SMT Nomenclature
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Ceramic Leadless Chip Carrier (LCC)
Ceramic,Leadless,Chip,Carrier,(L Ceramic Leadless Chip Carrier (LCC) Literature Number: SNOA023 Ceramic Leadless Chip Carrier (LCC) August 1999 Ceramic Leadless Chip Carrier (LCC) 20 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E20A © 2000 National Semiconductor Corporation MS101105 www.national.com 20 Lead Ceramic Leadless Chip Carrier NS Package Number EA20B Ceramic Leadless Chip Carrier (LCC) www.national.com 2 Ceramic Leadless Chip Carrier (LCC) 24 Lead Ceramic Leadless Chip Carrier NS Package Number E24B 28 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E28A 3 www.national.com 28 Lead Ceramic Leadless Chip Carrier, Dual Cavity NS Package Number EA028C Ceramic Leadless Chip Carrier (LCC) www.national.com 4 Ceramic Leadless Chip Carrier (LCC) 32 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E32A 32 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E32B 5 www.national.com 32 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E32C Ceramic Leadless Chip Carrier (LCC) 32 Lead Ceramic Leadless Chip Carrier, Type E NS Package Number EA32B www.national.com 6 Ceramic Leadless Chip Carrier (LCC) 32 Lead Ceramic Leadless Chip Carrier, DIP NS Package Number EA32C 40 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E40A 7 www.national.com 44 Lead Ceramic Leadless Chip Carrier, Type C NS Package Number E44A Ceramic Leadless Chip Carrier (LCC) 48 Lead Ceramic Leadless Chip Carrier NS Package Number EA48B www.national.com 8 Ceramic Leadless Chip Carrier (LCC) 68 Lead Ceramic -
PDF Package Information
This version: Apr. 2001 Previous version: Jun. 1997 PACKAGE INFORMATION 1. PACKAGE CLASSIFICATIONS This document is Chapter 1 of the package information document consisting of 8 chapters in total. PACKAGE INFORMATION 1. PACKAGE CLASSIFICATIONS 1. PACKAGE CLASSIFICATIONS 1.1 Packaging Trends In recent years, marked advances have been made in the electronics field. One such advance has been the progression from vacuum tubes to transistors and finally, to ICs. ICs themselves have been more highly integrated into LSIs, VLSIs, and now, ULSIs. With increased functions and pin counts, IC packages have had to change significantly in the last few years in order to keep-up with the advancement in semiconductor development. Functions required for conventional IC packages are as follows: 1) To protect IC chips from the external environment 2) To facilitate the packaging and handling of IC chips 3) To dissipate heat generated by IC chips 4) To protect the electrical characteristics of the IC Standard dual-in-line packages (DIP), which fulfill these basic requirements, have enjoyed wide usage in the electronics industry for a number of years. With increasing integration and higher speed ICs, and with the miniaturization of electronic equipment, newer packages have been requested by the industry which incorporate the functions listed below: 1) Multi-pin I/O 2) Ultra-miniature packages 3) Packages suited to high density ICs 4) Improved heat resistance for use with reflow soldering techniques 5) High throughput speed 6) Improved heat dissipation 7) Lower cost per pin In response to these requests, OKI has developed a diversified family of packages to meet the myriad requirements of today’s burgeoning electronics industry. -
Quad Flat No-Lead (QFN) Evauation Test
National Aeronautics and Space Administration Quad Flat No-Lead (QFN) Evaluation Testing Reza Ghaffarian, Ph.D. Jet Propulsion Laboratory Pasadena, California Jet Propulsion Laboratory California Institute of Technology Pasadena, California 6/17 National Aeronautics and Space Administration Quad Flat No-Lead (QFN) Evaluation Testing NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Success Reza Ghaffarian, Ph.D. Jet Propulsion Laboratory Pasadena, California NASA WBS: 724297.40.43 JPL Project Number: 104593 Task Number: 40.49.02.35 Jet Propulsion Laboratory 4800 Oak Grove Drive Pasadena, CA 91109 http://nepp.nasa.gov 6/17 This research was carried out at the Jet Propulsion Laboratory, California Institute of Technology, and was sponsored by the National Aeronautics and Space Administration Electronic Parts and Packaging (NEPP) Program. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise, does not constitute or imply its endorsement by the United States Government or the Jet Propulsion Laboratory, California Institute of Technology. Copyright 2017. California Institute of Technology. Government sponsorship acknowledged. Acknowledgments The author would like to acknowledge many people from industry and the Jet Propulsion Laboratory (JPL) who were critical to the progress of this activity including the Rochester Institute of Technology (RIT). The author extends his appreciation to program managers of the National Aeronautics and Space -
Parasitic Oscillation and Ringing of Power Mosfets Application Note
Parasitic Oscillation and Ringing of Power MOSFETs Application Note Parasitic Oscillation and Ringing of Power MOSFETs Description This document describes the causes of and solutions for parasitic oscillation and ringing of power MOSFETs. © 2017 - 2018 1 2018-07-26 Toshiba Electronic Devices & Storage Corporation Parasitic Oscillation and Ringing of Power MOSFETs Application Note Table of Contents Description ............................................................................................................................................ 1 Table of Contents ................................................................................................................................. 2 1. Parasitic oscillation and ringing of a standalone MOSFET .......................................................... 3 2. Forming of an oscillation network ....................................................................................................... 3 2.1. Oscillation phenomenon ..................................................................................................................... 3 2.1.1. Feedback circuit (positive and negative feedback) ......................................................................... 4 2.1.2. Conditions for oscillation ...................................................................................................................... 5 2.2. MOSFET oscillation .............................................................................................................................. 5 2.2.1. -
Packaging Product Specification
Packaging Product Specification PS007225-0607 Copyright ©2007 by ZiLOG, Inc. All rights reserved. www.zilog.com DO NOT USE IN LIFE SUPPORT Warning: LIFE SUPPORT POLICY ZiLOG'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS PRIOR WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF ZiLOG CORPORATION. As used herein Life support devices or systems are devices which (a) are intended for surgical implant into the body, or (b) support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the labeling can be reasonably expected to result in a significant injury to the user. A critical component is any component in a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system or to affect its safety or effectiveness. Document Disclaimer ©2007 by ZiLOG, Inc. All rights reserved. Information in this publication concerning the devices, applications, or technology described is intended to suggest possible uses and may be superseded. ZiLOG, INC. DOES NOT ASSUME LIABILITY FOR OR PROVIDE A REPRESENTATION OF ACCURACY OF THE INFORMATION, DEVICES, OR TECHNOLOGY DESCRIBED IN THIS DOCUMENT. ZiLOG ALSO DOES NOT ASSUME LIABILITY FOR INTELLECTUAL PROPERTY INFRINGEMENT RELATED IN ANY MANNER TO USE OF INFORMATION, DEVICES, OR TECHNOLOGY DESCRIBED HEREIN OR OTHERWISE. The information contained within this document has been verified according to the general principles of electrical and mechanical engineering. Z8, Z8 Encore!, Z8 Encore! XP, Z8 Encore! MC, Crimzon, eZ80, and ZNEO are trademarks or registered trademarks of ZiLOG, Inc. -
Package Reliability As Affected by Material and Processes
I,, '• Package Reliability as Affected By Materials and Processes The semiconductor industry is faced with the problem of how to increase the level of reliability of semiconductor parts being used in electronic systems which have had their lifetimes extended through new and.better system designs. By David Nixen, cussed, are all commercially availc1ble and presently The Aerospace Corporation, being used in high volume in industry. It is not the El Segundo, California intention of this article to present any new, revolu tionary packaging approach, but rather to compare the advantages and disadvantages of the major types The word "reliability" has been used in the semicon as they relate to reliability. uuctor industry over the years in every imaginable The actual choice of which package to use will not way. It may refer to why the cost is so high, the be presented here since that choice is too highly delivery so late, the documentation so voluminous, dependent upon the unique conditions of each indi or, it may be why the system is successful. When vidual case. discussed in the true sense of the word, perhaps reliability has no greater importance than in aero PACKAGE FAMILIES ,, , space systems. The basic package families are divided into three Until this year, a spacecraft system had a projected groups; these three groups, in turn, can be subdivid life of three to five years. Since an orbiting system ed and they, in turn, can also be subdivided. Only cannot be considered in a "repair/replace" categoryr the major families will be discussed, although some a component was required to have an extremely high of the subdivisions will be acknowledged. -
LM117/LM317A/LM317 3-Terminal Adjustable Regulator
LM117/LM317A/LM317 3-Terminal Adjustable Regulator July 2004 LM117/LM317A/LM317 3-Terminal Adjustable Regulator General Description age, supplies of several hundred volts can be regulated as long as the maximum input to output differential is not ex- The LM117 series of adjustable 3-terminal positive voltage ceeded, i.e., avoid short-circuiting the output. regulators is capable of supplying in excess of 1.5A over a Also, it makes an especially simple adjustable switching 1.2V to 37V output range. They are exceptionally easy to regulator, a programmable output regulator, or by connecting use and require only two external resistors to set the output a fixed resistor between the adjustment pin and output, the voltage. Further, both line and load regulation are better than LM117 can be used as a precision current regulator. Sup- standard fixed regulators. Also, the LM117 is packaged in plies with electronic shutdown can be achieved by clamping standard transistor packages which are easily mounted and the adjustment terminal to ground which programs the out- handled. put to 1.2V where most loads draw little current. In addition to higher performance than fixed regulators, the For applications requiring greater output current, see LM150 LM117 series offers full overload protection available only in series (3A) and LM138 series (5A) data sheets. For the IC’s. Included on the chip are current limit, thermal overload negative complement, see LM137 series data sheet. protection and safe area protection. All overload protection circuitry remains fully functional even if the adjustment ter- minal is disconnected. Features Normally, no capacitors are needed unless the device is n Guaranteed 1% output voltage tolerance (LM317A) situated more than 6 inches from the input filter capacitors in n Guaranteed max. -
Surface Mount • Chips, Melfs & Sots Introduction
® Association Connecting Electronics Industries DRM-18H (G) Global License This PDF document is licensed for simultaneous usage on every computer throughout all company facilities and locations. Global License files may be opened, copied or downloaded onto individual computers, or over computer networks, intranets, internet or web. Appropriate security measures and policies must be in place to prevent access to this PDF version of the IPC-DRM-18H by anyone from outside the licensed company. DEMO ONLY Version This is a promotional sample of the IPC Training and Reference Guide — DRM-18H / PDF Version. Please do not use this SAMPLE for training or reference purposes. IPC is a not-for-profit association for the electronics industry. Please respect our copyright. You may order printed or PDF versions of DRM-18H from IPC at: www.ipctraining.org, [email protected], or call (847) 597-2862. Table of Contents Terminology Surface Mount • CHIPs, MELFs & SOTs Introduction ......................... 2 Chip Components ....................... 39 Through Hole vs. Surface Mount ....... 3 Chip Components/Resistor .............. 40 Through Hole Leads ................ 3, 4 Chip Components/Capacitor ............. 41 Surface Mount Leadless .............. 4 Tantalum Capacitor ..................... 42 Surface Mount Leaded ............... 5 MELF ................................. 43 Component Packaging ................ 6 SOT/SOD .............................. 44 Identifying Components ............... 7 DPAK.................................. 45 Lead-Free Components -
Aluminum Electrolytic Capacitors
ALUMINUM ELECTROLYTIC CAPACITORS Snap-in Terminal Type, Withstanding Overvoltage series AD series Withstanding 3000 hours application of ripple current at 105°C. Suited for 100V/200V switch-over use in switching power supplies. Withstanding overvoltage and suited for IEC-60950 application. Withstandard AD overvoltage GU Specifications a Item Performance Characteristics Category Temperature Range – 40 ~ +105°C Rated Voltage Range 250V Rated Capacitance Range 82 ~ 1200µF Capacitance Tolerance ± 20% at 120Hz, 20°C Leakage Current I 3 CV (µA) (After 5 minutes' application of rated voltage) [C:Rated Capacitance (µF), V:Voltage (V)] Rated voltage(V) 250 Measurement frequency:120Hz, Temperature:20°C tan δ tan δ (MAX.) 0.15 Rated voltage(V) 250 Measurement frequency:120Hz Stability at Low Temperature Z—25°C/Z+20°C 3 Impedance ratio ZT/Z20 (MAX.) Z—40°C/Z+20°C 12 After an application of DC voltage (in the range of rated DC voltage Capacitance change Within ±20% of intial value even after over-lapping the specified ripple current)for 3000 hours Endurance tan δ 200% or less of intial spesified value at 105°C, capacitors meet the characteristic requirements listed at Leakage current Initial specified value or less right. Capacitance change Within ±15% of intial value After leaving capacitors under no load at 105°C for 1000 hours, they Shelf Life tan δ 150% or less of intial spesified value meet the requirements listed at right. Leakage current Initial specified value or less Withstand excess voltage Not defective after 7 hours continuous charges of 360VDC at 70°C atmosphere. Marking Printed with white color letter on black sleeve. -
Resistors, Capacitors and Inductors Are Not As They Appear
Paper ID #21050 Resistors, Capacitors and Inductors Are Not as They Appear Dr. Paul Benjamin Crilly, U.S. Coast Guard Academy Paul Crilly is a Professor of Electrical Engineering at the United States Coast Guard Academy. He re- ceived his Ph.D. from New Mexico State University, his M. S. and B.S. degrees at Rensselaer Polytechnic Institute, all in Electrical Engineering. He was previously an Associate Professor of Electrical and Com- puter Engineering at the University of Tennessee and was a Development Engineer at the Hewlett Packard Company. His areas of interest include laboratory development, antennas, wireless communications, sig- nal processing, and instrumentation. Dr. Tooran Emami, U.S. Coast Guard Academy Tooran Emami is an associate professor of Electrical Engineering at the U. S. Coast Guard Academy. She received M.S. and Ph.D. degrees in Electrical Engineering from Wichita State University in 2006 and 2009, respectively. Dr. Emami was an adjunct faculty member of the Department of Electrical Engineering and Computer Science at Wichita State University for three semesters. Her research interests are Proportional Integral Derivative (PID) controllers, robust control, time delay, compensator design, and filter design applications, for continuous-time and discrete-time systems. c American Society for Engineering Education, 2018 Abstract This paper presents an analysis of the basic elements of an electrical circuit in order that undergraduate engineering students will experience, and thereby understand the non-ideal nature of electrical components. It is motivated by the fact that many electrical engineering students, after they have completed their first circuits course believe that the assigned or measured values of a given resistor (R), inductor (L) or capacitor (C) are within the manufacturer’s stated tolerances and are in fact pure Rs, Ls and Cs. -
Package Information
PACKAGE INFORMATION Package Thermal Characteristics This document provides test information about the has one site, with minimal exposed copper area. standard packages offered by Allegro MicroSystems. Where two values are shown in this column, it in- The data given is intended as a general reference only dicates that the printed circuit board has multiple and is based on certain simplifications such as con- sites, each having a different amount of exposed stant chip size and standard bonding methods. copper foil. The ground leads (power tabs) of the devices are connected to these areas of copper To use this document, in the Allegro Package Code foil. The two results shown indicate the highest column, locate the package designator for the device. and the lowest test results. To locate package variants, use the JEDEC Package Note that the paired results are text hyperlinks to Outline column to locate the corresponding JEDEC other Web pages. Click the text to open the linked designator, or use the Quantity and Type of Terminals page, which provides information on the test and column to locate the variant by the configuration of printer circuit board layout, as well as intermedi- terminals. ate test results. Three columns of results are presented: • R , R , R . This column provides results θJC θJP θJT on other thermal dissipation paths: • RθJA High K. This test is performed using a high thermal conductivity, mutlilayer printed circuit RθJC [c] Through the device case. board that closely approximates those specified RθJP [p] Through the exposed thermal pad see in JEDEC standard JEDEC51-7 (surface-mount Application Note 26020, Procedure for Mea- devices), JEDEC51-5 (for exposed thermal suring Pad-to-Ambient Thermal Resistance pads), or JEDEC51-10 (through-hole devices). -
Lm317mdt/Nopb
Distributed by: www.Jameco.com ✦ 1-800-831-4242 The content and copyrights of the attached material are the property of its owner. LM117/LM317A/LM317 3-Terminal Adjustable Regulator June 2006 LM117/LM317A/LM317 3-Terminal Adjustable Regulator General Description age, supplies of several hundred volts can be regulated as long as the maximum input to output differential is not ex- The LM117 series of adjustable 3-terminal positive voltage ceeded, i.e., avoid short-circuiting the output. regulators is capable of supplying in excess of 1.5A over a Also, it makes an especially simple adjustable switching 1.2V to 37V output range. They are exceptionally easy to regulator, a programmable output regulator, or by connecting use and require only two external resistors to set the output a fixed resistor between the adjustment pin and output, the voltage. Further, both line and load regulation are better than LM117 can be used as a precision current regulator. Sup- standard fixed regulators. Also, the LM117 is packaged in plies with electronic shutdown can be achieved by clamping standard transistor packages which are easily mounted and the adjustment terminal to ground which programs the out- handled. put to 1.2V where most loads draw little current. In addition to higher performance than fixed regulators, the For applications requiring greater output current, see LM150 LM117 series offers full overload protection available only in series (3A) and LM138 series (5A) data sheets. For the IC’s. Included on the chip are current limit, thermal overload negative complement, see LM137 series data sheet. protection and safe area protection.