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Basic Optical Properties of Materials Summaries of Papers NATIONAL BUREAU of STANDARDS

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Basic Optical Properties of Materials Summaries of Papers NATIONAL BUREAU of STANDARDS A111D3 QSb3SS NATL INST OF STANDARDS & TECH RI.C. A1 11 03056385 _ Conference o/Basic optical prope 100 U57 N0.574, 1980 C.1 NBS-PUB-C 19 NBS SPECIAL PUBLICATION 574 * V„U Of U.S. DEPARTMENT OF COMMERCE / National Bureau of Standards Basic Optical Properties of Materials Summaries of Papers NATIONAL BUREAU OF STANDARDS The National Bureau of Standards' was established by an act of Congress on March 3, 1901. The Bureau's overall goal is to strengthen and advance the Nation's science and technology and facilitate their effective application for public benefit. To this end, the Bureau conducts research and provides: (1) a basis for the Nation's physical measurement system, (2) scientific and technological services for industry and government, (3) a technical basis for equity in trade, and (4) technical services to promote public safety. The Bureau's technical work is per- formed by the National Measurement Laboratory, the National Engineering Laboratory, and the Institute for Computer Sciences and Technology. THE NATIONAL MEASUREMENT LABORATORY provides the national system ot physical and chemical and materials measurement; coordinates the system with measurement systems of other nations and furnishes essential services leading to accurate and uniform physical and chemical measurement throughout the Nation's scientific community, industry, and commerce; conducts materials research leading to improved methods of measurement, standards, and data on the properties of materials needed by industry, commerce, educational institutions, and Government; provides advisory and research services to other Government agencies; develops, produces, and distributes Standard Reference Materials; and provides calibration services. The Laboratory consists of the following centers: Absolute Physical Quantities 2 — Radiation Research — Thermodynamics and Molecular Science — Analytical Chemistry — Materials Science. THE NATIONAL ENGINEERING LABORATORY provides technology and technical ser- vices to the public and private sectors to address national needs and to solve national problems; conducts research in engineering and applied science in support of these efforts; builds and maintains competence in the necessary disciplines required to carry out this research and technical service; develops engineering data and measurement capabilities; provides engineering measurement traceability services; develops test methods and proposes engineering standards and code changes; develops and proposes new engineering practices; and develops and improves mechanisms to transfer results of its research to the ultimate user. The Laboratory consists of the following centers: Applied Mathematics — Electronics and Electrical Engineering 2 — Mechanical Engineering and Process Technology 2 — Building Technology — Fire Research — Consumer Product Technology — Field Methods. THE INSTITUTE FOR COMPUTER SCIENCES AND TECHNOLOGY conducts research and provides scientific and technical services to aid Federal agencies in the selection, acquisition, application, and use of computer technology to improve effectiveness and economy in Government operations in accordance with Public Law 89-306 (40 U.S.C. 759), relevant Executive Orders, and other directives; carries out this mission by managing the Federal Information Processing Standards Program, developing Federal ADP standards guidelines, and managing Federal participation in ADP voluntary standardization activities; provides scientific and technological advisory services and assistance to Federal agencies; and provides the technical foundation for computer-related policies of the Federal Government. The Institute consists of the following centers: Programming Science and Technology — Computer Systems Engineering. 'Headquarters and Laboratories at Gaithersburg, M D, unless otherwise noted; mailing address Washington, DC 20234. ; Some divisions within the center are located at Boulder, CO 80303. NATIONAL BUREAU OF STANDARDS Basic Optical Properties of Materials LIBRARY APR 1 Summaries of Papers 2 1980 nt> t- 0-CC- -Ct4< &C/60 . as? Presented at the Topical Conference J9Po on Basic Optical Properties of Materials Held at the National Bureau of Standards Gaithersburg, Maryland, May 5-7, 1980 Edited by: Albert Feldman Center for Materials Science National Measurement Laboratory National Bureau of Standards Washington, D.C. 20234 In cooperation with: The Optical Society of America 1816 Jefferson Place, NW Washington, DC 20036 U.S. DEPARTMENT OF COMMERCE, Philip M. Klutznick, Secretary Luther H. Hodges, Jr., Deputy Secretary Jordan J. Baruch, Assistant Secretary for Productivity, Technology, and Innovation 3. NATIONAL BUREAU OF STANDARDS, Ernest Ambler, Director Issued May 1980 Library of Congress Catalog Card Number: 80-600038 National Bureau of Standards Special Publication 574 Nat. Bur. Stand. (U.S.), Spec. Publ. 574, 252 pages (May 1980) CODEN: XNBSAV U.S. GOVERNMENT PRINTING OFFICE WASHINGTON: 1980 For sale by the Superintendent of Documents, U.S. Government Printing Office, Washington, D.C. 20402 Price $6.50 (Add 25 percent for other than U.S. mailing). , , Foreword This Special Publication contains summaries of papers to be pre- sented at the Topical Conference on Basic Optical Properties of Materi- als to be held at the National Bureau of Standards in Gai thersburg Maryland on May 5-7, 1980. The conference is sponsored by the National Bureau of Standards in cooperation with the Optical Society of America. This publication contains summaries of 62 papers which include 14 invited papers. The principal topical areas are: Nonl inear Optical Properties Ultraviolet Properties Infrared Properties Graded Index Materials Inhomogeneous Materials Properties of Thin Films Optical Fibers Planar Optical Waveguides External Influences: Piezo-optics , Thermo-opti cs Magneto-optics The purpose of the conference is to discuss the state of the art in the measurement of the optical properties of optical materials. The emphasis is primarily on materials properties rather than on optical devices. The primary focus of the conference is on the measurement and theory of basic optical properties of materials in bulk, thin film, and fiber form. The manuscripts for the conference have been prepared by the authors in camera-ready form, and any questions pertaining to their content should be addressed to those authors. Albert Feldman Chai rperson Acknowl edgements We wish to thank the following individuals for their invaluable assistance in preparing for the conference and this summary: Jeanmarie Bartlett, Marilyn Dodge, Barbara Hyde, Jo Ann Lorden, and Kathy Stang. Special thanks are due to Kimberly Morgan for organizing the mailings for the conference, and for editing and assembling the completed Summary of Papers. Thanks are due to the Word Processing Center of the National Measurement Laboratory for retyping several of the manuscripts. i i i Program and Editorial Committee Albert Feldman - Chairperson National Bureau of Standards Edward Pal i k - Co-Chairman Arthur H. Guenther Naval Research Laboratory Air Force Weapons Laboratory Michael I. Bell Ivan P. Kami now National Bureau of Standards Bell Telephone Laboratories Bernard Bendow Robert V. Mohr Rome Air Development Center Catholic University Harold E. Bennett Alfred J. Thelen Michel son Laboratory Optical Coating Laboratory Naval Weapons Center Disclaimer Certain commercial equipment, instruments, or materials may be identified in this publication in order to adequately specify the experimental procedure. In no case does such identification imply recommendation or endorsement by the National Bureau of Standards, nor does it imply that the material or equipment identified is necessarily the best available for the purpose. iv CONTENTS Page Foreword iii Keynote Address — Important Areas of Optical Materials Research 1 *H. V. Winsor NONLINEAR OPTICAL PROPERTIES Properties of Low-Index Laser Materials 3 *M. J. Weber Nonlinear Optical Susceptibilities of Semiconductors and Optical Bi stability 9 H. M. Gibbs, S. L. McCall, T. N. C. Venkatesan, A. Passner, A. C. Gossard, and W. Wiegmann Band Structure Calculations of the Two-Photon Absorption Coefficients of InP and CdTe 13 A. Vaidyanathan, A. H. Guenther, and S. S. Mitra ULTRAVIOLET PROPERTIES Measurement and Interpretation of Ultraviolet Properties of Solids 16 *D. W. Lynch The Optical Properties of Kapton: Measurement and Applications 20 L. R. Painter, E. T. Arakawa, M. W. Williams and J. C. Ashley Optical Properties of TiC x ( 0 . 64<x<0 . 90 ) From 0.1 To 30eV ... 24 D. W. Lynch, C. G. Olson, D. J. Peterman, and J. H. Weaver Superconvergence Relations and the Analysis of Optical Data . 28 *D. Y. Smith INFRARED PROPERTIES Measurement of the Far Infrared Optical Constants of Disordered Solids 32 *U. Strom and P. C. Taylor *Invited Speaker v h - Infrared Impurity Absorption Spectra of Premium Q Quartz. 36 H. G. Lipson Far Infrared Study of the Reflection Spectra of SnS 40 D. G. Mead and H. R. Chandrasekhar Infrared Absorption in Highly Transparent Cubic Zirconia. ... 44 B. Bendow, H. G. Lipson, R. C. Marshall, and D. Billard The Temperature Dependence of the Optical Absorption of Metals 48 M. Bass, D. Gallant, and S. D. Allen GENERAL OPTICAL PROPERTIES The Statistical Description of Optical Inhomogenieties 51 E. L. Church Photoconductivity at 77K In Undoped Tellurium 55 N. G. Shyamprasad, C. H. Champness, and I. Shi Extrinsic States in Cinnabar (a-HgS) Grown by Chemical Vapor Transport 59 C. T. Simpson, W. Imaino, and W. M. Becker Differential Ref lectometry
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