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Published by the Press Syndicate of the University of Cambridge the Pitt Building, Trumpington Street, Cambridge, United Kingdom published by the press syndicate of the university of cambridge The Pitt Building, Trumpington Street, Cambridge, United Kingdom cambridge university press University Printing House, Shaftesbury Road, Cambridge CB2 8BS, UK One Liberty Plaza, New York, NY 10006, USA 477 Williamstown Road, Port Melbourne, VIC 3207, Australia Ruiz de Alarcón 13, 28014 Madrid, Spain Dock House, The Waterfront, Cape Town 8001, South Africa Copyright © 2018 Microscopy Society of America First published 2018 Printed in the United States of America This publication constitutes Supplement1 to Volume 24 , 201 8 of Microscopy and Microanalysis. Downloaded from https://www.cambridge.org/core. IP address: 170.106.202.58, on 28 Sep 2021 at 10:42:49, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms. https://doi.org/10.1017/S1431927618012357 Microscopy AND Microanalysis © MICROSCOPY SOCIETY OF AMERICA 2018 Editorial Board Ralph Albrecht University of Wisconsin, Madison, Wisconsin Ilke Arslan Pacific Northwest Laboratory, Richland, Washington Mary Grace Burke University of Manchester, Manchester, UK Barry Carter University of Connecticut, Storrs, Connecticut Wah Chiu Baylor College of Medicine, Houston, Texas Marc De Graef Carnegie Mellon University, Pittsburgh, Pennsylvania Niels de Jonge INM Institute for New Materials, Saarbrücken, Germany Elizabeth Dickey North Carolina State University, Raleigh Mark Ellisman University of California at San Diego, San Diego, California Pratibha Gai University of York, United Kingdom Marija Gajdardziska-Josifovska University of Wisconsin-Milwaukee, Milwaukee, Wisconsin Paul Kotula Sandia National Labs, Albuquerque, New Mexico William Landis University of Akron, Akron, Ohio Charles Lyman Lehigh University, Bethlehem, Pennsylvania Dale Newbury National Institute of Standards and Technology, Gaithersburg, Maryland Robert Price University of South Carolina, Columbia, South Carolina Jean-Paul Revel California Institute of Technology, Pasadena, California David Smith Arizona State University, Tempe, Arizona Nan Yao Princeton University, Princeton, New Jersey Nestor Zaluzec Argonne National Laboratory, Argonne, Illinois Editorial Board Representatives from Affiliated Societies Masashi Watanabe Lehigh University (MAS) Gautam Kumar Dey Bhabha Atomic Research Centre (EMSI) Gema Gonzalez Venezuelan Institute for Scientific Investigation (Venezuela) Michael Robertson Acadia University, Wolfville, Nova Scotia (Canada) Brendan Griffin University of Western Australia (AMMS) Guillermo Solorzano Pontificia Universidade Catolica, Rio de Janeiro (Brazil) Mike Matthews Atomic Weapons Establishment, Reading, Great Britain (EMAS) Miguel Yacaman Mexico Institute for Nuclear Research (Mexico) Henrique Almeida Universidade do Porto (Portugal) Founding Editor Jean-Paul Revel California Institute of Technology, Pasadena, California Previous Editors-in-Chief Dale Johnson University of South Florida, Tampa, Florida Charles Lyman Lehigh University, Bethlehem, Pennsylvania Robert L. 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IP address: 170.106.202.58, on 28 Sep 2021 at 10:42:49, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms. https://doi.org/10.1017/S1431927618012357 Microscopy & Microanalysis The Official M&M 2018 Proceedings Baltimore, MD, USA • August 5-9, 2018 Table of Contents Title Page i Copyright Page ii MAM Editors iii Copyright Information iv Contents v Welcome from the Society Presidents lxxix Welcome from the Program Chairs lxxx Plenary Sessions lxxxi Microscopy Society of America lxxxv Microanalysis Society of America xci Microscopical Society of Canada / Société de Microscopie du Canada xcv Meeting Awards xcvi Abstracts 2 Author Index 2358 Downloaded from https://www.cambridge.org/core. IP address: 170.106.202.58, on 28 Sep 2021 at 10:42:49, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms. https://doi.org/10.1017/S1431927618012357 v Analytical and Instrumentation Science Symposia Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms 2 My Sixty Years Spent with Professor Hatsujiro Hashimoto; M Shiojiri 4 Atomic Resolution Imaging of Dislocations in AlGaN and the Efficiency of UV LEDs; CJ Humphreys, FC-P Massabuau, SL Rhode, MK Horton, TJ O’Hanlon, A Kovacs, MS Zielinski, Attolight AG, MJ Kappers 6 Defect Evolution in GaAs-based Low-mismatch Heterostructures; A Gangopadhyay, A Maros, N Faleev, MR McCartney, DJ Smith 8 Analytical TEM Characterization of Source/Drain Contacts in Advanced Semiconductor Devices; J Li, H Niimi, O Gluschenkov, P Adusumilli, J Fronheiser, S Mochizuki, Z Liu, V Kamineni 10 Contributions to High Resolution and In Situ Electron Microscopy; R Sinclair, Y Liu, S Lee, AL Koh 12 A Novel Technique for In-Situ TEM Characterization of Precipitates in Alloys; J Rao, X Zhang, V Ocelík, D Vainchtein, JT De Hosson, S-C Liou, W-A Chiou 14 Whys and Wherefores of Open Aperture ESTEM for in-situ Catalyst Reaction Studies; ED Boyes, PL Gai 16 In Memory of the Late Professor Hatsujiro Hashimoto: Toward the Realization of His Dream; Y Takai 18 Improving the STEM Spatial Resolution Limit; OL Krivanek, AL Bleloch, N Dellby, TC Lovejoy, C Shi, W Zhou 20 Anchoring and Localizing Single Metal Atoms for Better Catalysis; J Liu 22 Imaging of Single Vacancies and Dopant Complexes in Aluminum Nitride; TB Eldred, JS Harris, JN Baker, DL Irving, JM LeBeau 24 Atomic Resolution Imaging and Quantitative Elemental Mapping of the Misfit Dislocation Core Phase in Multicomponent Oxides; N Bagués, J Santiso, BD Esser, REA Williams, DW McComb, Z Konstantinovic, L Balcells, F Sandiumenge 26 Differential Potential Distribution Observation in Transmission Electron Microscope with Conventional Thermal Electron Gun; K Sasaki, H Sasaki, S Saito 28 Professor Hatsujiro Hashimoto: My Great Mentor as a Pioneer of Electron Microscopy;
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