Selected Quality Metrics for Digital Passport Photographs Vom
Selected Quality Metrics for Digital Passport Photographs Vom Fachbereich Informatik der Technischen Universität Darmstadt genehmigte Dissertation Zur Erlangung des akademischen Grades Doktor-Ingenieurs (Dr.-Ing.) von Oriana Yuridia González Castillo aus Cuernavaca, Morelos Mexiko Referenten der Arbeit: Prof. Dr. José L. Encarnação, Technische Universität Darmstadt Prof. Dr. Stephen Wolthusen, Royal Holloway University of London Tag der Einreichung: 26.10.2007 Tag der mündliche Prüfung: 12.12.2007 Hochschulkennziffer D17 Acknowledgements This work was developed thanks to the facilities provided by the Fraunhofer-Institute for Com- puter Graphics Darmstadt (Fraunhofer IGD), the founds provided for the Consejo Nacional de Ciencia y Tecnología (CONACyT) México and the Deutscher Akademischer Austausch Dienst (DAAD) Germany. The development of this thesis in Germany has been one of the best experiences in my life. I learned many things which I could not have learned in any other country. This thesis rep- resents the culmination of the biggest dream I ever had. I want to thank all the people who supported me to make it possible: Stephanie Buechl, Dr. Volker Roth, Dr. Christoph Busch, Prof. José L. Encarnação, Dr. Stephen Wolthusen, Dr. Martin Schmucker, Dr. Henning Daum, Dr. Ullrich Pinsdorf, Dipl. Ing. Alexander Nouak and all the colleagues of the de- partment A8 from Fraunhofer IGD in Darmstadt. I also want to thank to: Elfriede Fitschen, Elke Frank, Sabine Bartsch, Doris Müller, Barbara Merten, Carola Eichel and my friends Ana, Adriana, Francisco, Chetna, Sebastian, Jaime, Sonja, Mariza, Erica and Roberto C. My family in Mexico has played a very important role in the development of my career.
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