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2010 IEEE Radiation Effects Data Workshop 2010 IEEE Radiation Effects Data Workshop Proceedings Denver, Colorado 19-23 July 2010 IEEE Catalog Number: CFP10422-PRT ISBN: 978-1-4244-8402-7 2010 IEEE Radiation Effects Data Workshop Copyright © 2010 by the Institute of Electrical and Electronic Engineers, Inc. All rights reserved. Copyright and Reprint Permissions Abstracting is permitted with credit to the source. Libraries are permitted to photocopy beyond the limit of U.S. copyright law for private use of patrons those articles in this volume that carry a code at the bottom of the first page, provided the per-copy fee indicated in the code is paid through Copyright Clearance Center, 222 Rosewood Drive, Danvers, MA 01923. For other copying, reprint or republication permission, write to IEEE Copyrights Manager, IEEE Service Center, 445 Hoes Lane, Piscataway, NJ 08854. All rights reserved. IEEE Catalog Number: CFP10422-ART ISBN 13: 978-1-4244-8404-1 Printed copies of this publication are available from: Curran Associates, Inc 57 Morehouse Lane Red Hook, NY 12571 USA Phone: (845) 758-0400 Fax: (845) 758-2633 E-mail: [email protected] Produced by IEEE eXpress Conference Publishing For information on producing a conference proceedings and receiving an estimate, contact [email protected] http://www.ieee.org/conferencepublishing The Radiation Effects Data Workshop (REDW) is a session of the Nuclear and Space Radiation Effect Conference (NSREC) Technical Program. The workshop is held as a poster session that is documented by this Workshop Record Publication, which serves as a permanent archive of the REDW. Posters were presented during the 2010 NSREC held at the Sheraton Denver Downtown Hotel, Denver, Colorado, on July 21. The purpose of the REDW is to publish high quality radiation effects data to the radiation effects community. The data includes but is not limited to radiation effects test facilities, standards, and environments, as well as radiation effects on microelectronic devices. The 2010 Workshop Record has twenty eight papers covering a broad range of topics including: total ionizing dose, displacement damage, and single particle effects on a large number of electronic devices, integrated circuits and detectors; test methodologies; environments and facilities. In addition, like the rest of the conference’s content, there is substantial international participation by contributors from Canada, France, Germany, as well as the United States. The high quality of this year’s Workshop Record is due to the contribution of the REDW authors. We thank them for their efforts. We also thank the session reviewers for their time and the valuable feedback they provided (reviewers are listed on the following page). All contributed to a very successful 2010 REDW. Although the Workshop Record provides a cumulative index that can be used to locate papers based on author and title, it is difficult to search for response data on a particular part number, type, or radiation effect. To simplify this activity, searchable tables covering the Workshop Records 1992-2009 are available on the NSREC website at http://www.nsrec.com/redw/ Each year the NSREC Awards Committee selects a paper as the Outstanding REDW Paper. The selection is based on relevance, technical content, innovation and overall quality. This year the Awards Committee selected “Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA,” by Martha V. O'Bryan, Dakai Chen, Hak S. Kim, Anthony M. Phan, and Melanie Berg of MEI Technologies; Kenneth A. LaBel, Jonathan A. Pellish, Jean- Marie Lauenstein, Cheryl Marshall, Ray L. Ladbury, Martin A. Carts, Anthony B. Sanders, and Michael A. Xapsos of NASA/GSFC; Timothy R. Oldham of Perot Systems Government Services, Inc; Stephen P. Buchner of Global Defense Technology and Systems; Paul Marshall; Farokh Irom of JPL; Larry G. Pearce, Eric T. Thomson, Theju M. Bernard, Harold W. Satterfield, Alan P. Williams, and Nick W. van Vonno, of Intersil Corporation; and Sam Burns, Rafi S. Albarian of Linear Technology. The authors will receive their awards at the 2011 NSREC in Las Vegas, Nevada. Leif Scheick 2010 REDW Chair Jeffery Black 2010 NSREC Technical Chair REDW 2010 Reviewers Larry McGee Susan H Crain Peter Miraglia Hafer, Craig Nick van Vonno Jean Marie Lauenstein Dave Hiemstra Chuck Foster Mayrant Simons, Raymond L.Ladbury Allan Johnston Aurore Luu Christian Poivey Marta Bagatin Joe Benedetto 2010 REDW Table of Contents Guide to the 2009 IEEE Radiation Effects ................................................................................................................ 1 D. M Hiemstra, MDA Corporation Recent Results for PowerPC Processor and Bridge Chip Testing........................................................................... 5 S. M. Guertin, Farokh Irom, NASA/JPL Single Event Upset Characterization of the Virtex-5 Field Programmable Gate Array Using Proton Irradiation .................................................................................................................................................................. 13 D. M. Hiemstra, G. Battiston, P. Gill, MDA Corporation Sensitivity of 2 Gb DDR2 SDRAMs to Protons and Heavy Ions ........................................................................... 17 R. Koga, P. Yu, J. George, S. Bielat, The Aerospace Corporation 90-nm Digital Single Event Transient Pulsewidth Measurements ........................................................................ 23 R. K. Lawrence, J. F. Ross, N. E. Wood, BAE Systems SEE Results for a 4-Port SpaceWire Router ........................................................................................................... 28 C. Hafer, B. Baranski, J. Larsen, F. Sievert, A. Jordan, Aeroflex Colorado Springs Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA ............................ 32 M. V. O'Bryan, D. Chen , H. S. Kim, A. M. Phan, M. D. Berg, MEI Technologies Inc. ; K. A. LaBel, J. A. Pellish, J.-M. Lauenstein, C. J. Marshall, R. L. Ladbury, M. A. Carts, A. B. Sanders, M. A. Xapsos, NASA GSFC; T. R. Oldham, Perot Systems Government Services, Inc.; S. P. Buchner, Global Defense Technology and Systems, Inc.; P. W. Marshall, Consultant; F. Irom, NASA JPL; L. G. Pearce, E. T. Thomson, T. M. Bernard, H. W. Satterfield, A. P. Williams, N. W. van Vonno, Intersil Corporation; J. F. Salzman, Texas Instruments; S. Burns, R. S. Albarian, Linear Technology Compendium of Test Results of Recent Single Event Effect Tests Conducted by the Jet Propulsion Laboratory ................................................................................................................................. 44 S. S. McClure, G. R. Allen, F. Irom, L. Z. Scheick, P. C. Adell, T. F. Miyahira, Jet Propulsion Laboratory Cross Comparison Guide for Results of Neutron SEE Testing of Microelectronics Applicable to Avionics .... 50 E. Normand, Boeing; L. Dominik, Honeywell Commercially Designed and Manufactured SDRAM SEE Data .......................................................................... 58 C. Hafer, M. Von Thun, M. Leslie, F. Sievert, A. Jordan, Aeroflex SEE Testing of National Semiconductor's LM98640QML System on a Chip for Focal Plane Arrays and Other Imaging Systems ...................................................................................................................................... 63 K. Kruckmeyer, R. Eddy, A. Szczapa, B. Brown, T. Santiago, National Semiconductor Single Event Latchup (SEL) and Total Ionizing Dose (TID) of a 1 Mbit Magnetoresistive Random Access Memory (MRAM) .......................................................................................................................... 71 J. Heidecker, G. Allen, D. Sheldon, Jet Propulsion Laboratory, California Institute of Technology TID and SEE Responses of Rad-Hardened A/D Converters ................................................................................. 75 G. Chaumont, A. Uguen, C. Prugne, STMicroelectronics; F. Malou, CNES Total Dose and Single Event Testing of a Hardened Point of Load Regulator .................................................... 80 N. W. van Vonno, L. G. Pearce, J. S. Gill, H. W. Satterfield, E. T. Thomson, T. E. Fobes, A. P. Williams, P. J. Chesley, Intersil Total Dose and Single Event Testing of a Hardened Single-Ended Current Mode PWM Controller ............... 88 N. W. van Vonno, L. G. Pearce, G. M. Wood, J. D. White, E. J. Thomson, T. M. Bernard, P. J. Chesley, R. Hood, Intersil Single Event and Low Dose-Rate TID Effects in the DS16F95 RS-485 Transceiver ........................................... 94 A. T. Kelly, P. R. Fleming, R. D. Brown, BAE Systems; F. Wong, Space Systems Loral Radiation Test of 8 Bit Microcontrollers ATmega128 & AT90CAN128 ............................................................ 100 A. Schüttauf, S. Rakers, C. Daniel, EADS ASTRIUM-ST ELDRS Characterization for a Very High Dose Mission ..................................................................................... 104 R. D. Harris, S. S. McClure, B. G. Rax, D. O. Thornbourn, K. B. Clark, T.-Y. Yan, Jet Propulsion Laboratory; A. J. Kenna, Northrop Grumman Space Technology The Effects of ELDRS at Ultra-Low Dose Rates .................................................................................................. 111 D. Chen, J. D. Forney, A. M. Phan, M. A. Carts, MEI/NASA-GSFC; R. L. Pease, RLP Research; S. R. Cox, K. LaBel , NASA-GSFC; K. Kruckmeyer, National Semiconductor; S. Burns, R. Albarian, Linear Technology; B. Holcombe,
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