Comparative Mass Spectrometric Analyses of Photofrin Oligomers By
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Main Types of Lasers Used for Manufacturing- Key Properties and Key Applications
Main Types of Lasers Used for Manufacturing- Key Properties and Key Applications Tom Kugler Fiber Systems Mgr. Laser Mechanisms, Inc. www.lasermech.com LME 2011 Topics • Laser Output Wavelengths • Laser Average Power • Laser Output Waveforms (Pulsing) • Laser Peak Power • Laser Beam Quality (Focusability) • Key Properties • Key Applications • Beam Delivery Styles 2 Tom Kugler- Laser Mechanisms Compared to standard light sources… • Laser Light is Collimated- the light rays are parallel to and diverge very slowly- they stay concentrated over long distances- that is a “laser beam” • Laser Light has high Power Density- parallel laser light has a power density in watts/cm2 that is over 1000 times that of ordinary incandescent light • Laser Light is Monochromatic- one color (wavelength) so optics are simplified and perform better • Laser light is highly Focusable- low divergence, small diameter beams, and monochromatic light mean the laser can be focused to a small focal point producing power densities at focus 1,000,000,000 times more than ordinary light. 3 Tom Kugler- Laser Mechanisms Laser Light • 100W of laser light focused to a diameter of 100um produces a power density of 1,270,000 Watts per square centimeter! 4 Tom Kugler- Laser Mechanisms Examples of Laser Types • Gas Lasers: Electrical Discharge in a Gas Mixture Excites Laser Action: – Carbon Dioxide (CO2) – Excimer (XeCl, KrF, ArF, XeF) • Light Pumped Solid State Lasers: Light from Lamps or Diodes Excites Ions in a Host Crystal or Glass: – Nd:YAG (Neodymium doped Yttrium Aluminum -
Modern Mass Spectrometry
Modern Mass Spectrometry MacMillan Group Meeting 2005 Sandra Lee Key References: E. Uggerud, S. Petrie, D. K. Bohme, F. Turecek, D. Schröder, H. Schwarz, D. Plattner, T. Wyttenbach, M. T. Bowers, P. B. Armentrout, S. A. Truger, T. Junker, G. Suizdak, Mark Brönstrup. Topics in Current Chemistry: Modern Mass Spectroscopy, pp. 1-302, 225. Springer-Verlag, Berlin, 2003. Current Topics in Organic Chemistry 2003, 15, 1503-1624 1 The Basics of Mass Spectroscopy ! Purpose Mass spectrometers use the difference in mass-to-charge ratio (m/z) of ionized atoms or molecules to separate them. Therefore, mass spectroscopy allows quantitation of atoms or molecules and provides structural information by the identification of distinctive fragmentation patterns. The general operation of a mass spectrometer is: "1. " create gas-phase ions "2. " separate the ions in space or time based on their mass-to-charge ratio "3. " measure the quantity of ions of each mass-to-charge ratio Ionization sources ! Instrumentation Chemical Ionisation (CI) Atmospheric Pressure CI!(APCI) Electron Impact!(EI) Electrospray Ionization!(ESI) SORTING DETECTION IONIZATION OF IONS OF IONS Fast Atom Bombardment (FAB) Field Desorption/Field Ionisation (FD/FI) Matrix Assisted Laser Desorption gaseous mass ion Ionisation!(MALDI) ion source analyzer transducer Thermospray Ionisation (TI) Analyzers quadrupoles vacuum signal Time-of-Flight (TOF) pump processor magnetic sectors 10-5– 10-8 torr Fourier transform and quadrupole ion traps inlet Detectors mass electron multiplier spectrum Faraday cup Ionization Sources: Classical Methods ! Electron Impact Ionization A beam of electrons passes through a gas-phase sample and collides with neutral analyte molcules (M) to produce a positively charged ion or a fragment ion. -
Methods of Ion Generation
Chem. Rev. 2001, 101, 361−375 361 Methods of Ion Generation Marvin L. Vestal PE Biosystems, Framingham, Massachusetts 01701 Received May 24, 2000 Contents I. Introduction 361 II. Atomic Ions 362 A. Thermal Ionization 362 B. Spark Source 362 C. Plasma Sources 362 D. Glow Discharge 362 E. Inductively Coupled Plasma (ICP) 363 III. Molecular Ions from Volatile Samples. 364 A. Electron Ionization (EI) 364 B. Chemical Ionization (CI) 365 C. Photoionization (PI) 367 D. Field Ionization (FI) 367 IV. Molecular Ions from Nonvolatile Samples 367 Marvin L. Vestal received his B.S. and M.S. degrees, 1958 and 1960, A. Spray Techniques 367 respectively, in Engineering Sciences from Purdue Univesity, Layfayette, IN. In 1975 he received his Ph.D. degree in Chemical Physics from the B. Electrospray 367 University of Utah, Salt Lake City. From 1958 to 1960 he was a Scientist C. Desorption from Surfaces 369 at Johnston Laboratories, Inc., in Layfayette, IN. From 1960 to 1967 he D. High-Energy Particle Impact 369 became Senior Scientist at Johnston Laboratories, Inc., in Baltimore, MD. E. Low-Energy Particle Impact 370 From 1960 to 1962 he was a Graduate Student in the Department of Physics at John Hopkins University. From 1967 to 1970 he was Vice F. Low-Energy Impact with Liquid Surfaces 371 President at Scientific Research Instruments, Corp. in Baltimore, MD. From G. Flow FAB 371 1970 to 1975 he was a Graduate Student and Research Instructor at the H. Laser Ionization−MALDI 371 University of Utah, Salt Lake City. From 1976 to 1981 he became I. -
1 Introduction of Mass Spectrometry and Ambient Ionization Techniques
1 1 Introduction of Mass Spectrometry and Ambient Ionization Techniques Yiyang Dong, Jiahui Liu, and Tianyang Guo College of Life Science & Technology, Beijing University of Chemical Technology, No. 15 Beisanhuan East Road, Chaoyang District, Beijing, 100029, China 1.1 Evolution of Analytical Chemistry and Its Challenges in the Twenty-First Century The Chemical Revolution began in the eighteenth century, with the work of French chemist Antoine Lavoisier (1743–1794) representing a fundamental watershed that separated the “modern chemistry” era from the “protochemistry” era (Figure 1.1). However, analytical chemistry, a subdiscipline of chemistry, is an ancient science and its metrological tools, basic applications, and analytical processes can be dated back to early recorded history [1]. In chronological spans covering ancient times, the middle ages, the era of the nineteenth century, and the three chemical revolutionary periods, analytical chemistry has successfully evolved from the verge of the nineteenth century to modern and contemporary times, characterized by its versatile traits and unprecedented challenges in the twenty-first century. Historically, analytical chemistry can be termed as the mother of chemistry, as the nature and the composition of materials are always needed to be iden- tified first for specific utilizations subsequently; therefore, the development of analytical chemistry has always been ahead of general chemistry [2]. During pre-Hellenistic times when chemistry did not exist as a science, various ana- lytical processes, for example, qualitative touchstone method and quantitative fire-assay or cupellation scheme have been in existence as routine quality control measures for the purpose of noble goods authentication and anti-counterfeiting practices. Because of the unavailability of archeological clues for origin tracing, the chemical balance and the weights, as stated in the earliest documents ever found, was supposed to have been used only by the Gods [3]. -
Detection of Lead in Soil with Excimer Laser Fragmentation Fluorescence Spectroscopy (ELFFS)
Detection of Lead in Soil with Excimer Laser Fragmentation Fluorescence Spectroscopy (ELFFS) J. H. Choi1, C. J. Damm2, N. J. O’Donovan1, R. F. Sawyer1, C. P. Koshland2, and D. Lucas3† 1Mechanical Engineering Department, University of California, Berkeley, CA 94720 2Science & Technology Department, Sierra Nevada College, NV 89451 3School of Public Health, University of California, Berkeley, CA 94720 4Environmental Energy Technologies Division, Lawrence Berkeley National Laboratory Berkeley, CA 94720 Date: 2/2/04 † Corresponding Author [email protected] PH: (510) 486-7002 FAX: (510) 486-7303 Index Headings: Photofragmentation; Fluorescence; Photochemistry; Plasma; Lead. 1 ABSTRACT Excimer laser fragmentation fluorescence spectroscopy (ELFFS) is used to monitor lead in soil sample and investigate laser-solid interactions. Pure lead nitrate salt and soil doped with lead nitrate are photolyzed with 193 nm light from an ArF excimer at fluences from 0.4 to 4 J/cm2. Lead emission is observed at 357.2, 364.0, 368.3, 373.9 and 405.8 nm. Time-resolved data show the decay time of the lead emission at 405.8 nm grows with increasing fluence, and a plasma is formed above fluences of 2 J/cm2, where a strong continuum emission interferes with the analyte signal. Fluences below this threshold allow us to achieve a detection limit of approximately 200 ppm in soil. INTRODUCTION Lead (Pb) poisoning from environmental and occupational exposure remains one of the most common and preventable diseases. There are numerous serious and detrimental health effects from inhalation or ingestion of lead, including poisoning or even death in extreme circumstances1. Various in situ, real-time methods to measure heavy metals in soil have been developed as a replacement for conventional wet-chemistry techniques that require laborious and time consuming processes, such as preparation, dissolution, chelation, and ion exchange2,3. -
D'évaluation Des Technologies De La Santé Du Québec
(CETS 2000-2 RE) Report – June 2000 A STATE-OF-KNOWLEDGE UPDATE THE EXCIMER LASER IN OPHTHALMOLOGY: Conseil d’Évaluation des Technologies de la Santé du Québec Report submitted to the Minister of Research, Science And Technology of Québec Conseil d’évaluation des technologies de la santé du Québec Information concerning this report or any other report published by the Conseil d'évaluation des tech- nologies de la santé can be obtained by contacting AÉTMIS. On June 28, 2000 was created the Agence d’évaluation des technologies et des modes d’intervention en santé (AÉTMIS) which took over from the Conseil d’évaluation des technologies de la santé. Agence d’évaluation des technologies et des modes d’intervention en santé 2021, avenue Union, Bureau 1040 Montréal (Québec) H3A 2S9 Telephone: (514) 873-2563 Fax: (514) 873-1369 E-mail: [email protected] Web site address: http://www.aetmis.gouv.qc.ca Legal deposit - Bibliothèque nationale du Québec, 2001 - National Library of Canada ISBN 2-550-37028-7 How to cite this report : Conseil d’évaluation des technologies de la santé du Québec. The excimer laser in ophtalmology: A state- of-knowledge update (CÉTS 2000-2 RE). Montréal: CÉTS, 2000, xi- 103 p Conseil d’évaluation des technologies de la santé du Québec THE EXCIMER LASER IN OPHTHALMOLOGY: A MANDATE STATE-OF-KNOWLEDGE UPDATE To promote and support health technology assessment, In May 1997, the Conseil d’évaluation des technologies de disseminate the results of the assessments and la santé du Québec (CETS) published a report dealing spe- encourage their use in decision making by all cifically with excimer laser photorefractive keratectomy stakeholders involved in the diffusion of these (PRK). -
Mass Spectrometry Workshop Ionization Methods Three Major Info
7/9/2018 Mass Spectrometry Workshop Ionization Methods Abraham Badu Assistant Professor Chemistry and Biochemistry July 9, 2018 OSU Three major info from MS • Molecular weight • Structural information via fragmentation • Isotope ratios 1 7/9/2018 Advances in Mass Spectrometry vacuum vacuum Ion Mass Ion Mass Detector Detector Source Analyzer Source Analyzer ‐ Electron Ionization (EI) ‐ Atmospheric Pressure Chemical Ionization (APCI) ‐ Chemical Ionization (CI) ‐ Electrospray Ionization (ESI) → For volale compounds → For non‐volatile liquid samples (≈1% of all compound) ‐ MALDI Ambient vacuum → For thermally Mass Detector unstable Ionization Analyte Sampling from their Native Analyzer solid samples Environment without Sample Methods Pre-treatment Some Sample Types Human Tissue Banknotes Whole Plant Drug Tablet Cooks et. al. Science 2004, 306, 471-473; Science 2006, 311, 1566 Badu-Tawiah et. al. Annu. Rev. Phys. Chem. 2013, 64, 481–505 Ionization Methods Neutral species → Charged species • Removal/addition of electron(s) – M + e- → (M+.)* + 2e- • electron ionization • Removal/addition of proton(s) – M + (Matrix)-H → MH+ + (Matrix)- • Chemical ionization (CI) • Atmospheric pressure CI (APCI) • Fast atom bombardment (FAB) • Electrospray/nanospray ionization (nESI) • Matrix assisted laser desorption/ionization (MALDI) • Desorption electrospray ionization (DESI) • Direct analysis in real time (DART) • Native spray 2 7/9/2018 Ion Sources: volatiles; non-volatile liquids; non-volatile solids EI ESI FAB MALDI Fast atom bombardment Electron Impact -
Patient Guide to Excimer Laser Refractive Surgery
A Patients’ Guide to Excimer Laser Refractive Surgery July 2011 Contents 1. Introduction 2. Understanding your refractive error 3. Changing the eye’s focus by surgery (refractive surgery) 4. Indications and contraindications to refractive surgery 5. Assessment for excimer laser refractive surgery 6. The day of surgery 7. The period after surgery 8. Results 9. Complications 10. Standards for laser refractive surgery 11. Glossary Royal College of Ophthalmologists 2 1. Introduction Focusing (refractive) errors such as short-sightedness (myopia), astigmatism, and long-sightedness (hyperopia) are usually corrected by wearing spectacles or contact lenses. Over the years a number of surgical techniques have been used to treat refractive errors and reduce the need for glasses (Table 1.1). The most common treatment uses an excimer laser. The following information explains the different excimer techniques, their advantages and disadvantages and the various terms used. Its aim is to help you come to an informed decision about any prospective treatment. If you have any further questions, your ophthalmic surgeon who will be performing the treatment should answer them. There are other surgical techniques as well as using the excimer laser. These other techniques are summarised in Table 1. Some are much more commonly used than others. (Please see section 2 for an explanation of the focusing problems of the eye). Site of Treatment Technique Procedure Indications Corneal techniques Excimer laser PRK – Photo- Low, mod & high: Refractive myopia Keratectomy -
Worldwide Market for Lasers Trends and Five-Year Forecast (2017 – 2023)
The Worldwide Market for Lasers Trends and Five-Year Forecast (2017 – 2023) Table of Contents Chapter 1: Executive Summary & Totals ............................................................................................. 13 1.1 The Overall Laser Market ....................................................................................................... 13 1.2 Good News From 2017 .......................................................................................................... 13 1.3 Things Troubling in 2017 ....................................................................................................... 14 1.4 Historic Laser Revenue .......................................................................................................... 14 1.4.1 The Laser Market by Segment .......................................................................................... 15 1.5 Laser Market by Laser Type ................................................................................................... 20 1.5.1 Fiber Lasers .................................................................................................................... 21 1.5.2 Low-Power Diode Lasers .................................................................................................. 23 1.5.3 High-Power Laser Diodes ................................................................................................. 24 1.5.4 Solid-State Lasers ........................................................................................................... -
Laser Disposal Guide
Laser Disposal Guide Introduction Lasers have a finite lifetime, which is based on use, experimental needs or technological advances. The goal of this guide is to provide guidance for the laser user and in particular, the LBNL Surplus/Excess staff and EHS waste disposal staff when dealing with lasers at the end of their life cycle. For the purpose of this guide, we will break lasers into several different types: gas, solid-state rod, liquid, and semiconductor. Laser systems also come in a variety of sizes, which does not relate to their optical laser output. In addition, when a laser is disposed of, a power supply often travels with it. Standard electrical safety protocols adequately address the power supply and will not be addressed in this document. All lasers that utilize electricity as their main energy source and were manufactured prior to July 1, 2006, will most likely have Lead in their printed circuit boards. Therefore these boards need to be disposed of as electronic waste (e-waste). There are United States regulations such as export control and European Reduction of Hazardous Materials regulations, known as RoHS rules, that affect how and the manner surplus lasers are to be dealt with. Here is in California there is the CA Dept. of Toxic Substances. Document prepared by Ken Barat & Justine Woo April 2012 Page | 1 Table of Contents Action Points/Questions to Ask Yourself .....................................................................................................3 User Responsibilities ....................................................................................................................................3 -
Ionization Techniques – Part IV
Ionization Techniques – Part IV CU- Boulder CHEM 5181 Mass Spectrometry & Chromatography Presented by Prof. Jose L. Jimenez MS Interpretation Lectures High Vacuum Sample Ion Mass Detector Recorder Inlet Source Analyzer Adapted from slides from Dr. Joel Kimmel, Fall 2007 1 Fast Atom Bombardment (FAB) and Secondary Ion Mass Spectrometry (SIMS) From Watson Desorption techniques. Analyze the ions emitted when a surface is irradiated with an energetic beam of neutrals (FAB) or ions (SIMS). 2 Producing Primary Beam: SIMS vs. FAB From de Hoffmann SIMS primary ions are Primary Beam of neutrals produced, e.g., as Cs atoms produced by ionizing and vaporize through a porous accelerating compound into tungsten plug. charge exchange collision with neutral. e.g.: From SIMS Tutorial: Ar+ + Ar → Ar+ + Ar http://www.eaglabs.com/en-US/references/tutorial/simstheo/ rapid slow slow rapid 3 Static SIMS • Low current (10-10 A cm2) of keV primary ions (Ar+, Cs+ ..) impact the solid analyte surface • Low probability of area being struck by multiple ions; less than 1/10 of atomic monolayer consumed • Primary ion beam focused to less than 1 um enables high resolution mapping – Often pulsed beam + TOFMS • Sensitive technique for the ID of organic molecules • Spectra show high abundance of protonated or cationized molecular ions. • Yields depend on substrate and primary beam; as high as 0.1 ions per incident ion. Elemental yields vary over many orders of magnitude. 4 FAB and liquid-SIMS • Sample is dissolved in non-volatile liquid matrix and bombarded with beam of neutrals (FAB) or ions • Shock wave ejects ions and molecules from solution. -
Optics for Excimer Laser Lithography
04_000479(0380)日東光器/C裏_エキシマ(リーフ) Optics for Excimer Laser Lithography Nitto Optical Co., Ltd. provides high-quality optical devices required for semiconductor manufacturing equipment such as excimer laser lithography, KrF and ArF, which become minute and precise with the progress of the semiconductor technology. Major Products and Measuring Instruments ZYGO 12" Interferometer WYKO NT1100 Fabry-Perot Etalon for Excimer Laser Etalon Flatness Etalon Roughness CaF2 Window Surface Flatness Surface Roughness CaF2 Prism Optics for Laser Interferometers Demands for highly accurate measurement technology are expanding these days. Our optical devices for laser interferometers are highly evaluated in the lithography field. Products: Corner Cube Prism (CCP)・Polarizing Beam Splitter (PBS) ・Quarter Wave Plate Quarter Wave Plate Light Source CCP CCP:Beam Deviation: < 2 arc seconds CCP:Transmitted Wavefront Distortion Reference Flat PBS (Fused Silica) P Polarization PBS (Fused Silica) 45゜rotated P&S Polarization S Polarization Detector PBS:Transmitted Wavefront Distortion PBS:Beam Deviation: < 2 arc seconds 1-14-18 Kudankita, Chiyoda-ku, Tokyo 102-0073, Japan TEL:+81-3-3511-8111 FAX:+81-3-3511-8110 E-MAIL:[email protected] URL:http://www.nitto-optical.co.jp/english/index.html 0606 -1- 04_000479(0380)日東光器/C表_バーミラー(リーフ) Bar Mirror for Semiconductor and LCD Steppers Nitto Optical provides Bar Mirrors which become large, high precision and diversified in materials with demand expansion for semiconductors and LCD market. Size : 100 mm~3500 mm Flattness : μm ~λ Measuring Instrument : Mirror Flatness by ZYGO 32" (φ800) or ZYGO 12" (φ300) interferometers. (please contact us for details about size, shape and materials) LCD Stepper Application Size: 100~3500 mm.