Ellipsometry
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Polarization of Electron and Photon Beams
Revista Brasileira de Física, Vol. 11, NP 4, 1981 Polarization of Electron and Photon Beams ?. R. S. GOMES Instituto de Física, Universidade Federal Fluminense, Niterdi, RJ. Recebido eni 17 de Fevereiro de 1981 In this work the concepts of polarization of photons and re- lativistic electrons are introduced in a simplified form. Although there are important differences in the concepts of photon and electron polarization, it is shown that the saine formal ism may be used to des- cribe them, which is very useful in the study oF interactions concer- ned with polarizations of both photons and electrons, as in the yho- toelectric and Compton effects. Photons are considered, in this work, as a special case of relativistic spin 1 particles, with zero rest mass. Neste trabalho são apresentados, de uma forma simplificada, os conceitos de polarização de fotons e eletrons. Embora existam im- portantes diferenças nos conceitos de polarizaçao de fot0ns.e eletrons, mostra-se que o mesmo formalismo pode ser usado para descreve-los, o que é muito útil no estudo de interações envolvendo polarizações de ambos, fotons e eletrons, como em efeitos fotoelétrico e Compton. Nes- te trabalho os fotons são considerados como um caso especial de partí- culas relativísticas de spin 1, com massa de repouso nula. 1. INTRODUCTION Dur ing a research progi-am concerned xi th correlat ions between polarizãtions of photons and electror~sin relativistic photoelectric effect, i t was noticed the lack of a text which brings together thecon- cepts and simplified descriptions of polarization of electron and pho- ton beams . That was the reason for trying to write such a text. -
Polarizer QWP Mirror Index Card
PH 481 Physical Optics Winter 2014 Laboratory #8 Week of March 3 Read: pp. 336-344, 352-356, and 360-365 of "Optics" by Hecht Do: 1. Experiment VIII.1: Birefringence and Optical Isolation 2. Experiment VIII.2: Birefringent crystals: double refraction 3. Experiment VIII.3: Optical activity: rotary power of sugar Experiment VIII.1: Birefringence and Optical Isolation In this experiment the birefringence of a material will be used to change the polarization of the laser beam. You will use a quarter-wave plate and a polarizer to build an optical isolator. This is a useful device that ensures that light is not reflected back into the laser. This has practical importance since light reflected back into a laser can perturb the laser operation. A quarter-wave plate is a specific example of a retarder, a device that introduces a phase difference between waves with orthogonal polarizations. A birefringent material has two different indices of refraction for orthogonal polarizations and so is well suited for this task. We will refer to these two directions as the fast and slow axes. A wave polarized along the fast axis will move through the material faster than a wave polarized along the slow axis. A wave that is linearly polarized along some arbitrary direction can be decomposed into its components along the slow and fast axes, resulting in part of the wave traveling faster than the other part. The wave that leaves the material will then have a more general elliptical polarization. A quarter-wave plate is designed so that the fast and slow Laser components of a wave will experience a relative phase shift of Index Card π/2 (1/4 of 2π) upon traversing the plate. -
Lab 8: Polarization of Light
Lab 8: Polarization of Light 1 Introduction Refer to Appendix D for photos of the appara- tus Polarization is a fundamental property of light and a very important concept of physical optics. Not all sources of light are polarized; for instance, light from an ordinary light bulb is not polarized. In addition to unpolarized light, there is partially polarized light and totally polarized light. Light from a rainbow, reflected sunlight, and coherent laser light are examples of po- larized light. There are three di®erent types of po- larization states: linear, circular and elliptical. Each of these commonly encountered states is characterized Figure 1: (a)Oscillation of E vector, (b)An electromagnetic by a di®ering motion of the electric ¯eld vector with ¯eld. respect to the direction of propagation of the light wave. It is useful to be able to di®erentiate between 2 Background the di®erent types of polarization. Some common de- vices for measuring polarization are linear polarizers and retarders. Polaroid sunglasses are examples of po- Light is a transverse electromagnetic wave. Its prop- larizers. They block certain radiations such as glare agation can therefore be explained by recalling the from reflected sunlight. Polarizers are useful in ob- properties of transverse waves. Picture a transverse taining and analyzing linear polarization. Retarders wave as traced by a point that oscillates sinusoidally (also called wave plates) can alter the type of polar- in a plane, such that the direction of oscillation is ization and/or rotate its direction. They are used in perpendicular to the direction of propagation of the controlling and analyzing polarization states. -
Observation of Elliptically Polarized Light from Total Internal Reflection in Bubbles
Observation of elliptically polarized light from total internal reflection in bubbles Item Type Article Authors Miller, Sawyer; Ding, Yitian; Jiang, Linan; Tu, Xingzhou; Pau, Stanley Citation Miller, S., Ding, Y., Jiang, L. et al. Observation of elliptically polarized light from total internal reflection in bubbles. Sci Rep 10, 8725 (2020). https://doi.org/10.1038/s41598-020-65410-5 DOI 10.1038/s41598-020-65410-5 Publisher NATURE PUBLISHING GROUP Journal SCIENTIFIC REPORTS Rights Copyright © The Author(s) 2020. Open Access This article is licensed under a Creative Commons Attribution 4.0 International License. Download date 29/09/2021 02:08:57 Item License https://creativecommons.org/licenses/by/4.0/ Version Final published version Link to Item http://hdl.handle.net/10150/641865 www.nature.com/scientificreports OPEN Observation of elliptically polarized light from total internal refection in bubbles Sawyer Miller1,2 ✉ , Yitian Ding1,2, Linan Jiang1, Xingzhou Tu1 & Stanley Pau1 ✉ Bubbles are ubiquitous in the natural environment, where diferent substances and phases of the same substance forms globules due to diferences in pressure and surface tension. Total internal refection occurs at the interface of a bubble, where light travels from the higher refractive index material outside a bubble to the lower index material inside a bubble at appropriate angles of incidence, which can lead to a phase shift in the refected light. Linearly polarized skylight can be converted to elliptically polarized light with efciency up to 53% by single scattering from the water-air interface. Total internal refection from air bubble in water is one of the few sources of elliptical polarization in the natural world. -
Characterization of an Active Metasurface Using Terahertz Ellipsometry Nicholas Karl, Martin S
Characterization of an active metasurface using terahertz ellipsometry Nicholas Karl, Martin S. Heimbeck, Henry O. Everitt, Hou-Tong Chen, Antoinette J. Taylor, Igal Brener, Alexander Benz, John L. Reno, Rajind Mendis, and Daniel M. Mittleman Citation: Appl. Phys. Lett. 111, 191101 (2017); View online: https://doi.org/10.1063/1.5004194 View Table of Contents: http://aip.scitation.org/toc/apl/111/19 Published by the American Institute of Physics APPLIED PHYSICS LETTERS 111, 191101 (2017) Characterization of an active metasurface using terahertz ellipsometry Nicholas Karl,1 Martin S. Heimbeck,2 Henry O. Everitt,2 Hou-Tong Chen,3 Antoinette J. Taylor,3 Igal Brener,4 Alexander Benz,4 John L. Reno,4 Rajind Mendis,1 and Daniel M. Mittleman1 1School of Engineering, Brown University, 184 Hope St., Providence, Rhode Island 02912, USA 2U.S. Army AMRDEC, Redstone Arsenal, Huntsville, Alabama 35808, USA 3Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA 4Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, New Mexico 87185, USA (Received 11 September 2017; accepted 19 October 2017; published online 6 November 2017) Switchable metasurfaces fabricated on a doped epi-layer have become an important platform for developing techniques to control terahertz (THz) radiation, as a DC bias can modulate the transmis- sion characteristics of the metasurface. To model and understand this performance in new device configurations accurately, a quantitative understanding of the bias-dependent surface characteristics is required. We perform THz variable angle spectroscopic ellipsometry on a switchable metasur- face as a function of DC bias. By comparing these data with numerical simulations, we extract a model for the response of the metasurface at any bias value. -
(EM) Waves Are Forms of Energy That Have Magnetic and Electric Components
Physics 202-Section 2G Worksheet 9-Electromagnetic Radiation and Polarizers Formulas and Concepts Electromagnetic (EM) waves are forms of energy that have magnetic and electric components. EM waves carry energy, not matter. EM waves all travel at the speed of light, which is about 3*108 m/s. The speed of light is often represented by the letter c. Only small part of the EM spectrum is visible to us (colors). Waves are defined by their frequency (measured in hertz) and wavelength (measured in meters). These quantities are related to velocity of waves according to the formula: 풗 = 흀풇 and for EM waves: 풄 = 흀풇 Intensity is a property of EM waves. Intensity is defined as power per area. 푷 푺 = , where P is average power 푨 o Intensity is related the magnetic and electric fields associated with an EM wave. It can be calculated using the magnitude of the magnetic field or the electric field. o Additionally, both the average magnetic and average electric fields can be calculated from the intensity. ퟐ ퟐ 푩 푺 = 풄휺ퟎ푬 = 풄 흁ퟎ Polarizability is a property of EM waves. o Unpolarized waves can oscillate in more than one orientation. Polarizing the wave (often light) decreases the intensity of the wave/light. o When unpolarized light goes through a polarizer, the intensity decreases by 50%. ퟏ 푺 = 푺 ퟏ ퟐ ퟎ o When light that is polarized in one direction travels through another polarizer, the intensity decreases again, according to the angle between the orientations of the two polarizers. ퟐ 푺ퟐ = 푺ퟏ풄풐풔 휽 this is called Malus’ Law. -
Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy
hv photonics Article Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy Najat Andam 1,2 , Siham Refki 2, Hidekazu Ishitobi 3,4, Yasushi Inouye 3,4 and Zouheir Sekkat 1,2,4,* 1 Department of Chemistry, Faculty of Sciences, Mohammed V University, Rabat BP 1014, Morocco; [email protected] 2 Optics and Photonics Center, Moroccan Foundation for Advanced Science, Innovation and Research, Rabat BP 10100, Morocco; [email protected] 3 Frontiers Biosciences, Osaka University, Osaka 565-0871, Japan; [email protected] (H.I.); [email protected] (Y.I.) 4 Department of Applied Physics, Osaka University, Osaka 565-0871, Japan * Correspondence: [email protected] Abstract: The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the Citation: Andam, N.; Refki, S.; Ishitobi, H.; Inouye, Y.; Sekkat, Z. -
Finding the Optimal Polarizer
Finding the Optimal Polarizer William S. Barbarow Meadowlark Optics Inc., 5964 Iris Parkway, Frederick, CO 80530 (Dated: January 12, 2009) ”I have an application requiring polarized light. What type of polarizer should I use?” This is a question that is routinely asked in the field of polarization optics. Many applications today require polarized light, ranging from semiconductor wafer processing to reducing the glare in a periscope. Polarizers are used to obtain polarized light. A polarizer is a polarization selector; generically a tool or material that selects a desired polarization of light from an unpolarized input beam and allows it to transmit through while absorbing, scattering or reflecting the unwanted polarizations. However, with five different varieties of linear polarizers, choosing the correct polarizer for your application is not easy. This paper presents some background on the theory of polarization, the five different polarizer categories and then concludes with a method that will help you determine exactly what polarizer is best suited for your application. I. POLARIZATION THEORY - THE TYPES OF not ideal, they transmit less than 50% of unpolarized POLARIZATION light or less than 100% of optimally polarized light; usu- ally between 40% and 98% of optimally polarized light. Light is a transverse electromagnetic wave. Every light Polarizers also have some leakage of the light that is not wave has a direction of propagation with electric and polarized in the desired direction. The ratio between the magnetic fields that are perpendicular to the direction transmission of the desired polarization direction and the of propagation of the wave. The direction of the electric undesired orthogonal polarization direction is the other 2 field oscillation is defined as the polarization direction. -
Lecture 14: Polarization
Matthew Schwartz Lecture 14: Polarization 1 Polarization vectors In the last lecture, we showed that Maxwell’s equations admit plane wave solutions ~ · − ~ · − E~ = E~ ei k x~ ωt , B~ = B~ ei k x~ ωt (1) 0 0 ~ ~ Here, E0 and B0 are called the polarization vectors for the electric and magnetic fields. These are complex 3 dimensional vectors. The wavevector ~k and angular frequency ω are real and in the vacuum are related by ω = c ~k . This relation implies that electromagnetic waves are disper- sionless with velocity c: the speed of light. In materials, like a prism, light can have dispersion. We will come to this later. In addition, we found that for plane waves 1 B~ = ~k × E~ (2) 0 ω 0 This equation implies that the magnetic field in a plane wave is completely determined by the electric field. In particular, it implies that their magnitudes are related by ~ ~ E0 = c B0 (3) and that ~ ~ ~ ~ ~ ~ k · E0 =0, k · B0 =0, E0 · B0 =0 (4) In other words, the polarization vector of the electric field, the polarization vector of the mag- netic field, and the direction ~k that the plane wave is propagating are all orthogonal. To see how much freedom there is left in the plane wave, it’s helpful to choose coordinates. We can always define the zˆ direction as where ~k points. When we put a hat on a vector, it means the unit vector pointing in that direction, that is zˆ=(0, 0, 1). Thus the electric field has the form iω z −t E~ E~ e c = 0 (5) ~ ~ which moves in the z direction at the speed of light. -
Use of Spectroscopic Ellipsometry and Modeling in Determining Composition and Thickness of Barium Strontium Titanate Thin-Films
Use of Spectroscopic Ellipsometry and Modeling in Determining Composition and Thickness of Barium Strontium Titanate Thin-Films A Thesis Submitted to the Faculty of Drexel University by Dominic G. Bruzzese III in partial fulfillment of the requirements for the degree of MS in Materials Science and Engineering June 2010 c Copyright June 2010 Dominic G. Bruzzese III. All Rights Reserved. Acknowledgements I would like to acknowledge the guidance and motivation I received from my advi- sor Dr. Jonathan Spanier not just during my thesis but for my entire stay at Drexel University. Eric Gallo for his help as my graduate student mentor and always making himself available to help me with everything from performing an experiment to ana- lyzing some result, he has been an immeasurable resource. Keith Fahnestock and the Natural Polymers and Photonics Group under the direction of Dr. Caroline Schauer for allowing the use of their ellipsometer, without which this work would not have been possible. I would like to thank everyone in the MesoMaterials Laboratory, espe- cially Stephen Nonenmann, Stephanie Johnson, Guannan Chen, Christopher Hawley, Brian Beatty, Joan Burger, and Andrew Akbasheu for help with experiments, as well as Oren Leffer and Terrence McGuckin for enlightening discussions. Claire Weiss and Dr. Pamir Alpay at the University of Connecticut have both contributed much to the the field and I am grateful for their work; also Claire produced the MOSD samples on which much of the characterization and modeling was done. Dr. Melanie Cole and the Army Research Office and Dr. Marc Ulrich for funding the project under W911NF-08-0124 and W911NF-08-0067. -
Polarization of Light Demonstration This Demonstration Explains Transverse Waves and Some Surprising Properties of Polarizers
Polarization of Light Demonstration This demonstration explains transverse waves and some surprising properties of polarizers. Number of Participants: Unlimited Audience: Middle (ages 11-13) and up Duration: 5-10 min Microbehunter Difficulty: Level 1 Materials Required: • 3 sheets of polarizing film – at least (20mm)2 • Long spring or Slinky Setup: 1. If necessary, prepare polarizing sheets by cutting a larger sheet into smaller pieces. While larger pieces of polarizing material are preferred, the demonstration works with smaller pieces. Presenter Brief: Light is a transverse wave because its two components, electric and magnetic fields, oscillate perpendicular to the direction of propagation. In general, a beam of light will consist of many photons traveling in the same direction but with arbitrary alignment of their electric and magnetic fields. Specifically, for an unpolarized light beam the electromagnetic components of each photon, while confined to a plane, are not aligned. If light is polarized, photons have aligned electromagnetic components and travel in the same direction. Polarization of Light Vocabulary: • Light – Electromagnetic radiation, which can be in the visible range. • Electromagnetic – A transverse wave consisting of oscillating electric and magnetic components. • Transverse wave – A wave consisting of oscillations perpendicular to the direction of propagation. • Polarized light – A beam of photons propagating with aligned oscillating components.Polarizer – A material which filters homogenous light along a singular axis and thus blocks arbitrary orientations and allows a specific orientation of oscillations. Physics & Explanation: Middle (ages 11-13) and general public: Light, or an electromagnetic wave, is a transverse wave with oscillating electric and magnetic components. Recall that in a transverse wave, the vibrations,” or oscillations, are perpendicular to the direction of propagation. -
Ellipsometry
AALBORG UNIVERSITY Institute of Physics and Nanotechnology Pontoppidanstræde 103 - 9220 Aalborg Øst - Telephone 96 35 92 15 TITLE: Ellipsometry SYNOPSIS: This project concerns measurement of the re- fractive index of various materials and mea- PROJECT PERIOD: surement of the thickness of thin films on sili- September 1st - December 21st 2004 con substrates by use of ellipsometry. The el- lipsometer used in the experiments is the SE 850 photometric rotating analyzer ellipsome- ter from Sentech. THEME: After an introduction to ellipsometry and a Detection of Nanostructures problem description, the subjects of polar- ization and essential ellipsometry theory are covered. PROJECT GROUP: The index of refraction for silicon, alu- 116 minum, copper and silver are modelled us- ing the Drude-Lorentz harmonic oscillator model and afterwards measured by ellipsom- etry. The results based on the measurements GROUP MEMBERS: show a tendency towards, but are not ade- Jesper Jung quately close to, the table values. The mate- Jakob Bork rials are therefore modelled with a thin layer of oxide, and the refractive indexes are com- Tobias Holmgaard puted. This model yields good results for the Niels Anker Kortbek refractive index of silicon and copper. For aluminum the result is improved whereas the result for silver is not. SUPERVISOR: The thickness of a thin film of SiO2 on a sub- strate of silicon is measured by use of ellip- Kjeld Pedersen sometry. The result is 22.9 nm which deviates from the provided information by 6.5 %. The thickness of two thick (multiple wave- NUMBERS PRINTED: 7 lengths) thin polymer films are measured. The polymer films have been spin coated on REPORT PAGE NUMBER: 70 substrates of silicon and the uniformities of the surfaces are investigated.