handheld Microscope Users Guide Hand-Held Microscope User’s Guide Table of Contents INTRODUCTION ..................................................................................................................................1 What is a Scope-On-A-Rope? .....................................................................................................1 Which model do you have?.........................................................................................................2 Analog vs. Digital .........................................................................................................................3 Where can I buy a SOAR? ...........................................................................................................3 NEW SCOPE-ON-A-ROPE..................................................................................................................4 Parts and Assembly of SOAR .....................................................................................................4 Connections .................................................................................................................................5 Turning It On.................................................................................................................................5 Comparing and Installing Lenses...............................................................................................6 How to Use and Capture Images with the 30X Lens.................................................................7
    [Show full text]
  • Understanding Imaging and Metrology with the Helium Ion Microscope
    Understanding Imaging and Metrology with the Helium Ion Microscope Michael T. Postek, Andras E. Vladar and Bin Ming National Institute of Standards and Technology Frontiers of Characterization and Metrology for Nanoelectronics CNSE University at Albany May 11-14, 2009 Disclaimer • Certain commercial equipment is identified in this report to adequately describe the experimental procedure. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the equipment identified is necessarily the best available for the purpose Nanoelectronics Manufacturing • The helium ion microscope is an exciting new technology for nanotechnology and nanomanufacturing. – Initially, appears straightforward – But, much must be understood • Especially to obtain meaningful quantitative information. • The NIST Manufacturing Engineering Laboratory (MEL) has supported “nanomanufacturing” through the development of measurements and standards since about 1999. • Semiconductor manufacturing is “nanomanufacturing” and MEL has supported SEMATECH since its inception • New magnification calibration sample Nanoelectronics Manufacturing • Development of successful nanomanufacturing is the key link between scientific discovery and commercial products • Revolutionize and possibly revitalize many industries and yield many new high-tech products • Without high-quality imaging, accurate measurements and standards at the sub- nanometer scale, nanomanufacturing cannot succeed Imaging and Measurements
    [Show full text]
  • Nanomedicine and Medical Nanorobotics - Robert A
    BIOTECHNOLOGY– Vol .XII – Nanomedicine and Medical nanorobotics - Robert A. Freitas Jr. NANOMEDICINE AND MEDICAL NANOROBOTICS Robert A. Freitas Jr. Institute for Molecular Manufacturing, Palo Alto, California, USA Keywords: Assembly, Nanomaterials, Nanomedicine, Nanorobot, Nanorobotics, Nanotechnology Contents 1. Nanotechnology and Nanomedicine 2. Medical Nanomaterials and Nanodevices 2.1. Nanopores 2.2. Artificial Binding Sites and Molecular Imprinting 2.3. Quantum Dots and Nanocrystals 2.4. Fullerenes and Nanotubes 2.5. Nanoshells and Magnetic Nanoprobes 2.6. Targeted Nanoparticles and Smart Drugs 2.7. Dendrimers and Dendrimer-Based Devices 2.8. Radio-Controlled Biomolecules 3. Microscale Biological Robots 4. Medical Nanorobotics 4.1. Early Thinking in Medical Nanorobotics 4.2. Nanorobot Parts and Components 4.3. Self-Assembly and Directed Parts Assembly 4.4. Positional Assembly and Molecular Manufacturing 4.5. Medical Nanorobot Designs and Scaling Studies Acknowledgments Bibliography Biographical Sketch Summary Nanomedicine is the process of diagnosing, treating, and preventing disease and traumatic injury, of relieving pain, and of preserving and improving human health, using molecular tools and molecular knowledge of the human body. UNESCO – EOLSS In the relatively near term, nanomedicine can address many important medical problems by using nanoscale-structured materials and simple nanodevices that can be manufactured SAMPLEtoday, including the interaction CHAPTERS of nanostructured materials with biological systems. In the mid-term, biotechnology will make possible even more remarkable advances in molecular medicine and biobotics, including microbiological biorobots or engineered organisms. In the longer term, perhaps 10-20 years from today, the earliest molecular machine systems and nanorobots may join the medical armamentarium, finally giving physicians the most potent tools imaginable to conquer human disease, ill-health, and aging.
    [Show full text]
  • Atomic Force Microscopy - Basics and Applications
    Astrid Kronenberger School of Engineering and Science Atomic Force Microscopy - Basics and Applications Summer School June 2006 „Complex Materials: Cooperative Projects of the Natural, Engineering and Biosciences“ Outline • Scanning Probe Microscopy • Atomic Force Microscopy – General set-up & operation modes – Sample preparation • Applications in life science – Imaging mode –Force-distancemode •Conclusion Scanning Probe Microscopy (SPM) ~1600 Light Microscope 1938: Transmission Electron Microscope 1964: Scanning Electron Microscope 1982: Scanning Tunneling Microscope 1984: Scanning Near-field Optical Microscope 1986: Atomic Force Microscope - magnetic force, lateral force, chemical force... Scanning Probe Microscopy • Creates images of surfaces using a probe. • Probe is moved (scanned) over the sample. tip • Sample-probe interaction is monitored as function of location. sample + Image resolution limited by probe-sample interaction volume - not by diffraction . + Interaction can modify surface - nanolithography possible. - Scanning technique quite slow. - Limited maximum image size. Atomic Force Microscopy position laser sensitive beam detector cantilever with tip Molecular interaction: E = F Δs sample E ~ eV; Δs~ Å F ~ 2.10-9 N Typical AFM resolution: x-y: 1nm; z: 0.1nm Detection: - sub-Å deflection -pNforces General AFM set-up measure deflection controller quadrant laser photodiode Adjust tip- sample distance cantilever sample surface piezo x-y-z ceramic Moving tip / moving sample: Use U=+/- 220 V x-, y-axis: 1 ...125 µm z-axis: 1 ... 20 µm closed / open loop control Basic AFM modi • Imaging mode –contactmode –non contactmode – intermittent / tapping mode •Force-distancemode – force spectroscopy – combined imaging & force spectroscopy Static AFM modi •Contactmode: – tip in continuous contact with sample – preferably used for hard samples – imaging in air and liquid – high resolution detect: deflection • Force spectroscopy mode: – consecutive cycles of tip approach and retract – interaction forces between tip and sample are recorded .
    [Show full text]
  • Introduction Scanning Probe Microscopy Techniques for Electrical and Electromechanical Characterization
    University of Nebraska - Lincoln DigitalCommons@University of Nebraska - Lincoln Alexei Gruverman Publications Research Papers in Physics and Astronomy January 2007 Introduction Scanning Probe Microscopy Techniques for Electrical and Electromechanical Characterization Sergei Kalinin Oak Ridge National Laboratory, [email protected] Alexei Gruverman University of Nebraska-Lincoln, [email protected] Follow this and additional works at: https://digitalcommons.unl.edu/physicsgruverman Part of the Physics Commons Kalinin, Sergei and Gruverman, Alexei, "Introduction Scanning Probe Microscopy Techniques for Electrical and Electromechanical Characterization" (2007). Alexei Gruverman Publications. 43. https://digitalcommons.unl.edu/physicsgruverman/43 This Article is brought to you for free and open access by the Research Papers in Physics and Astronomy at DigitalCommons@University of Nebraska - Lincoln. It has been accepted for inclusion in Alexei Gruverman Publications by an authorized administrator of DigitalCommons@University of Nebraska - Lincoln. Published in: Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, Sergei Kalinin and Alexei Gruverman, editors, 2 volumes (New York: Springer Science+Business Media, 2007). ◘ ◘ ◘ ◘ ◘ ◘ ◘ Sergei Kalinin, Oak Ridge National Laboratory Alexei Gruverman, University of Nebraska–Lincoln This document is not subject to copyright. Introduction Scanning Probe Microscopy Techniques for Electrical and Electromechanical Characterization s.Y. KALININ AND A. GRUVERMAN Progress in modem science is impossible without reliable tools for characteriza­ tion of structural, physical, and chemical properties of materials and devices at the micro-, nano-, and atomic scale levels. While structural information can be obtained by such established techniques as scanning and transmission electron microscopy, high-resolution examination oflocal electronic structure, electric po­ tential and chemical functionality is a much more daunting problem.
    [Show full text]
  • The Microscope Parts And
    The Microscope ­ Parts and Use Name:_______________________ Period:______ Historians credit the invention of the compound microscope to the Dutch spectacle maker, Zacharias Janssen, around the year 1590. The compound microscope uses lenses and light to enlarge the image and is also called an optical or light microscope (vs./ an electron microscope). The simplest optical microscope is the magnifying glass and is good to about ten times (10X) magnification. The compound microscope has two systems of lenses for greater magnification, 1) the ocular, or eyepiece lens that one looks into and 2) the objective lens, or the lens closest to the object. Before purchasing or using a microscope, it is important to know the functions of each part. Eyepiece Lens: the lens at the top that you look through. They are usually 10X or 15X power. Tube: Connects the eyepiece to the objective lenses Arm: Supports the tube and connects it to the base. It is used along with the base to carry the microscope Base: The bottom of the microscope, used for support Illuminator: A steady light source (110 volts) used in place of a mirror. Stage: The flat platform where you place your slides. Stage clips hold the slides in place. Revolving Nosepiece or Turret: This is the part that holds two or more objective lenses and can be rotated to easily change power. Objective Lenses: Usually you will find 3 or 4 objective lenses on a microscope. They almost always consist of 4X, 10X, 40X and 100X powers. When coupled with a 10X (most common) eyepiece lens, we get total magnifications of 40X (4X times 10X), 100X , 400X and 1000X.
    [Show full text]
  • Chapter 11 Applications of Ore Microscopy in Mineral Technology
    CHAPTER 11 APPLICATIONS OF ORE MICROSCOPY IN MINERAL TECHNOLOGY 11.1 INTRODUCTION The extraction of specific valuable minerals from their naturally occurring ores is variously termed "ore dressing," "mineral dressing," and "mineral beneficiation." For most metalliferous ores produced by mining operations, this extraction process is an important intermediatestep in the transformation of natural ore to pure metal. Although a few mined ores contain sufficient metal concentrations to require no beneficiation (e.g., some iron ores), most contain relatively small amounts of the valuable metal, from perhaps a few percent in the case ofbase metals to a few parts per million in the case ofpre­ cious metals. As Chapters 7, 9, and 10ofthis book have amply illustrated, the minerals containing valuable metals are commonly intergrown with eco­ nomically unimportant (gangue) minerals on a microscopic scale. It is important to note that the grain size of the ore and associated gangue minerals can also have a dramatic, and sometimes even limiting, effect on ore beneficiation. Figure 11.1 illustrates two rich base-metal ores, only one of which (11.1b) has been profitably extracted and processed. The McArthur River Deposit (Figure I 1.1 a) is large (>200 million tons) and rich (>9% Zn), but it contains much ore that is so fine grained that conventional processing cannot effectively separate the ore and gangue minerals. Consequently, the deposit remains unmined until some other technology is available that would make processing profitable. In contrast, the Ruttan Mine sample (Fig. 11.1 b), which has undergone metamorphism, is relativelycoarsegrained and is easily and economically separated into high-quality concentrates.
    [Show full text]
  • Science for Energy Technology: Strengthening the Link Between Basic Research and Industry
    ďŽƵƚƚŚĞĞƉĂƌƚŵĞŶƚŽĨŶĞƌŐLJ͛ƐĂƐŝĐŶĞƌŐLJ^ĐŝĞŶĐĞƐWƌŽŐƌĂŵ ĂƐŝĐŶĞƌŐLJ^ĐŝĞŶĐĞƐ;^ͿƐƵƉƉŽƌƚƐĨƵŶĚĂŵĞŶƚĂůƌĞƐĞĂƌĐŚƚŽƵŶĚĞƌƐƚĂŶĚ͕ƉƌĞĚŝĐƚ͕ĂŶĚƵůƟŵĂƚĞůLJĐŽŶƚƌŽů ŵĂƩĞƌĂŶĚĞŶĞƌŐLJĂƚƚŚĞĞůĞĐƚƌŽŶŝĐ͕ĂƚŽŵŝĐ͕ĂŶĚŵŽůĞĐƵůĂƌůĞǀĞůƐ͘dŚŝƐƌĞƐĞĂƌĐŚƉƌŽǀŝĚĞƐƚŚĞĨŽƵŶĚĂƟŽŶƐ ĨŽƌŶĞǁĞŶĞƌŐLJƚĞĐŚŶŽůŽŐŝĞƐĂŶĚƐƵƉƉŽƌƚƐKŵŝƐƐŝŽŶƐŝŶĞŶĞƌŐLJ͕ĞŶǀŝƌŽŶŵĞŶƚ͕ĂŶĚŶĂƟŽŶĂůƐĞĐƵƌŝƚLJ͘dŚĞ ^ƉƌŽŐƌĂŵĂůƐŽƉůĂŶƐ͕ĐŽŶƐƚƌƵĐƚƐ͕ĂŶĚŽƉĞƌĂƚĞƐŵĂũŽƌƐĐŝĞŶƟĮĐƵƐĞƌĨĂĐŝůŝƟĞƐƚŽƐĞƌǀĞƌĞƐĞĂƌĐŚĞƌƐĨƌŽŵ ƵŶŝǀĞƌƐŝƟĞƐ͕ŶĂƟŽŶĂůůĂďŽƌĂƚŽƌŝĞƐ͕ĂŶĚƉƌŝǀĂƚĞŝŶƐƟƚƵƟŽŶƐ͘ ďŽƵƚƚŚĞ͞ĂƐŝĐZĞƐĞĂƌĐŚEĞĞĚƐ͟ZĞƉŽƌƚ^ĞƌŝĞƐ KǀĞƌƚŚĞƉĂƐƚĞŝŐŚƚLJĞĂƌƐ͕ƚŚĞĂƐŝĐŶĞƌŐLJ^ĐŝĞŶĐĞƐĚǀŝƐŽƌLJŽŵŵŝƩĞĞ;^ͿĂŶĚ^ŚĂǀĞĞŶŐĂŐĞĚ ƚŚŽƵƐĂŶĚƐŽĨƐĐŝĞŶƟƐƚƐĨƌŽŵĂĐĂĚĞŵŝĂ͕ŶĂƟŽŶĂůůĂďŽƌĂƚŽƌŝĞƐ͕ĂŶĚŝŶĚƵƐƚƌLJĨƌŽŵĂƌŽƵŶĚƚŚĞǁŽƌůĚƚŽƐƚƵĚLJ ƚŚĞĐƵƌƌĞŶƚƐƚĂƚƵƐ͕ůŝŵŝƟŶŐĨĂĐƚŽƌƐ͕ĂŶĚƐƉĞĐŝĮĐĨƵŶĚĂŵĞŶƚĂůƐĐŝĞŶƟĮĐďŽƩůĞŶĞĐŬƐďůŽĐŬŝŶŐƚŚĞǁŝĚĞƐƉƌĞĂĚ ŝŵƉůĞŵĞŶƚĂƟŽŶŽĨĂůƚĞƌŶĂƚĞĞŶĞƌŐLJƚĞĐŚŶŽůŽŐŝĞƐ͘dŚĞƌĞƉŽƌƚƐĨƌŽŵƚŚĞĨŽƵŶĚĂƟŽŶĂůĂƐŝĐZĞƐĞĂƌĐŚEĞĞĚƐƚŽ ƐƐƵƌĞĂ^ĞĐƵƌĞŶĞƌŐLJ&ƵƚƵƌĞǁŽƌŬƐŚŽƉ͕ƚŚĞĨŽůůŽǁŝŶŐƚĞŶ͞ĂƐŝĐZĞƐĞĂƌĐŚEĞĞĚƐ͟ǁŽƌŬƐŚŽƉƐ͕ƚŚĞƉĂŶĞůŽŶ 'ƌĂŶĚŚĂůůĞŶŐĞƐĐŝĞŶĐĞ͕ĂŶĚƚŚĞƐƵŵŵĂƌLJƌĞƉŽƌƚEĞǁ^ĐŝĞŶĐĞĨŽƌĂ^ĞĐƵƌĞĂŶĚ^ƵƐƚĂŝŶĂďůĞŶĞƌŐLJ&ƵƚƵƌĞ ĚĞƚĂŝůƚŚĞŬĞLJďĂƐŝĐƌĞƐĞĂƌĐŚŶĞĞĚĞĚƚŽĐƌĞĂƚĞƐƵƐƚĂŝŶĂďůĞ͕ůŽǁĐĂƌďŽŶĞŶĞƌŐLJƚĞĐŚŶŽůŽŐŝĞƐŽĨƚŚĞĨƵƚƵƌĞ͘dŚĞƐĞ ƌĞƉŽƌƚƐŚĂǀĞďĞĐŽŵĞƐƚĂŶĚĂƌĚƌĞĨĞƌĞŶĐĞƐŝŶƚŚĞƐĐŝĞŶƟĮĐĐŽŵŵƵŶŝƚLJĂŶĚŚĂǀĞŚĞůƉĞĚƐŚĂƉĞƚŚĞƐƚƌĂƚĞŐŝĐ ĚŝƌĞĐƟŽŶƐŽĨƚŚĞ^ͲĨƵŶĚĞĚƉƌŽŐƌĂŵƐ͘;ŚƩƉ͗ͬͬǁǁǁ͘ƐĐ͘ĚŽĞ͘ŐŽǀͬďĞƐͬƌĞƉŽƌƚƐͬůŝƐƚ͘ŚƚŵůͿ ϭ ^ĐŝĞŶĐĞĨŽƌŶĞƌŐLJdĞĐŚŶŽůŽŐLJ͗^ƚƌĞŶŐƚŚĞŶŝŶŐƚŚĞ>ŝŶŬďĞƚǁĞĞŶĂƐŝĐZĞƐĞĂƌĐŚĂŶĚ/ŶĚƵƐƚƌLJ Ϯ EĞǁ^ĐŝĞŶĐĞĨŽƌĂ^ĞĐƵƌĞĂŶĚ^ƵƐƚĂŝŶĂďůĞŶĞƌŐLJ&ƵƚƵƌĞ ϯ ŝƌĞĐƟŶŐDĂƩĞƌĂŶĚŶĞƌŐLJ͗&ŝǀĞŚĂůůĞŶŐĞƐĨŽƌ^ĐŝĞŶĐĞĂŶĚƚŚĞ/ŵĂŐŝŶĂƟŽŶ ϰ ĂƐŝĐZĞƐĞĂƌĐŚEĞĞĚƐĨŽƌDĂƚĞƌŝĂůƐƵŶĚĞƌdžƚƌĞŵĞŶǀŝƌŽŶŵĞŶƚƐ ϱ ĂƐŝĐZĞƐĞĂƌĐŚEĞĞĚƐ͗ĂƚĂůLJƐŝƐĨŽƌŶĞƌŐLJ
    [Show full text]