4PI CONFOCAL

Effective Axial Resolution in Single-photon 4Pi Microscopy

The feasibility of single-photon 4Pi- is theoretically demonstrated. By inserting a pair of properly designed multi-ring phase- only pupil filters in the illumination path of a 4Pi the height of the sidelobes of the is importantly reduced, so that there is not ambiguity in the 3D image. Then, an axial resolution up to four times higher than that of sin- gle-photon confocal microscope can be effectively achieved.

Introduction

Confocal scanning microscopy is an imaging technique whose main feature is its proverbial capacity [1]. Although confocal technique was specifically designed to improve the axial resolution, it is remarkable that due to the laws of diffraction the resolution in Fig. 1: Schematic lay out of a 4Pi(c)-confocal microscope. Relay lenses are used to focus the pupil filters into the back focal planes of the objectives. the direction of the optical axis is about three times poorer than its lateral coun- terpart. This difference between axial To overcome this problem, it was pro- and lateral resolution leads to ani- posed the use of two-photon excitation sotropic images of three-dimensional [4], which allow an important reduction (3D) specimens. of the height of the secondary axial One attempt to reduce this anisotropy lobes. Then data deconvolution tech- is to insert in the illumination arm of the niques can be used to improve the qual- confocal setup a pupil filter composed by ity of the image [5]. two equal-area transparent rings [2]. What we report here is that by using a With this technique it is possible reduce pair properly designed phase-only pupil the axial extent of the point spread func- filters, the axial sidelobes of the PSF can tion (PSF) up to a factor 1.5. A very inge- be strongly downed. This implies that nious technique for reducing the axial single-photon 4Pi-confocal microscopy Prof. Manuel Martínez- extent of the PSF is to create a standing Corral can produce unambiguous 3D images, wave by the interference of two opposing and then it makes not necessary to resort wave-fronts, as made in the so-called to multi-photon processes. The phase- 4Pi-confocal microscopy [3]. In the 4Pi- filters are designed according to the ax- confocal microscope two opposing high- ial form of the Toraldo’s pupil-synthesis NA objectives are used for coherently il- method [6,7], and are composed by seven luminating and detecting the same point annular transparent zones. illuminating beam is linearly polarized, of a fluorescent specimen. The resulting the 3D PSF of this imaging system is PSF has an axial main peak that is about given by four times narrower than its confocal The 4Pi confocal principle counterpart. However, the narrowing of Consider a 4Pi(c)-confocal scanning mi- I (z,r,ϕ) = I (r,z,ϕ) I (r,z) = the main peak is accompanied by a se- 4Pi ill det croscope [3] like the one plotted in figure Ε (r,z,ϕ) + Ε (r,–z,–ϕ)2 Ε (εr, εz) vere enlargement of the secondary axial 1. The 3D specimen is illuminated by the + Ε (εr, – εz)2 (1) sidelobes, which lead to ambiguity in the standing wave generated by the inter- image. ference between the two opposing, where random polarization of fluores- tightly focused waves proceeding from cent light has been assumed. The para- the high NA objectives. The light emitted meter ε = λ λ fl represents the ratio exc / Keywords by the fluorescent specimen is collected between the excitation and the fluores- Confocal microscopy, Axial resolution, by the same objectives, and interfere at cence wavelength. In eq.(1) the function Apodization, Single-photon fluorescence the pinhole plane. If we consider that the Ε(r,z,ϕ) denotes the electric field in the

G.I.T. Imaging & Microscopy 2/2002 • 29 4PI CONFOCAL MICROSCOPY

focal region of an aberration-free lens il- The filters are inserted in the illumina- luminated by a linearly-polarized plane tion path to avoid waste of fluorescence wavefront. According to Richards and light. Wolf [8], Following the Toraldo’s method [7] we have designed a pupil filter that consists Ε ϕ [ ϕ] (r,z, )= I0 (r,z) + I2 (r,z) cos2 i + of seven annular zones. The zones have ϕ ϕ I2 (r,z) sin2 j –2iI1 (r,z) cos k (2) no absorption, having each pair of neigh- boring zones opposite phases, see figure

where I0,1,2 are integrals over the aper- 3. The choice of phase-only filters with ture angle and ϕ stands for the angle be- constant transmittance in the annular tween the polarization direction of the zones yields to a design that can be man- incident field and the observation merid- ufactured with relative ease. In figure 4 ian plane. we show the, numerically evaluated, PSF An example of 3D PSF is shown in of a 4Pi-confocal microscope in which figure 2, where we selected for the cal- two copies of the above phase filter are Fig. 2a culations NA=1.4 (n=1.518, α=67.5), inserted in the illumination path. The pa- λ ε exc=350 nm and = 0.8. Note from this rameters for the calculation were the figure that the PSF exhibits, along the same as the ones used in figure 2. Apart axial direction, a very narrow central from strongly reducing the axial side- lobe, but high axial sidelobes that can lobes, the use of Toraldo filters hardly af- produce artifacts in the 3D image. fects to the transverse extent of the PSF. To illustrate the utility of our proposal The use of phase-shifting apodizers a numerical imaging experiment was performed. We designed an elaborated To overcome the sidelobes problem synthetic 3D object consisting of two con- we propose to place in the illumination centric spherical fluorescence labeled path of a single-photon 4Pi-confocal mi- shells, as shown in figure 5(a). The test croscope, a pair of properly-designed object was designed to contain all the ax- phase-only pupil filters. This produces a ial and transverse frequencies. The dark significant reduction of the axial-PSF band in the object permits to clearly vi- sidelobes, and therefore makes it unnec- sualize the improvement in resolution essary the use of two-photon processes. along the different directions passing Fig. 2b

Fig. 2: Numerically evaluated contour plots of the 3D inten- sity PSF in the meridian plane ϕ = π / 2 corresponding to: (a) One objective; (b) Two oppos- ing illumination objectives; (c) Two opposing collection objectives; and (d) The 4Pi single-photon confocal mi- croscope. The parameters for the calculation were NA=1.4, λ λ exc=350 nm and fl =440 nm

Fig. 2c Fig. 3: The seven-zone Toraldo filter

Fig. 4: Contour plot of the intensity PSF correspond- ing to the apodized 4Pi Fig. 2d confocal microscope.

30 • G.I.T. Imaging & Microscopy 2/2002 4PI CONFOCAL MICROSCOPY

Conclusions [3] Hell, S.; E.H.K. Stelzer: J. Opt. Soc. Am. A 9, 2159–2166 (1992) The viability of single-photon 4Pi-confo- [4] Nagorni, M.; S. Hell: J. Opt. Soc. Am. A 18, cal microscopy is theoretically demon- 36–48 (2001) strated. By using multi-ring phase-only [5] Nagorni, M.; S. Hell: J. Opt. Soc. Am. A 18, pupil filters in the illumination path of 49–54 (2001) the microscope it is possible to down the [6] Toraldo di Francia, G.: Atti Fond. Giorgio axial sidelobes height to 7 % of the main Ronchi 7, 366–372 (1952) peak. This allows the system to receive [7] Martínez-Corral, M.; M. T. Caballero, E.H.K. the full benefit in axial resolution from a Stelzer, J. Swoger: Opt. Express 10, 98–103 main peak that is about four times (2002) sharper than that of a confocal micro- [8] Richards, B.; E. Wolf: Proc. Roy. Soc. (London) scope. The combination of the proposed A 253, 358–379 (1959) technique with deconvolution techniques would make it unnecessary the use of Prof. Manuel Martínez-Corral Fig. 5a multi-photon processes. is Professor of Optics at the University of Valencia. He received his M.S. and Ph.D. degrees from the same University in 1988 and 1993, respectively. Since 1999 Acknowledgements he leads the “3D Diffraction and Image Processing Research Group”, at the Optics Department. His re- This research was supported the Plan search interest includes focusing properties of light, Nacional I+D+I (Grant DPI2000-0774), laser beam shaping and improvement of resolution in Ministerio de Ciencia y Tecnología, Spain. 3D microscopy. He has published on these topics more than forty publications subject to peer review.

Literature Departamento de Óptica Universidad de Valencia [1] Wilson, T. (ed): Confocal Microscopy, Acade- E-46100 Burjassot, Spain mic, London 1990 Fax: +34 963864515 [2] Martínez-Corral, M.; P. Andrés; J. Ojeda-Cas- E-mail: [email protected] tañeda; G. Saavedra: Opt. Commun. 119, 491–498 (1995) Easy Info no. 210

Fig. 5b

Fig. 5c

Fig. 5: Imaging of the synthetic 3D object: (a) Test object consisting of two concentric spher- ical fluorescence labeled shells; (b) Axial sec- tion (x,z) of the calculated mage for the case of the confocal microscope; (c) Same as (b) but for the case of the apodized 4Pi microscope. through the focus. After convolution with the PSF of the 4Pi microscope (Fig. 4) and with the one corresponding to the confocal counterpart, we obtained the simulated images shown in figure 5(b-c). As can be noticed from the images the optical sectioning capacity of the apodized 4Pi is really superior to that of the confocal microscope.

G.I.T. Imaging & Microscopy 2/2002 • 31