DOCSLIB.ORG

13Th International Conference on Microscopy of Semiconducting

Total Page：16

File Type：pdf, Size：1020Kb

Download full-text PDF Read full-text
13Th International Conference on Microscopy of Semiconducting process is, however, not suitable for coat- In the session on applications, several Transmission electron microscopy re- ed conductors. N. Kashima (Chubu speakers discussed the requirements of vealed several interfacial reactions in the Electric Power, Japan) reported the success- coated conductors for devices such as tape. Controlling the grain-boundary ful deposition of 100-m lengths of YBCO transmission cables, generators, motors, chemistry is also important. M. Suenaga on rolled, non-textured Ag tape using a fault current limiters, and magnetic-levita- (Brookhaven National Laboratory, USA) six-stage MOCVD system. S. Sambasivan tion systems. Coated conductors are said that as the critical currents of the (Applied Thin Films, USA) reported a attractive for these devices because of the tapes become increasingly large, the so-far method for preparing YSZ buffer layers by potential for lower cost, low ac loss, opera- neglected investigation of the cryostability the oxidation of YZN (yttria-stabilized zir- tion at a higher temperature and higher of the coated conductors will also become conium nitride) films deposited directly on critical current, and reduced component an important issue. Y. Shiohara predicted both textured Ni and Ni-Cr tapes by reac- size. Most speakers projected that a cost of the availability of long lengths of YBCO- coated conductors by 2006. He also pre- tive sputtering in N2 atmospheres. RABiTS $50/kA m has to be achieved in order for tapes of more than 10 m in length are being coated conductors to be used in electric- dicted that there would be a crossover produced at Oak Ridge and at 3M. The power device applications. Nondestruc- from BSCCO conductors to YBCO-coated presence of a sulfur c 2 × 2 superstructure tive quality control for in situ process mon- conductors later in this decade. is key to growing the oxide seed layers on itoring using Raman spectroscopy, Auger, The workshop was supported by Argonne National Laboratory, IGC- textured Ni/Ni-alloy substrates. S. and x-ray techniques were presented by SuperPower, Los Alamos National Labora- Sathyamurthy and T. Aytug from Oak V. Maroni (Argonne National Laboratory, tory, MicroCoating Technologies (USA), Ridge reported the development of sim- USA) and L. Heatherly (Oak Ridge) in the Oak Ridge National Laboratory, and the plified buffer architectures using lan- characterization session. Use of magneto- University of Wisconsin. thanum zirconium oxide (La2Zr2O7) and optical imaging of the Jc distribution, cou- lanthanum manganese oxide (LaMnO3). pled with reel-to-reel Ic measurements, M. PARANS PARANTHAMAN, Chair D. Peterson from Los Alamos reported will be ideal for the determination of bad AMIT GOYAL, RON FEENSTRA, the development of strontium ruthenium spots in long tapes (M. Feldmann, Uni- TERUO IZUMI, AND VENKAT oxide (SrRuO3) for IBAD-MgO substrates. versity of Wisconsin, USA). SELVAMANICKAM, Co-organizers UPCOMING CONFERENCES 13th International Conference on Microscopy of Semiconducting Materials to be Held in Cambridge The 13th International Conference on analytical electron microscopy, advanced “SPM of GaN Surfaces”; Z. Liliental- Microscopy of Semiconducting Materials SPM and SEM applications, novel epitax- Weber (Lawrence Berkeley Laboratory, will be held at the University of Cambridge ial layer phenomena, the properties of Berkeley), “High-Resolution Electron March 31–April 3, 2003. It will focus on the quantum nanostructures, III-nitride Microscopy of Dislocations in GaN”; latest developments in the study of the developments, GeSi/Si for advanced D.A. Muller (Lucent Technologies, structural and electrical properties of devices, metal-semiconductor contacts, Murray Hill), “Exploring the Limits of semiconductors by the application of and silicides and important effects of crit- Device Physics”; V. Raineri (National transmission and scanning electron ical device-processing treatments. Institute of Methodologies and Tech- microscopy (TEM and SEM), scanning Invited speakers include M. Albrecht nologies for Microelectronics, Catania), probe microscopy (SPM), and x-ray-based (Erlangen University) on “Transmission “Process and Device Characterization”; methods. The abstract deadline is Electron Microscope-Cathodoluminescence F.M. Ross (IBM T.J. Watson Research December 2, 2002. Studies of III-Nitrides”; Y. Bando (Na- Center, Yorktown Heights), “Ge/Si The conference chairs are Tony Cullis tional Institute for Materials Science, Growth on Patterned Surfaces”; and E. (Sheffield University) and Paul Midgley Tsukuba), “Field-Emission Gun Trans- Zschech (AMD Saxony, Dresden), (Cambridge University). It is sponsored mission Electron Microscope Analysis of “Challenges of Failure Analysis.” by the Electron Microscopy and Analysis Nanotubes”; H. Bender (IMEC, Leuven), The conference proceedings will be Group (EMAG) of the Institute of Physics, “Developments in Silicides”; D. Bimberg published. For further details and infor- co-sponsored by The Royal Microscopical (Technical University, Berlin), “High- mation on abstract submission and regis- Society, and endorsed by the Materials Resolution Electron Microscopy and tration, access the conference Web site at Research Society. XSTM of Quantum Dots”; G.A.D. Briggs http://physics.iop.org/IOP/Confs/MSM/ Conference sessions will concentrate (Oxford University), “Nanostructures for or e-mail [email protected]. on key topics that include state-of-the-art Quantum Computing”; R.M. Feenstra studies in high-resolution imaging and (Carnegie Mellon University, Pittsburgh), ForFor thethe mostmost up-to-dateup-to-date informationinformation onon materialsmaterials meetingsmeetings andand conferencesconferences worldwideworldwide visitvisit thethe MaterialsMaterials Gateway—Gateway—www.mrs.org/gateway/www.mrs.org/gateway/ 814 www.mrs.org/publications/bulletin MRS BULLETIN/OCTOBER 2002 Downloaded from https://www.cambridge.org/core. IP address: 170.106.33.22, on 30 Sep 2021 at 13:26:07, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms. https://doi.org/10.1557/mrs2002.255.
Load more

Recommended publications
  • Curriculum Vitae with Track Record (January 2018) Professor Dr. Ir. A. T. J. Van Helvoort
    Curriculum vitae with track record (January 2018) Professor dr. ir. A. T. J. van Helvoort PERSONAL INFORMATION Family name, First name: van Helvoort, Antonius Theodorus Johannes Date of birth: 15.06.1973 Sex: male Nationality: Dutch Researcher unique identifiers: ORCID 0000-0001-6437-1474, ResearcherID: A-1400-2013 URL for personal web site: http://www.ntnu.edu/employees/a.helvoort EDUCATION 2002 PhD: Disputation date: 06.12.2002. Materials Science & Metallurgy, Cambridge University (Corpus Christi College), UK 1999 Master Natural Sciences/Materials Science, Delft technical University, the Netherlands CURRENT AND PREVIOUS POSITIONS 2014-…. Current Position: Professor Norwegian University of Science and Technology (NTNU)/ Faculty of Natural Sciences/Department of Physics, Trondheim, Norway. 2007-2014…. Previous position held: associate professor Norwegian University of Science and Technology (NTNU)/ Faculty of Natural Sciences/Department of Physics, Trondheim, Norway. 2005-2007 Previous position held: Researcher SINTEF Materials and Chemistry (Materials Physics), Trondheim, Norway. FELLOWSHIPS 2014-2015 Byfellow Churchill College Cambridge, UK MOBILITY 2014-2015 Department of Materials Science and Metallurgy/Electron Microscopy Croup, University of Cambridge/UK The sabbatical leave was award and financed by the faculty of Natural Sciences & Technology, Norwegian University of Science and Technology (NTNU). SUPERVISION OF GRADUATE STUDENTS AND RESEARCH FELLOWS 2007-…. 5 PhDs as main supervisor of which 3 finished. 2007-…. 7 PhDs as co-supervisor of which 2 finished 2003-…. 38 project/diploma(MSc)/exchange students. Norwegian University of Science and Technology (NTNU)/ Faculty of Natural Sciences/Department of Physics, Trondheim, Norway. TEACHING ACTIVITIES (NTNU, Department of Physics) 2015 General Physic lab non-physic students (lab coordination). (BSc level) 2008-2014 Nanotools – Characterization Nanomaterials.
    [Show full text]
  • Midgley Abstract
    MONASH CENTRE FOR ELECTRON MICROSCOPY SEMINAR Electron tomography – a new perspective for materials microscopy Dr Paul Midgley Department of Materials Science and Metallurgy University of Cambridge Friday 13 July, 2007, 2:00 p.m. – 3.00 p.m. Science Lecture Theatre S11, Bldg 25 Abstract Within materials science and engineering, the push for nanotechnology and the increasing use of nanoscale materials brings with it the need for high spatial resolution imaging and analysis. As the lateral dimensions of a feature approach that of its depth, as is happening for example in many semiconductor fabrication lines, electron microscopy is being pushed towards examining truly 3-dimensional objects and a single projection is not adequate for a complete description. To that end electron tomography has been adapted from the original ideas proposed in the life sciences to meet the needs of the materials scientist working at the nanoscale. Although electron tomography in the life sciences relies on a tilt series of bright field (BF) images exhibiting predominantly mass-thickness contrast, in materials science, for a general crystalline object, diffraction (and Fresnel) contrast very often prohibits the use of (coherent) BF images for electron tomographic reconstruction. Normally, other (incoherent) signals must be used. As such, high-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) imaging has been developed as the basis for the tomography tilt series and has become the conventional mode for materials-based electron tomography. However, STEM HAADF imaging will not reveal certain important electronic, compositional and structural properties of many materials and so more unconventional modes are also under development.
    [Show full text]
  • The Rapidly Changing Face of Electron Microscopy
    Chemical Physics Letters 631–632 (2015) 103–113 Contents lists available at ScienceDirect Chemical Physics Letters jou rnal homepage: www.elsevier.com/locate/cplett FRONTIERS ARTICLE The rapidly changing face of electron microscopy ∗ John Meurig Thomas , Rowan K. Leary, Alexander S. Eggeman, Paul A. Midgley Department of Materials Science & Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge CB3 0FS, UK a r t i c l e i n f o a b s t r a c t Article history: This short but wide-ranging review is intended to convey to chemical physicists and others engaged in Received 7 April 2015 the interfaces between solid-state chemistry and solid-state physics the growing power and extensive In final form 29 April 2015 applicability of multiple facets of the technique of electron microscopy. Available online 7 May 2015 © 2015 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/). 1. Introduction There is, however, another kind of 4D EM [9–11], which is the revolutionary one introduced by Zewail and co-workers that Fifty years ago electron microscopy (EM) had already made a achieves ultra-fast EM at the femtosecond time-scale, while also profound impact both on molecular biology and metallurgy. A neg- reaching near atomic resolution. This remarkable technical advance ative staining method for high-resolution EM of viruses soon led to has improved temporal resolution of imaging and spectra, gen- major progress in three-dimensional (3D) image reconstructions erated by EM, by some 10 orders of magnitude compared with of small viruses [1–3]; and the reality of the existence, movement the video recording rates still used extensively by microscopists.
    [Show full text]
  • Ultrafast Crystal Structure Determination of Pharmaceutical Compounds Using TEM Electron Diffraction Without Cooling Techniques
    CRYSTAL STRUCTURE DETERMINATION OF PHARMACEUTICALS WITH ELECTRON DIFFRACTION Dr. Partha Pratim Das Application Specialist, NanoMEGAS SPRL, Belgium [email protected] www.nanomegas.com This document was presented at PPXRD - Pharmaceutical Powder X-ray Diffraction Symposium Sponsored by The International Centre for Diffraction Data This presentation is provided by the International Centre for Diffraction Data in cooperation with the authors and presenters of the PPXRD symposia for the express purpose of educating the scientific community. All copyrights for the presentation are retained by the original authors. The ICDD has received permission from the authors to post this material on our website and make the material available for viewing. Usage is restricted for the purposes of education and scientific research. PPXRD Website – www.icdd.com/ppxrd ICDD Website - www.icdd.com Free transnational access to the most advanced TEM equipment and skilled operators for HR(S)TEM, EELS, EDX, Tomography, Holography and various in-situ state-of-the-art experiments X 2 SME participate CEOS NanoMEGAS X-ray Crystallography Neutron Electron Emerging new technique Why using electron crystallography ? STRUCTURE ANALYSIS WITH ELECTRON DIFFRACTION Why electrons? 104-5 times stronger interaction with matter compared with X-ray . single crystal data on powder sample . short data collection time - X- Ray peaks broaden with crystals of nm range With Electron microscope we can study nm- and micro-sized crystals STRUCTURE ANALYSIS WITH TEM TEM : Electron diffraction advantages Every TEM (electron microscope) TEM goniometer may produce ED patterns and HREM from individual single nanocrystals ED information: Cell parameter and symmetry determination Measuring intensity values leads to structure determination Nicola Pinna, Progr Colloid Polym Sci 130 (2005) 29-32 Nicola Pinna et al., Adv.
    [Show full text]
  • Program Time Schedule
    EUROPACAT- VIII, scientific program, time schedule Sunday 26.8 17:30 Opening 18:00 PL-1, Hall A, Keynote and Plenary lectures Hydrogen: From petrochemical workhorse to clean fuel, Herman P.C.E. Kuipers, , Speaker Herman P.C.E. Kuipers 19:00 Welcome reception Monday 27.8 09:00 Berzelius Lecture, Hall A, Keynote and Plenary lectures New Ligands and Applications for Olefin Metathesis Catalysts, R.H. Grubbs, California Institute of Technology, Speaker R.H. Grubbs 10:00 O4-1, Auditorium 1, New experimental approaches and characterization under reaction conditions (combinatorial methods included) Non-uniform catalytic behaviour of zeolite crystals as revealed by in-situ optical micro-spectroscopy, Marianne H.F. Kox, Eli Stavitski, Bert M. Weckhuysen, Utrecht University, Speaker Marianne Kox 10:00 O14-1, Auditorium 2, Catalysis for pollution control (mobile) The Effect of Water on the Adsorbed NOx species over BaO/Al2O3 NOx Storage Materials: A Combined FTIR and In Situ Time-Resolved XRD study, János Szanyi, Ja Hun Kwak, Do Heui Kim, Jonathan Hanson, Charles H.F. Peden, Pacific Northwest National Laboratory, Speaker Janos Szanyi 10:00 O15-1, Auditorium 3, Catalysis for bulk and specialty chemicals Nature and chemical reactivity of Ga species in ZSM-5 zeolite for alkane activation, N. Rane, R.A. van Santen, E.J.M. Hensen, Eindhoven University of Technology, Speaker N.Rane 10:00 K9-1, Hall A, Keynote and Plenary lectures Zeolite Catalysts in Oil Refining and Petrochemistry, Jens Weitkamp, University of Stuttgart, Speaker Jens Weitkamp 10:00 O5-1, Hall C, Catalysis for pharma and fine chemistry (homo- and heterogeneous catalysis) Methods to Assess Leaching of Active Palladium from Immobilized Molecular Catalysts in Heck and Suzuki Couplings, J.
    [Show full text]
  • Crystallography News British Crystallographic Association
    Crystallography News British Crystallographic Association Issue No. 112 March 2010 ISSN 1467-2790 Warwick April 2010 p6 BCA AGM 2009 Minutes p12 ECM26 p27 Dr Andrew Booth (1918-2009) p31 The Fankuchen Award p33 Small Molecule & Protein Ready & Protein SuperNova™ The Fastest, Most Intense Dual Wavelength X-ray System Automatic wavelength switching between Mo and Cu X-ray micro-sources 50W X-ray sources provide up to 3x more intensity than a 5kW rotating anode Fastest, highest performance CCD. Large area 135mm Atlas™ or highest sensitivity Eos™ – 330 (e-/X-ray Mo) gain Full 4-circle kappa goniometer AutoChem™, automatic structure solution and refinement software Extremely compact and very low maintenance driving X-ray innovation www.oxford-diffraction.com [email protected] Super Nova ad 1.4.09 - BCA.indd 1 3/4/09 15:38:04 Bruker AXS with DAVINCI. DESIGN The new D8 ADVANCE Designed for the next era in X-ray diffraction DAVINCI.MODE: Real-time component recognition and configuration DAVINCI.SNAP-LOCK: Alignment-free optics change without tools DIFFRAC.DAVINCI: The virtual diffractometer TWIN/TWIN SETUP: Push-button switch between Bragg-Brentano and parallel-beam geometries TWIST-TUBE: Fast and easy switching from line to point focus XRD Order Number DOC-P88-EXS071 © 2009 Bruker AXS GmbH. Printed in Germany. in Germany. AXS GmbH. Printed © 2009 Order Number DOC-P88-EXS071 Bruker think forward Crystallography News March 2010 Contents From the Editor . 2 Council Members . 3 BCA Administrative Office, From the President. 4 David Massey Northern Networking Events Ltd. Puzzle Corner and Corporate Members . 5 Glenfinnan Suite, Braeview House 9/11 Braeview Place East Kilbride G74 3XH BCA AGM 2010.
    [Show full text]
  • Francisco Javier Aparicio Rebollo Generado Desde: Editor CVN De FECYT Fecha Del Documento: 02/06/2021 V 1.4.3 78587B036d8a42cd2fdfae87b3a14c46
    Francisco Javier Aparicio Rebollo Generado desde: Editor CVN de FECYT Fecha del documento: 02/06/2021 v 1.4.3 78587b036d8a42cd2fdfae87b3a14c46 Este fichero electrónico (PDF) contiene incrustada la tecnología CVN (CVN-XML). La tecnología CVN de este fichero permite exportar e importar los datos curriculares desde y hacia cualquier base de datos compatible. Listado de Bases de Datos adaptadas disponible en http://cvn.fecyt.es/ 78587b036d8a42cd2fdfae87b3a14c46 Resumen libre del currículum Descripción breve de la trayectoria científica, los principales logros científico-técnicos obtenidos, los intereses y objetivos científico-técnicos a medio/largo plazo de la línea de investigación. Incluye también otros aspectos o peculiaridades importantes. Las investigaciones del Dr. Aparicio se centran en el desarrollo de nuevas metodologías de deposición en vacío y asistidas por plasma para la síntesis de nanomateriales y nanoestructuras orgánicas para diversas aplicaciones funcionales: fotónica, sensores ambientales, biomateriales, electrónica flexible, nanogeneradores y celdas solares. Durante sus investigaciones doctorales (Instituto de Ciencia de Materiales de Sevilla, ICMS) el candidato abordo con éxito el desarrollo de una innovadora técnica de plasma (RPAVD) para la síntesis de polímeros de plasma hiperfuncionales. Estos nanocomposites de plasma fueron el elemento clave en una nueva tecnología de sensores fotónicos desarrollados en el seno del proyecto Europeo PHODYE. En 2011 el Dr. Aparicio inició una estancia postdoctoral en el “Nanoscience Laboratory” (Universidad de Trento, Italia) liderado por el Prof. Pavesi (ERC Advanced Grant 2017) donde desarrolló transductores biofotónicos de elevada sensibilidad. Estos avances fueron determinantes en el proyecto NAoMI. En 2012 se unió al grupo de investigación “Chemistry of Plasma Surface Interactions ” (Universidad de Mons, Belgica) .
    [Show full text]
  • Faculty of Natural Sciences Research Showcase 2019
    Faculty of Natural Sciences Research Showcase 2019 Wednesday 25 September Information Booklet Sir Alexander Fleming Building Lecture Theatre G34, Concourse Level 1 and SAF B120-122 Imperial College London Exhibition Road SW7 2AZ London, UK 1 Contents Welcome from the Dean of the Faculty of Natural 03 Sciences Map of campus and location 04 Research showcase programme 05 Welcome to Imperial College London Symposium schedule 06 A warm welcome to the Faculty of Natural Sciences annual Research Showcase. Abstracts of the talks 08 As my term as Dean of the Faculty of Natural Sciences draws to its conclusion, I look back with immense pride at the achievements of our staff and students over the past 5 years. Expert Panel Session 22 As in previous years, our flagship event will showcase the scientific excellence that our Faculty has to offer: from fundamental science underpinning discoveries Abstract of the panel session in the infinitesimally small and infinitely big, to our most applied and innovative Biography of the panel members research. It provides a wonderful opportunity for all our guests and Faculty members to engage in stimulating discussions through a series of talks and posters by our members of staff, fellows and prize-winning post-graduate students. List of poster presenters 24 The breadth and collegial nature of our Faculty enables us to work collaboratively to address tomorrow’s biggest scientific challenges. Our panel discussion today led by the Centre for Environmental Policy on the topic of “The Plastic Challenge: Sustainable Interventions for a Healthy Planet” provides an example of how multidisciplinary research can tackle today’s environmental challenges.
    [Show full text]
  • Microcavity-Like Exciton-Polaritons Can Be the Primary Photoexcitation in Bare Organic Semiconductors
    Microcavity-Like Exciton-Polaritons can be the Primary Photoexcitation in Bare Organic Semiconductors Akshay Rao ( [email protected] ) University of Cambridge https://orcid.org/0000-0003-0320-2962 Raj Pandya University of Cambridge Richard Chen University of Cambridge Qifei Gu Cavendish Laboratory, University of Cambridge Jooyoug Sung University of Cambridge Christoph Schnedermann University of Cambridge https://orcid.org/0000-0002-2841-8586 Oluwafemi Ojambati University of Cambridge Rohit Chikkaraddy University of Cambridge https://orcid.org/0000-0002-3840-4188 Jeffrey Gorman University of Cambridge https://orcid.org/0000-0002-6888-7838 Gianni Jacucci University of Cambridge https://orcid.org/0000-0002-9156-0876 Olimpia Onelli University of Cambridge Tom Willhammar Stockholm University https://orcid.org/0000-0001-6120-1218 Duncan Johnstone University of Cambridge Sean Collins University of Leeds https://orcid.org/0000-0002-5151-6360 Paul Midgley University of Cambridge Florian Auras University of Cambridge https://orcid.org/0000-0003-1709-4384 Tomi Baikie University of Cambridge Rahul Jayaprakash University of Sheeld https://orcid.org/0000-0002-2021-1601 Fabrice Mathevet CNRS - Sorbonne University Richard Soucek Sorbonne Université Mathew Du University of California, San Diego Antonios Alvertis University of Cambridge Arjun Ashoka University of Cambridge Silvia Vignolini University of Cambridge https://orcid.org/0000-0003-0664-1418 David Lidzey University of Sheeld https://orcid.org/0000-0002-8558-1160 Jeremy Baumberg University of Cambridge
    [Show full text]
  • Download Issue
    ISSN 2056-5135 JOHNSON MATTHEY TECHNOLOGY REVIEW Johnson Matthey’s international journal of research exploring science and technology in industrial applications Volume 61, Issue 1, January 2017 Published by Johnson Matthey www.technology.matthey.com © Copyright 2017 Johnson Matthey Johnson Matthey Technology Review is published by Johnson Matthey Plc. This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License. You may share, copy and redistribute the material in any medium or format for any lawful purpose. You must give appropriate credit to the author and publisher. You may not use the material for commercial purposes without prior permission. You may not distribute modifi ed material without prior permission. The rights of users under exceptions and limitations, such as fair use and fair dealing, are not affected by the CC licenses. www.technology.matthey.com JOHNSON MATTHEY TECHNOLOGY REVIEW www.technology.matthey.com Johnson Matthey’s international journal of research exploring science and technology in industrial applications Contents Volume 61, Issue 1, January 2017 2 Guest Editorial: The Business of Sustainability By Neil Carson 3 Guest Editorial: Health Technologies at Johnson Matthey By John F. X. Morley and Nicholas Johnson 5 Molybdenum/Bismuth Based Mixed Metal Oxide Catalysts for Selective Propylene Oxidation and Zeolite Membrane Protected Palladium/Alumina Catalysts for Selective Carbon Monoxide Oxidation and Application in a Process Loop Using a Propane Feed By Maria Rivas
    [Show full text]
  • University's Widening Participation Approach Applauded
    The free magazine for The University of Manchester UniLife 25th April 2005 Volume 2 Issue 11 University’s Widening Participation Approach Applauded 2 UniLife NewsDigest A summary of the key news in this issue of UniLife: Contents 3 Widening Participation Professor Geoff Beattie, Head of the School of 4 News Psychological Sciences, will be analysing the body 7 language of the country’s top politicians on the ITV 16 Profile News throughout the run-up to the election. 18 Enterprise 20 Research The Faculty of Engineering and Physical Sciences 21 Students has held the first in a series of launch events aimed at showcasing its research. Delegates from industry, Government and the media attended 22 People 7 ‘Energy, the Environment and Sustainability’, held in partnership with the Royal Academy of 24 Community Engineering. 26 What’s On 28 Seminars Profile of Professor David Hulme, Director of the 29 Noticeboard 16 Chronic Poverty Research Centre and co-Director of the Global Poverty Research Group. 30 Classified Ads 32 Just the Job Photo of Julian Skyrme Manchester Science Enterprise Centre (MSEC) aims Head of Widening Participation to empower graduates and undergraduates to exploit knowledge and ideas commercially, and enable them to engage in enterprise during their 18 time at the University. It offers undergraduate, postgraduate and professional development courses, including the unique Master of Enterprise (MEnt) degree. The Universities of Manchester and Salford will give Oxbridge a run for their money when they go 21 head to head along the Manchester Ship Canal, in the 34th Two Cities Boat Race on Sunday, 8 May.
    [Show full text]
  • Transmission Electron Microscopy C
    Transmission Electron Microscopy C. Barry Carter · David B. Williams (Eds.) Transmission Electron Microscopy Diffraction, Imaging, and Spectrometry Editors C. Barry Carter David B. Williams University of Connecticut The Ohio State University Storrs, USA Columbus, USA ISBN 978-3-319-26649-7 ISBN 978-3-319-26651-0 (eBook) DOI 10.1007/978-3-319-26651-0 Library of Congress Control Number: 2016945257 © Springer International Publishing Switzerland 2016 This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or information storage and retrieval, electronic adaptation, com- puter software, or by similar or dissimilar methodology now known or hereafter developed. The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. The publisher, the authors and the editors are safe to assume that the advice and information in this book are believed to be true and accurate at the date of publication. Neither the publisher nor the authors or the editors give a warranty, express or implied, with respect to the material contained herein or for any errors or omissions that may have been made.
    [Show full text]