SDRAM (Synchronous Dynamic Random Access Memory)
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Product Guide SAMSUNG ELECTRONICS RESERVES the RIGHT to CHANGE PRODUCTS, INFORMATION and SPECIFICATIONS WITHOUT NOTICE
May. 2018 DDR4 SDRAM Memory Product Guide SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE. Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind. This document and all information discussed herein remain the sole and exclusive property of Samsung Electronics. No license of any patent, copyright, mask work, trademark or any other intellectual property right is granted by one party to the other party under this document, by implication, estoppel or other- wise. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar applications where product failure could result in loss of life or personal or physical harm, or any military or defense application, or any governmental procurement to which special terms or provisions may apply. For updates or additional information about Samsung products, contact your nearest Samsung office. All brand names, trademarks and registered trademarks belong to their respective owners. © 2018 Samsung Electronics Co., Ltd. All rights reserved. - 1 - May. 2018 Product Guide DDR4 SDRAM Memory 1. DDR4 SDRAM MEMORY ORDERING INFORMATION 1 2 3 4 5 6 7 8 9 10 11 K 4 A X X X X X X X - X X X X SAMSUNG Memory Speed DRAM Temp & Power DRAM Type Package Type Density Revision Bit Organization Interface (VDD, VDDQ) # of Internal Banks 1. SAMSUNG Memory : K 8. Revision M: 1st Gen. A: 2nd Gen. 2. DRAM : 4 B: 3rd Gen. C: 4th Gen. D: 5th Gen. -
DDR and DDR2 SDRAM Controller Compiler User Guide
DDR and DDR2 SDRAM Controller Compiler User Guide 101 Innovation Drive Software Version: 9.0 San Jose, CA 95134 Document Date: March 2009 www.altera.com Copyright © 2009 Altera Corporation. All rights reserved. Altera, The Programmable Solutions Company, the stylized Altera logo, specific device designations, and all other words and logos that are identified as trademarks and/or service marks are, unless noted otherwise, the trademarks and service marks of Altera Corporation in the U.S. and other countries. All other product or service names are the property of their respective holders. Altera products are protected under numerous U.S. and foreign patents and pending ap- plications, maskwork rights, and copyrights. Altera warrants performance of its semiconductor products to current specifications in accordance with Altera's standard warranty, but reserves the right to make changes to any products and services at any time without notice. Altera assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly agreed to in writing by Altera Corporation. Altera customers are advised to obtain the latest version of device specifications before relying on any published information and before placing orders for products or services. UG-DDRSDRAM-10.0 Contents Chapter 1. About This Compiler Release Information . 1–1 Device Family Support . 1–1 Features . 1–2 General Description . 1–2 Performance and Resource Utilization . 1–4 Installation and Licensing . 1–5 OpenCore Plus Evaluation . 1–6 Chapter 2. Getting Started Design Flow . 2–1 SOPC Builder Design Flow . 2–1 DDR & DDR2 SDRAM Controller Walkthrough . -
You Need to Know About Ddr4
Overcoming DDR Challenges in High-Performance Designs Mazyar Razzaz, Applications Engineering Jeff Steinheider, Product Marketing September 2018 | AMF-NET-T3267 Company Public – NXP, the NXP logo, and NXP secure connections for a smarter world are trademarks of NXP B.V. All other product or service names are the property of their respective owners. © 2018 NXP B.V. Agenda • Basic DDR SDRAM Structure • DDR3 vs. DDR4 SDRAM Differences • DDR Bring up Issues • Configurations and Validation via QCVS Tool COMPANY PUBLIC 1 BASIC DDR SDRAM STRUCTURE COMPANY PUBLIC 2 Single Transistor Memory Cell Access Transistor Column (bit) line Row (word) line G S D “1” => Vcc “0” => Gnd “precharged” to Vcc/2 Cbit Ccol Storage Parasitic Line Capacitor Vcc/2 Capacitance COMPANY PUBLIC 3 Memory Arrays B0 B1 B2 B3 B4 B5 B6 B7 ROW ADDRESS DECODER ADDRESS ROW W0 W1 W2 SENSE AMPS & WRITE DRIVERS COLUMN ADDRESS DECODER COMPANY PUBLIC 4 Internal Memory Banks • Multiple arrays organized into banks • Multiple banks per memory device − DDR3 – 8 banks, and 3 bank address (BA) bits − DDR4 – 16 banks with 4 banks in each of 4 sub bank groups − Can have one active row in each bank at any given time • Concurrency − Can be opening or closing a row in one bank while accessing another bank Bank 0 Bank 1 Bank 2 Bank 3 Row 0 Row 1 Row 2 Row 3 Row … Row Buffers COMPANY PUBLIC 5 Memory Access • A requested row is ACTIVATED and made accessible through the bank’s row buffers • READ and/or WRITE are issued to the active row in the row buffers • The row is PRECHARGED and is no longer -
Improving DRAM Performance by Parallelizing Refreshes
Improving DRAM Performance by Parallelizing Refreshes with Accesses Kevin Kai-Wei Chang Donghyuk Lee Zeshan Chishti† [email protected] [email protected] [email protected] Alaa R. Alameldeen† Chris Wilkerson† Yoongu Kim Onur Mutlu [email protected] [email protected] [email protected] [email protected] Carnegie Mellon University †Intel Labs Abstract Each DRAM cell must be refreshed periodically every re- fresh interval as specified by the DRAM standards [11, 14]. Modern DRAM cells are periodically refreshed to prevent The exact refresh interval time depends on the DRAM type data loss due to leakage. Commodity DDR (double data rate) (e.g., DDR or LPDDR) and the operating temperature. While DRAM refreshes cells at the rank level. This degrades perfor- DRAM is being refreshed, it becomes unavailable to serve mance significantly because it prevents an entire DRAM rank memory requests. As a result, refresh latency significantly de- from serving memory requests while being refreshed. DRAM de- grades system performance [24, 31, 33, 41] by delaying in- signed for mobile platforms, LPDDR (low power DDR) DRAM, flight memory requests. This problem will become more preva- supports an enhanced mode, called per-bank refresh, that re- lent as DRAM density increases, leading to more DRAM rows freshes cells at the bank level. This enables a bank to be ac- to be refreshed within the same refresh interval. DRAM chip cessed while another in the same rank is being refreshed, alle- density is expected to increase from 8Gb to 32Gb by 2020 as viating part of the negative performance impact of refreshes. -
Dual-DIMM DDR2 and DDR3 SDRAM Board Design Guidelines, External
5. Dual-DIMM DDR2 and DDR3 SDRAM Board Design Guidelines June 2012 EMI_DG_005-4.1 EMI_DG_005-4.1 This chapter describes guidelines for implementing dual unbuffered DIMM (UDIMM) DDR2 and DDR3 SDRAM interfaces. This chapter discusses the impact on signal integrity of the data signal with the following conditions in a dual-DIMM configuration: ■ Populating just one slot versus populating both slots ■ Populating slot 1 versus slot 2 when only one DIMM is used ■ On-die termination (ODT) setting of 75 Ω versus an ODT setting of 150 Ω f For detailed information about a single-DIMM DDR2 SDRAM interface, refer to the DDR2 and DDR3 SDRAM Board Design Guidelines chapter. DDR2 SDRAM This section describes guidelines for implementing a dual slot unbuffered DDR2 SDRAM interface, operating at up to 400-MHz and 800-Mbps data rates. Figure 5–1 shows a typical DQS, DQ, and DM signal topology for a dual-DIMM interface configuration using the ODT feature of the DDR2 SDRAM components. Figure 5–1. Dual-DIMM DDR2 SDRAM Interface Configuration (1) VTT Ω RT = 54 DDR2 SDRAM DIMMs (Receiver) Board Trace FPGA Slot 1 Slot 2 (Driver) Board Trace Board Trace Note to Figure 5–1: (1) The parallel termination resistor RT = 54 Ω to VTT at the FPGA end of the line is optional for devices that support dynamic on-chip termination (OCT). © 2012 Altera Corporation. All rights reserved. ALTERA, ARRIA, CYCLONE, HARDCOPY, MAX, MEGACORE, NIOS, QUARTUS and STRATIX words and logos are trademarks of Altera Corporation and registered in the U.S. Patent and Trademark Office and in other countries. -
Datasheet DDR4 SDRAM Revision History
Rev. 1.4, Apr. 2018 M378A5244CB0 M378A1K43CB2 M378A2K43CB1 288pin Unbuffered DIMM based on 8Gb C-die 78FBGA with Lead-Free & Halogen-Free (RoHS compliant) datasheet SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE. Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind. This document and all information discussed herein remain the sole and exclusive property of Samsung Electronics. No license of any patent, copyright, mask work, trademark or any other intellectual property right is granted by one party to the other party under this document, by implication, estoppel or other- wise. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar applications where product failure could result in loss of life or personal or physical harm, or any military or defense application, or any governmental procurement to which special terms or provisions may apply. For updates or additional information about Samsung products, contact your nearest Samsung office. All brand names, trademarks and registered trademarks belong to their respective owners. © 2018 Samsung Electronics Co., Ltd.GG All rights reserved. - 1 - Rev. 1.4 Unbuffered DIMM datasheet DDR4 SDRAM Revision History Revision No. History Draft Date Remark Editor 1.0 - First SPEC. Release 27th Jun. 2016 - J.Y.Lee 1.1 - Deletion of Function Block Diagram [M378A1K43CB2] on page 11 29th Jun. 2016 - J.Y.Lee - Change of Physical Dimensions [M378A1K43CB1] on page 41 1.11 - Correction of Typo 7th Mar. 2017 - J.Y.Lee 1.2 - Change of Physical Dimensions [M378A1K43CB1] on page 41 23h Mar. -
64M X 16 Bit DDRII Synchronous DRAM (SDRAM) Advance (Rev
AS4C64M16D2A-25BAN Revision History 1Gb Auto-AS4C64M16D2A - 84 ball FBGA PACKAGE Revision Details Date Rev 1.0 Preliminary datasheet Jan 2018 Alliance Memory Inc. 511 Taylor Way, San Carlos, CA 94070 TEL: (650) 610-6800 FAX: (650) 620-9211 Alliance Memory Inc. reserves the right to change products or specification without notice Confidential - 1 of 62 - Rev.1.0 Jan. 2018 AS4C64M16D2A-25BAN 64M x 16 bit DDRII Synchronous DRAM (SDRAM) Advance (Rev. 1.0, Jan. /2018) Features Overview JEDEC Standard Compliant The AS4C64M16D2A is a high-speed CMOS Double- AEC-Q100 Compliant Data-Rate-Two (DDR2), synchronous dynamic random- JEDEC standard 1.8V I/O (SSTL_18-compatible) access memory (SDRAM) containing 1024 Mbits in a 16-bit wide data I/Os. It is internally configured as a 8- Power supplies: V & V = +1.8V 0.1V DD DDQ bank DRAM, 8 banks x 8Mb addresses x 16 I/Os. The Operating temperature: TC = -40~105°C (Automotive) device is designed to comply with DDR2 DRAM key Supports JEDEC clock jitter specification features such as posted CAS# with additive latency, Fully synchronous operation Write latency = Read latency -1, Off-Chip Driver (OCD) Fast clock rate: 400 MHz impedance adjustment, and On Die Termination(ODT). Differential Clock, CK & CK# All of the control and address inputs are synchronized Bidirectional single/differential data strobe with a pair of externally supplied differential clocks. Inputs are latched at the cross point of differential clocks (CK - DQS & DQS# rising and CK# falling) All I/Os are synchronized with a 8 internal banks for concurrent operation pair of bidirectional strobes (DQS and DQS#) in a source 4-bit prefetch architecture synchronous fashion. -
DDR2 SDRAM SO-DIMM MODULE, 1.8V 512Mbyte - 64MX64 AVK6464U51E5667F0
DDR2 SDRAM SO-DIMM MODULE, 1.8V 512MByte - 64MX64 AVK6464U51E5667F0 FEATURES JEDEC Standard DDR2 PC2-5300 667MHz - Clock frequency: 333MHz with CAS latency 5 - 256 byte serial EEPROM - Data input and output masking - Programmable burst length: 2, 4, 8 - Programmable burst type: sequential and interleave - Programmable CAS latency: 5 - Auto refresh and self refresh capability - Gold card edge fingers - 8K refresh per 64ms - Low active and standby current consumption - SSTL-2 compatible inputs and outputs - Decoupling capacitors at each memory device - Double-sided module - 1.18 inch height DESCRIPTION The AVK6464U51E5667F0 family consists of Unbuffered DDR2 SDRAM SODIMM memory module. This module is JEDEC-standard 200-pin, small-outline, dual in-line memory module. A 256 byte serial EEPROM on board can be used to store module information such as timing, configuration, density, etc. The AVK6464U51E5667F0 memory module is 512MByte and organized as a 64MX64 array using (8) 32MX16 (4 internal banks) DDR2 SDRAMs in BGA packages. All memory modules are fabricated using the latest technology design, six-layer printed circuit board substrate construction with low ESR decoupling capacitors on-board for high reliability and low noise. PHYSICAL DIMENSIONS 2.661 0.040 256MBit 256MBit 256MBit 256MBit 1.18 32MX8 DDR2 32MX8 DDR2 32MX8 DDR2 32MX8 DDR2 BGA SDRAM BGA SDRAM BGA SDRAM BGA SDRAM 512MBit (8MX16X4) 512MBit (8MX16X4) S 512MBit (8MX16X4) 512MBit (8MX16X4) P 32MX16 DDR2 BGA SDRAM 32MX16 DDR2 BGA SDRAM D 32MX16 DDR2 BGA SDRAM 32MX16 DDR2 BGA SDRAM 0.787 1 199 0.140 All gray ICs are on the top, and all white ICs are on the back side of the modude The SPD EEPROM is populated on the back side of the module BGA Package Avant™ Technology LP. -
DDR4 8Gb C Die Unbuffered SODIMM Rev1.5 Apr.18.Book
Rev. 1.5, Apr. 2018 M471A5244CB0 M471A1K43CB1 M471A2K43CB1 260pin Unbuffered SODIMM based on 8Gb C-die 78FBGA with Lead-Free & Halogen-Free (RoHS compliant) datasheet SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE. Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind. This document and all information discussed herein remain the sole and exclusive property of Samsung Electronics. No license of any patent, copyright, mask work, trademark or any other intellectual property right is granted by one party to the other party under this document, by implication, estoppel or other- wise. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar applications where product failure could result in loss of life or personal or physical harm, or any military or defense application, or any governmental procurement to which special terms or provisions may apply. For updates or additional information about Samsung products, contact your nearest Samsung office. All brand names, trademarks and registered trademarks belong to their respective owners. © 2018 Samsung Electronics Co., Ltd. All rights reserved. - 1 - Rev. 1.5 Unbuffered SODIMM datasheet DDR4 SDRAM Revision History Revision No. History Draft Date Remark Editor 1.0 - First SPEC. Release 27th Jun. 2016 - J.Y.Lee 1.1 - Change of Function Block Diagram [M471A1K43CB1] on page 10~11 29th Jun. 2016 - J.Y.Lee - Change of Physical Dimensions on page 42~43 1.2 - Change of Physical Dimensions on page 42~43 24th Feb. -
Performance Evaluation and Feasibility Study of Near-Data Processing on DRAM Modules (DIMM-NDP) for Scientific Applications Matthias Gries, Pau Cabré, Julio Gago
Performance Evaluation and Feasibility Study of Near-data Processing on DRAM Modules (DIMM-NDP) for Scientific Applications Matthias Gries, Pau Cabré, Julio Gago To cite this version: Matthias Gries, Pau Cabré, Julio Gago. Performance Evaluation and Feasibility Study of Near-data Processing on DRAM Modules (DIMM-NDP) for Scientific Applications. [Technical Report] Huawei Technologies Duesseldorf GmbH, Munich Research Center (MRC). 2019. hal-02100477 HAL Id: hal-02100477 https://hal.archives-ouvertes.fr/hal-02100477 Submitted on 15 Apr 2019 HAL is a multi-disciplinary open access L’archive ouverte pluridisciplinaire HAL, est archive for the deposit and dissemination of sci- destinée au dépôt et à la diffusion de documents entific research documents, whether they are pub- scientifiques de niveau recherche, publiés ou non, lished or not. The documents may come from émanant des établissements d’enseignement et de teaching and research institutions in France or recherche français ou étrangers, des laboratoires abroad, or from public or private research centers. publics ou privés. TECHNICAL REPORT MRC-2019-04-15-R1, HUAWEI TECHNOLOGIES, MUNICH RESEARCH CENTER, GERMANY, APRIL 2019 1 Performance Evaluation and Feasibility Study of Near-data Processing on DRAM Modules (DIMM-NDP) for Scientific Applications Matthias Gries , Pau Cabre,´ Julio Gago Abstract—As the performance of DRAM devices falls more and more behind computing capabilities, the limitations of the memory and power walls are imminent. We propose a practical Near-Data Processing (NDP) architecture DIMM-NDP for mitigating the effects of the memory wall in the nearer-term targeting server applications for scientific computing. DIMM-NDP exploits existing but unused DRAM bandwidth on memory modules (DIMMs) and takes advantage of a subset of the forthcoming JEDEC NVDIMM-P protocol in order to integrate application-specific, programmable functionality near memory. -
Memory Controller SC White Paper
DEVELOPING HIGH-SPEED MEMORY INTERFACES: THE LatticeSCM FPGA ADVANTAGE A Lattice Semiconductor White Paper February 2006 Lattice Semiconductor 5555 Northeast Moore Ct. Hillsboro, Oregon 97124 USA Telephone: (503) 268-8000 www.latticesemi.com Developing High-Speed Memory Interfaces A Lattice Semiconductor White Paper Introduction A common problem for today’s system designers is to reliably interface to their next generation high- speed memory devices. As system bandwidths continue to increase, memory technologies have been optimized for higher speeds and performance. As a result, these next generation memory interfaces are also increasingly challenging to design to. Implementing high-speed, high-efficiency memory interfaces in programmable logic devices such as FPGAs has always been a major challenge for designers. Lattice Semiconductor offers customers a high performance FPGA platform in the LatticeSC to design high-speed memory interface solutions. The LatticeSC family implements various features on- chip that facilitate designing high-speed memory controllers to interface to the next generation high- speed, high performance DDR SDRAM, QDR SRAM, and emerging RLDRAM memory devices. The PURESPEED I/O structures on the LatticeSC, combined with the clock management resources and a high-speed FPGA fabric help customers reduce design risk and time-to-market for high-speed memory based designs. Additionally, the LatticeSCM family implements full-featured embedded high-speed memory controllers on-chip to interface smoothly to the next generation high-speed, high performance DDR I/II SDRAM, QDR II SRAM, and RLDRAM I/II memory devices. The embedded memory controllers, coupled with the I/O structures and clock management resources, are fully verified controllers for customers to use as off-the-shelf solutions. -
2048Mb Ddr2 Dimm
Apacer Memory Product Specification 2048MB DDR2 DIMM 2GB DDR2 DIMM based on 128MX8 ,8Banks, 1.8V DDR2 DIMM with SPD Features ‧Performance range ( Bandwidth: 5.3 GB/sec ) Part Number Max Freq. (Clock) Speed Grade 78.A1G9O.404 333MHz(3ns@CL5) 667Mbps ‧JEDECstandard 1.8V ± 0.1V Power Supply ‧VDDQ = 1.8V± 0.1V ‧Internal Bank: 8 Bank ‧Posted CAS ‧Programmable CAS Latency: 4, 5, 6 ‧Programmable Additive Latency: 0, 1 , 2 , 3 and 4 ‧Write Latency(WL) = Read Latency(RL) -1 ‧Burst Length: 4 , 8(Interleave/nibble sequential) ‧Programmable Sequential / Interleave Burst Mode ‧Bi-directional Differential Data-Strobe (Single-ended data-strobe is an optional feature) ‧Off-Chip Driver(OCD) Impedance Adjustment ‧On Die Termination ‧Refresh and Self Refresh Average Refesh Period 7.8us ‧Serial presence detect with EEPROM ‧Compliance with RoHS ‧Compliance with CE ‧Operating Temperature Rang: ‧Commercial 0°C ≦ TC ≦ 85°C ‧Refresh: auto-refresh, self-refresh ‧─Average refresh period 7.8us at 0°C ≦ TC ≦ 85°C 3.9us at 85°C ≦ TC ≦ 95°C Pin Description Pin Name Description Pin Name Description A0-A13 DDR2 SDRAM address bus CK0, CK1, CK2 DDR2 SDRAM clocks (positive line of differential pair) BA0-BA2 DDR2 SDRAM bank select CK0, CK1, CK2 DDR2 SDRAM clocks (negative line of differential pair) RAS DDR2 SDRAM row address strobe SCL I2C serial bus clock for EEPROM CAS DDR2 SDRAM column address strobe SDA I2C serial bus data line for EEPROM WE DDR2 SDRAM wirte enable SA0-SA2 I2C serial address select for EEPROM S0, S1 DIMM Rank Select Lines VDD* DDR2 SDRAM core power supply