Chapter 14 Interference and Diffraction
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Classical and Modern Diffraction Theory
Downloaded from http://pubs.geoscienceworld.org/books/book/chapter-pdf/3701993/frontmatter.pdf by guest on 29 September 2021 Classical and Modern Diffraction Theory Edited by Kamill Klem-Musatov Henning C. Hoeber Tijmen Jan Moser Michael A. Pelissier SEG Geophysics Reprint Series No. 29 Sergey Fomel, managing editor Evgeny Landa, volume editor Downloaded from http://pubs.geoscienceworld.org/books/book/chapter-pdf/3701993/frontmatter.pdf by guest on 29 September 2021 Society of Exploration Geophysicists 8801 S. Yale, Ste. 500 Tulsa, OK 74137-3575 U.S.A. # 2016 by Society of Exploration Geophysicists All rights reserved. This book or parts hereof may not be reproduced in any form without permission in writing from the publisher. Published 2016 Printed in the United States of America ISBN 978-1-931830-00-6 (Series) ISBN 978-1-56080-322-5 (Volume) Library of Congress Control Number: 2015951229 Downloaded from http://pubs.geoscienceworld.org/books/book/chapter-pdf/3701993/frontmatter.pdf by guest on 29 September 2021 Dedication We dedicate this volume to the memory Dr. Kamill Klem-Musatov. In reading this volume, you will find that the history of diffraction We worked with Kamill over a period of several years to compile theory was filled with many controversies and feuds as new theories this volume. This volume was virtually ready for publication when came to displace or revise previous ones. Kamill Klem-Musatov’s Kamill passed away. He is greatly missed. new theory also met opposition; he paid a great personal price in Kamill’s role in Classical and Modern Diffraction Theory goes putting forth his theory for the seismic diffraction forward problem. -
Phase Retrieval Without Prior Knowledge Via Single-Shot Fraunhofer Diffraction Pattern of Complex Object
Phase retrieval without prior knowledge via single-shot Fraunhofer diffraction pattern of complex object An-Dong Xiong1 , Xiao-Peng Jin1 , Wen-Kai Yu1 and Qing Zhao1* Fraunhofer diffraction is a well-known phenomenon achieved with most wavelength even without lens. A single-shot intensity measurement of diffraction is generally considered inadequate to reconstruct the original light field, because the lost phase part is indispensable for reverse transformation. Phase retrieval is usually conducted in two means: priori knowledge or multiple different measurements. However, priori knowledge works for certain type of object while multiple measurements are difficult for short wavelength. Here, by introducing non-orthogonal measurement via high density sampling scheme, we demonstrate that one single-shot Fraunhofer diffraction pattern of complex object is sufficient for phase retrieval. Both simulation and experimental results have demonstrated the feasibility of our scheme. Reconstruction of complex object reveals depth information or refraction index; and single-shot measurement can be achieved under most scenario. Their combination will broaden the application field of coherent diffraction imaging. Fraunhofer diffraction, also known as far-field diffraction, problem12-14. These matrix complement methods require 4N- does not necessarily need any extra optical devices except a 4 (N stands for the dimension) generic measurements such as beam source. The diffraction field is the Fourier transform of Gaussian random measurements for complex field15. the original light field. However, for visible light or X-ray Ptychography is another reliable method to achieve image diffraction, the phase part is hardly directly measurable1. with good resolution if the sample can endure scanning16-19. Therefore, phase retrieval from intensity measurement To achieve higher spatial resolution around the size of atom, becomes necessary for reconstructing the original field. -
Intensity of Double-Slit Pattern • Three Or More Slits
• Intensity of double-slit pattern • Three or more slits Practice: Chapter 37, problems 13, 14, 17, 19, 21 Screen at ∞ θ d Path difference Δr = d sin θ zero intensity at d sinθ = (m ± ½ ) λ, m = 0, ± 1, ± 2, … max. intensity at d sinθ = m λ, m = 0, ± 1, ± 2, … 1 Questions: -what is the intensity of the double-slit pattern at an arbitrary position? -What about three slits? four? five? Find the intensity of the double-slit interference pattern as a function of position on the screen. Two waves: E1 = E0 sin(ωt) E2 = E0 sin(ωt + φ) where φ =2π (d sin θ )/λ , and θ gives the position. Steps: Find resultant amplitude, ER ; then intensities obey where I0 is the intensity of each individual wave. 2 Trigonometry: sin a + sin b = 2 cos [(a-b)/2] sin [(a+b)/2] E1 + E2 = E0 [sin(ωt) + sin(ωt + φ)] = 2 E0 cos (φ / 2) cos (ωt + φ / 2)] Resultant amplitude ER = 2 E0 cos (φ / 2) Resultant intensity, (a function of position θ on the screen) I position - fringes are wide, with fuzzy edges - equally spaced (in sin θ) - equal brightness (but we have ignored diffraction) 3 With only one slit open, the intensity in the centre of the screen is 100 W/m 2. With both (identical) slits open together, the intensity at locations of constructive interference will be a) zero b) 100 W/m2 c) 200 W/m2 d) 400 W/m2 How does this compare with shining two laser pointers on the same spot? θ θ sin d = d Δr1 d θ sin d = 2d θ Δr2 sin = 3d Δr3 Total, 4 The total field is where φ = 2π (d sinθ )/λ •When d sinθ = 0, λ , 2λ, .. -
Light and Matter Diffraction from the Unified Viewpoint of Feynman's
European J of Physics Education Volume 8 Issue 2 1309-7202 Arlego & Fanaro Light and Matter Diffraction from the Unified Viewpoint of Feynman’s Sum of All Paths Marcelo Arlego* Maria de los Angeles Fanaro** Universidad Nacional del Centro de la Provincia de Buenos Aires CONICET, Argentine *[email protected] **[email protected] (Received: 05.04.2018, Accepted: 22.05.2017) Abstract In this work, we present a pedagogical strategy to describe the diffraction phenomenon based on a didactic adaptation of the Feynman’s path integrals method, which uses only high school mathematics. The advantage of our approach is that it allows to describe the diffraction in a fully quantum context, where superposition and probabilistic aspects emerge naturally. Our method is based on a time-independent formulation, which allows modelling the phenomenon in geometric terms and trajectories in real space, which is an advantage from the didactic point of view. A distinctive aspect of our work is the description of the series of transformations and didactic transpositions of the fundamental equations that give rise to a common quantum framework for light and matter. This is something that is usually masked by the common use, and that to our knowledge has not been emphasized enough in a unified way. Finally, the role of the superposition of non-classical paths and their didactic potential are briefly mentioned. Keywords: quantum mechanics, light and matter diffraction, Feynman’s Sum of all Paths, high education INTRODUCTION This work promotes the teaching of quantum mechanics at the basic level of secondary school, where the students have not the necessary mathematics to deal with canonical models that uses Schrodinger equation. -
Origin of Probability in Quantum Mechanics and the Physical Interpretation of the Wave Function
Origin of Probability in Quantum Mechanics and the Physical Interpretation of the Wave Function Shuming Wen ( [email protected] ) Faculty of Land and Resources Engineering, Kunming University of Science and Technology. Research Article Keywords: probability origin, wave-function collapse, uncertainty principle, quantum tunnelling, double-slit and single-slit experiments Posted Date: November 16th, 2020 DOI: https://doi.org/10.21203/rs.3.rs-95171/v2 License: This work is licensed under a Creative Commons Attribution 4.0 International License. Read Full License Origin of Probability in Quantum Mechanics and the Physical Interpretation of the Wave Function Shuming Wen Faculty of Land and Resources Engineering, Kunming University of Science and Technology, Kunming 650093 Abstract The theoretical calculation of quantum mechanics has been accurately verified by experiments, but Copenhagen interpretation with probability is still controversial. To find the source of the probability, we revised the definition of the energy quantum and reconstructed the wave function of the physical particle. Here, we found that the energy quantum ê is 6.62606896 ×10-34J instead of hν as proposed by Planck. Additionally, the value of the quality quantum ô is 7.372496 × 10-51 kg. This discontinuity of energy leads to a periodic non-uniform spatial distribution of the particles that transmit energy. A quantum objective system (QOS) consists of many physical particles whose wave function is the superposition of the wave functions of all physical particles. The probability of quantum mechanics originates from the distribution rate of the particles in the QOS per unit volume at time t and near position r. Based on the revision of the energy quantum assumption and the origin of the probability, we proposed new certainty and uncertainty relationships, explained the physical mechanism of wave-function collapse and the quantum tunnelling effect, derived the quantum theoretical expression of double-slit and single-slit experiments. -
Engineering Viscoelasticity
ENGINEERING VISCOELASTICITY David Roylance Department of Materials Science and Engineering Massachusetts Institute of Technology Cambridge, MA 02139 October 24, 2001 1 Introduction This document is intended to outline an important aspect of the mechanical response of polymers and polymer-matrix composites: the field of linear viscoelasticity. The topics included here are aimed at providing an instructional introduction to this large and elegant subject, and should not be taken as a thorough or comprehensive treatment. The references appearing either as footnotes to the text or listed separately at the end of the notes should be consulted for more thorough coverage. Viscoelastic response is often used as a probe in polymer science, since it is sensitive to the material’s chemistry and microstructure. The concepts and techniques presented here are important for this purpose, but the principal objective of this document is to demonstrate how linear viscoelasticity can be incorporated into the general theory of mechanics of materials, so that structures containing viscoelastic components can be designed and analyzed. While not all polymers are viscoelastic to any important practical extent, and even fewer are linearly viscoelastic1, this theory provides a usable engineering approximation for many applications in polymer and composites engineering. Even in instances requiring more elaborate treatments, the linear viscoelastic theory is a useful starting point. 2 Molecular Mechanisms When subjected to an applied stress, polymers may deform by either or both of two fundamen- tally different atomistic mechanisms. The lengths and angles of the chemical bonds connecting the atoms may distort, moving the atoms to new positions of greater internal energy. -
Section 22-3: Energy, Momentum and Radiation Pressure
Answer to Essential Question 22.2: (a) To find the wavelength, we can combine the equation with the fact that the speed of light in air is 3.00 " 108 m/s. Thus, a frequency of 1 " 1018 Hz corresponds to a wavelength of 3 " 10-10 m, while a frequency of 90.9 MHz corresponds to a wavelength of 3.30 m. (b) Using Equation 22.2, with c = 3.00 " 108 m/s, gives an amplitude of . 22-3 Energy, Momentum and Radiation Pressure All waves carry energy, and electromagnetic waves are no exception. We often characterize the energy carried by a wave in terms of its intensity, which is the power per unit area. At a particular point in space that the wave is moving past, the intensity varies as the electric and magnetic fields at the point oscillate. It is generally most useful to focus on the average intensity, which is given by: . (Eq. 22.3: The average intensity in an EM wave) Note that Equations 22.2 and 22.3 can be combined, so the average intensity can be calculated using only the amplitude of the electric field or only the amplitude of the magnetic field. Momentum and radiation pressure As we will discuss later in the book, there is no mass associated with light, or with any EM wave. Despite this, an electromagnetic wave carries momentum. The momentum of an EM wave is the energy carried by the wave divided by the speed of light. If an EM wave is absorbed by an object, or it reflects from an object, the wave will transfer momentum to the object. -
Fraunhofer Diffraction Effects on Total Power for a Planckian Source
Volume 106, Number 5, September–October 2001 Journal of Research of the National Institute of Standards and Technology [J. Res. Natl. Inst. Stand. Technol. 106, 775–779 (2001)] Fraunhofer Diffraction Effects on Total Power for a Planckian Source Volume 106 Number 5 September–October 2001 Eric L. Shirley An algorithm for computing diffraction ef- Key words: diffraction; Fraunhofer; fects on total power in the case of Fraun- Planckian; power; radiometry. National Institute of Standards and hofer diffraction by a circular lens or aper- Technology, ture is derived. The result for Fraunhofer diffraction of monochromatic radiation is Gaithersburg, MD 20899-8441 Accepted: August 28, 2001 well known, and this work reports the re- sult for radiation from a Planckian source. [email protected] The result obtained is valid at all temper- atures. Available online: http://www.nist.gov/jres 1. Introduction Fraunhofer diffraction by a circular lens or aperture is tion, because the detector pupil is overfilled. However, a ubiquitous phenomenon in optics in general and ra- diffraction leads to losses in the total power reaching the diometry in particular. Figure 1 illustrates two practical detector. situations in which Fraunhofer diffraction occurs. In the All of the above diffraction losses have been a subject first example, diffraction limits the ability of a lens or of considerable interest, and they have been considered other focusing optic to focus light. According to geo- by Blevin [2], Boivin [3], Steel, De, and Bell [4], and metrical optics, it is possible to focus rays incident on a Shirley [5]. The formula for the relative diffraction loss lens to converge at a focal point. -
Basic Electrical Engineering
BASIC ELECTRICAL ENGINEERING V.HimaBindu V.V.S Madhuri Chandrashekar.D GOKARAJU RANGARAJU INSTITUTE OF ENGINEERING AND TECHNOLOGY (Autonomous) Index: 1. Syllabus……………………………………………….……….. .1 2. Ohm’s Law………………………………………….…………..3 3. KVL,KCL…………………………………………….……….. .4 4. Nodes,Branches& Loops…………………….……….………. 5 5. Series elements & Voltage Division………..………….……….6 6. Parallel elements & Current Division……………….………...7 7. Star-Delta transformation…………………………….………..8 8. Independent Sources …………………………………..……….9 9. Dependent sources……………………………………………12 10. Source Transformation:…………………………………….…13 11. Review of Complex Number…………………………………..16 12. Phasor Representation:………………….…………………….19 13. Phasor Relationship with a pure resistance……………..……23 14. Phasor Relationship with a pure inductance………………....24 15. Phasor Relationship with a pure capacitance………..……….25 16. Series and Parallel combinations of Inductors………….……30 17. Series and parallel connection of capacitors……………...…..32 18. Mesh Analysis…………………………………………………..34 19. Nodal Analysis……………………………………………….…37 20. Average, RMS values……………….……………………….....43 21. R-L Series Circuit……………………………………………...47 22. R-C Series circuit……………………………………………....50 23. R-L-C Series circuit…………………………………………....53 24. Real, reactive & Apparent Power…………………………….56 25. Power triangle……………………………………………….....61 26. Series Resonance……………………………………………….66 27. Parallel Resonance……………………………………………..69 28. Thevenin’s Theorem…………………………………………...72 29. Norton’s Theorem……………………………………………...75 30. Superposition Theorem………………………………………..79 31. -
Properties of Electromagnetic Waves Any Electromagnetic Wave Must Satisfy Four Basic Conditions: 1
Chapter 34 Electromagnetic Waves The Goal of the Entire Course Maxwell’s Equations: Maxwell’s Equations James Clerk Maxwell •1831 – 1879 •Scottish theoretical physicist •Developed the electromagnetic theory of light •His successful interpretation of the electromagnetic field resulted in the field equations that bear his name. •Also developed and explained – Kinetic theory of gases – Nature of Saturn’s rings – Color vision Start at 12:50 https://www.learner.org/vod/vod_window.html?pid=604 Correcting Ampere’s Law Two surfaces S1 and S2 near the plate of a capacitor are bounded by the same path P. Ampere’s Law states that But it is zero on S2 since there is no conduction current through it. This is a contradiction. Maxwell fixed it by introducing the displacement current: Fig. 34-1, p. 984 Maxwell hypothesized that a changing electric field creates an induced magnetic field. Induced Fields . An increasing solenoid current causes an increasing magnetic field, which induces a circular electric field. An increasing capacitor charge causes an increasing electric field, which induces a circular magnetic field. Slide 34-50 Displacement Current d d(EA)d(q / ε) 1 dq E 0 dt dt dt ε0 dt dq d ε E dt0 dt The displacement current is equal to the conduction current!!! Bsd μ I μ ε I o o o d Maxwell’s Equations The First Unified Field Theory In his unified theory of electromagnetism, Maxwell showed that electromagnetic waves are a natural consequence of the fundamental laws expressed in these four equations: q EABAdd 0 εo dd Edd s BE B s μ I μ ε dto o o dt QuickCheck 34.4 The electric field is increasing. -
The Path Integral Approach to Quantum Mechanics Lecture Notes for Quantum Mechanics IV
The Path Integral approach to Quantum Mechanics Lecture Notes for Quantum Mechanics IV Riccardo Rattazzi May 25, 2009 2 Contents 1 The path integral formalism 5 1.1 Introducingthepathintegrals. 5 1.1.1 Thedoubleslitexperiment . 5 1.1.2 An intuitive approach to the path integral formalism . .. 6 1.1.3 Thepathintegralformulation. 8 1.1.4 From the Schr¨oedinger approach to the path integral . .. 12 1.2 Thepropertiesofthepathintegrals . 14 1.2.1 Pathintegralsandstateevolution . 14 1.2.2 The path integral computation for a free particle . 17 1.3 Pathintegralsasdeterminants . 19 1.3.1 Gaussianintegrals . 19 1.3.2 GaussianPathIntegrals . 20 1.3.3 O(ℏ) corrections to Gaussian approximation . 22 1.3.4 Quadratic lagrangians and the harmonic oscillator . .. 23 1.4 Operatormatrixelements . 27 1.4.1 Thetime-orderedproductofoperators . 27 2 Functional and Euclidean methods 31 2.1 Functionalmethod .......................... 31 2.2 EuclideanPathIntegral . 32 2.2.1 Statisticalmechanics. 34 2.3 Perturbationtheory . .. .. .. .. .. .. .. .. .. .. 35 2.3.1 Euclidean n-pointcorrelators . 35 2.3.2 Thermal n-pointcorrelators. 36 2.3.3 Euclidean correlators by functional derivatives . ... 38 0 0 2.3.4 Computing KE[J] and Z [J] ................ 39 2.3.5 Free n-pointcorrelators . 41 2.3.6 The anharmonic oscillator and Feynman diagrams . 43 3 The semiclassical approximation 49 3.1 Thesemiclassicalpropagator . 50 3.1.1 VanVleck-Pauli-Morette formula . 54 3.1.2 MathematicalAppendix1 . 56 3.1.3 MathematicalAppendix2 . 56 3.2 Thefixedenergypropagator. 57 3.2.1 General properties of the fixed energy propagator . 57 3.2.2 Semiclassical computation of K(E)............. 61 3.2.3 Two applications: reflection and tunneling through a barrier 64 3 4 CONTENTS 3.2.4 On the phase of the prefactor of K(xf ,tf ; xi,ti) .... -
Simple Cubic Lattice
Chem 253, UC, Berkeley What we will see in XRD of simple cubic, BCC, FCC? Position Intensity Chem 253, UC, Berkeley Structure Factor: adds up all scattered X-ray from each lattice points in crystal n iKd j Sk e j1 K ha kb lc d j x a y b z c 2 I(hkl) Sk 1 Chem 253, UC, Berkeley X-ray scattered from each primitive cell interfere constructively when: eiKR 1 2d sin n For n-atom basis: sum up the X-ray scattered from the whole basis Chem 253, UC, Berkeley ' k d k d di R j ' K k k Phase difference: K (di d j ) The amplitude of the two rays differ: eiK(di d j ) 2 Chem 253, UC, Berkeley The amplitude of the rays scattered at d1, d2, d3…. are in the ratios : eiKd j The net ray scattered by the entire cell: n iKd j Sk e j1 2 I(hkl) Sk Chem 253, UC, Berkeley For simple cubic: (0,0,0) iK0 Sk e 1 3 Chem 253, UC, Berkeley For BCC: (0,0,0), (1/2, ½, ½)…. Two point basis 1 2 iK ( x y z ) iKd j iK0 2 Sk e e e j1 1 ei (hk l) 1 (1)hkl S=2, when h+k+l even S=0, when h+k+l odd, systematical absence Chem 253, UC, Berkeley For BCC: (0,0,0), (1/2, ½, ½)…. Two point basis S=2, when h+k+l even S=0, when h+k+l odd, systematical absence (100): destructive (200): constructive 4 Chem 253, UC, Berkeley Observable diffraction peaks h2 k 2 l 2 Ratio SC: 1,2,3,4,5,6,8,9,10,11,12.