10/1/2013

CHE323/CHE384 Chemical Processes for Micro- and Nanofabrication Device Isolation www.lithoguru.com/scientist/CHE323 • A wafer will conduct. Two transistors located close to each other on the wafer will be electrically Lecture 27 connected via the substrate Device Isolation

Chris A. Mack Adjunct Associate Professor • Device isolation is used to prevent separate transistors from interacting with each other through the substrate Reading : – Goal: good isolation while consuming the smallest area of Chapter 15, Fabrication Engineering at the Micro- and Nanoscale , 4 th edition, Campbell silicon

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Device Isolation LOCOS Process

• There are two common approaches to device isolation • LOCOS – Local Oxidation of Silicon Deposit filmstack (Pad oxide, – Popular in the 1970s and 1980s , Resist) • STI – Shallow Trench Isolation – Came in to use in the 1990s – Preferred method for 250 nm technologies Lithography and etch opens area Strip nitride and below where Field Oxide (FOX) will be Silicon Substrate Silicon Nitride © Chris Mack, 2013 3 © Chris Mack, 2013 (Image from Wikimedia Commons) Resist 4

LOCOS Process Shallow Trench Isolation Processes

Deposit filmstack Pattern trench • Bird’s beak encroaches on active area, using up space FOX Bird’s Beak Resist strip Thermal oxidation (liner oxide)

• Better isolation comes from thicker oxide, but Deposit CVD oxide fill CMP oxide this leads to larger bird’s beak • Usually a field implant is carried out just before oxidation (to increase V of parasitic th Strip nitride MOSFET) (Image from Wikimedia Commons) Silicon Substrate Silicon Nitride Silicon Dioxide Resist © Chris Mack, 2013 5 © Chris Mack, 2013 6

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STI Process Lecture 27: What have we learned?

• Now the dominant isolation approach • Why is device isolation needed? • Uses less area, allowing greater transistor • What are the two most common device isolation processes? • Trench depth can be large (~500nm) even • Why is STI the more common today? as trench width decreases • Requires well controlled deep etches, good oxide CVD process, and CMP

© Chris Mack, 2013 7 © Chris Mack, 2013 8

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