Printed Circuit Board (PCB) Technology for Electrochemical Sensors and Sensing Platforms
Total Page:16
File Type:pdf, Size:1020Kb
Load more
Recommended publications
-
A Low-Cost Printed Circuit Board Design Technique and Processes Using Ferric Chloride Solution
Nigerian Journal of Technology (NIJOTECH) Vol. 39, No. 4, October 2020, pp. 1223 – 1231 Copyright© Faculty of Engineering, University of Nigeria, Nsukka, Print ISSN: 0331-8443, Electronic ISSN: 2467-8821 www.nijotech.com http://dx.doi.org/10.4314/njt.v39i4.31 A LOW-COST PRINTED CIRCUIT BOARD DESIGN TECHNIQUE AND PROCESSES USING FERRIC CHLORIDE SOLUTION C. T. Obe1, S. E. Oti 2, C. U. Eya3,*, D. B. N. Nnadi4 and O. E. Nnadi 5 1, 2, 3, 4, DEPT. OF ELECTRICAL ENGINEERING, UNIVERSITY OF NIGERIA NSUKKA, ENUGU STATE, NIGERIA 5, ENUGU ELECTRICITY DISTRIBUTION CO. (EEDC), 62 OKPARA AVENUE ENUGU, ENUGU STATE, NIGERIA E-mail addresses: 1 [email protected] , 2 [email protected] , 3 [email protected], 4 [email protected] , 5 [email protected] ABSTRACT This paper presents a low-cost printed circuit board (PCB) design technique and processes using ferric chloride (푭풆푪풍ퟑ) solution on a metal plate for a design topology. The PCB design makes a laboratory prototype easier by reducing the work piece size, eliminating the ambiguous connecting wires and breadboards circuit errors. This is done by manual etching of the designed metal plate via immersion in ferric chloride solutions for a given time interval 0-15mins. With easy steps, it is described on how to make a conventional single-sided printed circuit board with low-cost, time savings and reduced energy from debugging. The simulation and results of the printed circuit is designed and verified in the Multisim software version 14.0 and LeCroy WJ35A oscilloscope respectively. -
The Software Engineering Prototype
Calhoun: The NPS Institutional Archive Theses and Dissertations Thesis Collection 1983 The software engineering prototype. Kirchner, Michael R. Monterey, California. Naval Postgraduate School http://hdl.handle.net/10945/19989 v':''r'r' 'iCj:.VV',V«',."'''j-i.'','I /" .iy NAVAL POSTGRADUATE SCHOOL Monterey, California THESIS THE SOFTWARE ENGINEERING PROTOTYPE by Michael R. Kirchner June 1983 Th€isis Advisor: Gordon C. Howe 11 Approved for public release; distribution unlimited T210117 t*A ^ Monterey, CA 93943 SECURITY CUASSIPICATION OP THIS PAGE (Wht\ Dmtm Enturmd) READ INSTRUCTIONS REPORT DOCUMENTATION PAGE BEFORE COMPLETING FORM I. REPOHT NUMBER 2. GOVT ACCESSION NO. 3. RECIPIENT'S CATALOG NUMBER 4. TITLE (and Subtltlt) 5. TYPE OF REPORT & PE-RIOD COVERED The Software Engineering Prototype Master's Thesis 6. PERFORMING ORG. REPORT NUMBER 7. AUTHORr«> a. CONTRACT OR GRANT NUMBERr*; Michael R. Kirchner • • PeRFORMINOOROANIZATION NAME AND ADDRESS 10. PROGRAM ELEMENT. PROJECT, TASK AREA & WORK Naval Postgraduate School UNIT NUMBERS Monterey, California 93940 II. CONTROLLING Or^lCE NAME AND ADDRESS 12. REPORT DATE Naval Postgraduate School June, 1983 Monterey, California 13. NUMBER OF PAGES 100 U. MONITORING AGENCY NAME ft AODRESSCi/ d<//*ran( Irom ConUoltlng Oltlem) 15. SECURITY CLASS, (of thia roport) UNCLASSIFIED 15«. DECLASSIFICATION/ DOWNGRADING SCHEDULE te. DISTRIBUTION STATEMENT (ol Ihit Report) Approved for public release; distribution unlimited 17. DISTRIBUTION STATEMENT (of lh» mtattmct anffd /n Block 30, It dlUartH /ram Rmport) le. SURRLEMENTARY NOTES 19. KEY WORDS fConlinu* on fvtf aid* It n»e»aaarr and Idantlty br block numbar) software engineering, software prototype, software design, design theories, software engineering environments, case studies, software development, information systems development, system development life cycle 20. -
Development of Printed Circuit Board Technology Embedding Active and Passive Devices for E-Function Module
Development of Printed Circuit Board Technology Embedding Active and Passive Devices for e-Function Module Noboru Fujimaki Kiyoshi Koike Kazuhiro Takami Sigeyuki Ogata Hiroshi Iinaga Background shortening of signal wirings between circuits, reduction of damping resistors and elimination of characteristic Higher functionality of today’s portable devices impedance controls. Embedded component module demands smaller, lighter and thinner electronic boards have been adopted for higher functionality of components. Looking at the evolution of package video cameras and miniaturizing wireless communication miniaturization from the flat structure (System in Package: devices. It is expected the use will spread to a wider SiP) -> silicon chip stack structure (Chip on Chip: CoC) -> range of areas including automotive, consumer products, package stack structure (Package on Package: PoP) -> Si industrial equipment and infrastructure equipment. To through chip contact structure, the technology has gone meet these needs, a technology to package and embed from two-dimensional to three-dimensional packaging the various components and LSI will be required. This achieving high density packages. The trends in printed article discusses the method of embedding components, circuit boards and their packaging are shown in Figure 1. soldering technology, production method, reliability and Among the printed circuit boards, the three-dimensional case examples of the embedded component module integrated printed circuit board (hereafter referred to as board. “embedded component module board”) is attracting great attention. Integrating components into embedded component module boards Component embedding enables passive components (1) Embedding active components to be positioned directly beneath the LSI mounted There are two methods of embedding active on the surface providing electrical benefits such as components. -
Utilising Commercially Fabricated Printed Circuit Boards As an Electrochemical Biosensing Platform
micromachines Article Utilising Commercially Fabricated Printed Circuit Boards as an Electrochemical Biosensing Platform Uroš Zupanˇciˇc,Joshua Rainbow , Pedro Estrela and Despina Moschou * Centre for Biosensors, Bioelectronics and Biodevices (C3Bio), Department of Electronic & Electrical Engineering, University of Bath, Claverton Down, Bath BA2 7AY, UK; [email protected] (U.Z.); [email protected] (J.R.); [email protected] (P.E.) * Correspondence: [email protected]; Tel.: +44-(0)-1225-383245 Abstract: Printed circuit boards (PCBs) offer a promising platform for the development of electronics- assisted biomedical diagnostic sensors and microsystems. The long-standing industrial basis offers distinctive advantages for cost-effective, reproducible, and easily integrated sample-in-answer-out diagnostic microsystems. Nonetheless, the commercial techniques used in the fabrication of PCBs produce various contaminants potentially degrading severely their stability and repeatability in electrochemical sensing applications. Herein, we analyse for the first time such critical technological considerations, allowing the exploitation of commercial PCB platforms as reliable electrochemical sensing platforms. The presented electrochemical and physical characterisation data reveal clear evidence of both organic and inorganic sensing electrode surface contaminants, which can be removed using various pre-cleaning techniques. We demonstrate that, following such pre-treatment rules, PCB-based electrodes can be reliably fabricated for sensitive electrochemical -
Best Practices for Board Layout of Motor Drivers
Application Report SLVA959A–November 2018–Revised January 2019 Best Practices for Board Layout of Motor Drivers .................................................................................................................. Motor Drive Business Unit ABSTRACT PCB design of motor drive systems is not trivial and requires special considerations and techniques to achieve the best performance. Power efficiency, high-speed switching frequency, low-noise jitter, and compact board design are few primary factors that designers must consider when laying out a motor drive system. Texas Instruments' DRV devices are ideal for such type of systems because they are highly integrated and well-equipped with protection circuitry. The goal of this application report is to highlight the primary factors of a motor drive layout when using a DRV device and provide a best practice guideline for a high performance solution that reduces thermal stress, optimizes efficiency, and minimizes noise in a motor drive application. Contents 1 Grounding Optimization ..................................................................................................... 3 2 Thermal Overview ........................................................................................................... 7 3 Vias........................................................................................................................... 11 4 General Routing Techniques ............................................................................................. 14 5 Bulk and Bypass -
MAT 253 Operating Manual - Rev
MAT 253 OPERATING MANUAL Issue 04/2002 Ident. No. 114 9090 Thermo Finnigan MAT GmbH Postfach 1401 62 28088 Bremen Germany Reparatur-Begleitkarte*) Repair-Covering Letter Absender: Geräte-Type: Despachter: Instrument Type: __________________________________ _________________________________ __________________________________ Service-Nr.: Service No Sie erhalten zur Reparatur unter unserer Bestell-Nr.: You receive for repair under our order no.: Festgestellte Mängel oder deren Auswirkung: Established defect or its effect: Bitte detaillierte Angaben machen / Please specify in detail Ein Austauschteil haben wir erhalten unter Kommissions-Nr.: An exchange part already received with commission no.: Ja/Yes Nein/No Die Anlage ist außer Funktion The system is out of function Ja/Yes Nein/No Durch die nachfolgende Unterschrift By signing this document I am/ we are certifying bestätige(n) ich /wir, daß die o.g. Teile frei von that the a. m. parts are free from hazardous gesundheitsschädlichen Stoffen sind, bzw. vor materials. In case the parts have been used for ihrer Einsendung an Thermo Finnigan MAT the analysis of hazardous substances I/we dekontaminiert wurden, falls die Teile mit attest that the parts have been decontaminated giftigen Stoffen in Verbindung gekommen sind. before sending them to Thermo Finnigan MAT. __________________________________ _________________________________ Datum / date Unterschrift / signature *) Bitte vollständig ausfüllen / Please fill in completely MAT 253 O P E R A T I N G M A N U A L TABLE OF CONTENTS 1 GETTING -
Software Prototyping Rapid Software Development to Validate Requirements
FSE Foundations of software engineering Software Prototyping Rapid software development to validate requirements G51FSE Monday, 20 February 12 Objectives To describe the use of prototypes in different types of development project To discuss evolutionary and throw-away prototyping To introduce three rapid prototyping techniques - high-level language development, database programming and component reuse To explain the need for user interface prototyping FSE Lecture 10 - Prototyping 2 Monday, 20 February 12 System prototyping Prototyping is the rapid development of a system In the past, the developed system was normally thought of as inferior in some way to the required system so further development was required Now, the boundary between prototyping and normal system development is blurred Many systems are developed using an evolutionary approach FSE Lecture 10 - Prototyping 3 Monday, 20 February 12 Why bother? The principal use is to help customers and developers understand the requirements for the system Requirements elicitation: users can experiment with a prototype to see how the system supports their work Requirements validation: The prototype can reveal errors and omissions in the requirements Prototyping can be considered as a risk reduction activity which reduces requirements risks FSE Lecture 10 - Prototyping 4 Monday, 20 February 12 Prototyping bene!ts Misunderstandings between software users and developers are exposed Missing services may be detected and confusing services may be identi!ed A working system is available early in -
Legal Metrology
CanCan therethere bebe aa metrologymetrology forfor psychometricians?psychometricians? LucaLuca MariMari Università Cattaneo – LIUC, Italy BEAR Seminar, University of California, Berkeley Tuesday, January 31, 2017 AbstractAbstract Metrology -- the “science of measurement and its application” according to the International Vocabulary of Metrology (VIM) -- is a body of knowledge traditionally bound to the measurement of physical quantities, sometimes with the further specification that only high quality (in some sense to be agreed) measurement-related activities constitute actual metrology, as those performed in the US by the NIST. Given the social reputation of measurement, it is not amazing that there is a tension to continue the historical process of expanding such a still strict scope, where in particular under scrutiny is the necessity that the object of measurement is a physical quantity. Arguing about metrology is then a good opportunity to discuss of the very nature of measurement and its limits, between science, technology, mathematics, and society. MyMy profileprofile Luca Mari (MS in physics, University of Milano, Italy, 1987; Ph.D. in measurement science, Polytechnic of Torino, Italy, 1994) since 2006 has been a full professor of measurement science with Università Cattaneo - LIUC, Castellanza, Italy, where he teaches courses on measurement science, statistical data analysis, and system theory. He is currently the chairman of the TC1 (Terminology) and the secretary of the TC25 (Quantities and units) of the International Electrotechnical Commission (IEC), and an IEC expert in the WG2 (VIM) of the Joint Committee for Guides in Metrology (JCGM). He has been the chairman of the TC7 (Measurement Science) of the International Measurement Confederation (IMEKO). -
Series Catalog
Conductive Polymer Aluminum Electrolytic Capacitors Surface Mount Type CY,SY series [Guaranteed at 85 ℃] Features ● Endurance 85 ℃ 2000 h ● Product height (3.0 mm max.) ● High ripple current (5100 mA rms to 6300 mA rms max.) ● RoHS compliance, Halogen free Specifications Series CY / SY Category temp. range –55 ℃ to +85 ℃ Rated voltage range 4.0 V, 6.3V Nominal cap. range 330 μF to 470 μF Capacitance tolerance ±20 % (120 Hz / +20 ℃) DC leakage current I ≦ 0.1 CV (μA) 2 minutes Dissipation factor (tan δ) ≦ 0.06 (120 Hz / + 20 ℃) Surge voltage (V) Rated voltage × 1.25 (15 ℃ to 35 ℃) +85 ℃ 2000 h, rated voltage applied Capacitance change Within ±20 % of the initial value Endurance Dissipation factor (tan δ) ≦ 2 times of the initial limit DC leakage current ≦ 3 times of the initial limit +60 ℃, 90 % RH, 500 h, No-applied voltage Capacitance change of 4.0 V 6.3 V Damp heat initial measurd value +60 %, –20 % +50 %, –20 % (Steady state) Dissipation factor (tan δ) ≦ 2 times of the initial limit DC leakage current Within the initial limit Marking Dimensions (not to scale) Capacitance (μF) Polarity bar (Positive) ⊖ ⊕ H P P L W1 W2 Lot No. W2 R. voltage code R. voltage code Unit:V 単位:mm g 4.0 Series L±0.2 W1±0.2 W2±0.1 H±0.2 P±0.3 j 6.3 CY / SY 7.3 4.3 2.4 2.8 1.3 ✽ Externals of figure are the reference. Design and specifications are each subject to change without notice. Ask factory for the current technical specifications before purchase and/or use. -
Recalibration of the U.S. National Prototype Kilogram
Journal of Research of the National Bureau of Standards Volume 90, Number 4, July-August 1985 Recalibration of the U .S. National Prototype Kilogram R. S. Davis National Bureau of Standards, Gaithersburg, MD 20899 Accepted: June 14, 1985 The U.S. national prototype kilogram, K20, and its check standard, K4, were recalibrated at the Bureau International des Poids et Mesures (BIPM). Both these kilograms are made of platinum-iridium alloy. Two additional kilograms, made of different alloys of stainless steel, were also included in the calibrations. The mass of K20 in 1889 was certified as being 1 kg-O.039 mg. Prior to the work reported below, K20 was most recently recalibrated at the BIPM in 1948 and certified as having a mass of I kg-O.OI9 mg. K4 had never been recalibrated. Its initial certification in 1889 stated its mass as I kg-O.075 mg. The work reported below establishes the new mass value of K20 as 1 kg-O.022 mg and that of K4 as I kg-O.106 mg. The new results are discussed in detail and an attempt is made to assess the long-term stability of the standards involved with a \iew toward assigning a realistic uncertainty to the measurements. Key words: International System of Units; kilogram unit; mass; national prototype kilograms; platinum iridium kilograms; stainless steel kilograms; standards of mass; Systeme International d'Unites. 1. Introduction gram artifacts ordered in 1878 from Johnson, Matthey and Company of London. Four years later, 40 more The International Prototype Kilogram (lPK), made replicas of the IPK were ordered; these eventually be of an alloy of 90% platinum and 10% iridium, is kept at coming the first national prototypes. -
MOSFET Operation Lecture Outline
97.398*, Physical Electronics, Lecture 21 MOSFET Operation Lecture Outline • Last lecture examined the MOSFET structure and required processing steps • Now move on to basic MOSFET operation, some of which may be familiar • First consider drift, the movement of carriers due to an electric field – this is the basic conduction mechanism in the MOSFET • Then review basic regions of operation and charge mechanisms in MOSFET operation 97.398*, Physical Electronics: David J. Walkey Page 2 MOSFET Operation (21) Drift • The movement of charged particles under the influence of an electric field is termed drift • The current density due to conduction by drift can be written in terms of the electron and hole velocities vn and vp (cm/sec) as =+ J qnvnp qpv • This relationship is general in that it merely accounts for particles passing a certain point with a given velocity 97.398*, Physical Electronics: David J. Walkey Page 3 MOSFET Operation (21) Mobility and Velocity Saturation • At low values of electric field E, the carrier velocity is proportional to E -the proportionality constant is the mobility µ • At low fields, the current density can therefore be written Jqn= µ qpµ !nE+!p E v n v p • At high E, scattering limits the velocity to a maximum value and the relationship above no longer holds - this is termed velocity saturation 97.398*, Physical Electronics: David J. Walkey Page 4 MOSFET Operation (21) Factors Influencing Mobility • The value of mobility (velocity per unit electric field) is influenced by several factors – The mechanisms of conduction through the valence and conduction bands are different, and so the mobilities associated with electrons and holes are different. -
Session 2 ENVIRONMENTALLY SOUND MANAGEMENT of USED and SCRAP PERSONAL COMPUTERS (Pcs)
Session 2 ENVIRONMENTALLY SOUND MANAGEMENT OF USED AND SCRAP PERSONAL COMPUTERS (PCs) Robert Tonetti US EPA, Office of Solid Waste Second OECD Workshop on Environmentally Sound Management of Wastes Destined for Recovery Operations 28-29 September 2000 Vienna, Austria TABLE OF CONTENTS INTRODUCTION...........................................................................................................................................4 DEFINITION AND CHARACTERIZATION OF “USED AND SCRAP PCS” ...........................................5 PRINCIPAL ENVIRONMENTAL CONCERNS...........................................................................................7 Substances of Concern.................................................................................................................................7 Exposure to Substances of Concern.............................................................................................................8 OVERVIEW OF REUSE/RECYCLING PRACTICES..................................................................................9 Overview of Reuse.......................................................................................................................................9 Environmental Considerations of Reuse......................................................................................................9 Overview of Raw Material Recovery ........................................................................................................10 GUIDELINES FOR DOMESTIC PROGRAMS ..........................................................................................12