Integrated Circuit Packaging, Assembly and Interconnections
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Understanding Performance Numbers in Integrated Circuit Design Oprecomp Summer School 2019, Perugia Italy 5 September 2019
Understanding performance numbers in Integrated Circuit Design Oprecomp summer school 2019, Perugia Italy 5 September 2019 Frank K. G¨urkaynak [email protected] Integrated Systems Laboratory Introduction Cost Design Flow Area Speed Area/Speed Trade-offs Power Conclusions 2/74 Who Am I? Born in Istanbul, Turkey Studied and worked at: Istanbul Technical University, Istanbul, Turkey EPFL, Lausanne, Switzerland Worcester Polytechnic Institute, Worcester MA, USA Since 2008: Integrated Systems Laboratory, ETH Zurich Director, Microelectronics Design Center Senior Scientist, group of Prof. Luca Benini Interests: Digital Integrated Circuits Cryptographic Hardware Design Design Flows for Digital Design Processor Design Open Source Hardware Integrated Systems Laboratory Introduction Cost Design Flow Area Speed Area/Speed Trade-offs Power Conclusions 3/74 What Will We Discuss Today? Introduction Cost Structure of Integrated Circuits (ICs) Measuring performance of ICs Why is it difficult? EDA tools should give us a number Area How do people report area? Is that fair? Speed How fast does my circuit actually work? Power These days much more important, but also much harder to get right Integrated Systems Laboratory The performance establishes the solution space Finally the cost sets a limit to what is possible Introduction Cost Design Flow Area Speed Area/Speed Trade-offs Power Conclusions 4/74 System Design Requirements System Requirements Functionality Functionality determines what the system will do Integrated Systems Laboratory Finally the cost sets a limit -
FC-PBGA, Flip Chip Plastic Ball Grid Array
TM Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, C-Ware, t he Energy Efficient Solutions logo, mobileGT, PowerQUICC, QorIQ, StarCore and Symphony are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. BeeKit, BeeStack, ColdFire+, CoreNet, Flexis, Kinetis, MXC, Platform in a Package, Processor Expert, QorIQ Qonverge, Qorivva, QUICC Engine, SMARTMOS, TurboLink, VortiQa and Xtrinsic are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. © 2011 Freescale Semiconductor, Inc. Table of Contents Slide 1. FC-PBGA Package Configurations 3 2. Printed Circuit Board Design for FC-PBGA 11 3. Surface Mount Assembly 16 4. Component Level Qualification 29 5. Board-Level Reliability 31 6. Thermal Performance 38 Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, C-Ware, the Energy Efficient Solutions logo, mobileGT, PowerQUICC, QorIQ, StarCore and Symphony are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. BeeKit, BeeStack, ColdFire+, CoreNet, Flexis, Kinetis, MXC, Platform in a TM 2 Package, Processor Expert, QorIQ Qonverge, Qorivva, QUICC Engine, SMARTMOS, TurboLink, VortiQa and Xtrinsic are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. © 2011 Freescale Semiconductor, Inc. TM FC-PBGA Package Configurations Freescale, the Freescale logo, AltiVec, C-5, CodeTEST, CodeWarrior, ColdFire, C-Ware, t he Energy Efficient Solutions logo, mobileGT, PowerQUICC, QorIQ, StarCore and Symphony are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. BeeKit, BeeStack, ColdFire+, CoreNet, Flexis, Kinetis, MXC, Platform in a Package, Processor Expert, QorIQ Qonverge, Qorivva, QUICC Engine, SMARTMOS, TurboLink, VortiQa and Xtrinsic are trademarks of Freescale Semiconductor, Inc. -
Chapter 9 Chip Bonding At
9 CHIP BONDING AT THE FIRST LEVEL The I/O interface to the die primarily interconnects electrical power, ground and signals. It must provide for low impedance for the power distribution system, so as to keep switching noise within specification, and controlled impedance for the signal leads to allow adequate signal integrity. In addition it must accommodate all the I/O and power and ground leads required, and at the same time, minimize the cost for high volume assembly. The secondary role of chip bonding is to be mechanically robust, not interfere with thermal man- agement and be the geometrical transformer from the die features to the next level of packaging features. There are many options for the next level of interconnect, including: ¥ leadframe in a single chip package ¥ ceramic substrate in a single chip package ¥ laminate substrate in a single chip package ¥ ceramic substrate in a multichip module ¥ laminate substrate in a multichip module ¥ glass substrate, such as an LCD (liquid crystal display) ¥ laminate substrate, such as a circuit board ¥ ceramic substrate, such as a circuit board For all of these first level interfaces, the chip bonding options are the same. Illustrated in Figure 9-1, they are: ¥ wirebond ¥ TAB (tape automated bonding) ¥ flip chip; either with a solder interface, a polymer adhesive or a welded joint Because of the parallel efforts in widely separated applications involving similar, but slightly dif- ferent variations of chip attach techniques, seemingly confusing names have historically evolved to describe some of the attach technologies. COG (chip on glass) refers to assembly of bare die onto LCD panels. -
Chap01: Computer Abstractions and Technology
CHAPTER 1 Computer Abstractions and Technology 1.1 Introduction 3 1.2 Eight Great Ideas in Computer Architecture 11 1.3 Below Your Program 13 1.4 Under the Covers 16 1.5 Technologies for Building Processors and Memory 24 1.6 Performance 28 1.7 The Power Wall 40 1.8 The Sea Change: The Switch from Uniprocessors to Multiprocessors 43 1.9 Real Stuff: Benchmarking the Intel Core i7 46 1.10 Fallacies and Pitfalls 49 1.11 Concluding Remarks 52 1.12 Historical Perspective and Further Reading 54 1.13 Exercises 54 CMPS290 Class Notes (Chap01) Page 1 / 24 by Kuo-pao Yang 1.1 Introduction 3 Modern computer technology requires professionals of every computing specialty to understand both hardware and software. Classes of Computing Applications and Their Characteristics Personal computers o A computer designed for use by an individual, usually incorporating a graphics display, a keyboard, and a mouse. o Personal computers emphasize delivery of good performance to single users at low cost and usually execute third-party software. o This class of computing drove the evolution of many computing technologies, which is only about 35 years old! Server computers o A computer used for running larger programs for multiple users, often simultaneously, and typically accessed only via a network. o Servers are built from the same basic technology as desktop computers, but provide for greater computing, storage, and input/output capacity. Supercomputers o A class of computers with the highest performance and cost o Supercomputers consist of tens of thousands of processors and many terabytes of memory, and cost tens to hundreds of millions of dollars. -
Photovoltaic Couplers for MOSFET Drive for Relays
Photocoupler Application Notes Basic Electrical Characteristics and Application Circuit Design of Photovoltaic Couplers for MOSFET Drive for Relays Outline: Photovoltaic-output photocouplers(photovoltaic couplers), which incorporate a photodiode array as an output device, are commonly used in combination with a discrete MOSFET(s) to form a semiconductor relay. This application note discusses the electrical characteristics and application circuits of photovoltaic-output photocouplers. ©2019 1 Rev. 1.0 2019-04-25 Toshiba Electronic Devices & Storage Corporation Photocoupler Application Notes Table of Contents 1. What is a photovoltaic-output photocoupler? ............................................................ 3 1.1 Structure of a photovoltaic-output photocoupler .................................................... 3 1.2 Principle of operation of a photovoltaic-output photocoupler .................................... 3 1.3 Basic usage of photovoltaic-output photocouplers .................................................. 4 1.4 Advantages of PV+MOSFET combinations ............................................................. 5 1.5 Types of photovoltaic-output photocouplers .......................................................... 7 2. Major electrical characteristics and behavior of photovoltaic-output photocouplers ........ 8 2.1 VOC-IF characteristics .......................................................................................... 9 2.2 VOC-Ta characteristic ........................................................................................ -
COSC 6385 Computer Architecture - Multi-Processors (IV) Simultaneous Multi-Threading and Multi-Core Processors Edgar Gabriel Spring 2011
COSC 6385 Computer Architecture - Multi-Processors (IV) Simultaneous multi-threading and multi-core processors Edgar Gabriel Spring 2011 Edgar Gabriel Moore’s Law • Long-term trend on the number of transistor per integrated circuit • Number of transistors double every ~18 month Source: http://en.wikipedia.org/wki/Images:Moores_law.svg COSC 6385 – Computer Architecture Edgar Gabriel 1 What do we do with that many transistors? • Optimizing the execution of a single instruction stream through – Pipelining • Overlap the execution of multiple instructions • Example: all RISC architectures; Intel x86 underneath the hood – Out-of-order execution: • Allow instructions to overtake each other in accordance with code dependencies (RAW, WAW, WAR) • Example: all commercial processors (Intel, AMD, IBM, SUN) – Branch prediction and speculative execution: • Reduce the number of stall cycles due to unresolved branches • Example: (nearly) all commercial processors COSC 6385 – Computer Architecture Edgar Gabriel What do we do with that many transistors? (II) – Multi-issue processors: • Allow multiple instructions to start execution per clock cycle • Superscalar (Intel x86, AMD, …) vs. VLIW architectures – VLIW/EPIC architectures: • Allow compilers to indicate independent instructions per issue packet • Example: Intel Itanium series – Vector units: • Allow for the efficient expression and execution of vector operations • Example: SSE, SSE2, SSE3, SSE4 instructions COSC 6385 – Computer Architecture Edgar Gabriel 2 Limitations of optimizing a single instruction -
Rapid Mapping of Digital Integrated Circuit Logic Gates Via Multi-Spectral Backside Imaging
RAPID MAPPING OF DIGITAL INTEGRATED CIRCUIT LOGIC GATES VIA MULTI-SPECTRAL BACKSIDE IMAGING RONEN ADATO1;4;∗, AYDAN UYAR1;4, MAHMOUD ZANGENEH1;4, BOYOU ZHOU1;4, AJAY JOSHI1;4, BENNETT GOLDBERG1;2;3;4 AND M SELIM UNL¨ U¨ 1;3;4 Abstract. Modern semiconductor integrated circuits are increasingly fabricated at untrusted third party foundries. There now exist myriad security threats of malicious tampering at the hardware level and hence a clear and pressing need for new tools that enable rapid, robust and low-cost validation of circuit layouts. Optical backside imaging offers an attractive platform, but its limited resolution and throughput cannot cope with the nanoscale sizes of modern circuitry and the need to image over a large area. We propose and demonstrate a multi-spectral imaging approach to overcome these obstacles by identifying key circuit elements on the basis of their spectral response. This obviates the need to directly image the nanoscale components that define them, thereby relaxing resolution and spatial sampling requirements by 1 and 2 - 4 orders of magnitude respectively. Our results directly address critical security needs in the integrated circuit supply chain and highlight the potential of spectroscopic techniques to address fundamental resolution obstacles caused by the need to image ever shrinking feature sizes in semiconductor integrated circuits. 1. Introduction Semiconductor integrated circuits (ICs) are pervasive and essential components in virtually all modern devices, from personal computers, to medical equipment, to varied military systems and technologies. Their functionality is defined by a massive number (∼ 106 − 109 currently) of in- terconnected logic gates that correspond physically to various nanoscale doped regions, polysilicon and metal (usually copper and tungsten) structures. -
Basic Design of MOSFET, Four-Phase, Digital Integrated Circuits
Scholars' Mine Masters Theses Student Theses and Dissertations 1969 Basic design of MOSFET, four-phase, digital integrated circuits Earl Morris Worstell Follow this and additional works at: https://scholarsmine.mst.edu/masters_theses Part of the Electrical and Computer Engineering Commons Department: Recommended Citation Worstell, Earl Morris, "Basic design of MOSFET, four-phase, digital integrated circuits" (1969). Masters Theses. 5304. https://scholarsmine.mst.edu/masters_theses/5304 This thesis is brought to you by Scholars' Mine, a service of the Missouri S&T Library and Learning Resources. This work is protected by U. S. Copyright Law. Unauthorized use including reproduction for redistribution requires the permission of the copyright holder. For more information, please contact [email protected]. BASIC DESIGN OF MOSFET, FOUR-PHASE, DIGITAL INTEGRATED CIRCUITS By t_fL/ () Earl Morris Worstell , Jr./ J q¥- 2., A Thesis submitted to the faculty of THE UNIVERSITY OF MISSOURI - ROLLA in partial fulfillment of the requirements for the Degree of MASTER OF SCIENCE IN ELECTRICAL ENGINEERING Ro 11 a , M i sous ri 1969 Approved By i BASIC DESIGN OF MOSFET, FOUR-PHASE, DIGITAL INTEGRATED CIRCUITS by Earl M. Worstell, Jr. Abstract MOSFET is defined as metal oxide semiconductor field-effect transis tor. The integrated circuit design relates strictly to logic and switch ing circuits rather than linear circuits. The design of MOS circuits is primarily one of charge and discharge of stray capacitance through MOSFETS used as switches and active loads. To better take advantage of the possibilities of MOS technology, four phase (4¢) circuitry is developed. It offers higher speeds and lower power while permitting higher circuit density than does static or two phase (2cj>) logic. -
Quad Flat No-Lead (QFN) Evauation Test
National Aeronautics and Space Administration Quad Flat No-Lead (QFN) Evaluation Testing Reza Ghaffarian, Ph.D. Jet Propulsion Laboratory Pasadena, California Jet Propulsion Laboratory California Institute of Technology Pasadena, California 6/17 National Aeronautics and Space Administration Quad Flat No-Lead (QFN) Evaluation Testing NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Success Reza Ghaffarian, Ph.D. Jet Propulsion Laboratory Pasadena, California NASA WBS: 724297.40.43 JPL Project Number: 104593 Task Number: 40.49.02.35 Jet Propulsion Laboratory 4800 Oak Grove Drive Pasadena, CA 91109 http://nepp.nasa.gov 6/17 This research was carried out at the Jet Propulsion Laboratory, California Institute of Technology, and was sponsored by the National Aeronautics and Space Administration Electronic Parts and Packaging (NEPP) Program. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise, does not constitute or imply its endorsement by the United States Government or the Jet Propulsion Laboratory, California Institute of Technology. Copyright 2017. California Institute of Technology. Government sponsorship acknowledged. Acknowledgments The author would like to acknowledge many people from industry and the Jet Propulsion Laboratory (JPL) who were critical to the progress of this activity including the Rochester Institute of Technology (RIT). The author extends his appreciation to program managers of the National Aeronautics and Space -
Integrated Circuit Design Macmillan New Electronics Series Series Editor: Paul A
Integrated Circuit Design Macmillan New Electronics Series Series Editor: Paul A. Lynn Paul A. Lynn, Radar Systems A. F. Murray and H. M. Reekie, Integrated Circuit Design Integrated Circuit Design Alan F. Murray and H. Martin Reekie Department of' Electrical Engineering Edinhurgh Unit·ersity Macmillan New Electronics Introductions to Advanced Topics M MACMILLAN EDUCATION ©Alan F. Murray and H. Martin Reekie 1987 All rights reserved. No reproduction, copy or transmission of this publication may be made without written permission. No paragraph of this publication may be reproduced, copied or transmitted save with written permission or in accordance with the provisions of the Copyright Act 1956 (as amended), or under the terms of any licence permitting limited copying issued by the Copyright Licensing Agency, 7 Ridgmount Street, London WC1E 7AE. Any person who does any unauthorised act in relation to this publication may be liable to criminal prosecution and civil claims for damages. First published 1987 Published by MACMILLAN EDUCATION LTD Houndmills, Basingstoke, Hampshire RG21 2XS and London Companies and representatives throughout the world British Library Cataloguing in Publication Data Murray, A. F. Integrated circuit design.-(Macmillan new electronics series). 1. Integrated circuits-Design and construction I. Title II. Reekie, H. M. 621.381'73 TK7874 ISBN 978-0-333-43799-5 ISBN 978-1-349-18758-4 (eBook) DOI 10.1007/978-1-349-18758-4 To Glynis and Christa Contents Series Editor's Foreword xi Preface xii Section I 1 General Introduction -
AN1902: Assembly Guidelines for QFN and SON Packages
AN1902 Assembly guidelines for QFN (quad flat no-lead) and SON (small outline no-lead) packages Rev. 9 — 28 April 2021 Application note Document information Information Content Keywords QFN, SON, PCB, Assembly, Soldering Abstract This document provides guidelines for the handling and board mounting of QFN and SON packages including recommendations for printed-circuit board (PCB) design, soldering, and rework. NXP Semiconductors AN1902 Assembly guidelines for QFN (quad flat no-lead) and SON (small outline no-lead) packages Revision history Rev Date Description v.9 20210428 Updated description in Section 7.1 and Section 7.2 v.8 20180206 Rewrote to combine Freescale AN1902 and NXP AN10365 application notes into a single document. AN1902 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2021. All rights reserved. Application note Rev. 9 — 28 April 2021 2 / 50 NXP Semiconductors AN1902 Assembly guidelines for QFN (quad flat no-lead) and SON (small outline no-lead) packages 1 Introduction This application note provides guidelines for the handling and board mounting of NXP's QFN and SON packages including recommendations for printed-circuit board (PCB) design, board mounting, and rework. Generic information of package properties such as moisture sensitivity level (MSL) rating, board level reliability, mechanical and thermal resistance data are also provided. Semiconductor components are electrical (ESD) and mechanical sensitive devices. Proper precautions for handling, packing and processing are described. 2 Scope This application note contains generic information about various QFN and SON packages assembled at NXP and NXP's assembly and test vendors. Refer to Section 9 "Downloading package information from NXP website" of this application note for step by step instructions for retrieving package information. -
Application Notes
U-118 ul B UNITRODE APPLICATION NOTES NEW DRIVER ICs OPTIMIZE HIGH SPEED POWER MOSFET SWITCHING CHARACTERISTICS Bill Andreycak UNITRODE Integrated Circuits Corporation, Merrimack, N.H. ABSTRACT systems and, in the process opened the way to new performance Although touted as a high impedance, voltage controlled device, levels and new topologies. prospective users of Power MOSFETs soon learn that it takes high A major factor in this regard is the potential for extemely fast drive currents to achieve high speed switching. This paper switching. Not only is there no storage time inherent with MOSFETs, describes the construction techniques which lead to the parasitic but the switching times can be user controlled to suit the application. effects which normally limit FETperformance, and discusses several This or course, requires that the designer have an understanding approaches useful to improve switching speed. A series of drivers of the switching dynamics inherent in these devices. Even though ICs, the UC3705, UC3706, UC3707 and UC3709 are featured and power MOSFETs are majority carrier devices, the speed at which their performance is highlighted. This publication supercedes they can switch is dependent upon many parameters and parasitic Unitrode Application Note U-98, originally written by R. Patel and effects related to the device’s construction. R. Mammano of Unitrode Corporation. THE POWER MOSFET MODEL INTRODUCTION An understanding of the parasitic elements in a power MOSFET can An investigation of Power MOSFET construction techniques will be gained by comparing the construction details of a MOSFET with identify several parasitic elements which make the highly-touted its electrical model as shown in Figure 1.