An-815 Understanding Jitter Units
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Laser Linewidth, Frequency Noise and Measurement
Laser Linewidth, Frequency Noise and Measurement WHITEPAPER | MARCH 2021 OPTICAL SENSING Yihong Chen, Hank Blauvelt EMCORE Corporation, Alhambra, CA, USA LASER LINEWIDTH AND FREQUENCY NOISE Frequency Noise Power Spectrum Density SPECTRUM DENSITY Frequency noise power spectrum density reveals detailed information about phase noise of a laser, which is the root Single Frequency Laser and Frequency (phase) cause of laser spectral broadening. In principle, laser line Noise shape can be constructed from frequency noise power Ideally, a single frequency laser operates at single spectrum density although in most cases it can only be frequency with zero linewidth. In a real world, however, a done numerically. Laser linewidth can be extracted. laser has a finite linewidth because of phase fluctuation, Correlation between laser line shape and which causes instantaneous frequency shifted away from frequency noise power spectrum density (ref the central frequency: δν(t) = (1/2π) dφ/dt. [1]) Linewidth Laser linewidth is an important parameter for characterizing the purity of wavelength (frequency) and coherence of a Graphic (Heading 4-Subhead Black) light source. Typically, laser linewidth is defined as Full Width at Half-Maximum (FWHM), or 3 dB bandwidth (SEE FIGURE 1) Direct optical spectrum measurements using a grating Equation (1) is difficult to calculate, but a based optical spectrum analyzer can only measure the simpler expression gives a good approximation laser line shape with resolution down to ~pm range, which (ref [2]) corresponds to GHz level. Indirect linewidth measurement An effective integrated linewidth ∆_ can be found by can be done through self-heterodyne/homodyne technique solving the equation: or measuring frequency noise using frequency discriminator. -
Johnson Noise and Shot Noise: the Determination of the Boltzmann Constant, Absolute Zero Temperature and the Charge of the Electron
Johnson Noise and Shot Noise: The Determination of the Boltzmann Constant, Absolute Zero Temperature and the Charge of the Electron MIT Department of Physics (Dated: September 3, 2013) In electronic measurements, one observes \signals," which must be distinctly above the \noise." Noise induced from outside sources may be reduced by shielding and proper \grounding." Less noise means greater sensitivity with signal/noise as the figure of merit. However, there exist fundamental sources of noise which no clever circuit can avoid. The intrinsic noise is a result of the thermal jitter of the charge carriers and the quantization of charge. The purpose of this experiment is to measure these two limiting electrical noises. From the measurements, values of the Boltzmann constant and the charge of the electron will be derived. PREPARATORY QUESTIONS By the end of the 19th century, the accumulated ev- idence from chemistry, crystallography, and the kinetic Please visit the Johnson and Shot Noise chapter on the theory of gases left little doubt about the validity of the 8.13x website at mitx.mit.edu to review the background atomic theory of matter. Nevertheless, there were still material for this experiment. Answer all questions found arguments against the atomic theory, stemming from a in the chapter. Work out the solutions in your laboratory lack of "direct" evidence for the reality of atoms. In fact, notebook; submit your answers on the web site. there was no precise measurement yet available of the quantitative relation between atoms and the objects of direct scientific experience such as weights, meter sticks, EXPERIMENT GOALS clocks, and ammeters. -
An Integrated Low Phase Noise Radiation-Pressure-Driven Optomechanical Oscillator Chipset
OPEN An integrated low phase noise SUBJECT AREAS: radiation-pressure-driven OPTICS AND PHOTONICS NANOSCIENCE AND optomechanical oscillator chipset TECHNOLOGY Xingsheng Luan1, Yongjun Huang1,2, Ying Li1, James F. McMillan1, Jiangjun Zheng1, Shu-Wei Huang1, Pin-Chun Hsieh1, Tingyi Gu1, Di Wang1, Archita Hati3, David A. Howe3, Guangjun Wen2, Mingbin Yu4, Received Guoqiang Lo4, Dim-Lee Kwong4 & Chee Wei Wong1 26 June 2014 Accepted 1Optical Nanostructures Laboratory, Columbia University, New York, NY 10027, USA, 2Key Laboratory of Broadband Optical 13 October 2014 Fiber Transmission & Communication Networks, School of Communication and Information Engineering, University of Electronic 3 Published Science and Technology of China, Chengdu, 611731, China, National Institute of Standards and Technology, Boulder, CO 4 30 October 2014 80303, USA, The Institute of Microelectronics, 11 Science Park Road, Singapore 117685, Singapore. High-quality frequency references are the cornerstones in position, navigation and timing applications of Correspondence and both scientific and commercial domains. Optomechanical oscillators, with direct coupling to requests for materials continuous-wave light and non-material-limited f 3 Q product, are long regarded as a potential platform for should be addressed to frequency reference in radio-frequency-photonic architectures. However, one major challenge is the compatibility with standard CMOS fabrication processes while maintaining optomechanical high quality X.L. (xl2354@ performance. Here we demonstrate the monolithic integration of photonic crystal optomechanical columbia.edu); Y.H. oscillators and on-chip high speed Ge detectors based on the silicon CMOS platform. With the generation of (yh2663@columbia. both high harmonics (up to 59th order) and subharmonics (down to 1/4), our chipset provides multiple edu) or C.W.W. -
Understanding Jitter and Wander Measurements and Standards Second Edition Contents
Understanding Jitter and Wander Measurements and Standards Second Edition Contents Page Preface 1. Introduction to Jitter and Wander 1-1 2. Jitter Standards and Applications 2-1 3. Jitter Testing in the Optical Transport Network 3-1 (OTN) 4. Jitter Tolerance Measurements 4-1 5. Jitter Transfer Measurement 5-1 6. Accurate Measurement of Jitter Generation 6-1 7. How Tester Intrinsics and Transients 7-1 affect your Jitter Measurement 8. What 0.172 Doesn’t Tell You 8-1 9. Measuring 100 mUIp-p Jitter Generation with an 0.172 Tester? 9-1 10. Faster Jitter Testing with Simultaneous Filters 10-1 11. Verifying Jitter Generator Performance 11-1 12. An Overview of Wander Measurements 12-1 Acronyms Welcome to the second edition of Agilent Technologies Understanding Jitter and Wander Measurements and Standards booklet, the distillation of over 20 years’ experience and know-how in the field of telecommunications jitter testing. The Telecommunications Networks Test Division of Agilent Technologies (formerly Hewlett-Packard) in Scotland introduced the first jitter measurement instrument in 1982 for PDH rates up to E3 and DS3, followed by one of the first 140 Mb/s jitter testers in 1984. SONET/SDH jitter test capability followed in the 1990s, and recently Agilent introduced one of the first 10 Gb/s Optical Channel jitter test sets for measurements on the new ITU-T G.709 frame structure. Over the years, Agilent has been a significant participant in the development of jitter industry standards, with many contributions to ITU-T O.172/O.173, the standards for jitter test equipment, and Telcordia GR-253/ ITU-T G.783, the standards for operational SONET/SDH network equipment. -
Analysis and Design of Wideband LC Vcos
Analysis and Design of Wideband LC VCOs Axel Dominique Berny Robert G. Meyer Ali Niknejad Electrical Engineering and Computer Sciences University of California at Berkeley Technical Report No. UCB/EECS-2006-50 http://www.eecs.berkeley.edu/Pubs/TechRpts/2006/EECS-2006-50.html May 12, 2006 Copyright © 2006, by the author(s). All rights reserved. Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. To copy otherwise, to republish, to post on servers or to redistribute to lists, requires prior specific permission. Analysis and Design of Wideband LC VCOs by Axel Dominique Berny B.S. (University of Michigan, Ann Arbor) 2000 M.S. (University of California, Berkeley) 2002 A dissertation submitted in partial satisfaction of the requirements for the degree of Doctor of Philosophy in Electrical Engineering and Computer Sciences in the GRADUATE DIVISION of the UNIVERSITY OF CALIFORNIA, BERKELEY Committee in charge: Professor Robert G. Meyer, Co-chair Professor Ali M. Niknejad, Co-chair Professor Philip B. Stark Spring 2006 Analysis and Design of Wideband LC VCOs Copyright 2006 by Axel Dominique Berny 1 Abstract Analysis and Design of Wideband LC VCOs by Axel Dominique Berny Doctor of Philosophy in Electrical Engineering and Computer Sciences University of California, Berkeley Professor Robert G. Meyer, Co-chair Professor Ali M. Niknejad, Co-chair The growing demand for higher data transfer rates and lower power consumption has had a major impact on the design of RF communication systems. -
Modeling the Impact of Phase Noise on the Performance of Crystal-Free Radios Osama Khan, Brad Wheeler, Filip Maksimovic, David Burnett, Ali M
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: EXPRESS BRIEFS, VOL. 64, NO. 7, JULY 2017 777 Modeling the Impact of Phase Noise on the Performance of Crystal-Free Radios Osama Khan, Brad Wheeler, Filip Maksimovic, David Burnett, Ali M. Niknejad, and Kris Pister Abstract—We propose a crystal-free radio receiver exploiting a free-running oscillator as a local oscillator (LO) while simulta- neously satisfying the 1% packet error rate (PER) specification of the IEEE 802.15.4 standard. This results in significant power savings for wireless communication in millimeter-scale microsys- tems targeting Internet of Things applications. A discrete time simulation method is presented that accurately captures the phase noise (PN) of a free-running oscillator used as an LO in a crystal- free radio receiver. This model is then used to quantify the impact of LO PN on the communication system performance of the IEEE 802.15.4 standard compliant receiver. It is found that the equiv- alent signal-to-noise ratio is limited to ∼8 dB for a 75-µW ring oscillator PN profile and to ∼10 dB for a 240-µW LC oscillator PN profile in an AWGN channel satisfying the standard’s 1% PER specification. Index Terms—Crystal-free radio, discrete time phase noise Fig. 1. Typical PN plot of an RF oscillator locked to a stable crystal frequency modeling, free-running oscillators, IEEE 802.15.4, incoherent reference. matched filter, Internet of Things (IoT), low-power radio, min- imum shift keying (MSK) modulation, O-QPSK modulation, power law noise, quartz crystal (XTAL), wireless communication. -
Retrospective Analysis of Phonatory Outcomes After CO2 Laser Thyroarytenoid 00111 Myoneurectomy in Patients with Adductor Spasmodic Dysphonia
Global Journal of Otolaryngology ISSN 2474-7556 Research Article Glob J Otolaryngol Volume 22 Issue 4- June 2020 Copyright © All rights are reserved by Rohan Bidaye DOI: 10.19080/GJO.2020.22.556091 Retrospective Analysis of Phonatory Outcomes after CO2 Laser Thyroarytenoid Myoneurectomy in Patients with Adductor Spasmodic Dysphonia Rohan Bidaye1*, Sachin Gandhi2*, Aishwarya M3 and Vrushali Desai4 1Senior Clinical Fellow in Laryngology, Deenanath Mangeshkar Hospital, India 2Head of Department of ENT, Deenanath Mangeshkar Hospital, India 3Fellow in Laryngology, Deenanath Mangeshkar Hospital, India 4Chief Consultant, Speech Language Pathologist, Deenanath Mangeshkar Hospital, India Submission: May 16, 2020; Published: June 08, 2020 *Corresponding author: Rohan Bidaye and Sachin Gandhi, Senior Clinical Fellow in Laryngology and Head of Department of ENT, Deenanath Mangeshkar Hospital, India Abstract Introduction: Adductor spasmodic dysphonia (ADSD) is a focal laryngeal dystonia characterized by spasms of laryngeal muscles during speech. Botulinum toxin injection in the Thyroarytenoid muscle remains the gold-standard treatment for ADSD. However, as Botulinum toxin CO2 laser Thyroarytenoid myoneurectomy (TAM) has been reported as an effective technique for treatment of ADSD. It provides sustained improvementinjections need in tothe be voice repeated over a periodically,longer duration. the voice quality fluctuates over a longer period. A Microlaryngoscopic Transoral approach to Methods: Trans oral Microlaryngoscopic CO2 laser TAM was performed in 14 patients (5 females and 9 males), aged between 19 and 64 years who were diagnosed with ADSD. Data was collected from over 3 years starting from Jan 2014 – Dec 2016. GRBAS scale along with Multi- dimensional voice programme (MDVP) analysis of the voice and Video laryngo-stroboscopic (VLS) samples at the end of 3 and 12 months of surgery would be compared with the pre-operative readings. -
Understanding Phase Error and Jitter: Definitions, Implications
This article has been accepted for inclusion in a future issue of this journal. Content is final as presented, with the exception of pagination. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS–I: REGULAR PAPERS 1 Understanding Phase Error and Jitter: Definitions, Implications, Simulations, and Measurement Ian Galton , Fellow, IEEE, and Colin Weltin-Wu, Member, IEEE (Invited Paper) Abstract— Precision oscillators are ubiquitous in modern elec- multiplication by a sinusoidal oscillator signal whereas most tronic systems, and their accuracy often limits the performance practical mixer circuits perform multiplication by squared-up of such systems. Hence, a deep understanding of how oscillator oscillator signals. Fundamental questions typically are left performance is quantified, simulated, and measured, and how unanswered such as: How does the squaring-up process change it affects the system performance is essential for designers. the oscillator error? How does multiplying by a squared-up Unfortunately, the necessary information is spread thinly across oscillator signal instead of a sinusoidal signal change a mixer’s the published literature and textbooks with widely varying notations and some critical disconnects. This paper addresses this behavior and response to oscillator error? problem by presenting a comprehensive one-stop explanation of Another obstacle to learning the material is that there are how oscillator error is quantified, simulated, and measured in three distinct oscillator error metrics in common use: phase practice, and the effects of oscillator error in typical oscillator error, jitter, and frequency stability. Each metric offers advan- applications. tages in certain applications, so it is important to understand Index Terms— Oscillator phase error, phase noise, jitter, how they relate to each other, yet with the exception of [1], frequency stability, Allan variance, frequency synthesizer, crystal, the authors are not aware of prior publications that provide phase-locked loop (PLL). -
AN279: Estimating Period Jitter from Phase Noise
AN279 ESTIMATING PERIOD JITTER FROM PHASE NOISE 1. Introduction This application note reviews how RMS period jitter may be estimated from phase noise data. This approach is useful for estimating period jitter when sufficiently accurate time domain instruments, such as jitter measuring oscilloscopes or Time Interval Analyzers (TIAs), are unavailable. 2. Terminology In this application note, the following definitions apply: Cycle-to-cycle jitter—The short-term variation in clock period between adjacent clock cycles. This jitter measure, abbreviated here as JCC, may be specified as either an RMS or peak-to-peak quantity. Jitter—Short-term variations of the significant instants of a digital signal from their ideal positions in time (Ref: Telcordia GR-499-CORE). In this application note, the digital signal is a clock source or oscillator. Short- term here means phase noise contributions are restricted to frequencies greater than or equal to 10 Hz (Ref: Telcordia GR-1244-CORE). Period jitter—The short-term variation in clock period over all measured clock cycles, compared to the average clock period. This jitter measure, abbreviated here as JPER, may be specified as either an RMS or peak-to-peak quantity. This application note will concentrate on estimating the RMS value of this jitter parameter. The illustration in Figure 1 suggests how one might measure the RMS period jitter in the time domain. The first edge is the reference edge or trigger edge as if we were using an oscilloscope. Clock Period Distribution J PER(RMS) = T = 0 T = TPER Figure 1. RMS Period Jitter Example Phase jitter—The integrated jitter (area under the curve) of a phase noise plot over a particular jitter bandwidth. -
End-To-End Deep Learning for Phase Noise-Robust Multi-Dimensional Geometric Shaping
MITSUBISHI ELECTRIC RESEARCH LABORATORIES https://www.merl.com End-to-End Deep Learning for Phase Noise-Robust Multi-Dimensional Geometric Shaping Talreja, Veeru; Koike-Akino, Toshiaki; Wang, Ye; Millar, David S.; Kojima, Keisuke; Parsons, Kieran TR2020-155 December 11, 2020 Abstract We propose an end-to-end deep learning model for phase noise-robust optical communications. A convolutional embedding layer is integrated with a deep autoencoder for multi-dimensional constellation design to achieve shaping gain. The proposed model offers a significant gain up to 2 dB. European Conference on Optical Communication (ECOC) c 2020 MERL. This work may not be copied or reproduced in whole or in part for any commercial purpose. Permission to copy in whole or in part without payment of fee is granted for nonprofit educational and research purposes provided that all such whole or partial copies include the following: a notice that such copying is by permission of Mitsubishi Electric Research Laboratories, Inc.; an acknowledgment of the authors and individual contributions to the work; and all applicable portions of the copyright notice. Copying, reproduction, or republishing for any other purpose shall require a license with payment of fee to Mitsubishi Electric Research Laboratories, Inc. All rights reserved. Mitsubishi Electric Research Laboratories, Inc. 201 Broadway, Cambridge, Massachusetts 02139 End-to-End Deep Learning for Phase Noise-Robust Multi-Dimensional Geometric Shaping Veeru Talreja, Toshiaki Koike-Akino, Ye Wang, David S. Millar, Keisuke Kojima, Kieran Parsons Mitsubishi Electric Research Labs., 201 Broadway, Cambridge, MA 02139, USA., [email protected] Abstract We propose an end-to-end deep learning model for phase noise-robust optical communi- cations. -
Signal-To-Noise Ratio and Dynamic Range Definitions
Signal-to-noise ratio and dynamic range definitions The Signal-to-Noise Ratio (SNR) and Dynamic Range (DR) are two common parameters used to specify the electrical performance of a spectrometer. This technical note will describe how they are defined and how to measure and calculate them. Figure 1: Definitions of SNR and SR. The signal out of the spectrometer is a digital signal between 0 and 2N-1, where N is the number of bits in the Analogue-to-Digital (A/D) converter on the electronics. Typical numbers for N range from 10 to 16 leading to maximum signal level between 1,023 and 65,535 counts. The Noise is the stochastic variation of the signal around a mean value. In Figure 1 we have shown a spectrum with a single peak in wavelength and time. As indicated on the figure the peak signal level will fluctuate a small amount around the mean value due to the noise of the electronics. Noise is measured by the Root-Mean-Squared (RMS) value of the fluctuations over time. The SNR is defined as the average over time of the peak signal divided by the RMS noise of the peak signal over the same time. In order to get an accurate result for the SNR it is generally required to measure over 25 -50 time samples of the spectrum. It is very important that your input to the spectrometer is constant during SNR measurements. Otherwise, you will be measuring other things like drift of you lamp power or time dependent signal levels from your sample. -
Image Denoising by Autoencoder: Learning Core Representations
Image Denoising by AutoEncoder: Learning Core Representations Zhenyu Zhao College of Engineering and Computer Science, The Australian National University, Australia, [email protected] Abstract. In this paper, we implement an image denoising method which can be generally used in all kinds of noisy images. We achieve denoising process by adding Gaussian noise to raw images and then feed them into AutoEncoder to learn its core representations(raw images itself or high-level representations).We use pre- trained classifier to test the quality of the representations with the classification accuracy. Our result shows that in task-specific classification neuron networks, the performance of the network with noisy input images is far below the preprocessing images that using denoising AutoEncoder. In the meanwhile, our experiments also show that the preprocessed images can achieve compatible result with the noiseless input images. Keywords: Image Denoising, Image Representations, Neuron Networks, Deep Learning, AutoEncoder. 1 Introduction 1.1 Image Denoising Image is the object that stores and reflects visual perception. Images are also important information carriers today. Acquisition channel and artificial editing are the two main ways that corrupt observed images. The goal of image restoration techniques [1] is to restore the original image from a noisy observation of it. Image denoising is common image restoration problems that are useful by to many industrial and scientific applications. Image denoising prob- lems arise when an image is corrupted by additive white Gaussian noise which is common result of many acquisition channels. The white Gaussian noise can be harmful to many image applications. Hence, it is of great importance to remove Gaussian noise from images.