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Diapositive 1 MountainsMap® SPM Surface metrology software for scanning probe microscopes Highly intuitive, state of the art imaging and analysis MountainsMap® SPM software is a best in class solution for Powered by industry-standard Mountains Technology®, SPM imaging and analysis for nanotechnology and MountainsMap® SPM runs in a highly intuitive desktop nanoscience applications . It inputs multi-channel images publishing environment that takes all of the pain out of (topography, phase, deflection, etc.) from SPM’s (AFM’s, creating a surface metrology report. The standard STM’s, NSOM’s). You can manipulate the images MountainsMap® SPM software can be enhanced by adding simultaneously, overlay any image (for example phase) on optional modules for surface stitching (the automatic the surface topography to facilitate the study of correlations, assembly of multiple surface into a single surface), grains and of course study any image independently. Intelligent and particles analysis, force spectroscopy, advanced surface filters ensure that you see high quality images of everything texture analysis, nano-contour analysis, spectral analysis and that the SPM has measured. You carry out geometric filtering, the analysis of surface evolution, wavelets analysis, analysis, analysis of roughness and surface texture, image co-localization and statistics. Report functional analysis and more, all in accordance with the latest standards and methods. Analyze Analyze Visualize Visualize Powered by Mountains Technology® Work comfortably in a desktop publishing environment with full metrological traceability Visual analysis reports Powerful automation features Working in one of six European languages, Japanese, Any step can be fine tuned at any time and all of the Korean or Mandarin Chinese, you build a visual analysis dependent steps are recalculated automatically. Common report frame by frame, page by page, carrying out graphical sequences of steps can be saved in a library and inserted and analytical studies of the surface under study, applying into any document at any time to gain time. Once an analysis filters, calculating ISO and national parameters, inserting report has been completed it can be applied as a template to measurement identity cards, adding comments and automate the analysis of multiple measurement data files. illustrations. Every analysis step is recorded in a hierarchical Pass/fail criteria with tolerances can be defined for any analysis workflow that assures full metrological traceability. parameter. Green/red pass fail traffic lights are displayed You can navigate to any frame by clicking on it in the automatically together with instructions on how to handle workflow or in the page viewer. Numerical results can be failures. exported in an Excel .csv file, frames and pages can be exported as bitmaps, and finished reports can be exported as PDF files for easy circulation. Two page document including studies in the Grains and Particles optional module 2 See everything that you measure Real time 3D imaging Multi-channel imaging MountainsMap® SPM inputs multi-channel images. You can manipulate all of the images simultaneously, zooming in on them simultaneously, rotating them to any angle, and extracting profiles between the same points on each image. You can extract individual images for visualization and analysis, applying different renderings, controlling the lighting level, selecting the height amplification and using any standard or user-defined palette for the vertical scale. The palette can be fine tuned automatically or interactively to highlight surface features, taking into account the distribution of data points on the surface. In addition, you can define a flight plan and fly over a surface, taking in all of the features of interest and output a video. Overlays Any image can be overlaid on the surface topography making it possible to visualize any correlations, for example between phase and topography. Phase overlay (in degree units) on topography Multi-channel imaging 3 Assuring the highest quality images Powerful tools for removing artifacts and eliminating noise Notoriously SPM’s produce measurement artifacts and noise Correction that can obscure surface features. In addition surfaces may Aberrant scan lines can be removed and irregular scan lines need to be leveled or flipped prior to analysis. can be corrected. Thresholding removes anomalous spikes, MountainsMap® SPM provides a full set of normalization, tip deconvolution minimizes tip impact on measurement data, correction and denoising tools. and isolated artifacts can be removed by retouching. Normalization Denoising Surfaces can be leveled by applying several techniques that Images can be denoised by applying a wide range of spatial can take selected zones into account and ignore others. filters with configurable matrices. The 3D Fourier Analysis They can also be flipped and rotated. Form can be removed, optional modules allows you to filter surfaces by directly for example prior to surface roughness and waviness editing the FFT and the 3D Advanced Surface Texture analysis. modules makes it possible to carry out filtering based upon sub-surface extraction. Background cleaning the sequence of operations includes form removal, surface segmentation and subtraction, and median denoising. 4 Analyzing surface geometry, surface roughness and more in accordance with the latest standards and methods Geometric analysis MountainsMap® SPM contains a full set of tools for studying surface geometry. You can measure distances, angles, areas of peaks and valleys, volumes of bumps and holes, and step heights on surfaces and profiles. Step height measurements can be used, for example to calculate the number unit cells there are in each step in a terraced nanostructure. Roughness analysis Following form removal, surfaces are separated into their roughness and waviness components by applying the latest advanced filtering techniques defined in ISO 16610, including robust Gaussian and spline filters. Step height measurement Functional analysis Analytical studies facilitate the assessment of friction and wear in nano-devices. They include the Abbott-Firestone bearing ratio curve and depth distribution histogram, the subtraction of one surface from another, and the calculation of the material/void volume ratio and thickness of up to three vertical slices of a surface. ISO surface texture parameters MountainsMap® SPM calculates ISO 25178 height and bearing ratio parameters (Sa, Sq, Ssk, Sku, Sz, etc., and Smr, Sdc, Sxp), ISO 4287 primary and roughness parameters (Ra, Rq, Rsk, Rmr, Rdc, Rdq, RPc, etc.). The right standards wherever you are Wherever you are, with MountainsMap SPM you can work with your national standards and international standards at the same time. MountainsMap® SPM not only calculates ISO ISO 25178 3D areal surface texture parameters parameters, it also calculates ASME B46.1 2D and 3D parameters (USA), displays GB/T (China), DIN (Germany), JIS (Japan), NF (France), BSI (UK), UNE (Spain) and UNI (Italy) equivalents of ISO parameters when they are available, and calculates the older EUR 15178 3D parameters. Advanced analysis and parameters More advanced analysis and additional parameters are available in optional modules. 5 Optional modules Everything you need for advanced imaging and analysis Grains, particles, islands and motifs The MountainsMap® SPM Grains & Particles module separates grains (particles, islands) from the horizontal background by binarization and it also detects them above a specified threshold height. Grain parameters are analyzed statistically and a large number of parameters are generated. Motifs analysis partitions a surface into motifs using segmentation by watersheds. calculates ISO 25178 features parameters (Spd, S10z, Sda). Force curves The Force Spectroscopy module automatically preprocesses force curve data, detects single adhesion events and detects protein unfolding events in accordance with the WLC (wormlike chain) model. Series of force curves can also be visualized and analyzed statistically. Advanced surface texture analysis The 3D Advanced Surface Texture allows you to extract and analyze a subsurface layer (for example a deposited layer on a memory cell) and analyze it in exactly the same way as a full surface measurement. It includes analytical studies of surface isotropy, directionality and periodicity, and fractal analysis. It also provides advanced functional volume analysis, calculating ISO 25178 functional volume parameters (Vmp, Vmc, Vvv, etc.) and presenting them graphically, and also calculating ISO 25178 hybrid and spatial, parameters (Sal, Str, Sdr, etc.) and ISO 12781 flatness parameters (FLTt, FLTp, FLTv, FLTq). Grains & Particles module: statistics on grains and particles The 2D Advanced Surface Texture module provides advanced analysis of 2D profiles including roughness / waviness filters from 2RC to ISO 16610, the creation and statistical analysis of series of profiles, and more. The two modules are MATLABTM compatible, making it possible to apply user-defined operators including filters. Image Co-localization The Image Co-localization module automatically co- localizes images from different instrument families for example 3D topography measured by profilometers, confocal microscopes or SPM’s with SEM or fluorescence images. Force Spectroscopy module: protein unfolding adhesion events (WLC model) 6 Optional Modules Everything you need for advanced imaging and analysis (continued) Nano-contour analysis The entry-level Contour
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