Recovering Planar Surfaces by Stereovision Based on Projective
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Program Committee Ahmad Lotfi, Nottingham Trent University, United Kingdom Alessio Vecchio, University of Pisa, Italy Andreas Riener, Johannes Kepler University Linz, Austria Antonio Jara, University of Murcia, Spain Antonio Lopez, University of Oviedo, Spain Asier Aztiria, University of Mondragon, Spain Björn Gottfried, University of Bremen, Germany Carlos Ramos, Polytechnic of Porto, Portugal Ching-Hsien Hsu Chung, Hua University, Taiwan Christos Goumopoulos, CTI, Greece Davide Merico, University of Milan-Bicocca, Italy Davy Preuveneers Katholieke, Universiteit Leuven, Belgium Diane Cook, Washington State University, USA Diego Gachet Páez, Universidad Europea de Madrid, Spain Dimitris Charitos, University of Athens, Greece Dolors Royo, Universitat Politècnica de Catalunya, Spain Dorothy Monekosso, University of Ulster, United Kingdom Fahim Kawsar, Lancaster University, United Kingdom Fei Li, Vienna University of Technology, Austria Fulvio Corno, Politecnico di Torino, Italy Gabriel Skantze, KTH, Sweden Gordon Hunter, Kingston University, United Kingdom Goreti Marreiros, Polytechnic of Porto, Portugal Hani Hagras, University of Essex, United Kingdom Hans Guesgen, Massey University, New Zealand Harald Hüning, Ulm University / Daimler AG, Germany Ho-fung Leung, The Chinese University of Hong Kong, PRC Hristijan Gjoreski, Jozef Stefan Institute, Slovenia Hui Wang, University of Ulster, United Kingdom Jan Alexandersson, DFKI GmbH, Germany Jason Ng, British Telecom (BT), United Kingdom Javier Jaen, Polytechnic University of Valencia, Spain Jilei Tian, Nokia Research Center, China Jo Vermeulen, Hasselt University, Belgium John O'Donoghue, University College Cork, Republic of Ireland Jose Machado, University of Minho, Portugal Junzhong Gu, East China Normal University, China Kaori Fujinami, Tokyo University of Agriculture and Technology, Japan Konstantinos Daflos, National Technical University of Athens, Greece Kristof Van Laerhoven, TU Darmstadt, Germany Lindsay Evett, Nottingham Trent University, United Kingdom Lieu-Hen Chen, National Chi Nan University, Taiwan Marc Böhlen, University at Buffalo, USA Marcus Handte, Universität Duisburg-Essen, Germany Maurice Mulvenna, University of Ulster, United Kingdom Michael Beigl, Karlsruhe Institute of Technology, Germany Michael Freed, SRI International, USA Michael Schneider, AGT Germany, Germany Minjuan Wang, San Diego State University, USA Nicu Sebe, University of Trento, Italy Pablo Haya, Universidad Autónoma de Madrid, Spain Ralf Jung, DFKI, Germany xvi Rene Meier, Trinity College Dublin, Republic of Ireland Rui Jose, University of Minho, Portugal Simon Egerton, Monash University, Sunway Campus, Malaysia Susanna Pirttikangas, University of Oulu, Finland Sven Fleck, SmartSurv Vision Systems, Germany Teresa Romão, FCT/ New University of Lisbon, Portugal Tobias Heinroth, University of Ulm, Germany Udo Kruschwitz, University of Essex, United Kingdom Veikko Ikonen, VTT, Finland Wen Zhan Song, Georgia State University, USA Wolfgang Maass, University of St. Gallen, Switzerland Wolfgang Reitberger, Aalto University, Finland Xiang Su, University of Oulu, Finland Yacine Bellik, LIMSI-CNRS, Paris-South 11 University, France Yu Zheng, Microsoft Research Asia, China xvii.