DRAM Component Part Numbering System
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2GB DDR3 SDRAM 72Bit SO-DIMM
Apacer Memory Product Specification 2GB DDR3 SDRAM 72bit SO-DIMM Speed Max CAS Component Number of Part Number Bandwidth Density Organization Grade Frequency Latency Composition Rank 0C 78.A2GCB.AF10C 8.5GB/sec 1066Mbps 533MHz CL7 2GB 256Mx72 256Mx8 * 9 1 Specifications z Support ECC error detection and correction z On DIMM Thermal Sensor: YES z Density:2GB z Organization – 256 word x 72 bits, 1rank z Mounting 9 pieces of 2G bits DDR3 SDRAM sealed FBGA z Package: 204-pin socket type small outline dual in line memory module (SO-DIMM) --- PCB height: 30.0mm --- Lead pitch: 0.6mm (pin) --- Lead-free (RoHS compliant) z Power supply: VDD = 1.5V + 0.075V z Eight internal banks for concurrent operation ( components) z Interface: SSTL_15 z Burst lengths (BL): 8 and 4 with Burst Chop (BC) z /CAS Latency (CL): 6,7,8,9 z /CAS Write latency (CWL): 5,6,7 z Precharge: Auto precharge option for each burst access z Refresh: Auto-refresh, self-refresh z Refresh cycles --- Average refresh period 7.8㎲ at 0℃ < TC < +85℃ 3.9㎲ at +85℃ < TC < +95℃ z Operating case temperature range --- TC = 0℃ to +95℃ z Serial presence detect (SPD) z VDDSPD = 3.0V to 3.6V Apacer Memory Product Specification Features z Double-data-rate architecture; two data transfers per clock cycle. z The high-speed data transfer is realized by the 8 bits prefetch pipelined architecture. z Bi-directional differential data strobe (DQS and /DQS) is transmitted/received with data for capturing data at the receiver. z DQS is edge-aligned with data for READs; center aligned with data for WRITEs. -
Product Guide SAMSUNG ELECTRONICS RESERVES the RIGHT to CHANGE PRODUCTS, INFORMATION and SPECIFICATIONS WITHOUT NOTICE
May. 2018 DDR4 SDRAM Memory Product Guide SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE. Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind. This document and all information discussed herein remain the sole and exclusive property of Samsung Electronics. No license of any patent, copyright, mask work, trademark or any other intellectual property right is granted by one party to the other party under this document, by implication, estoppel or other- wise. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar applications where product failure could result in loss of life or personal or physical harm, or any military or defense application, or any governmental procurement to which special terms or provisions may apply. For updates or additional information about Samsung products, contact your nearest Samsung office. All brand names, trademarks and registered trademarks belong to their respective owners. © 2018 Samsung Electronics Co., Ltd. All rights reserved. - 1 - May. 2018 Product Guide DDR4 SDRAM Memory 1. DDR4 SDRAM MEMORY ORDERING INFORMATION 1 2 3 4 5 6 7 8 9 10 11 K 4 A X X X X X X X - X X X X SAMSUNG Memory Speed DRAM Temp & Power DRAM Type Package Type Density Revision Bit Organization Interface (VDD, VDDQ) # of Internal Banks 1. SAMSUNG Memory : K 8. Revision M: 1st Gen. A: 2nd Gen. 2. DRAM : 4 B: 3rd Gen. C: 4th Gen. D: 5th Gen. -
DDR and DDR2 SDRAM Controller Compiler User Guide
DDR and DDR2 SDRAM Controller Compiler User Guide 101 Innovation Drive Software Version: 9.0 San Jose, CA 95134 Document Date: March 2009 www.altera.com Copyright © 2009 Altera Corporation. All rights reserved. Altera, The Programmable Solutions Company, the stylized Altera logo, specific device designations, and all other words and logos that are identified as trademarks and/or service marks are, unless noted otherwise, the trademarks and service marks of Altera Corporation in the U.S. and other countries. All other product or service names are the property of their respective holders. Altera products are protected under numerous U.S. and foreign patents and pending ap- plications, maskwork rights, and copyrights. Altera warrants performance of its semiconductor products to current specifications in accordance with Altera's standard warranty, but reserves the right to make changes to any products and services at any time without notice. Altera assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly agreed to in writing by Altera Corporation. Altera customers are advised to obtain the latest version of device specifications before relying on any published information and before placing orders for products or services. UG-DDRSDRAM-10.0 Contents Chapter 1. About This Compiler Release Information . 1–1 Device Family Support . 1–1 Features . 1–2 General Description . 1–2 Performance and Resource Utilization . 1–4 Installation and Licensing . 1–5 OpenCore Plus Evaluation . 1–6 Chapter 2. Getting Started Design Flow . 2–1 SOPC Builder Design Flow . 2–1 DDR & DDR2 SDRAM Controller Walkthrough . -
You Need to Know About Ddr4
Overcoming DDR Challenges in High-Performance Designs Mazyar Razzaz, Applications Engineering Jeff Steinheider, Product Marketing September 2018 | AMF-NET-T3267 Company Public – NXP, the NXP logo, and NXP secure connections for a smarter world are trademarks of NXP B.V. All other product or service names are the property of their respective owners. © 2018 NXP B.V. Agenda • Basic DDR SDRAM Structure • DDR3 vs. DDR4 SDRAM Differences • DDR Bring up Issues • Configurations and Validation via QCVS Tool COMPANY PUBLIC 1 BASIC DDR SDRAM STRUCTURE COMPANY PUBLIC 2 Single Transistor Memory Cell Access Transistor Column (bit) line Row (word) line G S D “1” => Vcc “0” => Gnd “precharged” to Vcc/2 Cbit Ccol Storage Parasitic Line Capacitor Vcc/2 Capacitance COMPANY PUBLIC 3 Memory Arrays B0 B1 B2 B3 B4 B5 B6 B7 ROW ADDRESS DECODER ADDRESS ROW W0 W1 W2 SENSE AMPS & WRITE DRIVERS COLUMN ADDRESS DECODER COMPANY PUBLIC 4 Internal Memory Banks • Multiple arrays organized into banks • Multiple banks per memory device − DDR3 – 8 banks, and 3 bank address (BA) bits − DDR4 – 16 banks with 4 banks in each of 4 sub bank groups − Can have one active row in each bank at any given time • Concurrency − Can be opening or closing a row in one bank while accessing another bank Bank 0 Bank 1 Bank 2 Bank 3 Row 0 Row 1 Row 2 Row 3 Row … Row Buffers COMPANY PUBLIC 5 Memory Access • A requested row is ACTIVATED and made accessible through the bank’s row buffers • READ and/or WRITE are issued to the active row in the row buffers • The row is PRECHARGED and is no longer -
Improving DRAM Performance by Parallelizing Refreshes
Improving DRAM Performance by Parallelizing Refreshes with Accesses Kevin Kai-Wei Chang Donghyuk Lee Zeshan Chishti† [email protected] [email protected] [email protected] Alaa R. Alameldeen† Chris Wilkerson† Yoongu Kim Onur Mutlu [email protected] [email protected] [email protected] [email protected] Carnegie Mellon University †Intel Labs Abstract Each DRAM cell must be refreshed periodically every re- fresh interval as specified by the DRAM standards [11, 14]. Modern DRAM cells are periodically refreshed to prevent The exact refresh interval time depends on the DRAM type data loss due to leakage. Commodity DDR (double data rate) (e.g., DDR or LPDDR) and the operating temperature. While DRAM refreshes cells at the rank level. This degrades perfor- DRAM is being refreshed, it becomes unavailable to serve mance significantly because it prevents an entire DRAM rank memory requests. As a result, refresh latency significantly de- from serving memory requests while being refreshed. DRAM de- grades system performance [24, 31, 33, 41] by delaying in- signed for mobile platforms, LPDDR (low power DDR) DRAM, flight memory requests. This problem will become more preva- supports an enhanced mode, called per-bank refresh, that re- lent as DRAM density increases, leading to more DRAM rows freshes cells at the bank level. This enables a bank to be ac- to be refreshed within the same refresh interval. DRAM chip cessed while another in the same rank is being refreshed, alle- density is expected to increase from 8Gb to 32Gb by 2020 as viating part of the negative performance impact of refreshes. -
Dual-DIMM DDR2 and DDR3 SDRAM Board Design Guidelines, External
5. Dual-DIMM DDR2 and DDR3 SDRAM Board Design Guidelines June 2012 EMI_DG_005-4.1 EMI_DG_005-4.1 This chapter describes guidelines for implementing dual unbuffered DIMM (UDIMM) DDR2 and DDR3 SDRAM interfaces. This chapter discusses the impact on signal integrity of the data signal with the following conditions in a dual-DIMM configuration: ■ Populating just one slot versus populating both slots ■ Populating slot 1 versus slot 2 when only one DIMM is used ■ On-die termination (ODT) setting of 75 Ω versus an ODT setting of 150 Ω f For detailed information about a single-DIMM DDR2 SDRAM interface, refer to the DDR2 and DDR3 SDRAM Board Design Guidelines chapter. DDR2 SDRAM This section describes guidelines for implementing a dual slot unbuffered DDR2 SDRAM interface, operating at up to 400-MHz and 800-Mbps data rates. Figure 5–1 shows a typical DQS, DQ, and DM signal topology for a dual-DIMM interface configuration using the ODT feature of the DDR2 SDRAM components. Figure 5–1. Dual-DIMM DDR2 SDRAM Interface Configuration (1) VTT Ω RT = 54 DDR2 SDRAM DIMMs (Receiver) Board Trace FPGA Slot 1 Slot 2 (Driver) Board Trace Board Trace Note to Figure 5–1: (1) The parallel termination resistor RT = 54 Ω to VTT at the FPGA end of the line is optional for devices that support dynamic on-chip termination (OCT). © 2012 Altera Corporation. All rights reserved. ALTERA, ARRIA, CYCLONE, HARDCOPY, MAX, MEGACORE, NIOS, QUARTUS and STRATIX words and logos are trademarks of Altera Corporation and registered in the U.S. Patent and Trademark Office and in other countries. -
NON-CONFIDENTIAL for Publication COMP
EUROPEAN COMMISSION Brussels, 15.1.2010 SG-Greffe(2010) D/275 C(2010) 150 Subject: Case COMP/C-3/ 38 636 Rambus (Please quote this reference in all correspondence) […]* 1. I refer to Hynix' complaint to the Commission of 18 December 2002 lodged jointly with Infineon pursuant to Article 3 of Council Regulation No. 17/621 against Rambus Inc. ("Rambus"), an undertaking incorporated in 1990 in California and reincorporated in Delaware, USA, in 1997, with its principal place of business in Los Altos, California, regarding alleged violations of Article 101 and Article 102 of the Treaty on the Functioning of the European Union ("TFEU")2 in connection with computer memory chips which are known as synchronous DRAM chips ("the Complaint"). I also refer to the letters listed here below, by which Hynix provided additional information/explanations on the above matter, as well as the Commission’s letter of 13 October 2009 ["Article 7 letter"] addressed to Hynix in that matter and the response to the Article 7 letter of 12 November 2009. […] 2. For the reasons set out below, the Commission considers that there is no sufficient degree of Community interest for conducting a further investigation into the alleged infringement and rejects your complaint pursuant to Article 7(2) of the Commission Regulation (EC) 773/20043. * This version of the Commission Decision of 15.1.2010 does not contain any business secrets or other confidential information. 1 Regulation No. 17 of the Council of 6 February 1962, First Regulation implementing Articles 85 and 86 of the Treaty (OJ No. 13, 21.2.1962, p. -
Refresh Now and Then Seungjae Baek, Member, IEEE, Sangyeun Cho, Senior Member, IEEE, and Rami Melhem, Fellow, IEEE
IEEE TRANSACTIONS ON COMPUTERS 1 Refresh Now and Then Seungjae Baek, Member, IEEE, Sangyeun Cho, Senior Member, IEEE, and Rami Melhem, Fellow, IEEE Abstract—DRAM stores information in electric charge. Because DRAM cells lose stored charge over time due to leakage, they have to be “refreshed” in a periodic manner to retain the stored information. This refresh activity is a source of increased energy consumption as the DRAM density grows. It also incurs non-trivial performance loss due to the unavailability of memory arrays during refresh. This paper first presents a comprehensive measurement based characterization study of the cell-level data retention behavior of modern low-power DRAM chips. 99.7% of the cells could retain the stored information for longer than 1 second at a high temperature. This average cell retention behavior strongly indicates that we can deeply reduce the energy and performance penalty of DRAM refreshing with proper system support. The second part of this paper, accordingly, develops two practical techniques to reduce the frequency of DRAM refresh operations by excluding a few leaky memory cells from use and by skipping refreshing of unused DRAM regions. We have implemented the proposed techniques completely in the Linux OS for experimentation, and measured performance improvement of up to 17.2% with the refresh operation reduction of 93.8% on smartphone like low-power platforms. Index Terms—SDRAM, refresh operation, power consumption, performance improvement. ✦ 1 INTRODUCTION again. Refresh period, the time interval within which we RAM is commonly used in a computer system’s main must walk through all rows once, is typically 32 ms or D memory. -
Datasheet DDR4 SDRAM Revision History
Rev. 1.4, Apr. 2018 M378A5244CB0 M378A1K43CB2 M378A2K43CB1 288pin Unbuffered DIMM based on 8Gb C-die 78FBGA with Lead-Free & Halogen-Free (RoHS compliant) datasheet SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE. Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind. This document and all information discussed herein remain the sole and exclusive property of Samsung Electronics. No license of any patent, copyright, mask work, trademark or any other intellectual property right is granted by one party to the other party under this document, by implication, estoppel or other- wise. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar applications where product failure could result in loss of life or personal or physical harm, or any military or defense application, or any governmental procurement to which special terms or provisions may apply. For updates or additional information about Samsung products, contact your nearest Samsung office. All brand names, trademarks and registered trademarks belong to their respective owners. © 2018 Samsung Electronics Co., Ltd.GG All rights reserved. - 1 - Rev. 1.4 Unbuffered DIMM datasheet DDR4 SDRAM Revision History Revision No. History Draft Date Remark Editor 1.0 - First SPEC. Release 27th Jun. 2016 - J.Y.Lee 1.1 - Deletion of Function Block Diagram [M378A1K43CB2] on page 11 29th Jun. 2016 - J.Y.Lee - Change of Physical Dimensions [M378A1K43CB1] on page 41 1.11 - Correction of Typo 7th Mar. 2017 - J.Y.Lee 1.2 - Change of Physical Dimensions [M378A1K43CB1] on page 41 23h Mar. -
Zynq-7000 All Programmable Soc and 7 Series Devices Memory Interface Solutions User Guide (UG586) [Ref 2]
Zynq-7000 AP SoC and 7 Series Devices Memory Interface Solutions (v4.1) DS176 April 4, 2018 Advance Product Specification • I/O Power Reduction option reduces average I/O Introduction power by automatically disabling DQ/DQS IBUFs and The Xilinx® Zynq®-7000 All Programmable SoC and internal terminations during writes and periods of 7 series FPGAs memory interface solutions cores provide inactivity high-performance connections to DDR3 and DDR2 • Internal VREF support SDRAMs, QDR II+ SRAM, RLDRAM II/RLDRAM 3, and • LPDDR2 SDRAM. Multicontroller support for up to eight controllers • Two controller request processing modes: DDR3 and DDR2 SDRAMs o Normal: reorder requests to optimize system throughput and latency This section discusses the features, applications, and functional description of Xilinx 7 series FPGAs memory o Strict: memory requests are processed in the order interface solutions in DDR3 and DDR2 SDRAMs. These received solutions are available with an optional AXI4 slave interface. LogiCORE™ IP Facts Table Core Specifics DDR3 SDRAM Features Supported Zynq®-7000 All Programmable SoC (1) • Component support for interface widths up to 72 bits Device Family 7series(2) FPGAs • Supported DDR3 Component and DIMM, DDR2 Single and dual rank UDIMM, RDIMM, and SODIMM Memory support Component and DIMM, QDR II+, RLDRAM II, RLDRAM 3, and LPDDR2 SDRAM Components • DDR3 (1.5V) and DDR3L (1.35V) Resources See Table 1. • 1, 2, 4, and 8 Gb density device support Provided with Core • 8-bank support Documentation Product Specification • x8 and x16 device -
Memory & Storage Challenges and Solutions
Memory & Storage Challenges and Solutions G S A 2 0 1 9 Jinman Han Senior Vice President, Memory Product Planning & Application Engineering Legal Disclaimer This presentation is intended to provide information concerning SSD and memory industry. We do our best to make sure that information presented is accurate and fully up-to-date. However, the presentation may be subject to technical inaccuracies, information that is not up-to-date or typographical errors. As a consequence, Samsung does not in any way guarantee the accuracy or completeness of information provided on this presentation. The information in this presentation or accompanying oral statements may include forward-looking statements. These forward-looking statements include all matters that are not historical facts, statements regarding the Samsung Electronics' intentions, beliefs or current expectations concerning, among other things, market prospects, growth, strategies, and the industry in which Samsung operates. By their nature, forward- looking statements involve risks and uncertainties, because they relate to events and depend on circumstances that may or may not occur in the future. Samsung cautions you that forward looking statements are not guarantees of future performance and that the actual developments of Samsung, the market, or industry in which Samsung operates may differ materially from those made or suggested by the forward-looking statements contained in this presentation or in the accompanying oral statements. In addition, even if the information contained herein or the oral statements are shown to be accurate, those developments may not be indicative developments in future periods. Abstract Memory-centric system innovation is the overarching theme of modern semiconductor technology and is one of the crucial driving forces of the future IT world. -
64M X 16 Bit DDRII Synchronous DRAM (SDRAM) Advance (Rev
AS4C64M16D2A-25BAN Revision History 1Gb Auto-AS4C64M16D2A - 84 ball FBGA PACKAGE Revision Details Date Rev 1.0 Preliminary datasheet Jan 2018 Alliance Memory Inc. 511 Taylor Way, San Carlos, CA 94070 TEL: (650) 610-6800 FAX: (650) 620-9211 Alliance Memory Inc. reserves the right to change products or specification without notice Confidential - 1 of 62 - Rev.1.0 Jan. 2018 AS4C64M16D2A-25BAN 64M x 16 bit DDRII Synchronous DRAM (SDRAM) Advance (Rev. 1.0, Jan. /2018) Features Overview JEDEC Standard Compliant The AS4C64M16D2A is a high-speed CMOS Double- AEC-Q100 Compliant Data-Rate-Two (DDR2), synchronous dynamic random- JEDEC standard 1.8V I/O (SSTL_18-compatible) access memory (SDRAM) containing 1024 Mbits in a 16-bit wide data I/Os. It is internally configured as a 8- Power supplies: V & V = +1.8V 0.1V DD DDQ bank DRAM, 8 banks x 8Mb addresses x 16 I/Os. The Operating temperature: TC = -40~105°C (Automotive) device is designed to comply with DDR2 DRAM key Supports JEDEC clock jitter specification features such as posted CAS# with additive latency, Fully synchronous operation Write latency = Read latency -1, Off-Chip Driver (OCD) Fast clock rate: 400 MHz impedance adjustment, and On Die Termination(ODT). Differential Clock, CK & CK# All of the control and address inputs are synchronized Bidirectional single/differential data strobe with a pair of externally supplied differential clocks. Inputs are latched at the cross point of differential clocks (CK - DQS & DQS# rising and CK# falling) All I/Os are synchronized with a 8 internal banks for concurrent operation pair of bidirectional strobes (DQS and DQS#) in a source 4-bit prefetch architecture synchronous fashion.