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r V f .6 1 .*......'=r t63 - t-1 f 3 - 1( 15. Reasilons of BecRiling Silicon Bteg with Phosphine Silane BBd Disilane 1 h -----=- -- --------- ---=--- ---=- =-=- =-------- -=---- --= -=----=- to (1) Financial support from the United States Atomic EnergyMASTERCommission 9K t is gratefully acknowledged. This is · AEC report No. COO-1713-16. -40 M 1 -0..1 The formation of disilane and silane H331 SiSiH3 the fast-neutro'n +d 31 SiH4 from CD , irradiation of phosphine-silane mixtures has been rationalized by proposing a ia. 0.V' set of product-determing steps involving the intermediate silylene: 31 SiH2 - which is the product of the primary reactions of recoiling silicon atoms.2 31PH + ·n ;631Si + p + 3 H: :':· ' 1, 1- 3 gi ...:»,. : 3·1 •••••••• ) :31 SiH 2 44 U 1 9.: . ..'. X"" f .:31 SiH2 + SiH4 ·H-31.1 SiSiHi v i - 6'' I b . 3 1 SiH · · , · :31 SiH2 + SiH4 4 ,4 31 SiH :31 SiH2 + PH3 4 ; involatile material :3 1 SiH2 ' ' PH3 ., L 0 1 . 9. (2) P.P. Gaspar, S.A. B·ock and W.. C. Eckelman, J. Amer. Chem. Soc., 22, 6914 (1968). ..R' The present report provides support,for the intermediacy of :31 SiH and suggests the occurence of a novel reaction:-.the insertion of :31 SiH into silicon- 2 silicon bonds. *$.An mechanism for the formation gf involving the ·1 . ternative H331SiSiH3 coupling of silyl radicals, '31 SiH3 with nonradioactive 'SiH3 formed from . : A: silane by radiation damage „ had been ·rendered unlikely by the failure of ' scavengers to-affect product yields. 2, '.However; the reaction , :- (NO,.C2H4-). r LEGAL NOTICE I u .. S ./ .,· »'.: I *- I .·6 - This report was prepared as an account of work sponsored by the United States Government. 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MT- .. 3 T / -2- 1 efficiencies of the scavengers employed toward silyl radicals is unknown, and further evidence for the intermediacy of :31 SiH2 rather than '31 SiH3 / is desirable. To this end the fast-neutron irradiation of phosphine-disilane mixtures was undertaken, since in this system the insertion of :31 SiH2 into Si-H bonds can be distinguished from the coupling of ' 31 SiH3 with the debris .. '. from radiation damage. Radiation damage in the phosphine-disilane system would be expected to produce 'SiH3 as well as 'SiH, SiH, '3 and thus coupling with·'31 would lead · .4 -, SiH3 (3) While the radiolysis of disilane has not been reported, it is well- known that both C-C and C-H bond-rupture occur in the radiolysis of hydrocarbons. See S.C. Lind, Radiation Chemistry of Gases, Reinhold, N.Y., L961, pp. 103, 179; also A.V. Topchiev (ed.),·Radiolysis of Hydrocarbons, ·Elsevier, Amsterdam, 1964. to the formation of significant amounts of H331 SiSiH ds well as H331 SiSi SiH3. In the event that :31 SiHi is the predominant intermediate the major expected product is trisilane 31 Sisi2HB formed by Si-H insertion. The results of fast-neutron irradiation of mixtures of phosphine with , - .:.. 1 silane, disilane and both silane and disilane are given in Table I. The product distributions suggest the following conclusions: 31 1. The small amount of H3 SiSiH3 and the large amount of 31 Sisi2H8 formed from the reactions of recoiling silicon atoms in phosphine-disilane mixture .. are in. accord with the intermediacy of :31 whi·ch SiH2 ·inserts into the Si-H (or Si-Si, vide infra) bonds of disilane to form the major product. 31 31 2. The formation of small amounts of H3 SiSiH and SiH4 from phosphine- disilane mixture suggests a mechanism for the formation of these products, and for the formation of 31 SiH from phosphine-silane mixtures, consistent with a 4 dominant role for :31 SiH2 as reaction intermediate: I ' :7 -3- 7' ..., t. .'.. „4 1 -·· ,-, major H 31 SiSiH · >. 3 3 :31 SiH2 + .' SiH4 4-0 [H333SiSilj]* . D N minor 3 1 Si114 + . :SiH2 ·: : 91' ir major 31 Sisi2H8 + minor H 31 SiSiH + :SiH :31 SiH2 H3SiSiH342 31SiSi 28H ]* >3 3 2 _mino#) 3 1 SiH4 + 2 : SiH2 Similar thermal decompositions of disilane and trisilane to silylene have been recently suggested to explain the products4' 5, and reaction kineticss of . , ; , 4. I .... disilane and trisilane pyrolysis. (4) E.N. Tebben and M. A. Ring, Inorg. Chem.,.8, 1787 (1969). (5) M. Bowrey and J.H.Purnell,''J..Amer. Chem. 'Soc., 22,· 2594 (1970). 3:' .The previously overlooked2 formation a minor product Of31 Sisi.2118 as from phosphine-silane mixtures cannot be due to a reaction ·of :3 1 SiH2 . The formation of trisilane from silane may be understood, however, if a primordial ., step toward the production of :3 1 SiH, is the insertion 9f a silicon atom into 1 11 i it .1..1, 1 ,1.,1 .1 KI j . , 11 . , .1 1 1 '. , an Si-H bond of silane. The resulting divalent species H-31 may occasionally ........ .,1 Si-siH3. survive to take part in a second insertion forming trisilane, although its normal 1 ... '' , 1 1 1 1 1 1 .1, . fate seems to be Si-Si bond scission. .'.. .A.. , 1. ..t... L .. , 1.... , 1 11 1 r 4. A remarkably high ratio of 31 Sisi2HB to H331 SiSiH3 is obtained from 1 & 1 1. : ."... 1 / ' . ,1 Y phosphine-silane-disilane mixtures. A reactivity ratio, disilane to silane, of 4.9+1.9 has been obtained from a series of experiments in which the silane- I. .. ....1 1.1 / , disilane ratio varied from 0.25 to 4.0. Since the ratio of Si-H bonds in the .,1. il'.. 1 two molecules is 1 6 4, : Jit 11is .,clear that either the Si-H bonds o f disilane ·more reactive toward insertion by :31 SiH2 than are the bonds ., , .,1., 1.... , t.' 1 11 , are considerably I I . • i i . ... & 1.. 1 1.,i . l .. ,., 1.'. / 1 i i.... lilli. 1.., y ..l. ...1 L 1... .,It 10„«, ..1 1 1,• ' ' It.. ../,1 , i,l ..1. 11 Ll 1/.t' & - -4- or undergoing of silane, : 31 SiH2 is insertion into the Si-Si bond of disilane as to form H)Si 31 SiH-SiH.,LJ as well H331 SiSiH2Sili by Si-H insertion. 1 p It has recently been suggested that the Si-H bonds of disilane may be weaker than those in silane,6 and this may explain the differential reactivity toward (6) R.P. Hollandsworth and·M.A. Ring, Inorg. Chem., 2, 1635 (1968). :1 1 silylene. On the other hand, Si-Si bond insertion haa been noted as a possible explanation for a slightly greater than statistical ratio of B-tetrasilane to iso-tetrasilane believed to have resulted from reaction of :SiH2 with trisilane.5 We are continuing to investigate the possible insertion of :31 SiH2 into Si-Si bonds by appropriate product degradation studies. , Peter P. Gaspar, Peter Markus ch.· 4- 9. ' · · Department of Chemistry . 111 Washington University 11 i . , C. .: ' -7 -. c, i..- Saint Louis, Missouri 63130 M E 1 11 1 •. 11 - I 1 ./ 4 ... ': 0. , . I : "T b.1 :. 11 .„ " 11 - f .. ., r. 4 . ..4 (, '.,..-. 3 . I ..5 , 0 , 4 J t 6 . , i " . 3 ./ I.a Yields 31 Si-Labeled Products Table-==== of from Reactions of 31 Si Atoms 31 Expt SUbstrate 31 Sisi H k sili4 H3-31 SiSiH3b 28 A p 1 PH3 , SiH4 18,3005.,700 .61,100 + 9.200 8,900 + 1,300 -.. A 1:1 PH : SiH ..3 4 · 18,300 + 2,700 - 67,300 + -10,100 CLO,000 - + 1,500 A 1:1 PH : H SiSiH 3 3 3 6,800 + 1,000 4,400 +-700 58,300 - + 8,700 SiSiH 7,100 + 1,100 11,800 + 1,800 A 1:1:1 PH3 : SiH 433 : H - 44,400 + 6,700 A 1:1:1 PH : SiH : H SiSiH 5,700 + 900 10,600 + 1,600 3 4 39 3 4 47,800 i 7,200 B 5:1:4 : PH3 SiH :433 H Si SiH 7,900 -+ 1,200 7,800 + 1,200 60,700 + 9,100 B 5:4:1 PH : SiH H Si SiH 3 43 3 6,400 + 1,000 26,500 + 4,000 17,900 + 2,300 ... a -All samples at total pressure 2.0 + 0.1 atm and, within an experiment, irradiated simultaneously at equal neutron flux as described in ref 2.