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A Comprehensive Stochastic Design Methodology for Hold-Timing Resiliency in Voltage-Scalable Design
2118 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, VOL. 26, NO. 10, OCTOBER 2018 A Comprehensive Stochastic Design Methodology for Hold-Timing Resiliency in Voltage-Scalable Design Zhengyu Chen , Student Member, IEEE, Huanyu Wang, Student Member, IEEE, Geng Xie, Student Member, IEEE,andJieGu , Member, IEEE Abstract— In order to fulfill different demands between challenges due to the conflicting requirements between low ultralow energy consumption and high performance, integrated power consumption and high performance. To achieve low circuits are being designed to operate across a large range of power consumption, supply voltage V is typically reduced to supply voltages, in which resiliency to timing violation is the DD key requirement. Unfortunately, traditional timing analysis which near-threshold voltages, e.g., around 0.5 V. At such a voltage, focuses on setup timing tolerance for higher performance cannot stochastic variation associated with transistor threshold volt- model the hold violation efficiently across different voltages. ages becomes a major factor in determining logic timing which In this paper, we proposed a complete flow of computationally makes timing analysis extremely time consuming [1]. Conven- efficient methodology for guaranteeing hold margin, which is tional solution which introduces extra timing margin to avoid particularly important for low-power devices, e.g., Internet-of- Things devices. Leveraging both the conventional static timing timing violation at low-voltage region leads to performance analysis and a most probable point (MPP) theory, we develop a degradation at high-voltage region. In addition, the inefficiency new hold-timing closure methodology across voltages eliminating of conventional static timing analysis (STA) cannot meet the expensive Monte Carlo simulation. -
Efficient Checker Processor Design
Efficient Checker Processor Design Saugata Chatterjee, Chris Weaver, and Todd Austin Electrical Engineering and Computer Science Department University of Michigan {saugatac,chriswea,austin}@eecs.umich.edu Abstract system works to increase test space coverage by proving a design is correct, either through model equivalence or assertion. The approach is significantly more efficient The design and implementation of a modern micro- than simulation-based testing as a single proof can ver- processor creates many reliability challenges. Design- ify correctness over large portions of a design’s state ers must verify the correctness of large complex systems space. However, complex modern pipelines with impre- and construct implementations that work reliably in var- cise state management, out-of-order execution, and ied (and occasionally adverse) operating conditions. In aggressive speculation are too stateful or incomprehen- our previous work, we proposed a solution to these sible to permit complete formal verification. problems by adding a simple, easily verifiable checker To further complicate verification, new reliability processor at pipeline retirement. Performance analyses challenges are materializing in deep submicron fabrica- of our initial design were promising, overall slowdowns tion technologies (i.e. process technologies with mini- due to checker processor hazards were less than 3%. mum feature sizes below 0.25um). Finer feature sizes However, slowdowns for some outlier programs were are generally characterized by increased complexity, larger. more exposure to noise-related faults, and interference In this paper, we examine closely the operation of the from single event radiation (SER). It appears the current checker processor. We identify the specific reasons why advances in verification (e.g., formal verification, the initial design works well for some programs, but model-based test generation) are not keeping pace with slows others. -
Overcoming the Challenges in Very Deep Submicron for Area Reduction, Power Reduction and Faster Design Closure
Overcoming the Challenges in Very Deep Submicron for area reduction, power reduction and faster design closure A THESIS SUBMITTED IN PARTIAL FULFILLMENT OF THE REQUIREMENTS FOR THE DEGREE OF Master of Technology in VLSI Design and Embedded System By K. RAKESH Roll No: 20507010 Department of Electronics and Communication Engineering National Institute Of Technology Rourkela 2007 Overcoming the Challenges in Very Deep Submicron for area reduction, power reduction and faster design closure A THESIS SUBMITTED IN PARTIAL FULFILLMENT OF THE REQUIREMENTS FOR THE DEGREE OF Master of Technology in VLSI Design and Embedded System By K. RAKESH Roll No: 20507010 Under the Guidance of Prof. K. K. MAHAPATRA Department of Electronics and Communication Engineering National Institute Of Technology Rourkela 2007 National Institute of Technology Rourkela CERTIFICATE This is to certify that the thesis entitled, “Overcoming the Challenges in Very Deep Submicron for area reduction, power reduction and faster design closure” submitted by Mr. Koyyalamudi Rakesh (20507010) in partial fulfillment of the requirements for the award of Master of Technology Degree in Electronics & Communication Engineering with specialization in “VLSI Design & Embedded System” at the National Institute of Technology, Rourkela (Deemed University) is an authentic work carried out by him under my supervision and guidance. To the best of my knowledge, the matter embodied in the thesis has not been submitted to any other University / Institute for the award of any Degree or Diploma. Prof. K.K. Mahapatra Dept. of Electronics & Communication Engg. Date: National Institute of Technology Rourkela-769008 ACKNOWLEDGEMENTS This project is by far the most significant accomplishment in my life and it would be impossible without people who supported me and believed in me. -
Irun User Guide
irun User Guide Product Version 9.2 July 2010 © 1995-2010 Cadence Design Systems, Inc. All rights reserved. Portions © Free Software Foundation, Regents of the University of California, Sun Microsystems, Inc., Scriptics Corporation. Used by permission. Printed in the United States of America. Cadence Design Systems, Inc. (Cadence), 2655 Seely Ave., San Jose, CA 95134, USA. Product NC-SIM contains technology licensed from, and copyrighted by: Free Software Foundation, Inc., 59 Temple Place, Suite 330, Boston, MA 02111-1307 USA, and is © 1989, 1991. All rights reserved. Regents of the University of California, Sun Microsystems, Inc., Scriptics Corporation, and other parties and is © 1989-1994 Regents of the University of California, 1984, the Australian National University, 1990-1999 Scriptics Corporation, and other parties. All rights reserved. Open SystemC, Open SystemC Initiative, OSCI, SystemC, and SystemC Initiative are trademarks or registered trademarks of Open SystemC Initiative, Inc. in the United States and other countries and are used with permission. SystemC/HDL mixed-language simulation patent 7424703 was issued on 9/9/2008 Trademarks: Trademarks and service marks of Cadence Design Systems, Inc. contained in this document are attributed to Cadence with the appropriate symbol. For queries regarding Cadence’s trademarks, contact the corporate legal department at the address shown above or call 800.862.4522. All other trademarks are the property of their respective holders. Restricted Permission: This publication is protected by copyright law and international treaties and contains trade secrets and proprietary information owned by Cadence. Unauthorized reproduction or distribution of this publication, or any portion of it, may result in civil and criminal penalties. -
Three-Dimensional Integrated Circuit Design: EDA, Design And
Integrated Circuits and Systems Series Editor Anantha Chandrakasan, Massachusetts Institute of Technology Cambridge, Massachusetts For other titles published in this series, go to http://www.springer.com/series/7236 Yuan Xie · Jason Cong · Sachin Sapatnekar Editors Three-Dimensional Integrated Circuit Design EDA, Design and Microarchitectures 123 Editors Yuan Xie Jason Cong Department of Computer Science and Department of Computer Science Engineering University of California, Los Angeles Pennsylvania State University [email protected] [email protected] Sachin Sapatnekar Department of Electrical and Computer Engineering University of Minnesota [email protected] ISBN 978-1-4419-0783-7 e-ISBN 978-1-4419-0784-4 DOI 10.1007/978-1-4419-0784-4 Springer New York Dordrecht Heidelberg London Library of Congress Control Number: 2009939282 © Springer Science+Business Media, LLC 2010 All rights reserved. This work may not be translated or copied in whole or in part without the written permission of the publisher (Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA), except for brief excerpts in connection with reviews or scholarly analysis. Use in connection with any form of information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed is forbidden. The use in this publication of trade names, trademarks, service marks, and similar terms, even if they are not identified as such, is not to be taken as an expression of opinion as to whether or not they are subject to proprietary rights. Printed on acid-free paper Springer is part of Springer Science+Business Media (www.springer.com) Foreword We live in a time of great change. -
Simulator for the RV32-Versat Architecture
Simulator for the RV32-Versat Architecture João César Martins Moutoso Ratinho Thesis to obtain the Master of Science Degree in Electrical and Computer Engineering Supervisor(s): Prof. José João Henriques Teixeira de Sousa Examination Committee Chairperson: Prof. Francisco André Corrêa Alegria Supervisor: Prof. José João Henriques Teixeira de Sousa Member of the Committee: Prof. Marcelino Bicho dos Santos November 2019 ii Declaration I declare that this document is an original work of my own authorship and that it fulfills all the require- ments of the Code of Conduct and Good Practices of the Universidade de Lisboa. iii iv Acknowledgments I want to thank my supervisor, Professor Jose´ Teixeira de Sousa, for the opportunity to develop this work and for his guidance and support during that process. His help was fundamental to overcome the multiple obstacles that I faced during this work. I also want to acknowledge Professor Horacio´ Neto for providing a simple Convolutional Neural Net- work application, used as a basis for the application developed for the RV32-Versat architecture. A special acknowledgement goes to my friends, for their continuous support, and Valter,´ that is developing a multi-layer architecture for RV32-Versat. When everything seemed to be doomed he always had a miraculous solution. Finally, I want to express my sincere gratitude to my family for giving me all the support and encour- agement that I needed throughout my years of study and through the process of researching and writing this thesis. They are also part of this work. Thank you. v vi Resumo Esta tese apresenta um novo ambiente de simulac¸ao˜ para a arquitectura RV32-Versat baseado na ferramenta de simulac¸ao˜ Verilator. -
HB0085: Coreabc V3.7 Handbook
HB0085 Handbook CoreABC v3.7 Microsemi makes no warranty, representation, or guarantee regarding the information contained herein or the suitability of its products and services for any particular purpose, nor does Microsemi assume any liability whatsoever arising out of the application or use of any product or circuit. The products sold hereunder and any other products sold by Microsemi have been subject to limited testing and should not be used in conjunction with mission-critical equipment or applications. Any performance specifications are believed to be reliable but are not verified, and Buyer must conduct and complete all performance and other testing of the products, alone and together with, or installed in, any end-products. Buyer shall not Microsemi Corporate Headquarters rely on any data and performance specifications or parameters provided by Microsemi. It is the Buyer's responsibility to One Enterprise, Aliso Viejo, independently determine suitability of any products and to test and verify the same. The information provided by Microsemi CA 92656 USA hereunder is provided “as is, where is” and with all faults, and the entire risk associated with such information is entirely Within the USA: +1 (800) 713-4113 with the Buyer. Microsemi does not grant, explicitly or implicitly, to any party any patent rights, licenses, or any other IP Outside the USA: +1 (949) 380-6100 rights, whether with regard to such information itself or anything described by such information. Information provided in this Fax: +1 (949) 215-4996 document is proprietary to Microsemi, and Microsemi reserves the right to make any changes to the information in this Email: [email protected] document or to any products and services at any time without notice. -
LATTICE SEMICONDUCTOR CORPORATION (Exact Name of Registrant As Specified in Its Charter)
3333 33 UNITED STATES SECURITIES AND EXCHANGE COMMISSION Washington, D.C. 20549 FORM 10-K (Mark One) ANNUAL REPORT PURSUANT TO SECTION 13 OR 15(d) OF THE SECURITIES EXCHANGE ACT OF 1934 FOR THE FISCAL YEAR ENDED JANUARY 3, 2009 or TRANSITION REPORT PURSUANT TO SECTION 13 OR 15(d) OF THE SECURITIES EXCHANGE ACT OF 1934 FOR THE TRANSITION PERIOD FROM TO Commission file number: 000-18032 LATTICE SEMICONDUCTOR CORPORATION (Exact name of registrant as specified in its charter) Delaware 93-0835214 (State of Incorporation) (I.R.S. Employer Identification Number) 5555 NE Moore Court Hillsboro, Oregon 97124-6421 (Address of principal executive offices) (Zip Code) Registrant’s telephone number, including area code: (503) 268-8000 Securities registered pursuant to Section 12(b) of the Act: (Title of Class) (Name of each exchange on which registered) Common Stock, $.01 par value NASDAQ Global Market Securities registered pursuant to Section 12(g) of the Act: None Indicate by check mark if the registrant is a well-known seasoned issuer, as defined in Rule 405 of the Securities Act. Yes No Indicate by check mark if the registrant is not required to file reports pursuant to Section 13 or Section 15(d) of the Act. Yes No Indicate by check mark whether the registrant (1) has filed all reports required to be filed by Section 13 or 15(d) of the Securities Exchange Act of 1934 during the preceding 12 months (or for such shorter period that the registrant was required to file such reports), and (2) has been subject to such filing requirements for the past 90 days. -
FPGA Design Security Issues: Using the Ispxpga® Family of Fpgas to Achieve High Design Security
White Paper FPGA Design Security Issues: Using the ispXPGA® Family of FPGAs to Achieve High Design Security December 2003 5555 Northeast Moore Court Hillsboro, Oregon 97124 USA Telephone: (503) 268-8000 FAX: (503) 268-8556 www.latticesemi.com WP1010 Using the ispXPGA Family of FPGAs to Lattice Semiconductor Achieve High Design Security Introduction In today’s complex systems, FPGAs are increasingly being used to replace functions traditionally performed by ASICs and even microprocessors. Ten years ago, the FPGA was at the fringe of most designs; today it is often at the heart. With FPGA technology taking gate counts into the millions, a trend accelerated by embedded ASIC-like functionality, the functions performed by the FPGA make an increasingly attractive target for piracy. Many tech- niques have been developed over the years to steal designs from all types of silicon chips. Special considerations must now be made when thinking about protecting valuable Intellectual Property (IP) implemented within the FPGA. The most common FPGA technology in use today is SRAM-based, which is fast and re-configurable, but must be re-configured every time the FPGA is powered up. Typically, an external PROM is used to hold the configuration data for the FPGA. The link between the PROM and FPGA represents a significant security risk. The configuration data is exposed and vulnerable to piracy while the device powers up. Using a non-volatile-based FPGA eliminates this security risk. Traditionally, non-volatile FPGAs were based on Antifuse technology that is secure, but very expensive to use due to its one-time programmability and higher manufacturing costs. -
Design Closure: Power Constraints, Best Practices for an Accurate Report Power Estimation
Design Closure: Power Constraints, best practices for an accurate Report Power estimation Feb 2021 © Copyright 2021 Xilinx Design Closure Sessions Session 1 Methodology, tips, and tricks for achieving better Quality-of-Results Session 2 Using Timing Closure Assistance tools to address tough timing issues Session 3 Power Constraints, best practices for an accurate Report Power estimation 2 © Copyright 2021 Xilinx Agenda Power impact and Time to Market Design Closure an efficient approach Understanding design power Design Power Constraints Vivado Commands 3 © Copyright 2021 Xilinx Power impact and Time to Market © Copyright 2021 Xilinx Why is Power Closure so important? Board Design is Fixed Power and Thermal Issues take a long time to correct Design Changes (Typically Weeks) Re-Run P&R HDL Changes Reducing design specifications Hardware changes (Typically Months) Board Re-spin Power Delivery Changes Thermal Solution Changes 5 © Copyright 2021 Xilinx Power / Thermal / Board Design Methodology Power Estimation Thermal Design Define Power Delivery If power cannot be reduced, Thermal and Define / Simulate PDN Board Design needs to be redone Define Board / Sch Checklist (very time consuming) Constrain Vivado Modify Run report_power Design DISSECTION No Designed within • What went well? Budget? • Lessons learned? Yes Converge and ensure all original assumption/ design constraints are met SUCCESS 6 © Copyright 2021 Xilinx Design Closure an efficient approach © Copyright 2021 Xilinx Design closure – combining Timing and Power More efficient, -
Understanding Performance Numbers in Integrated Circuit Design Oprecomp Summer School 2019, Perugia Italy 5 September 2019
Understanding performance numbers in Integrated Circuit Design Oprecomp summer school 2019, Perugia Italy 5 September 2019 Frank K. G¨urkaynak [email protected] Integrated Systems Laboratory Introduction Cost Design Flow Area Speed Area/Speed Trade-offs Power Conclusions 2/74 Who Am I? Born in Istanbul, Turkey Studied and worked at: Istanbul Technical University, Istanbul, Turkey EPFL, Lausanne, Switzerland Worcester Polytechnic Institute, Worcester MA, USA Since 2008: Integrated Systems Laboratory, ETH Zurich Director, Microelectronics Design Center Senior Scientist, group of Prof. Luca Benini Interests: Digital Integrated Circuits Cryptographic Hardware Design Design Flows for Digital Design Processor Design Open Source Hardware Integrated Systems Laboratory Introduction Cost Design Flow Area Speed Area/Speed Trade-offs Power Conclusions 3/74 What Will We Discuss Today? Introduction Cost Structure of Integrated Circuits (ICs) Measuring performance of ICs Why is it difficult? EDA tools should give us a number Area How do people report area? Is that fair? Speed How fast does my circuit actually work? Power These days much more important, but also much harder to get right Integrated Systems Laboratory The performance establishes the solution space Finally the cost sets a limit to what is possible Introduction Cost Design Flow Area Speed Area/Speed Trade-offs Power Conclusions 4/74 System Design Requirements System Requirements Functionality Functionality determines what the system will do Integrated Systems Laboratory Finally the cost sets a limit -
NOT for Printing
New York City Transit ADC60 Waste Management and Resource Efficiency in Transportation SUMMER CONFERENCE IN NEW YORK CITY JULY 13—JULY 15, 2009 2 Broadway, New York Monday July 13, 2009 Tuesday July 14, 2009 Wednesday July 15, 2009 8:30AM – Registration and Breakfast 8:30AM Registration and Breakfast 8:30AM Registration and Breakfast 9:00AM – Welcome/Opening Session 8:45AM Hazardous Materials Investigation/Remediation – 8:45AM Environmental Focus 1 PDH, .1 CM Thomas Abdallah, PE, LEED AP, NYCT Panel Discussion 1 PDH, .1 CM 1. US EPA EPA Region 2 Transportation and Construction Initia- Ernest Tollerson, MTA 1. The Triad Approach: Theory, Practice, and Expectations, Joel tive, Charles Harewood, EPA Collette Ericsson, PE, LEED AP, MTA Regional Bus S. Hayworth, PhD, PE, Hayworth Engineering 2. Hot LEED Topics, Lauren Yarmuth, LEED AP, YRG Ed Wallingford, Committee Chair TRB ADC-60 2. A TRIAD investigation combining Electrical Resistivity Imaging 3. Storm water Retrofitting to Restore Ecosystems, Ted Brown, 9:30AM Sustainability Initiatives 1PDH, .1 CM (ERI), Soil Conductivity/Membrane Interface Probe (SC/MIP), P.E., LEED AP 1. Assessing Green Building Performance, Thomas Burke, PE, Todd R. Kincaid, Ph.D., Kevin Day, P.G., Roger Lamb, P.G., 4. Western Railyards Air Quality, Helen Ginzburg &Tammy Pet- LEED AP, U.S. GSA H2H Associates sios, PB 2. Climate Change and the Port Authority, Chris Zeppie, Chrstine 3. Geologic Framework Modeling for Large Construction Projects, 10:15AM Environmental Engineering Around the World Wedig, PANYNJ Christine Vilardi, PG, CGWP, STV, Inc. 1PDH, .1 CM 3. The High-Line: Conversion of an Abandoned Railway to an Additional Panel Members 1.