CEDA Currents T.W. Williams Wins EDAA Lifetime Design, Automation and Test in Europe Conference Achievement Award (DATE). The European Design and Automation Association He has authored several seminal papers related to has awarded the 2007 EDAA Lifetime Achievement test technology and scan design. An IEEE Fellow, Award to Thomas W. Williams for his outstanding Williams has received several awards, including the W. contributions to the state of the art in testability of Wallace McDowell Award from the IEEE Computer electronic circuits, and specifically to full-scan design. Society (which he shared with Ed Eichelberger in This award is given to candidates who have made 1989). In 1997, he was presented the IBM Corporation innovative contributions that have impacted the way Award for Test. electronic systems are designed. Past recipients in- For more information about this award, contact clude Kurt Antreich (2003), Hugo De Man (2004), Bernard Courtois (
[email protected]). Jochen Jess (2005), and Robert Brayton (2006). Thomas W. Williams is a Synopsys Fellow and an Richard Newton Passes Away adjunct professor at the University of Calgary, Alberta, EDA pioneer A. Richard Newton, Dean of Engineer- Canada. He has also served at IBM Microelectronics ing at the University of California, Berkeley, passed Division in Boulder, Colorado, as manager of the VLSI away on 2 January 2007. The news came as a shock to Design for Testability Group, which dealt with DFT of the entire community. In a short span, Richard Newton IBM products. Williams has a BS in electrical wore many hats and contributed to the society in so engineering from Clarkson University, an MA in pure many ways as an academic, an entrepreneur, an mathematics from the State University of New York at administrator, but above all as a visionary with Binghamton, and a PhD in electrical engineering from enormous compassion.