Philosophical Magazine Atomic-Resolution Spectroscopic
This article was downloaded by: [Cornell University Library] On: 30 April 2015, At: 08:23 Publisher: Taylor & Francis Informa Ltd Registered in England and Wales Registered Number: 1072954 Registered office: Mortimer House, 37-41 Mortimer Street, London W1T 3JH, UK Philosophical Magazine Publication details, including instructions for authors and subscription information: http://www.tandfonline.com/loi/tphm20 Atomic-resolution spectroscopic imaging of oxide interfaces L. Fitting Kourkoutis a , H.L. Xin b , T. Higuchi c , Y. Hotta c d , J.H. Lee e f , Y. Hikita c , D.G. Schlom e , H.Y. Hwang c g & D.A. Muller a h a School of Applied and Engineering Physics , Cornell University , Ithaca, USA b Department of Physics , Cornell University , Ithaca, USA c Department of Advanced Materials Science , University of Tokyo , Kashiwa, Japan d Correlated Electron Research Group , RIKEN , Saitama, Japan e Department of Materials Science and Engineering , Cornell University , Ithaca, USA f Department of Materials Science and Engineering , Pennsylvania State University , University Park, USA g Japan Science and Technology Agency , Kawaguchi, Japan h Kavli Institute at Cornell for Nanoscale Science , Ithaca, USA Published online: 20 Oct 2010. To cite this article: L. Fitting Kourkoutis , H.L. Xin , T. Higuchi , Y. Hotta , J.H. Lee , Y. Hikita , D.G. Schlom , H.Y. Hwang & D.A. Muller (2010) Atomic-resolution spectroscopic imaging of oxide interfaces, Philosophical Magazine, 90:35-36, 4731-4749, DOI: 10.1080/14786435.2010.518983 To link to this article: http://dx.doi.org/10.1080/14786435.2010.518983 PLEASE SCROLL DOWN FOR ARTICLE Taylor & Francis makes every effort to ensure the accuracy of all the information (the “Content”) contained in the publications on our platform.
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