Simple Cubic Lattice

Total Page:16

File Type:pdf, Size:1020Kb

Simple Cubic Lattice Chem 253, UC, Berkeley What we will see in XRD of simple cubic, BCC, FCC? Position Intensity Chem 253, UC, Berkeley Structure Factor: adds up all scattered X-ray from each lattice points in crystal n iKd j Sk e j1 K ha kb lc d j x a y b z c 2 I(hkl) Sk 1 Chem 253, UC, Berkeley X-ray scattered from each primitive cell interfere constructively when: eiKR 1 2d sin n For n-atom basis: sum up the X-ray scattered from the whole basis Chem 253, UC, Berkeley ' k d k d di R j ' K k k Phase difference: K (di d j ) The amplitude of the two rays differ: eiK(di d j ) 2 Chem 253, UC, Berkeley The amplitude of the rays scattered at d1, d2, d3…. are in the ratios : eiKd j The net ray scattered by the entire cell: n iKd j Sk e j1 2 I(hkl) Sk Chem 253, UC, Berkeley For simple cubic: (0,0,0) iK0 Sk e 1 3 Chem 253, UC, Berkeley For BCC: (0,0,0), (1/2, ½, ½)…. Two point basis 1 2 iK ( x y z ) iKd j iK0 2 Sk e e e j1 1 ei (hk l) 1 (1)hkl S=2, when h+k+l even S=0, when h+k+l odd, systematical absence Chem 253, UC, Berkeley For BCC: (0,0,0), (1/2, ½, ½)…. Two point basis S=2, when h+k+l even S=0, when h+k+l odd, systematical absence (100): destructive (200): constructive 4 Chem 253, UC, Berkeley Observable diffraction peaks h2 k 2 l 2 Ratio SC: 1,2,3,4,5,6,8,9,10,11,12.. Simple cubic BCC: 2,4,6,8,10, 12…. FCC: 3,4,8,11,12,16,19, 24…. a dhkl h2 k 2 l 2 2d sin n Chem 253, UC, Berkeley FCC S=4 when h+k, k+l, h+l all even (h,k, l all even/odd) S=0, otherwise i (hk ) i (hl) i (lk ) Sk 1 e e e 5 Chem 253, UC, Berkeley Observable diffraction peaks h2 k 2 l 2 Ratio SC: 1,2,3,4,5,6,8,9,10,11,12.. Simple BCC: 2,4,6,8,10, 12, 14…. cubic (1,2,3,4,5,6,7…) FCC: 3,4,8,11,12,16,19, 24…. a dhkl h2 k 2 l 2 2d sin n Chem 253, UC, Berkeley Observable diffraction peaks h2 k 2 l 2 Ratio a d hkl 2 2 2 SC: 1,2,3,4,5,6,8,9,10,11,12.. h k l BCC: 2,4,6,8,10, 12, 14…. (1,2,3,4,5,6,7…) 2d sin n FCC: 3,4,8,11,12,16, 19, 24…. 2 sin 2 (h2 k 2 l 2 ) 4a2 6 Chem 253, UC, Berkeley What we will see in XRD of simple cubic, BCC, FCC? 2 sin A 2 0.5 (BCC); 0.75 (FCC) sin B a dhkl h2 k 2 l 2 Chem 253, UC, Berkeley Ex: An element, BCC or FCC, shows diffraction peaks at 2: 40, 58, 73, 86.8,100.4 and 114.7. Determine:(a) Crystal structure?(b) Lattice constant? (c) What is the element? 2theta thetasin 2 h2 k 2 l 2 (hkl) 40 20 0.117 1 (110) 58 29 0.235 2 (200) 73 36.5 0.3538 3 (211) 86.8 43.4 0.4721 4 (220) 100.4 50.2 0.5903 5 (310) 114.7 57.35 0.7090 6 (222) a =3.18 Å, BCC, W 7 Chem 253, UC, Berkeley Reading : West Chapter 5 Polyatomic Structures n K ha kb lc S f (k)ei Kd j k j j1 d j x a y b z c fj: atomic scattering factor No. of electrons n n iKd j 2i(hxkylz) Sk f je f je j1 j1 Chem 253, UC, Berkeley Simple Cubic Lattice Caesium Chloride (CsCl) is primitive cubic Cs (0,0,0) Cl (1/2,1/2,1/2) i (hkl) Sk fCs fCle What about CsI? 8 Chem 253, UC, Berkeley (hkl) CsCl CsI (100) (110) (111) (200) (210) (211) (220) (221) (300) (310) (311) Chem 253, UC, Berkeley FCC Lattices Sodium Chloride (NaCl) Na: (0,0,0)(0,1/2,1/2)(1/2,0,1/2)(1/2,1/2,0) Add (1/2,1/2,1/2) Cl: (1/2,1/2,1/2) (1/2,0,0)(0,1/2,0)(0,0,1/2) 9 Chem 253, UC, Berkeley i (hk l) i (hk ) i (hl) i (lk ) Sk [ f Na fCle ][1 e e e ] S=4 (fNa +fCl) when h, k, l, all even; S=4(fNa-fCl) when h, k, l all odd S=0, otherwise Chem 253, UC, Berkeley (hkl) NaCl KCl (100) (110) (111) (200) (210) (211) (220) (221) (300) (310) (311) 10 Chem 253, UC, Berkeley Chem 253, UC, Berkeley Diamond Lattice 11 Chem 253, UC, Berkeley i (hk ) i (hl) i (lk ) S fcc 1 e e e FCC: Diamond Lattice S=4 when h+k, k+l, h+l all even (h,k, l all even/odd) SSi(hkl)=Sfcc(hkl)[1+exp(i/2)(h+k+l)]. S=0, otherwise SSi(hkl) will be zero if the sum (h+k+l) is equal to 2 times an odd integer, such as (200), (222). [h+k+l=2(2n+1)] SSi(hkl) will be non-zero if (1)(h,k,l) contains only even numbers and (2) the sum (h+k+l) is equal to 4 times an integer. [h+k+l=4n] Shkl will be non-zero if h,k, l all odd: 4( fsi ifsi ) Chem 253, UC, Berkeley Silicon Diffraction pattern 12 Chem 253, UC, Berkeley Chem 253, UC, Berkeley 13 Chem 253, UC, Berkeley Chem 253, UC, Berkeley Bond charges in covalent solid (1/8,1/8,1/8), (3/8,3/8,1/8),(1/8,3/8,3/8) and (3/8,1/8,3/8). Bond charges form a "crystal" with a fcc lattice with 4 "atoms" per unit cell. origin : (1/8,1/8,1/8). Bond charge position: (0,0,0), (1/4,1/4,0),(0,1/4,1/4) and (1/4,0,1/4). Sbond-charge(hkl) = Sfcc(hkl)[1+exp(i/2)(h+k)+exp(i/2)(k+l)+exp(i/2)(h+l)]. For h=k=l=2: Sbond-charge(222)=Sfcc(222)[1+3exp(i/2)4]=4Sfcc(222) non-zero! n n iKd j 2i(hxkylz) Sk f je f je j1 j1 14 Chem 253, UC, Berkeley Nanocrystal X-ray Diffraction Chem 253, UC, Berkeley Finite Size Effect 15 Chem 253, UC, Berkeley Bragg angle: B in phase, constructive For 1 B 1 2 Phase lag between two planes: 3 4 j-1 j At j+1 th plane: j+1 Phase lag: j 2j-1 2 2j 2j planes: net diffraction at 1 :0 Chem 253, UC, Berkeley Bragg angle: B in phase, constructive For 2 B 1 2 Phase lag between two planes: 3 4 5 j-1 At j+1 th plane: j j+1 Phase lag: j 2j-1 2 2j 2j planes: net diffraction at 2 :0 16 Chem 253, UC, Berkeley How particle size influence the peak width of the diffraction beam. Full width half maximum (FWHM) Chem 253, UC, Berkeley 17 Chem 253, UC, Berkeley The width of the diffraction peak is governed by # of crystal planes 2j. i.e. crystal thickness/size Scherrer Formula: 0.9 t B2 B2 B2 B cosB M S BM: Measured peak width at half peak intensity (in radians) BS: Corresponding width for standard bulk materials (large grain size >200 nm) Readily applied for crystal size of 5-50 nm. Chem 253, UC, Berkeley • Suppose =1.5 Å, d=1.0 Å, and =49°. Then for a crystal 1mmindiameter, the breath B, due to the small crystal effect alone, would be about 2x10-7 radian (10-5 degree), or too small to be observable. Such a crystal would contain some 107 parallel lattice planes of the spacing assumed above. • However, if the crystal were only 500 Å thick,itwould contain only 500 planes, and the diffraction curve would be relatively broad, namely about 4x10-3 radian (0.2°), which is easily measurable. 18.
Recommended publications
  • Classical and Modern Diffraction Theory
    Downloaded from http://pubs.geoscienceworld.org/books/book/chapter-pdf/3701993/frontmatter.pdf by guest on 29 September 2021 Classical and Modern Diffraction Theory Edited by Kamill Klem-Musatov Henning C. Hoeber Tijmen Jan Moser Michael A. Pelissier SEG Geophysics Reprint Series No. 29 Sergey Fomel, managing editor Evgeny Landa, volume editor Downloaded from http://pubs.geoscienceworld.org/books/book/chapter-pdf/3701993/frontmatter.pdf by guest on 29 September 2021 Society of Exploration Geophysicists 8801 S. Yale, Ste. 500 Tulsa, OK 74137-3575 U.S.A. # 2016 by Society of Exploration Geophysicists All rights reserved. This book or parts hereof may not be reproduced in any form without permission in writing from the publisher. Published 2016 Printed in the United States of America ISBN 978-1-931830-00-6 (Series) ISBN 978-1-56080-322-5 (Volume) Library of Congress Control Number: 2015951229 Downloaded from http://pubs.geoscienceworld.org/books/book/chapter-pdf/3701993/frontmatter.pdf by guest on 29 September 2021 Dedication We dedicate this volume to the memory Dr. Kamill Klem-Musatov. In reading this volume, you will find that the history of diffraction We worked with Kamill over a period of several years to compile theory was filled with many controversies and feuds as new theories this volume. This volume was virtually ready for publication when came to displace or revise previous ones. Kamill Klem-Musatov’s Kamill passed away. He is greatly missed. new theory also met opposition; he paid a great personal price in Kamill’s role in Classical and Modern Diffraction Theory goes putting forth his theory for the seismic diffraction forward problem.
    [Show full text]
  • Intensity of Double-Slit Pattern • Three Or More Slits
    • Intensity of double-slit pattern • Three or more slits Practice: Chapter 37, problems 13, 14, 17, 19, 21 Screen at ∞ θ d Path difference Δr = d sin θ zero intensity at d sinθ = (m ± ½ ) λ, m = 0, ± 1, ± 2, … max. intensity at d sinθ = m λ, m = 0, ± 1, ± 2, … 1 Questions: -what is the intensity of the double-slit pattern at an arbitrary position? -What about three slits? four? five? Find the intensity of the double-slit interference pattern as a function of position on the screen. Two waves: E1 = E0 sin(ωt) E2 = E0 sin(ωt + φ) where φ =2π (d sin θ )/λ , and θ gives the position. Steps: Find resultant amplitude, ER ; then intensities obey where I0 is the intensity of each individual wave. 2 Trigonometry: sin a + sin b = 2 cos [(a-b)/2] sin [(a+b)/2] E1 + E2 = E0 [sin(ωt) + sin(ωt + φ)] = 2 E0 cos (φ / 2) cos (ωt + φ / 2)] Resultant amplitude ER = 2 E0 cos (φ / 2) Resultant intensity, (a function of position θ on the screen) I position - fringes are wide, with fuzzy edges - equally spaced (in sin θ) - equal brightness (but we have ignored diffraction) 3 With only one slit open, the intensity in the centre of the screen is 100 W/m 2. With both (identical) slits open together, the intensity at locations of constructive interference will be a) zero b) 100 W/m2 c) 200 W/m2 d) 400 W/m2 How does this compare with shining two laser pointers on the same spot? θ θ sin d = d Δr1 d θ sin d = 2d θ Δr2 sin = 3d Δr3 Total, 4 The total field is where φ = 2π (d sinθ )/λ •When d sinθ = 0, λ , 2λ, ..
    [Show full text]
  • Light and Matter Diffraction from the Unified Viewpoint of Feynman's
    European J of Physics Education Volume 8 Issue 2 1309-7202 Arlego & Fanaro Light and Matter Diffraction from the Unified Viewpoint of Feynman’s Sum of All Paths Marcelo Arlego* Maria de los Angeles Fanaro** Universidad Nacional del Centro de la Provincia de Buenos Aires CONICET, Argentine *[email protected] **[email protected] (Received: 05.04.2018, Accepted: 22.05.2017) Abstract In this work, we present a pedagogical strategy to describe the diffraction phenomenon based on a didactic adaptation of the Feynman’s path integrals method, which uses only high school mathematics. The advantage of our approach is that it allows to describe the diffraction in a fully quantum context, where superposition and probabilistic aspects emerge naturally. Our method is based on a time-independent formulation, which allows modelling the phenomenon in geometric terms and trajectories in real space, which is an advantage from the didactic point of view. A distinctive aspect of our work is the description of the series of transformations and didactic transpositions of the fundamental equations that give rise to a common quantum framework for light and matter. This is something that is usually masked by the common use, and that to our knowledge has not been emphasized enough in a unified way. Finally, the role of the superposition of non-classical paths and their didactic potential are briefly mentioned. Keywords: quantum mechanics, light and matter diffraction, Feynman’s Sum of all Paths, high education INTRODUCTION This work promotes the teaching of quantum mechanics at the basic level of secondary school, where the students have not the necessary mathematics to deal with canonical models that uses Schrodinger equation.
    [Show full text]
  • Structure Factors Again
    Structure factors again • Remember 1D, structure factor for order h 1 –Fh = |Fh|exp[iαh] = I0 ρ(x)exp[2πihx]dx – Where x is fractional position along “unit cell” distance (repeating distance, origin arbitrary) • As if scattering was coming from a single “center of gravity” scattering point • Presence of “h” in equation means that structure factors of different orders have different phases • Note that exp[2πihx]dx looks (and behaves) like a frequency, but it’s not (dx has to do with unit cell, and the sum gives the phase Back and Forth • Fourier sez – For any function f(x), there is a “transform” of it which is –F(h) = Ûf(x)exp(2pi(hx))dx – Where h is reciprocal of x (1/x) – Structure factors look like that • And it works backward –f(x) = ÛF(h)exp(-2pi(hx))dh – Or, if h comes only in discrete points –f(x) = SF(h)exp(-2pi(hx)) Structure factors, cont'd • Structure factors are a "Fourier transform" - a sum of components • Fourier transforms are reversible – From summing distribution of ρ(x), get hth order of diffraction – From summing hth orders of diffraction, get back ρ(x) = Σ Fh exp[-2πihx] Two dimensional scattering • In Frauenhofer diffraction (1D), we considered scattering from points, along the line • In 2D diffraction, scattering would occur from lines. • Numbering of the lines by where they cut the edges of a unit cell • Atom density in various lines can differ • Reflections now from planes Extension to 3D – Planes defined by extension from 2D case – Unit cells differ • Depends on arrangement of materials in 3D lattice • = "Space
    [Show full text]
  • System Design and Verification of the Precession Electron Diffraction Technique
    NORTHWESTERN UNIVERSITY System Design and Verification of the Precession Electron Diffraction Technique A DISSERTATION SUBMITTED TO THE GRADUATE SCHOOL IN PARTIAL FULFILLMENT OF THE REQUIREMENTS for the degree DOCTOR OF PHILOSOPHY Field of Materials Science and Engineering By Christopher Su-Yan Own EVANSTON, ILLINOIS First published on the WWW 01, August 2005 Build 05.12.07. PDF available for download at: http://www.numis.northwestern.edu/Research/Current/precession.shtml c Copyright by Christopher Su-Yan Own 2005 All Rights Reserved ii ABSTRACT System Design and Verification of the Precession Electron Diffraction Technique Christopher Su-Yan Own Bulk structural crystallography is generally a two-part process wherein a rough starting structure model is first derived, then later refined to give an accurate model of the structure. The critical step is the deter- mination of the initial model. As materials problems decrease in length scale, the electron microscope has proven to be a versatile and effective tool for studying many problems. However, study of complex bulk structures by electron diffraction has been hindered by the problem of dynamical diffraction. This phenomenon makes bulk electron diffraction very sensitive to specimen thickness, and expensive equip- ment such as aberration-corrected scanning transmission microscopes or elaborate methodology such as high resolution imaging combined with diffraction and simulation are often required to generate good starting structures. The precession electron diffraction technique (PED), which has the ability to significantly reduce dynamical effects in diffraction patterns, has shown promise as being a “philosopher’s stone” for bulk electron diffraction. However, a comprehensive understanding of its abilities and limitations is necessary before it can be put into widespread use as a standalone technique.
    [Show full text]
  • Lecture Notes
    Solid State Physics PHYS 40352 by Mike Godfrey Spring 2012 Last changed on May 22, 2017 ii Contents Preface v 1 Crystal structure 1 1.1 Lattice and basis . .1 1.1.1 Unit cells . .2 1.1.2 Crystal symmetry . .3 1.1.3 Two-dimensional lattices . .4 1.1.4 Three-dimensional lattices . .7 1.1.5 Some cubic crystal structures ................................ 10 1.2 X-ray crystallography . 11 1.2.1 Diffraction by a crystal . 11 1.2.2 The reciprocal lattice . 12 1.2.3 Reciprocal lattice vectors and lattice planes . 13 1.2.4 The Bragg construction . 14 1.2.5 Structure factor . 15 1.2.6 Further geometry of diffraction . 17 2 Electrons in crystals 19 2.1 Summary of free-electron theory, etc. 19 2.2 Electrons in a periodic potential . 19 2.2.1 Bloch’s theorem . 19 2.2.2 Brillouin zones . 21 2.2.3 Schrodinger’s¨ equation in k-space . 22 2.2.4 Weak periodic potential: Nearly-free electrons . 23 2.2.5 Metals and insulators . 25 2.2.6 Band overlap in a nearly-free-electron divalent metal . 26 2.2.7 Tight-binding method . 29 2.3 Semiclassical dynamics of Bloch electrons . 32 2.3.1 Electron velocities . 33 2.3.2 Motion in an applied field . 33 2.3.3 Effective mass of an electron . 34 2.4 Free-electron bands and crystal structure . 35 2.4.1 Construction of the reciprocal lattice for FCC . 35 2.4.2 Group IV elements: Jones theory . 36 2.4.3 Binding energy of metals .
    [Show full text]
  • Form and Structure Factors: Modeling and Interactions Jan Skov Pedersen, Department of Chemistry and Inano Center University of Aarhus Denmark SAXS Lab
    Form and Structure Factors: Modeling and Interactions Jan Skov Pedersen, Department of Chemistry and iNANO Center University of Aarhus Denmark SAXS lab 1 Outline • Model fitting and least-squares methods • Available form factors ex: sphere, ellipsoid, cylinder, spherical subunits… ex: polymer chain • Monte Carlo integration for form factors of complex structures • Monte Carlo simulations for form factors of polymer models • Concentration effects and structure factors Zimm approach Spherical particles Elongated particles (approximations) Polymers 2 Motivation - not to replace shape reconstruction and crystal-structure based modeling – we use the methods extensively - alternative approaches to reduce the number of degrees of freedom in SAS data structural analysis (might make you aware of the limited information content of your data !!!) - provide polymer-theory based modeling of flexible chains - describe and correct for concentration effects 3 Literature Jan Skov Pedersen, Analysis of Small-Angle Scattering Data from Colloids and Polymer Solutions: Modeling and Least-squares Fitting (1997). Adv. Colloid Interface Sci. , 70 , 171-210. Jan Skov Pedersen Monte Carlo Simulation Techniques Applied in the Analysis of Small-Angle Scattering Data from Colloids and Polymer Systems in Neutrons, X-Rays and Light P. Lindner and Th. Zemb (Editors) 2002 Elsevier Science B.V. p. 381 Jan Skov Pedersen Modelling of Small-Angle Scattering Data from Colloids and Polymer Systems in Neutrons, X-Rays and Light P. Lindner and Th. Zemb (Editors) 2002 Elsevier
    [Show full text]
  • A STUDY of the BINARY SYSTEM Na-Cs
    C oo|p ef A STUDY OF THE BINARY SYSTEM Na-Cs BY L. M. COOPER THESIS FOR THE DEGREE OF BACHELOR OF SCIENCE IN CHEMICAL ENGINEERING COLLEGE OF LIBERAL ARTS AND SCIENCES UNIVERSITY OF ILLINOIS 1917 1*3 »T UNIVERSITY OF ILLINOIS .Maz..25. i^ilr. THIS IS TO CERTIFY THAT THE THESIS PREPARED UNDER MY SUPERVISION BY LiiOU...M...,..C.O,Qm T3E.. BINARY.. ENTITLED A... SI.UM.. .PI.. S^^^^^ THE IS APPROVED BY ME AS FULFILLING THIS PART OF THE REQUIREMENTS FOR DEGREE OF., BA.GHELOR...Qii...S.C.IM.C.E. Instructor in Charge Approved : HEAD OF DEPARTMENT OF. 3 UHJC -13- IX TABLE OF CONTENTS Page I Introduction 1 II Source and purification of materials 2 III Method 6 IV Table 7 V Temperature-concentration diagram of the binary system Na-Gs 8 VI Discussion of diagram 9 VII Conclusions 11 VIII Bibliography 12 IX Table of Contents 13 X Acknowledgement 14 Digitized by the Internet Archive in 2013 http://archive.org/details/studyofbinarysysOOcoop . I INTRODUCTION Systems of two alkali metals have been little studied. Lithium in its alloy forming properties resembles magnesium rather than sodium, and its behavior is in some respects anom- alous. Molten lithium is hardly miscible with sodium or potas- (1) sium. Sodium forms a single compound NaoK, with potassium, (3) but this compound dissociates below its melting point. It is probable that both lithium and sodium would prove, on investi- gation, to form compounds with rubidium and caesium, but that the metals of the potassium sub-group would not combine with one another In the second sub-group, copper, silver, and gold alloy together, forming solid solutions either completely or to a limited extent.
    [Show full text]
  • The Path Integral Approach to Quantum Mechanics Lecture Notes for Quantum Mechanics IV
    The Path Integral approach to Quantum Mechanics Lecture Notes for Quantum Mechanics IV Riccardo Rattazzi May 25, 2009 2 Contents 1 The path integral formalism 5 1.1 Introducingthepathintegrals. 5 1.1.1 Thedoubleslitexperiment . 5 1.1.2 An intuitive approach to the path integral formalism . .. 6 1.1.3 Thepathintegralformulation. 8 1.1.4 From the Schr¨oedinger approach to the path integral . .. 12 1.2 Thepropertiesofthepathintegrals . 14 1.2.1 Pathintegralsandstateevolution . 14 1.2.2 The path integral computation for a free particle . 17 1.3 Pathintegralsasdeterminants . 19 1.3.1 Gaussianintegrals . 19 1.3.2 GaussianPathIntegrals . 20 1.3.3 O(ℏ) corrections to Gaussian approximation . 22 1.3.4 Quadratic lagrangians and the harmonic oscillator . .. 23 1.4 Operatormatrixelements . 27 1.4.1 Thetime-orderedproductofoperators . 27 2 Functional and Euclidean methods 31 2.1 Functionalmethod .......................... 31 2.2 EuclideanPathIntegral . 32 2.2.1 Statisticalmechanics. 34 2.3 Perturbationtheory . .. .. .. .. .. .. .. .. .. .. 35 2.3.1 Euclidean n-pointcorrelators . 35 2.3.2 Thermal n-pointcorrelators. 36 2.3.3 Euclidean correlators by functional derivatives . ... 38 0 0 2.3.4 Computing KE[J] and Z [J] ................ 39 2.3.5 Free n-pointcorrelators . 41 2.3.6 The anharmonic oscillator and Feynman diagrams . 43 3 The semiclassical approximation 49 3.1 Thesemiclassicalpropagator . 50 3.1.1 VanVleck-Pauli-Morette formula . 54 3.1.2 MathematicalAppendix1 . 56 3.1.3 MathematicalAppendix2 . 56 3.2 Thefixedenergypropagator. 57 3.2.1 General properties of the fixed energy propagator . 57 3.2.2 Semiclassical computation of K(E)............. 61 3.2.3 Two applications: reflection and tunneling through a barrier 64 3 4 CONTENTS 3.2.4 On the phase of the prefactor of K(xf ,tf ; xi,ti) ....
    [Show full text]
  • Direct Phase Determination in Protein Electron Crystallography
    Proc. Natl. Acad. Sci. USA Vol. 94, pp. 1791–1794, March 1997 Biophysics Direct phase determination in protein electron crystallography: The pseudo-atom approximation (electron diffractionycrystal structure analysisydirect methodsymembrane proteins) DOUGLAS L. DORSET Electron Diffraction Department, Hauptman–Woodward Medical Research Institute, Inc., 73 High Street, Buffalo, NY 14203-1196 Communicated by Herbert A. Hauptman, Hauptman–Woodward Medical Research Institute, Buffalo, NY, December 12, 1996 (received for review October 28, 1996) ABSTRACT The crystal structure of halorhodopsin is Another approach to such phasing problems, especially in determined directly in its centrosymmetric projection using cases where the structures have appropriate distributions of 6.0-Å-resolution electron diffraction intensities, without in- mass, would be to adopt a pseudo-atom approach. The concept cluding any previous phase information from the Fourier of using globular sub-units as quasi-atoms was discussed by transform of electron micrographs. The potential distribution David Harker in 1953, when he showed that an appropriate in the projection is assumed a priori to be an assembly of globular scattering factor could be used to normalize the globular densities. By an appropriate dimensional re-scaling, low-resolution diffraction intensities with higher accuracy than these ‘‘globs’’ are then assumed to be pseudo-atoms for the actual atomic scattering factors employed for small mol- normalization of the observed structure factors. After this ecule structures
    [Show full text]
  • Safety Data Sheet According to 1907/2006/EC, Article 31 Printing Date 21.07.2021 Revision: 21.07.2021
    Page 1/6 Safety data sheet according to 1907/2006/EC, Article 31 Printing date 21.07.2021 Revision: 21.07.2021 SECTION 1: Identification of the substance/mixture and of the company/undertaking · 1.1 Product identifier · Trade name: Cesium chloride (99.999%-Cs) PURATREM · Item number: 93-5542 · CAS Number: 7647-17-8 · EC number: 231-600-2 · 1.2 Relevant identified uses of the substance or mixture and uses advised against No further relevant information available. · 1.3 Details of the supplier of the safety data sheet · Manufacturer/Supplier: Strem Chemicals, Inc. 7 Mulliken Way NEWBURYPORT, MA 01950 USA [email protected] · Further information obtainable from: Technical Department · 1.4 Emergency telephone number: EMERGENCY: CHEMTREC: + 1 (800) 424-9300 During normal opening times: +1 (978) 499-1600 SECTION 2: Hazards identification · 2.1 Classification of the substance or mixture · Classification according to Regulation (EC) No 1272/2008 The substance is not classified according to the CLP regulation. · 2.2 Label elements · Labelling according to Regulation (EC) No 1272/2008 Void · Hazard pictograms Void · Signal word Void · Hazard statements Void · Precautionary statements P231 Handle under inert gas. P262 Do not get in eyes, on skin, or on clothing. P305+P351+P338 IF IN EYES: Rinse cautiously with water for several minutes. Remove contact lenses, if present and easy to do. Continue rinsing. P403+P233 Store in a well-ventilated place. Keep container tightly closed. P422 Store contents under inert gas. P501 Dispose of contents/container in accordance with local/regional/national/international regulations. · 2.3 Other hazards · Results of PBT and vPvB assessment · PBT: Not applicable.
    [Show full text]
  • Solid State Physics: Problem Set #3 Structural Determination Via X-Ray Scattering Due: Friday Jan
    Physics 375 Fall (12) 2003 Solid State Physics: Problem Set #3 Structural Determination via X-Ray Scattering Due: Friday Jan. 31 by 6 pm Reading assignment: for Monday, 3.2-3.3 (structure factors for different lattices) for Wednesday, 3.4-3.7 (scattering methods) for Friday, 4.1-4.3 (mechanical properties of crystals) Problem assignment: Chapter 3 Problems: *3.1 Debye-Scherrer analysis (identify the crystal structure) [Robert] 3.2 Lattice parameter from Debye-Scherrer data 3.11 Measuring thermal expansion with X-ray scattering A1. The unit cell dimension of fcc copper is 0.36 nm. Calculate the longest wavelength of X- rays which will produce diffraction from the close packed planes. From what planes could X- rays with l=0.50 nm be diffracted? *A2. Single crystal diffraction: A cubic crystal with lattice spacing 0.4 nm is mounted with its [001] axis perpendicular to an incident X-ray beam of wavelength 0.1 nm. Initially the crystal is set so as to produce a diffracted beam associated with the (020) planes. Calculate the angle through which the crystal must be turned in order to produce a beam from the (hkl) planes where: a) (hkl)=(030) b) (hkl)=(130) [Brian] c) Which of these diffracted beams would be forbidden if the crystal is: i) sc; ii) bcc; iii) fcc A3. Structure factors for the fcc and diamond bases. a) Construct the structure factor Shkl for the fcc lattice and show that it vanishes unless h, k, and l are all even or all odd. b) Construct the structure factor Shkl for the diamond lattice and show that it vanishes unless h, k, and l are all odd or h+k+l=4n where n is an integer.
    [Show full text]