electronics

Article A High Efficiency Low Noise RF-to-DC Converter Employing Gm-Boosting Envelope Detector and Offset Canceled Latch Comparator

Thithuy Pham 1, Dongmin Kim 1 , Seohyeong Jeong 1, Junghyup Lee 2,* and Donggu Im 1,*

1 Division of Electronic Engineering, Jeonbuk National University, Jeonju-si 561-756, Korea; [email protected] (T.P.); [email protected] (D.K.); [email protected] (S.J.) 2 Department of Information and Communication Engineering, Daegu Gyeongbuk Institute of Science and Technology (DGIST), Daegu 42988, Korea * Correspondence: [email protected] (J.L.); [email protected] (D.I.)

Abstract: This work presents a high efficiency RF-to-DC conversion circuit composed of an LC-CL balun-based Gm-boosting envelope detector, a low noise baseband amplifier, and an offset canceled latch comparator. It was designed to have high sensitivity with low power consumption for wake- up receiver (WuRx) applications. The proposed envelope detector is based on a fully integrated inductively degenerated common-source amplifier with a series gate inductor. The LC-CL balun circuit is merged with the core of the envelope detector by sharing the on-chip gate and source inductors. The proposed technique doubles the transconductance of the input transistor of the envelope detector without any extra power consumption because the gate and source voltage on the   input transistor operates in a differential mode. This results in a higher RF-to-DC conversion gain. In order to improve the sensitivity of the wake-up radio, the DC offset of the latch comparator circuit Citation: Pham, T.; Kim, D.; Jeong, S.; is canceled by controlling the body bias voltage of a pair of differential input transistors through Lee, J.; Im, D. A High Efficiency Low a binary-weighted current source cell. In addition, the hysteresis characteristic is implemented in Noise RF-to-DC Converter order to avoid unstable operation by the large noise at the compared signal. The hysteresis window Employing Gm-Boosting Envelope is programmable by changing the channel width of the latch transistor. The low noise baseband Detector and Offset Canceled Latch Comparator. Electronics 2021, 10, 1078. amplifier amplifies the output signal of the envelope detector and transfers it into the comparator https://doi.org/10.3390/ circuit with low noise. For the 2.4 GHz WuRx, the proposed envelope detector with no external electronics10091078 matching components shows the simulated conversion gain of about 16.79 V/V when the input power is around the sensitivity of −60 dBm, and this is 1.7 times higher than that of the conventional Academic Editor: Ahmed Abu-Siada envelope detector with the same current and load. The proposed RF-to-DC conversion circuit (WuRx) achieves a sensitivity of about −65.4 dBm based on 45% to 55% duty, dissipating a power of 22 µW Received: 17 March 2021 from a 1.2 V supply voltage. Accepted: 26 April 2021 Published: 2 May 2021 Keywords: baseband amplifier; comparator; conversion gain; envelope detector; LC-CL balun; offset cancellation; programmable hysteresis; RF-to-DC conversion; wake-up receiver Publisher’s Note: MDPI stays neutral with regard to jurisdictional claims in published maps and institutional affil- iations. 1. Introduction Internet of Things (IoT) is an emerging and fast-growing heterogeneous network that will interconnect a variety of devices (including smartphones, home appliances, sensors, and other network devices), people, data, and processes for a wide range of applications Copyright: © 2021 by the authors. including smart home, building, and cities, agriculture, transportation, and health. Even- Licensee MDPI, Basel, Switzerland. tually, it allows them to communicate with each other seamlessly. It is expected that This article is an open access article distributed under the terms and the number of connected IoT devices will increase from 27 billion in 2017 to 73 billion conditions of the Creative Commons in 2025 [1]. One of the most important challenges for a truly innovative IoT solution is Attribution (CC BY) license (https:// extending the lifetime of IoT sensor nodes. Because it is almost impossible to replace the creativecommons.org/licenses/by/ battery periodically in outdoor environments, IoT sensor nodes should be driven by a 4.0/). self-powered energy-harvesting system without a battery by significantly reducing its

Electronics 2021, 10, 1078. https://doi.org/10.3390/electronics10091078 https://www.mdpi.com/journal/electronics Electronics 2021, 10, 1078 2 of 12

power consumption. The self-powered IoT sensor nodes enable its applications to expand into outdoor environments, and this will give us incalculable economic value. Various wireless technologies have been proposed for low-power IoT applications, such as IEEE802.15.4 (ZigBee), Bluetooth Low Energy (BLE), IEEE802.15.6 (Medical Body- Area Networks, MBAN), and IEEE802.11a/b/g/n (Wi-Fi) [2–4]. Unfortunately, however, one single wireless technology may not be sufficient to cover both short- and long-range IoT applications. For instance, BLE and ZigBee are competing to provide the IoT with an ultra- low-power and low-cost wireless connectivity solution, but their application is limited by the transmission range (within a few hundred meters). Recently, sub-GHz low power wide area network (LPWAN) technologies have been introduced for long range and low-power IoT applications [5,6]. Many LPWAN technologies such as SigFox, long-range wide area network (LoRaWAN), narrowband IoT (NB-IoT), and long-term evolution (LTE)-M have been developed to ensure a long transmission range of more than multiple kilometers with long battery life operation while showing low transmission data rates with small packet data sizes. Consequently, the optimum wireless technology is strongly dependent on IoT applications, and hybrid (short and long range) wireless connectivity solutions optimizing communication range, data rate, and power consumption will be an essential technology in the near future for truly innovative IoT solutions. In addition, because the most power-hungry building block in IoT devices is the wireless communication part, reducing and optimizing the power consumption of the wireless transceiver can make the IoT device intelligent by decreasing the overall power consumption of the complete IoT system and providing opportunities to add many additional functionalities. It is very important to reduce or eliminate the wasted power in the idle state to decrease the total power consumption of the wireless transceiver. The idle state is when the transceiver is listening to the channel to check for an incoming message [7]. Several techniques such as duty cycling method in [8], asynchronous scheme in [9], and wake-up radio in [10] have been devised to reduce the power in the idle state. Among them, the wake- up radio has been a popular transceiver architecture in recent years for battery-powered IoT applications because of its simple hardware configuration and system application. As shown in Figure1, the RF to DC converter circuit composed of RF envelope detector (RFED), baseband amplifier, and comparator has been employed as a separate wake-up receiver (WuRx) in order to monitor the communication channel continuously and enable the main radio when it is needed. The most important consideration in implementing a WuRx is low power dissipation while maximizing sensitivity, and as a result, WuRx is typically designed by a simple RFED consisting of Schottky diodes or MOSFETs in the weak inversion region without active filtering or amplification of the input signal [11]. This implies that the sensitivity of WuRx is strongly dependent on the efficiency of the RF to DC conversion and noise performance of RFED. In order to avoid a false wake-up by strong interferers coming from nearby terminals with high transmit power such as mobile phones and WiFi devices, the RFED should have good out-of-band (OOB) rejection characteristic. In addition, it is important to minimize the effect of DC offset of the comparator circuit to avoid sensitivity degradation. In this paper, a high efficiency RF-to-DC conversion circuit, which is composed of an LC-CL balun-based Gm-boosting RFED, a low noise baseband amplifier, and an offset canceled latch comparator, is proposed for 2.4-GHz WuRx applications. The rest of this paper is organized as follows. In Section2, we discussed the architecture of the proposed envelope detector. The programmable hysteresis comparator including the proposed DC offset cancellation scheme is analyzed and explained in Section3. Section4 discusses the post-layout simulation result and finally, the conclusion is described in Section5. Electronics 2021, 10, x FOR PEER REVIEW 3 of 13 Electronics 2021, 10, 1078 3 of 12

FigureFigure 1. Typical 1. Typical block block diagram diagram of ofa wirele a wirelessss part part of of IoT sensorsensor node node with with a separatea separate wake-up wake-up receiver. receiver. 2. Design of RF Envelope Detector 2.1.In Conventionalthis paper, RFa high Envelope efficiency Detector RF-to-DC conversion circuit, which is composed of an LC-CL balun-based Gm-boosting RFED, a low noise baseband amplifier, and an offset can- Generally, the RF-to-DC conversion exploits the non-linearity feature of devices. There celedare latch two typescomparator, of envelope is proposed detector for which 2.4-GHz are passive WuRx and applications. active topology. The rest The of passive this paper is organizedone can operate as follows. without In a Section bias current, 2, we however, discussed it exhibitsthe architecture various disadvantages of the proposed such enve- lopeas detector. low input The impedance programmable and power hysteresis loss. The co MOSFETmparator with including a limited the threshold proposed voltage DC offset cancellationis a key device scheme in anis analyzed active envelope and explained detection in circuit Section which 3. Section is commonly 4 discusses used in the RF post- layoutdemodulation. simulation Figure result2 andshows finally, the schematic the conclusion of the conventional is described RFED in Section [ 12]. It5. has been built based on the inductively degenerated common-source amplifier with current source 2. Designload. The of envelope RF Envelope of the originalDetector signal is extracted by down-converting the incident RF signal Vin to baseband frequencies by using the exponential transfer function of the input 2.1. Conventional RF Envelope Detector transistor M1 operating in subthreshold region. The high frequency component is then removedGenerally, by an theRC RF-to-DC(R1 − C1) low-passconversion filter exploi to achievets the a purenon-linearity baseband envelopefeature of signal. devices. ThereThe are most two important types of specifications envelope detector of an envelope which are detector passive are and conversion active gain,topology. efficiency, The pas- siveand one noise can performance.operate without The conversion a bias current, gain is however, defined as it the exhibits ratio of various output DC disadvantages voltage such(baseband as low input frequency) impedance and input and modulatedpower loss. signal The MOSFET (carrier signal). with a The limited saturated threshold drain volt- current of the input MOSFET M biased in the subthreshold region can be expressed as age is a key device in an active envelope1 detection circuit which is commonly used in RF demodulation. Figure 2 shows the schematicW of theVGS conventional RFED [12]. It has been ID ' ID0( ) exp( ), (1) built based on the inductively degeneratedL common-sourcenVT amplifier with current source load. The envelope of the original signal is extracted by down-converting the incident RF where ID0 is a current constant independent of gate-to-source voltage, (W/L) is the aspect signalratio V ofin to the baseband transistor, frequenciesn is a process-dependent by using the term exponential related to depletiontransfer function region character- of the input 1 transistoristics, and M V operatingT is the thermal in subthreshold voltage (=kT/q region.; 26 mV Th ate room high temperature) frequency component [13]. When the is then removedsmall sinusoidal by an RC wave (R1 −V Cacos(w1) low-passct) and DCfilter bias to voltage achieveV biasa pureare applied baseband to the envelope gate of the signal. Theinput most transistor importantM1 specifications, Equation (1) can of bean modifiedenvelope based detector on a are Taylor conversion series as gain, efficiency, and noise performance. The conversion gain is defined as the ratio of output DC voltage ' ( W ) ( Vbias+Va cos(wct) ) ' ( Va cos(wct) ) (baseband frequency)ID IandD0 Linputexp modulatednV signalIB 0(carrierexp nVsignal). The saturated drain T T (2) V1a 2 Va Va 2 current of the input MOSFET' I [1 + (M biased) + incos the( wsubthresholdct) + ( ) cos region(2wct can)], be expressed as B0 2nVT nVT 2nVT

where I is the DC drain current of the input transistorW VMGS. This drain current is converted B0 II ( )exp(1 ), (1) into the output voltage through aDD current0 source with RC (R − C ) load, and the RC LnVT 1 1 low-pass filter attenuates the high frequency carrier component of the output voltage 2 whereleaving ID0 is a signala current DC componentconstant independenIB0(Va/2nVTt )of. Becausegate-to-source the transconductance voltage, (W/L (g)m is) ofthe the aspect ratioMOSFET of the transistor, biased in the n is subthreshold a process-dependent region is given term by rela (IB0ted/nV toT), depletion the output region voltage character- (Vo) and conversion gain (K ) of the RFED are calculated as istics, and VT is the thermalv voltage (=kT/q; 26 mV at room temperature) [13]. When the small sinusoidal wave Vacos(wct) and DC2 bias voltage Vbias are applied to the gate of the 1 Va 1 Va input transistor M1, EquationVo ' g (1)mR outcan( be modified) and Kv ' basedgmR outon( a Taylor), series as (3) 4 nVT 4 nVT + W VVbias acos( wt c ) V a cos( wt c ) IIDD00()exp( ) I B exp( ) LnVnVTT (2) VV V ++aa22 + a  IBcc0 [1 ( ) cos(wt ) ( ) cos(2 wt )], 22nVTT nV nV T

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where IB0 is the DC drain current of the input transistor M1. This drain current is converted into the output voltage through a current source with RC (R1 − C1) load, and the RC low- pass filter attenuates the high frequency carrier component of the output voltage leaving a signal DC component IB0(Va/2nVT)2. Because the transconductance (gm) of the MOSFET biased in the subthreshold region is given by (IB0/nVT), the output voltage (Vo) and conver- sion gain (Kv) of the RFED are calculated as

2 11VVaa VgRo m out( ) and KgR v m out ( ), (3) 44nVTT nV

where Rout is the output impedance of the RFED. From (3), the conversion gain, which is the effectiveness of peak detection from carrier frequency to baseband frequency, is di- rectly proportional to gm, Rout, and Va. The matching network composed of L2, C2, and L3 is adopted to match the input impedance of the RFED to the source impedance. The passive voltage gain by the matching network should be added to (3) for the complete conversion gain of the RFED.

2.2. Proposed LC-CL Balun-Based Gm-Boosting RF Envelope Detector Figure 3 shows the schematic of the proposed LC-CL balun-based Gm-boosting RFED. Like the conventional RFED of Figure 2, this configuration is originated from an inductively degenerated common source amplifier with a current source. The key part of this detector is the LC-CL balun playing a role as a voltage doubler that converts the single- Electronics 2021, 10, 1078 4 of 12 ended to differential signal across the gate and source of the input transistor M1. As a result, the transconductance of input transistor M1 is doubled because the gate-source voltage increase twice. This directly increases the conversion gain of the RFED from (3) withoutwhere R anyout is extra the outputpower impedanceconsumption. of theThe RFED.input matching From (3), network the conversion composed gain, of which a series is capacitorthe effectiveness C3 and ofa shunt peak detection inductor from L3 is carrieremployed frequency to match to baseband the input frequency, impedance is directly of the RFEDproportional to the source to gm, impedance.Rout, and V aThe. The Cac matching1 is a DC networkblocking composedcapacitor for of theL2, Cinput2, and signal.L3 is Althoughadopted to this match technique the input requires impedance one additi of theonal RFED inductor to the sourcefor the impedance.implementation The passiveof LC- CLvoltage balun, gain theby number the matching of inductors network including should th bee addedmatching to (3)network for the is complete the same conversion as that of thegain conventional of the RFED. RFED of Figure 2 because of the simpler input matching network.

FigureFigure 2. 2. ConventionalConventional RF RF envelope envelope detector. detector.

2.2. Proposed LC-CL Balun-Based Gm-Boosting RF Envelope Detector Figure3 shows the schematic of the proposed LC-CL balun-based Gm-boosting RFED. Like the conventional RFED of Figure2, this configuration is originated from an inductively degenerated common source amplifier with a current source. The key part of this detector is the LC-CL balun playing a role as a voltage doubler that converts the single-ended to differential signal across the gate and source of the input transistor M1. As a result, the transconductance of input transistor M1 is doubled because the gate-source voltage increase twice. This directly increases the conversion gain of the RFED from (3) without any extra power consumption. The input matching network composed of a series

C3 and a shunt inductor L3 is employed to match the input impedance of the RFED to the source impedance. The Cac1 is a DC blocking capacitor for the input signal. Although this technique requires one additional inductor for the implementation of LC-CL balun, the Electronics 2021, 10, x FOR PEER REVIEW 5 of 13 number of inductors including the matching network is the same as that of the conventional RFED of Figure2 because of the simpler input matching network.

FigureFigure 3. 3. ProposedProposed LCLC--CLCL balun-basedbalun-based Gm-boosting Gm-boosting RF envelope detector.

Figure 4 compares the simulated conversion gain of the conventional RFED (Figure 2) and proposed RFED (Figure 3). Input power is scaled in dB and output voltage is on a logarithmic scale. The summary of device size and component value for both detector circuits is presented in Table 1. Both detectors are designed to consume an identical cur- rent of 10 μA from a 1.2 V power supply, and the value of R1 and C1 is set to have a cut- off frequency of 50 KHz. In addition, all components excepting Cac2 are fully integrated into the single chip for the implementation of highly miniaturized WuRx with low cost. In the simulation, the performance of the RFED is evaluated using an AM signal with a modulation index of 0.75, a modulation rate of 50 KHz, and a carrier frequency of 2.4 GHz. As shown in Figure 4, the proposed RFED shows a conversion gain of 16.79 V/V which is 1.7 times higher than that of the conventional RFED. The output voltage of the proposed RFED is approximately 2.8 mV for an −60 dBm input signal.

Figure 4. Simulated conversion gain of the conventional and proposed RFED.

Table 1. Component values of the conventional and proposed RFED.

Type Component Value Component Value Conventional M1 28 μm/0.24 μm L3 6.5 nH RFED M2 90 μm/0.7 μm C1 2 pF

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Electronics 2021, 10, 1078 5 of 12 Figure 3. Proposed LC-CL balun-based Gm-boosting RF envelope detector.

FigureFigure4 4 compares compares the the simulated simulated conversion conversion gain gain of of the the conventional conventional RFED RFED ( Figure (Figure2 ) and2) and proposed proposed RFED RFED (Figure (Figure3). 3). Input Input power power is is scaled scaled in in dB dB and and output output voltage voltage is is on on a a logarithmiclogarithmic scale.scale. The summary of device sizesize andand componentcomponent valuevalue forfor bothboth detectordetector circuitscircuits isis presentedpresented in in Table Table1. 1. Both Both detectors detectors are are designed designed to consumeto consume an identicalan identical current cur- 1 1 ofrent 10 ofµ A10 from μA from a 1.2 a V 1.2 power V power supply, supply, and theand valuethe value of R 1ofand R andC1 is C set is toset have to have a cut-off a cut- ac2 frequencyoff frequency of 50 of KHz. 50 KHz. In addition, In addition, all components all components excepting exceptingCac2 areC fully are fully integrated integrated into theinto single the single chip chip for the for implementationthe implementation of highly of highly miniaturized miniaturized WuRx WuRx with with low low cost. cost. In theIn the simulation, simulation, the the performance performance of of the the RFED RFED is is evaluated evaluated using using an an AM AM signalsignal withwith aa modulationmodulation indexindex ofof 0.75,0.75, aa modulationmodulation raterate ofof 50 KHz, and a carrier frequency of 2.4 GHz. AsAs shownshown inin FigureFigure4 4,, the the proposed proposed RFED RFED shows shows a a conversion conversion gain gain of of 16.79 16.79 V/V V/V which which is is 1.71.7 timestimes higherhigher thanthan thatthat ofof thethe conventionalconventional RFED.RFED. TheThe outputoutput voltagevoltage ofof thethe proposedproposed RFEDRFED isis approximatelyapproximately 2.82.8 mVmV forfor anan −−6060 dBm dBm input input signal. signal.

FigureFigure 4.4. Simulated conversionconversion gaingain ofof thethe conventionalconventional andand proposedproposed RFED.RFED.

TableTable 1.1. ComponentComponent valuesvalues ofof thethe conventionalconventional andand proposedproposed RFED.RFED.

Type Component Component Value Component Value

ConventionalConventional MM11 28 µμm/0.24m/0.24 µμmm LL33 6.5 nHnH RFED MM22 90 µμm/0.7m/0.7 µμmm CC11 22 pFpF R1 1.5 MΩ C2 0.7 pF Rbig 100 kΩ Cac1 5 pF L1 6.5 nH Cac2 1 µF L2 1.3 nH

Proposed M1 28 µm/0.24 µm C1 2 pF RFED M2 90 µm/0.7 µm C2 0.66 pF R1 1.5 MΩ C3 12 pF Rbig 100 kΩ Cac1 5 pF L2 6.5 nH Cac2 1 µF L3 1.2 nH

3. Design of Baseband Amplifier Figure5a shows the schematic of the designed fully differential baseband amplifier. It is based on a single-stage operational transconductance amplifier (OTA) biased in the subthreshold region. It amplifies the differential outputs of RFED and reduces the effect of DC offset caused by the next comparator circuit. The RC (R1 − C1) load provides some OOB rejection characteristic, and the value of R1 and C1 is chosen for a bandwidth greater than 50 KHz. For a low power operation, the tail transistor is biased with as low a current Electronics 2021, 10, x FOR PEER REVIEW 6 of 13

R1 1.5 MΩ C2 0.7 pF Rbig 100 KΩ Cac1 5 pF L1 6.5 nH Cac2 1 μF L2 1.3 nH Proposed M1 28 μm/0.24 μm C1 2 pF RFED M2 90 μm/0.7 μm C2 0.66 pF R1 1.5 MΩ C3 12 pF Rbig 100 KΩ Cac1 5 pF L2 6.5 nH Cac2 1 μF L3 1.2 nH

3. Design of Baseband Amplifier Figure 5a shows the schematic of the designed fully differential baseband amplifier. It is based on a single-stage operational transconductance amplifier (OTA) biased in the subthreshold region. It amplifies the differential outputs of RFED and reduces the effect Electronics 2021, 10, 1078 6 of 12 of DC offset caused by the next comparator circuit. The RC (R1 − C1) load provides some OOB rejection characteristic, and the value of R1 and C1 is chosen for a bandwidth greater than 50 KHz. For a low power operation, the tail transistor is biased with as low a current asas 3 3 μµA.A. As As shown shown in in the the frequency frequency response response of of Figure Figure 55b,b, itit showsshows aa maximummaximum voltagevoltage gaingain of of 13 13 dB dB at at the the center center frequency frequency of of35.5 35.5 KHz KHz and and a 3-dB a 3-dB bandwidth bandwidth of 75 of KHz 75 KHz in the in simulation.the simulation.

(a) (b)

FigureFigure 5. 5. SchematicSchematic and and simulation simulation result result of of designed designed baseband baseband amplifier: amplifier: ( (aa)) schematic schematic and and ( (bb)) frequency frequency response. response.

4.4. Design Design of of Comparator Comparator 44.1..1. Conventional Conventional Hysteresis Hysteresis Comparator Comparator TheThe hysteresis hysteresis characteristic characteristic is required is required to avoid to avoid unstable unstable operation operation by the by large the noise large atnoise the compared at the compared signal. Figure signal. 6 shows Figure the6 shows conventional the conventional hysteresis hysteresiscomparator comparator employing internalemploying positive internal feedback positive to achieve feedback a hyster to achieveesis [14]. a hysteresis The first [stage14]. The is the first PMOS stage differ- is the M M M entialPMOS pair differential with diode-connected pair with diode-connected load transistor load M transistor3 (M6) and lath3 ( transistor6) and lath M transistor4 (M5). Intu-4 itively,(M5). Intuitively, the amount the of amount hysteresis of hysteresis is determ isined determined by the bychannel the channel width width ratio ratiobetween between the diode-connectedthe diode-connected load load transistor transistor and and latch latch transistor transistor because because it itis isdirectly directly related related to to the the amount of feedback by latch transistor. The common source stage M (M ) amplifies the amount of feedback by latch transistor. The common source stage M7 (M88) amplifies the Electronics 2021, 10, x FOR PEER REVIEW 7 of 13 differentialdifferential outputs outputs of of the the first first stage, stage, and and th thee differential differential outputs outputs are are converted converted into into the the single-ended output through the current mirror M and M . single-ended output through the current mirror M99 and M1010.

FigureFigure 6. 6. ConventionalConventional hysteresis hysteresis comparator. comparator.

WhenWhen the the input input signal signal is is higher than the reference voltage byby anan amountamount ofof VVhyshys,, the the outputoutput is is at at logic logic high high “1.” “1”. In contrast, In contrast, the theoutput output is at islogic at logiclow “0” low when “0” whenthe input the signal input is smaller than the reference voltage by a value of Vhys. This relationship can be represented by =+=− VVVVVVVVo'1' if p > n hys and o '0' if p < n hys . (4)

As a result, it is important to calculate the upper trip point (+Vhys) and lower trip point (−Vhys) of the comparator circuit. As the differential voltage heads toward the upper trip point, M1 turns on. Once it reaches the supply current such that ID5 = K ∙ ID6, where K is the channel width ratio between M3 (M6) and M4 (M5), the comparator trips. The process oc- curs in a similar way when there is a transition from “1” to “0.” In summary, the condi- tions for the upper trip point (+Vhys) are given by =+ = = = == IIIIIIIbias D122634 D, D D , D D 0, and IIKI D 1 D 5 D 6 , (5)

where Ibias is the tail current of the input differential pair. Based on Equation (5), the abso- lute value of the upper trip point (+Vhys) and lower trip point (−Vhys) is derived as − KI12bias ||||+=−=VV , (6) hys hys + μ CWL()/ K 1 pox 1,2

where μp is the mobility of input PMOS transistors, Cox is the oxide capacitance, and (W/L) is the ratio between channel width and channel length of input PMOS transistors. The hysteresis window is the difference between these two trip points and can be easily varied by controlling the value of K.

4.2. Proposed Programmable Hysteresis Comparator with Body--Based DC Offset Cancellation Figure 7 shows the proposed programmable hysteresis comparator with body-bias- sing-based DC offset cancellation. In order to vary the hysteresis window of the conven- tional hysteresis comparator of Figure 6, the diode-connected load transistor M3 (M6) and common-source transistor M7 (M8) are constructed with several switched MOSFET branches in parallel, each of which consists of a unit MOSFET in series with a cascode switch. The channel width of unit MOSFET in the switched MOSFET branches is designed to be binary-weighted to vary total channel width linearly adopting the minimum number of branches. The channel length of unit MOSFET in all branches is identical. By digitally

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signal is smaller than the reference voltage by a value of Vhys. This relationship can be represented by

0 0 0 0 Vo = 1 if Vp >Vn + Vhys and Vo = 0 if Vp

As a result, it is important to calculate the upper trip point (+Vhys) and lower trip point (−Vhys) of the comparator circuit. As the differential voltage heads toward the upper trip point, M1 turns on. Once it reaches the supply current such that ID5 = K · ID6, where K is the channel width ratio between M3 (M6) and M4 (M5), the comparator trips. The process occurs in a similar way when there is a transition from “1” to “0”. In summary, the conditions for the upper trip point (+Vhys) are given by

Ibias = ID1 + ID2, ID2 = ID6, ID3 = ID4 = 0, and ID1 = ID5 = KID6, (5)

where Ibias is the tail current of the input differential pair. Based on Equation (5), the absolute value of the upper trip point (+Vhys) and lower trip point (−Vhys) is derived as √ s K − 1 2Ibias | + Vhys| = | − Vhys| = √ , (6) K + 1 µpCox(W/L)1,2

where µp is the mobility of input PMOS transistors, Cox is the oxide capacitance, and (W/L) is the ratio between channel width and channel length of input PMOS transistors. The hysteresis window is the difference between these two trip points and can be easily varied by controlling the value of K.

4.2. Proposed Programmable Hysteresis Comparator with Body-Biasing-Based DC Offset Cancellation Figure7 shows the proposed programmable hysteresis comparator with body-biassing- based DC offset cancellation. In order to vary the hysteresis window of the conven- tional hysteresis comparator of Figure6, the diode-connected load transistor M3 (M6) and common-source transistor M7 (M8) are constructed with several switched MOSFET branches in parallel, each of which consists of a unit MOSFET in series with a cascode Electronics 2021, 10, x FOR PEER REVIEWswitch. The channel width of unit MOSFET in the switched MOSFET branches is designed8 of 13

to be binary-weighted to vary total channel width linearly adopting the minimum number of branches. The channel length of unit MOSFET in all branches is identical. By digitally turningturning on on oror offoff the cascode cascode swit switchch in in each each branch, branch, the the value value of K of, whichK, which is directly is directly re- relatedlated to to the the feedback feedback factor factor by bylatch latch transi transistor,stor, can canbe changed be changed for the for programmable the programmable hys- hysteresisteresis characteristic. characteristic. H<2> H<1> H<0> H<2> H<1> H<0> H<0> H<1> H<2> H<0> H<1> H<2>

FigureFigure 7. 7.Proposed Proposed programmable programmable hysteresis hysteresis comparator comparator withwith body-biasing-basedbody-biasing-based DC DC offset offset cancellation. cancellation.

It is highly required to cancel the DC offset caused by the comparator circuit in order to improve the sensitivity of the wake-up radio. Many offset cancellation techniques, which are based on using pre-amplifiers with input/output offset storage (IOS/OOS) in [15], unbalanced output loads in [16], and auxiliary shunt calibrating transistors at input nodes in [17], have been reported recently. However, the simpler offset cancellation method with extremely low power consumption and small occupied area is highly re- quired for WuRx applications. The work of [18] presented an offset cancellation technique based on a body bias control of the transistor. The offset is sampled and digitalized by the flash analog-to-digital converter (ADC), and the voltage signals generated from the refer- ence digital-to-analog converter (DAC) are injected into the body nodes of the input dif- ferential pair to cancel the DC offset. One of the main drawbacks of this technique is that the voltage biasing is quite sensitive to process, voltage, and temperature (PVT) varia- tions. Two voltage signals traveling along a pair of long conductor lines can cause an ad- ditional DC offset by some mismatches. As shown in the proposed DC offset cancellation technique of Figure 7, the current biasing is employed to control the body bias voltage of a pair of differential input transis- tors. The current generated from the adjustable current source is converted into the volt- age near the body node of the input transistor, and this voltage is directly injected into the body node. The hardware complexity of the proposed scheme is very simple, and it is more robust over PVT variations than the conventional voltage biasing-based technique of [18]. Assuming the input offset voltage is modeled as a voltage source, VOS, in series with the inverting input node of the comparator and the input voltage Vp and Vn are the same, VOS can be expressed as =− − + + =− + = VVVVVVVVVos n sg12 sg p sg 12 sg ( n p ) 22II  DD21−+− (|VV | | |), (7) WWthp21 thp μμCC() () poxLL21 pox

where |Vthp1| and |Vthp2| are the threshold voltage of input transistors M1 and M2. On the other hand, the threshold voltage of PMOS transistor is given by

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It is highly required to cancel the DC offset caused by the comparator circuit in order to improve the sensitivity of the wake-up radio. Many offset cancellation techniques, which are based on using pre-amplifiers with input/output offset storage (IOS/OOS) in [15], unbalanced output loads in [16], and auxiliary shunt calibrating transistors at input nodes in [17], have been reported recently. However, the simpler offset cancellation method with extremely low power consumption and small occupied area is highly required for WuRx applications. The work of [18] presented an offset cancellation technique based on a body bias control of the transistor. The offset is sampled and digitalized by the flash analog-to-digital converter (ADC), and the voltage signals generated from the reference digital-to-analog converter (DAC) are injected into the body nodes of the input differential pair to cancel the DC offset. One of the main drawbacks of this technique is that the voltage biasing is quite sensitive to process, voltage, and temperature (PVT) variations. Two voltage signals traveling along a pair of long conductor lines can cause an additional DC offset by some mismatches. As shown in the proposed DC offset cancellation technique of Figure7, the current biasing is employed to control the body bias voltage of a pair of differential input transistors. The current generated from the adjustable current source is converted into the voltage near the body node of the input transistor, and this voltage is directly injected into the body node. The hardware complexity of the proposed scheme is very simple, and it is more robust over PVT variations than the conventional voltage biasing-based technique of [18]. Assuming the input offset voltage is modeled as a voltage source, VOS, in series with the inverting input node of the comparator and the input voltage Vp and Vn are the same, VOS can be expressed as

Vos = −Vn − Vsg1 + Vsg2 + Vp = −Vsg1 + Vsg2 (∵ Vn = Vp) r r (7) ' 2ID2 − 2ID1 + (|V | − |V |), ( W ) ( W ) thp2 thp1 µpCox L 2 µpCox L 1

where |Vthp1| and |Vthp2| are the threshold voltage of input transistors M1 and M2. On the other hand, the threshold voltage of PMOS transistor is given by q q |Vthp| ' |Vth0,p| + |γ|( 2φf + |Vsb| − 2φf ), (8)

where |Vth0,p| is the threshold voltage at Vsb = 0, φf is the Fermi voltage, and γ is the body-effect coefficient [19]. From (7) and (8), the specific body bias voltages of input transistors can make the exact value of |Vthp2|−|Vthp1| to cancel a given DC offset voltage VOS completely. The programmable hysteresis and offset cancellation characteristics of the proposed comparator are verified through the simulation. Its current consumption is nearly constant for hysteresis characteristics and approximately 2.4 µA from a 1.2 V supply voltage at the initial state without DC offset cancellation. Figure8a shows the simulated programmable hysteresis window through a digital code. As the 3-bit digital code H<2:0> decreases from “111” to “001” in the proposed comparator of Figure7, the hysteresis window becomes wider (2.4 mV~141.6 mV). This is well-matched to the predicted result from Equation (6). Figure8b presents the simulated output voltage ( Vo2) of the comparator according to the variation of calibration current (IB2) when the DC offset voltage VOS ranges from 3 mV to 15 mV with a step size of 2 mV. Both of the calibration current IB1 and IB2 are 125 nA at the initial state, and they are designed to vary from 125 nA to 750 nA with a step size of 125 nA through a digital switch control. It can be seen that the proposed comparator cancels the given DC offset voltage VOS through the adjustment of calibration current (IB2) and the IB2 to make VO2 zero increases when the VOS becomes significant. Electronics 2021, 10, x FOR PEER REVIEW 9 of 13

++−γφ φ ||||||(2||2),VVthp th0, p f V sb f (8)

where |Vth0,p| is the threshold voltage at Vsb = 0, Фf is the Fermi voltage, and γ is the body- effect coefficient [19]. From (7) and (8), the specific body bias voltages of input transistors can make the exact value of |Vthp2|−|Vthp1| to cancel a given DC offset voltage VOS completely. The programmable hysteresis and offset cancellation characteristics of the proposed comparator are verified through the simulation. Its current consumption is nearly con- stant for hysteresis characteristics and approximately 2.4 μA from a 1.2 V supply voltage at the initial state without DC offset cancellation. Figure 8a shows the simulated program- mable hysteresis window through a digital code. As the 3-bit digital code H<2:0> de- creases from “111” to “001” in the proposed comparator of Figure 7, the hysteresis win- dow becomes wider (2.4 mV~141.6 mV). This is well-matched to the predicted result from Equation (6). Figure 8b presents the simulated output voltage (Vo2) of the comparator ac- cording to the variation of calibration current (IB2) when the DC offset voltage VOS ranges from 3 mV to 15 mV with a step size of 2 mV. Both of the calibration current IB1 and IB2 are 125 nA at the initial state, and they are designed to vary from 125 nA to 750 nA with a step size of 125 nA through a digital switch control. It can be seen that the proposed com- Electronics 2021, 10, 1078 9 of 12 parator cancels the given DC offset voltage VOS through the adjustment of calibration cur- rent (IB2) and the IB2 to make VO2 zero increases when the VOS becomes significant.

(a) (b)

Figure 8. ((a)) Simulated Simulated programmable hysteresis windowwindow throughthrough aa digitaldigital code;code; ((bb)) simulatedsimulated outputoutput voltagevoltage ((VVoo22) of the comparator according to the variation of calibration current (IB2). comparator according to the variation of calibration current (IB2).

5.5. Post Post Layout Layout Simulation Results of Proposed RF-to-DC Conversion Circuit forfor WuRx WuRxThe proposed high efficiency RF-to-DC conversion circuit for 2.4 GHz WuRx applica- tionsThe was proposed designed high and simulatedefficiency inRF-to-DC Cadence/Spectre conversion environment circuit for 2.4 using GHz a 65-nmWuRx CMOSappli- cationsprocess. was Figure designed9 shows and the simulated layout photograph in Cadence/Spectre of the designed environment circuit. using It occupies a 65-nm an CMOSactive areaprocess. of 500 Figure× 840 9 showsµm2. Allthe inputlayout matchingphotograph components of the designed including circuit. inductors It occupies are anfully active integrated area of into 500 the× 840 single μm2 chip. All forinput the matching implementation components of highly including miniaturized inductors WuRx are fullywith integrated low cost. The into power the single consumption chip for the of theimplementation proposed WuRx of highly is 22 µ miniaturizedW at a 1.2 V powerWuRx withsupply low voltage. cost. The In orderpower to consumption enhance the accuracyof the proposed of the simulation, WuRx is 22 the μ commercialW at a 1.2 V processpower supplydesign kitvoltage. (PDK) In having order highto enhance accuracy the modeling accuracy was of the used simulation, and the post the layoutcommercial simulation pro- cessremoving design some kit (PDK) errors having caused hi bygh parasitic accuracy resistance modeling and was capacitance used and the was post proceeded. layout sim- Be- ulationcause the removing input matching some errors network caused is integrated by parasitic into resistance the chip andand allcapacitance circuit components was pro- ceeded.excepting Because a by-pass the capacitor input matchingCac2 of the network proposed is integrated RF envelope into detector the chip are and PDK all elements, circuit Electronics 2021, 10, x FOR PEER REVIEW 10 of 13 componentsit is expected excepting that the magnitude a by-pass ofcapacitor error between Cac2 of thethe simulationproposed RF and envelope measurement detector results are PDKis quite elements, small. it is expected that the magnitude of error between the simulation and measurement results is quite small.

FigureFigure 9. 9. LayoutLayout photograph photograph of of the the designed designed circuit. circuit.

Figure 10 shows the post layout simulated input reflection coefficient (S11) of the Figure 10 shows the post layout simulated input reflection coefficient (S11) of the pro- proposed WuRx. The S11 of the proposed WuRx is less than −15 dB at 2.4 GHz. Figure 11 posed WuRx. The S11 of the proposed WuRx is less than −15 dB at 2.4 GHz. Figure 11 presents the post layout simulated voltage waveforms of the input node of WuRx and presents the post layout simulated voltage waveforms of the input node of WuRx and output node of RFED, baseband amplifier, and comparator. In the simulation, an AM output node of RFED, baseband amplifier, and comparator. In the simulation, an AM modulated signal with a modulation index of 0.75, a modulation rate of 50 kHz, a carrier frequency of 2.4 GHz, and an input power of −60 dBm is applied to the input of WuRx. When the power of the AM modulated input signal is −60 dBm, the of the en- velope signal at the input node of WuRx is about 0.8 mVpp. The RFED down-converts it into the baseband frequency and generates the envelope signal with the amplitude of 14 mVpp. The baseband amplifier amplifies the output of RFED with about 13 dB voltage gain, and the envelope signal with the amplitude of 67 mVpp is injected into the compara- tor circuit. The last stage of the comparator generates the final output bit pattern. Based on the requirement of the duty cycle for the common ASK demodulators ranging from 40% to 60%, the proposed WuRx achieves a sensitivity of −64.5 dBm for a square-wave bit pat- tern with 45%~55% duty cycle in the post layout simulation.

Figure 10. Post layout simulated input reflection coefficient (S11) of the proposed WuRx.

Electronics 2021, 10, x FOR PEER REVIEW 10 of 13

Figure 9. Layout photograph of the designed circuit.

Electronics 2021, 10, 1078 Figure 10 shows the post layout simulated input reflection coefficient (S11) of the pro-10 of 12 posed WuRx. The S11 of the proposed WuRx is less than −15 dB at 2.4 GHz. Figure 11 presents the post layout simulated voltage waveforms of the input node of WuRx and output node of RFED, baseband amplifier, and comparator. In the simulation, an AM modulated signal signal with with a amodulation modulation index index of of0.75, 0.75, a modulation a modulation rate rate of 50 of kHz, 50 kHz, a carrier a carrier frequency of of 2.4 2.4 GHz, GHz, and and an an input input power power of of−60− dBm60 dBm is applied is applied to the to input the input of WuRx. of WuRx. When the the power power of of the the AM AM modulated modulated input input signal signal is −60 is dBm,−60 dBm,the amplitude the amplitude of the en- of the envelopevelope signal signal at the at theinput input node node of WuRx of WuRx is about is about 0.8 mV 0.8pp mV. Thepp .RFED The RFED down-converts down-converts it itinto into the the baseband baseband frequency frequency and andgenerates generates the envelope the envelope signal signal with the with amplitude the amplitude of 14 of 14mV mVpp. ppThe. The baseband baseband amplifier amplifier amplifies amplifies the outp the outputut of RFED of RFED with with about about 13 dB 13 voltage dB voltage gain, and the envelope envelope signal signal with with the the amplitude amplitude of of 67 67 mV mVpppp is isinjected injected into into the the compara- comparator circuit.tor circuit. The The last last stage stage of theof the comparator comparator generates generates the the final final output output bit bit pattern. pattern. Based Based on the requirementon the requirement of the of duty the duty cycle cycle for thefor commonthe common ASK ASK demodulators demodulators ranging ranging from from 40%40% to 60%,to 60%, the the proposed proposed WuRx WuRx achieves achieves a a sensitivity sensitivity of of− −64.5 dBm for for a a square-wave square-wave bit bit pat- pattern withtern with 45%~55% 45%~55% duty duty cycle cycle in thein the post post layout layout simulation. simulation.

Electronics 2021, 10, x FOR PEER REVIEW 11 of 13

11 Figure 10. 10. PostPost layout layout simulated simulated input input reflection reflection coefficient coefficient (S ()S of11 )the of proposed the proposed WuRx. WuRx.

Figure 11. Post layout simulated voltage waveforms of input node of WuRx WuRx and output output node node of of RFED, RFED, baseband baseband amplifier, amplifier, andand comparator.comparator.

In Table 2 2,, the the post post layout layout simulationsimulation resultsresults ofof thethe proposedproposed WuRx WuRx are are summarized summarized and compared toto thethe traditionaltraditional 2.4 2.4 GHz GHz WuRx WuRx circuits. circuits. One One reference reference work work of [of20 ][20] report- re- porting the simulation results is added in the comparison table. This reference is a touch- stone that evaluates the performance of the proposed work because it is designed using the same process technology. Despite of adopting the fully integrated on-chip passive ele- ments for the input matching network, it shows better sensitivity performance while con- suming a similar current consumption due to the LC-CL balun-based Gm-boosting tech- nique of RFED and body-biasing-based DC offset cancellation technique of programmable hysteresis comparator. In addition, the proposed WuRx adopting a single-ended RFED can reduce the cost and PCB size by eliminating an external compared to the traditional WuRx circuits with a differential RFED.

Table 2. Performance summary and comparison with the traditional 2.4 GHz WuRx circuits.

Parameters 1 [12] 2 [20] 1 [21] 1 [22] 3This Work Carrier Frequency 2.4 2.4 2.4 2.4 2.4 (GHz) Modulation Rate 100 2000 100 2.5 50 (kHz) Sensitivity −65 −60 −50 −61.5 −65.4 (dBm) Off-chip Matching Yes No Yes 4No No Components (?) Differential or Differential Single-ended Differential Single-ended Single-ended Single-ended Power Consump- 10 22 4.5 0.365 22 tion (μW) Supply Voltage (V) 0.5 1 0.8 0.8 1.2 CMOS Technology 180 nm 65 nm 180 nm 65 nm 65 nm 1 Measurement results, 2 simulation results, 3 post layout simulation results, 4 rectifier-antenna co- design.

6. Conclusions

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ing the simulation results is added in the comparison table. This reference is a touchstone that evaluates the performance of the proposed work because it is designed using the same process technology. Despite of adopting the fully integrated on-chip passive elements for the input matching network, it shows better sensitivity performance while consuming a similar current consumption due to the LC-CL balun-based Gm-boosting technique of RFED and body-biasing-based DC offset cancellation technique of programmable hystere- sis comparator. In addition, the proposed WuRx adopting a single-ended RFED can reduce the cost and PCB size by eliminating an external transformer compared to the traditional WuRx circuits with a differential RFED.

Table 2. Performance summary and comparison with the traditional 2.4 GHz WuRx circuits.

Parameters 1 [12] 2 [20] 1 [21] 1 [22] 3 This Work Carrier Frequency 2.4 2.4 2.4 2.4 2.4 (GHz) Modulation Rate 100 2000 100 2.5 50 (kHz) Sensitivity −65 −60 −50 −61.5 −65.4 (dBm) Off-chip Matching Yes No Yes 4 No No Components (?) Differential or Differential Single-ended Differential Single-ended Single-ended Single-ended Power Consumption (µW) 10 22 4.5 0.365 22 Supply Voltage (V) 0.5 1 0.8 0.8 1.2 CMOS Technology 180 nm 65 nm 180 nm 65 nm 65 nm 1 Measurement results, 2 simulation results, 3 post layout simulation results, 4 rectifier-antenna co-design.

6. Conclusions The high efficiency RF-to-DC conversion circuit composed of an LC-CL balun-based Gm-boosting RFED, a low noise baseband amplifier, and an offset canceled latch com- parator is implemented using a 65-nm CMOS process technology for low power WuRx applications. It provides a new way to increase the conversion gain of RFED and improve the sensitivity by doubling the transconductance of the input transistor without additional power consumption. The programmable hysteresis makes it flexible for the comparator to cover different noise conditions. The offset cancellation scheme, which is implemented without complex circuitry, helps to mitigate the offset due to mismatch error. Taking ad- vantage of technology scaling, the implemented system has become a significant potential solution for many WuRx and wireless communication systems.

Author Contributions: Conceptualization, T.T.P., J.L., and D.I.; investigation, T.T.P., D.K., S.-H.J., J.L., and D.I.; supervision, J.L. and D.I.; writing—original draft, T.T.P. and D.I. All authors have read and agreed to the published version of the manuscript. Funding: This research was funded by Institute for Information and Communications Technology Promotion (IITP) grant funded by the Korea Government (MSIT) (No. 2018-0-01461) and Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (2018R1A2B6008816). Acknowledgments: This work was supported by Institute for Information and Communications Technology Promotion (IITP) grant funded by the Korea Government (MSIT) (No. 2018-0-01461) and Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (2018R1A2B6008816). The CAD tool was supported by IDEC. Conflicts of Interest: The authors declare no conflict of interest. Electronics 2021, 10, 1078 12 of 12

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