Transmission Electron Microscopy C

Transmission Electron Microscopy C. Barry Carter · David B. Williams (Eds.) Transmission Electron Microscopy Diffraction, Imaging, and Spectrometry Editors C. Barry Carter David B. Williams University of Connecticut The Ohio State University Storrs, USA Columbus, USA ISBN 978-3-319-26649-7 ISBN 978-3-319-26651-0 (eBook) DOI 10.1007/978-3-319-26651-0 Library of Congress Control Number: 2016945257 © Springer International Publishing Switzerland 2016 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, com- puter software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, express or implied, with respect to the material contained herein or for any errors or omissions that may have been made. Printed on acid-free paper This Springer International Publishing Switzerland imprint is published by Springer Nature The registered company is Springer-Verlag GmbH Berlin Heidelberg Dedicated to Bryony Carter and Margie Williams Foreword by Sir John Thomas of the Companion to Williams and Carter’s book on TEM Ever since 1996, when the first edition ofTransmission Electron Microscopy: A Textbook for Materials Science (by David Williams and Barry Carter) appeared, this became the favoured and standard text for all those interested in mastering the electron microscopic examination of materials. It was, and remains, the vade mecum of choice. With its massive repository of highly relevant information and advice, teem- ing with attractive pedagogical accoutrements, this text gained almost instant, worldwide popularity. The second edition, published in 2009, contained many new features, prompted primarily by the growth of the subject and the arrival of a range of powerful additional variants of transmission electron microscopy (TEM). It had become fully apparent at that time that TEM is not just a widely useful investigative tool, but also, in its most modern form, a near complete chemical and structural laboratory, from which a multitude of properties pertaining to condensed matter may be extracted. In the intervening years it has become possible to add yet further, powerful variants for identification and characterization of both solids and, increasingly of liquids and surfaces, at evermore impressive resolutions – spatial, spectral and temporal. For example, modern scanning transmission electron microscopes (STEM), used principally for the retrieval of energy-dispersive X-rays (EDX) and electron energy loss (EEL), as may be gleaned from Chap. 11 of this Companion, can routinely generate spectra of images in which behind every image pixel lies a complete (EDX or EEL) spectrum. Moreover, by recording a tilt series of such spectrum images, 4D ‘spectrum tomograms’ produce spectral (and have chemical) information at every real space voxel. One of the most dramatic advances made since the second edition of W&C appeared is the vast im- provement (by nearly ten orders of magnitude) in temporal resolution that has been accomplished, largely through the innovative work of Zewail and colleagues in California. Up until less than a decade ago, electron microscopists recorded dynamic changes of specimens in TEMs at around millisecond resolution. Nowadays, sub-picosecond resolutions can be attained, thereby uncovering a whole host of new condensed-matter phenomena. The emergence of major new advances such as this, along with those in tomography, holography, EELS and in ‘aberration corrected’ imaging, has, inter alia, persuaded W&C to enlist a collection of world-renowned experts to expatiate their knowledge following the same admirable pedagogic approach of the progenitor text. Nowadays, thanks to modern versions of electron microscopes, the structure and composition of matter in all realms can be elucidated at unprecedented resolution in both space and time; one can ‘see’ individual atoms, and follow the acts of bond formation and rupture. All this opens up ways, outlined by contributors to this admirable Companion, to even greater insights and information in the years to come. It is reassuring to learn that W&C intend to produce further editions of this Companion when the time is ripe to do so. When I decided to turn to TEM as an investigative tool, more than fifty years ago, other chemists re- garded my decision with incredulity and perplexity. ‘Of what possible use could TEM be to the chem- ist?’ was the refrain I heard. That was in the era when chemists believed that only X-ray crystallography could enlighten chemists about the nature of solids. It was fondly believed by most chemists of that generation that all crystals were, in effect, a paradise of faultless regularity. But I had already discovered that the reactivity of solids, as well as their electronic and excitonic behaviour, is intimately associated with crystalline defects, and TEM, in its numerous variants, could answer most of my questions. These vii viii Foreword by Sir John Thomas of the Companion to Williams and Carter’s book on TEM days, no self-respecting Department of Chemistry anywhere in the world can function properly without an electron microscope. Indeed, nanoscience and nanotechnology, which are of importance to all physical and biological sciences, are impossible to pursue without a TEM. Today, such is the power of direct-detection cameras (described in Chap. 2), that many X-ray crystallographers have now turned to the TEM to solve very complicated biologically significant structures like large ribosomal subunits from human mitochondria. It is most gratifying that this Companion text is likely to satisfy the scientific appetites of all complexions of investigators of condensed matter. I warmly commend this Companion and, in particular, the way in which it follows the ethos of the original W&C volumes by posing two different levels of questions (Q and T), and the use “traffic light” boxes. Sir John Meurig Thomas Hon. Professor at the Department of Materials Science and Metallurgy, University of Cambridge, and Former Director of the Royal Institution of G.B., London Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry Preface In the prefaces to the first and second editions of Williams & Carter, we asked the same question: “How is this book different from the many other TEM books on the market?” Our answer was, in essence, that these volumes are true textbooks, written to be studied by undergraduates and graduates, constructed in lecture-size segments and (in the softbound versions) able to be used at the console of the microscope. Perhaps the most distinguishing feature of the books was that, unlike all previous TEM texts, we wrote them as we taught in the classroom: in an informal style, interspersed with side comments and the occa- sional attempted joke – which rendered translation into other languages too challenging. Around 20,000 hard copies have been printed to date, and hundreds of thousands of chapters have been downloaded. So why do we need a Companion Volume, and why do we refer to it as the Companion Volume? The answer requires recounting a little history, which, as we’ve indicated in prior prefaces, is something we enjoy. We see this book as filling a need that is really a reflection on what has happened to the TEM field in the decades since Williams first suggested the need for such a book to Carter in the living room of the Carter home in Ithaca, NY, one cold spring morning in 1985, and which is why Carter proposed that it should be W&C. Buoyed by excess coffee (see Section 34.2 of the second edition) we decided to go ahead and write. At first, we decided that a group of four complementary experts could cover the principal aspects of the TEM field at that time (hence the division of the book into four parts). Such a team was assembled. However, we found that textbook writing was not for the faint of heart. Soon after we started putting fingers to the keyboards of our $2,500(!) Apple Macintoshes and mailing floppy disks to each other containing our initial attempts, we were reduced to just W&C. Despite our lack of expertise in certain key areas of the TEM field, we managed, by 1996, to complete W&CI. Then, no doubt due to the same excesses of caffeine, we decided in 2003 to rewrite the text, and so W&CII was born in 2009. When starting W&CII we recognized that there was not much in W&CI that we could omit! But it was already a macrotome. We also realized that writing another full book on all the new things that were happening in TEM was not what we had time to do – it would take another 10 years at least. (It did.) So we invited a few of our long-time friends and colleagues who were won- derfully qualified to write particular chapters; the ones whose photos you see in these pages are still our friends, we hope. So the Companion Volume was conceived as a collection of chapters that would be written by world experts on topics that are either perennially important or really new and fascinating, and that we could keep current without sacrificing material in W&C.

Load more