Mountains® 7.3 Release
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Fall 2015 Surface imaging, analysis & metrology news from Digital Surf ® In this issue Mountains 7.3 release: all the key features explained Whatever your microscope or profilometer, the new Mountains® What’s new in 7.3 ? 7.3 update to be released this winter has something for you. - for Surface New features include automatic detection of step heights on topography surfaces, revolutionary SEM image colorization, options for - for Scanning electron advanced profile analysis and much, much more. microscopy - for Profile analysis - for Scanning Probe Microscopy - General features p. 2 Research Using Mountains® to process STM/STS measurements p. 6 Automatic step height detection Surface metrology Q&A Profile standards are set to change: what you need to know p. 8 Read more overleaf News in brief A look back at this summer's shows p. 10 Coming soon Deconvoluting a multi-peak curve p. 11 Probing electrical structure at the Metrologists: how will the upcoming atomic scale: Mountains® helps revision of profile parameters researchers reveal hidden details standards affect you? p. 6 p. 8 Join us on Facebook, PLUS LinkedIn and YouTube! Visitors to the 2015 MRS Fall Meeting & Exhibit in Boston, Massachusetts, USA (November 29 - December 4) are invited to preview new Mountains® 7.3 features at Digital Surf's booth 704. www.digitalsurf.com 2 MOUNTAINS 7.3 WHAT’S NEW FOR SURFACE TOPOGRAPHY? FACTS Step-height calculation Just got easier! Step height calculation has never The color-code allows you to quickly been easier thanks to Mountains® find measurements related to each new automatic detection method. plane in the parameters table. Whereas previously it was necessary A particularly useful feature to manually define the different planes for measuring step heights on of a surface, Mountains® now does the complex surfaces such as electrical work for you. components! In just one click, see your different step heights instantly appear as different MEMS pressure sensor color-coded areas on the surface. Lighting customization for your 3D models Lights, camera, action! Take the director’s chair and add or remove lighting, change projector positions and light your surface the way you want! Use the new "Lighting configuration" menu when in 3D view to edit and save your lighting settings for reuse on other surfaces. Different lighting types and positions applied to a surface, allowing better visualization of otherwise hidden features Other new features for Surface topography: graphical scale enhancement, export a study as a new image studiable in the workflow, new options for aligning series of surfaces or images etc. Read more: www.digitalsurf.com/whatsnew 3 MOUNTAINS 7.3 WHAT’S NEW FOR SCANNING ELECTRON MICROSCOPY? FACTS Built-in click & color colorization Saves you hours Colorizing your SEM images can really aid visualization Here are 3 reasons to use Mountains® and interpretation of the information they contain, for colorizing your SEM images as well as making them more aesthetically pleasing for publication purposes. It’s quick. One click of the mouse is enough to color an object in your 1image. Objects are detected automatically. No need to create layers or play 2with transparency levels. Mountains® does the work for you Use the same software for image processing & analysis. Once you’ve 3colorized your image in Mountains®, ® making objects easier to see, you have Colorizing images using Mountains couldn't be easier. Simply access to a comprehensive range of tools choose a color from the color picker and apply. to carry out different types of analysis: 3D reconstruction, surface geometry anal- Example: secondary electron image of ash particles recorded by ysis, surface roughness measurement. Randolph Shannon, Lab Manager, PMET Inc., New Brighton, PA See more examples and watch the Mountains® video tutorial by visiting www.digitalsurf.com Other new features for SEM: new operators on images (lighting, resampling etc.) Read more: www.digitalsurf.com/whatsnew 4 MOUNTAINS 7.3 WHAT’S NEW FOR PROFILE ANALYSIS? FACTS Generate sliding profiles For improved measurement reliability To assess the dispersion of values The new “Sliding profiles” operator in along a profile and hence the sta- Mountains® generates a series of pro- tistical reliability of surface texture files on each of which average param- parameters, it may be useful to cal- eters may be calculated. culate these parameters, for instance Ra (average surface roughness), on several sliding profile segments, rather than on the total measurement length. The new operator generates several consecutive or overlapping profiles. New extract area operator Zoom in on parametric profiles As for basic profiles and surfaces, it is now possible to extract areas or zones from parametric profiles, e.g. resulting from the horizontal profile extraction of a surface object. Select elements to extract simply by double clicking on them in the dialog. This is a useful feature for zooming in on a region of interest. Other new features for profiles: new parameters, profile enhancement features (line thickness...), zoom etc. Read more: www.digitalsurf.com/whatsnew 5 MOUNTAINS 7.3 WHAT’S NEW FOR SCANNING PROBE MICROSCOPY? FACTS Distinguish elements in a series Extended flexibility for publication in your research papers Graphs and other display items play an important role in enhancing the quality of manuscripts. They offer the reader a quick overview of the study findings, and allow authors to present detailed results and complex trends in a clear and concise way. To better serve the needs of the thousands of researchers who use Mountains® for their work, the software now offers the possibility of distinguishing elements on series of profiles, series of spectrum or force curves. Different styles (color, line width, line style) can be associated with each element. A key visible on the top right clearly identifies what each element in the graph stands for. Other new features for SPM: map study on force volume curves, display spectrum in normalized mode, features for STM and STS data (see overleaf). Read more: www.digitalsurf.com/whatsnew GENERAL FEATURES FACTS ® User interface now available in Russian Get MountainsMap 7.3! Keeping your Mountains® software up- “привет” (Privyet) to all our Russian users! to-date will ensure you have all the latest The Mountains® software interface is now features and bug fixes as well as improving available in Russian. To enable Russian simply go to Preferences and select Russian the overall security of your computer. from the list of our 11 working languages! - MountainsMap® users will receive an email inviting them to update their software online as soon as the new version is available. - If you are still using MountainsMap® 6 or an earlier version of the software, please contact us directly to talk about an update. Other new general features: improved compatibility with external applications, video compression, clipboard enhancements, user Phone +33 38150 4800 or email us interface adapted to high resolution display, new file formats etc. at [email protected] Read more: www.digitalsurf.com/whatsnew 6 RESEARCH PROBING ELECTRICAL STRUCTURE AT THE ATOMIC SCALE Mountains® helps researchers reveal hidden details SEM image showing the GaAs nanowire array analyzed (image colorized using Mountains®) Using SPM to investigate semiconductor surfaces Scanning tunneling microscopy (STM) belongs to the As a general rule, a large number surface science tools that enable both imaging of surfaces of I-V characteristics are acquired at the atomic scale and investigation of their spectroscopic 1under identical feedback conditions. properties. Bruno Grandidier of the Institut d'Électronique, Sets of reproducible characteristics de Microélectronique et de Nanotechnologies (IEMN) in must be averaged in order to increase Lille, France, tells Surface newsletter how he and his team the signal-to-noise ratio. of researchers use this technique, along with Mountains® software, to analyze electronic states of GaAs nanowire shells. Despite averaging, I-V character- When used in spectroscopic mode, STM gives access to the istics are strongly dependent on electronic states of a surface within a given energy window. 2the transmission probability. Related This window depends on the bias applied across the tunneling changes in the spectrum may hide junction formed by the surface of a material and the STM probe. small variations induced by the elec- tronic properties of the semiconduc- This technique is particularly well suited to investigating semiconductor tor. Moreover, the current is obtained surfaces. By measuring the dependence of the tunneling current on from the integration of states within the applied voltage, one can deduce key information from an I-V the energy range for which tunneling characteristic, such as the width of the semiconductor band gap and occurs. Thus, obtaining the electronic the spectral position of electronic bands. structure of the sample usually requires acquiring the derivative of the current However, several difficulties have to be overcome before obtaining and vertically moving the STM tip in a this information. controlled manner so that the dynamic range increases. The electronic properties of the sample can only be obtained once all these procedures have been applied. The good news is, Mountains® software now provides The differential conductance must the extraction and processing methods required to handle these del- then be normalized with regard to icate operations. 3the average I-V characteristic, convo- luted to a suitable function to get rid of the dependence of the transmission probability and avoid any divergence. Research into the structural and electronical properties of GaAs (gallium arsenide) nanowires is of great interest for the next generation of compact terahertz sources and detectors with numerous applications in astronomy, communications, sensing, imaging and medical diagnostics. 7 RESEARCH Obtaining information on electrical structure using Mountains® software Let's have a closer look at these new tools, unveiled at low temperature and thus contains a high concentration in the new 7.3 version of the software.